"Comparative Analysis of Open and Short Defects in Embedded SRAM Using ..."

Venkatesham Maddela et al. (2023)

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DOI: 10.1007/S11277-023-10704-W

access: closed

type: Journal Article

metadata version: 2023-10-14

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  - https://dblp.org/rec/journals/wpc/MaddelaSPS23
Venkatesham Maddela, Sanjeet Kumar Sinha, Muddapu Parvathi, Vinay Sharma:
Comparative Analysis of Open and Short Defects in Embedded SRAM Using Parasitic Extraction Method for Deep Submicron Technology. Wirel. Pers. Commun. 132(3): 2123-2141 (2023)

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