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"Numerical Examination of Photon Recycling as an Explanation of Observed ..."

Joseph W. Parks Jr., Kevin F. Brennan, Arlynn W. Smith (1998)

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DOI: 10.1155/1998/16476

access: open

type: Journal Article

metadata version: 2023-05-08

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Joseph W. Parks Jr., Kevin F. Brennan, Arlynn W. Smith:
Numerical Examination of Photon Recycling as an Explanation of Observed Carrier Lifetime in Direct Bandgap Materials. VLSI Design 8(1-4): 153-157 (1998)

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