"SCAR: Power Side-Channel Analysis at RTL Level."

Amisha Srivastava et al. (2024)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2024.3390601

access: closed

type: Journal Article

metadata version: 2024-06-18

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/SrivastavaDCPSPB24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/SrivastavaDCPSPB24
Amisha Srivastava, Sanjay Das, Navnil Choudhury, Rafail Psiakis, Pedro Henrique Silva, Debjit Pal, Kanad Basu:
SCAR: Power Side-Channel Analysis at RTL Level. IEEE Trans. Very Large Scale Integr. Syst. 32(6): 1110-1123 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.