"Reliable Power Gating With NBTI Aging Benefits."

Daniele Rossi et al. (2016)

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DOI: 10.1109/TVLSI.2016.2519385

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type: Journal Article

metadata version: 2025-05-31

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Daniele Rossi, Vasileios Tenentes, Sheng Yang, S. Saqib Khursheed, Bashir M. Al-Hashimi:
Reliable Power Gating With NBTI Aging Benefits. IEEE Trans. Very Large Scale Integr. Syst. 24(8): 2735-2744 (2016)

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