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"Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in ..."
Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu (2014)
- Chen-Wei Lin, Mango Chia-Tso Chao, Chih-Chieh Hsu:
Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs. IEEE Trans. Very Large Scale Integr. Syst. 22(6): 1294-1307 (2014)
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