"A New Delay Test Based on Delay Defect Detection Within Slack Intervals ..."

Haihua Yan, Adit D. Singh (2006)

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DOI: 10.1109/TVLSI.2006.886415

access: closed

type: Journal Article

metadata version: 2020-03-11

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Haihua Yan, Adit D. Singh:
A New Delay Test Based on Delay Defect Detection Within Slack Intervals (DDSI). IEEE Trans. Very Large Scale Integr. Syst. 14(11): 1216-1226 (2006)

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