"Impact Ionization and Hot-Electron Injection Derived Consistently from ..."

Paul E. Hasler et al. (1998)

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DOI: 10.1155/1998/73698

access: open

type: Journal Article

metadata version: 2023-05-08

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Paul E. Hasler, Andreas G. Andreou, Chris Diorio, Bradley A. Minch, Carver A. Mead:
Impact Ionization and Hot-Electron Injection Derived Consistently from Boltzmann Transport. VLSI Design 8(1-4): 454-461 (1998)

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