"Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled ..."

Yangyang Pan, Guiqiang Dong, Tong Zhang (2013)

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DOI: 10.1109/TVLSI.2012.2210256

access: closed

type: Journal Article

metadata version: 2020-03-11

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Yangyang Pan, Guiqiang Dong, Tong Zhang:
Error Rate-Based Wear-Leveling for nand Flash Memory at Highly Scaled Technology Nodes. IEEE Trans. Very Large Scale Integr. Syst. 21(7): 1350-1354 (2013)

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