"Microarchitecture-level leakage reduction with data retention."

Weiping Liao, Joseph M. Basile, Lei He (2005)

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DOI: 10.1109/TVLSI.2005.859560

access: closed

type: Journal Article

metadata version: 2023-03-13

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Weiping Liao, Joseph M. Basile, Lei He:
Microarchitecture-level leakage reduction with data retention. IEEE Trans. Very Large Scale Integr. Syst. 13(11): 1324-1328 (2005)

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