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Test.","volume":"27","number":"5","pages":"647-655","year":"2011","type":"Journal Articles","access":"closed","key":"journals/et/ZhuHWP11","doi":"10.1007/S10836-011-5238-3","ee":"https://doi.org/10.1007/s10836-011-5238-3","url":"https://dblp.org/rec/journals/et/ZhuHWP11"}, "url":"URL#4559205" }, { "@score":"1", "@id":"4559206", "info":{"authors":{"author":[{"@pid":"69/6211-1","text":"Jianfeng Zhu 0001"},{"@pid":"48/4498-1","text":"Hu He 0001"},{"@pid":"48/1853","text":"Dong Wu"},{"@pid":"68/9240","text":"Liyang Pan"}]},"title":"Erratum to: A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect.","venue":"J. Electron. Test.","volume":"27","number":"5","pages":"679","year":"2011","type":"Journal Articles","access":"open","key":"journals/et/ZhuHWP11a","doi":"10.1007/S10836-011-5249-0","ee":"https://doi.org/10.1007/s10836-011-5249-0","url":"https://dblp.org/rec/journals/et/ZhuHWP11a"}, "url":"URL#4559206" } ] } } } )