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"Test produktionsbedingter Laufzeitfehler in hochintegrierten, digitalen ..."

Volker H.-W. Meyer (2003)

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DOI: —

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type: Book or Thesis

metadata version: 2024-03-13

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Volker H.-W. Meyer:
Test produktionsbedingter Laufzeitfehler in hochintegrierten, digitalen Schaltungen (Production test of delay faults in digital VLSI circuits). Bremen University, Germany, 2003

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