"Fault-sensitivity analysis and reliability enhancement of ..."

Mandeep Singh, Israel Koren (2003)

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DOI: 10.1109/TVLSI.2003.812376

access: closed

type: Journal Article

metadata version: 2020-03-11

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Mandeep Singh, Israel Koren:
Fault-sensitivity analysis and reliability enhancement of analog-to-digital converters. IEEE Trans. Very Large Scale Integr. Syst. 11(5): 839-852 (2003)

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