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"IVF: Characterizing the Vulnerability of Microprocessor Structures to ..."

Songjun Pan, Yu Hu, Xiaowei Li (2012)

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DOI: 10.1109/TVLSI.2011.2134115

access: closed

type: Journal Article

metadata version: 2020-09-25

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Songjun Pan, Yu Hu, Xiaowei Li:
IVF: Characterizing the Vulnerability of Microprocessor Structures to Intermittent Faults. IEEE Trans. Very Large Scale Integr. Syst. 20(5): 777-790 (2012)

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