"One-Dimensional Analysis of Subthreshold Characteristics of SOI-MOSFET ..."

Rimon Ikeno, Hiroshi Ito, Kunihiro Asada (1998)

> Home

Details and statistics

DOI: 10.1155/1998/23890

access: open

type: Journal Article

metadata version: 2023-05-08

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/IkenoIA98
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/IkenoIA98
Rimon Ikeno, Hiroshi Ito, Kunihiro Asada:
One-Dimensional Analysis of Subthreshold Characteristics of SOI-MOSFET Considering Quantum Mechanical Effects. VLSI Design 6(1-4): 65-67 (1998)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.