"A BIST (Built-In Self-Test) strategy for mixed-signal integrated circuits ..."

Hongzhi Li (2004)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2024-09-03

- view
  authority control:
- export record
  dblp key:
  - phd/basesearch/Li04d
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/basesearch/Li04d
Hongzhi Li:
A BIST (Built-In Self-Test) strategy for mixed-signal integrated circuits (BIST (Built-in Self-Test) Strategie für integrierte Mixed-Signal Schaltungen). University of Erlangen-Nuremberg, Germany, 2004

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.