"The Impact of Statistical Leakage Models on Design Yield Estimation."

Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif (2011)

> Home

Details and statistics

DOI: 10.1155/2011/471903

access: open

type: Journal Article

metadata version: 2018-11-24

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/KanjJN11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/KanjJN11
Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif:
The Impact of Statistical Leakage Models on Design Yield Estimation. VLSI Design 2011: 471903:1-471903:12 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.