"Study of Electron Velocity Overshoot in NMOS Inversion Layers."

Wei-Kai Shih et al. (1998)

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DOI: 10.1155/1998/65364

access: open

type: Journal Article

metadata version: 2023-05-08

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  - https://dblp.org/rec/journals/vlsi/ShihJRMT98
Wei-Kai Shih, Srinivas Jallepalli, Mahbub Rashed, Christine M. Maziar, A. F. Tasch Jr.:
Study of Electron Velocity Overshoot in NMOS Inversion Layers. VLSI Design 8(1-4): 429-435 (1998)

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