"New Approach to Hot Electron Effects in Si-MOSFETs Based on an ..."

Jürgen Jakumeit, Umberto Ravaioli, Karl Hess (1998)

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DOI: 10.1155/1998/81023

access: open

type: Journal Article

metadata version: 2023-05-08

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Jürgen Jakumeit, Umberto Ravaioli, Karl Hess:
New Approach to Hot Electron Effects in Si-MOSFETs Based on an Evolutionary Algorithm Using a Monte Carlo Like Mutation Operator. VLSI Design 6(1-4): 307-311 (1998)

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