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@inproceedings{DBLP:conf/itc/Al-ArsGBR01,
author = {Zaid Al{-}Ars and
Ad J. van de Goor and
Jens Braun and
Detlev Richter},
title = {Simulation based analysis of temperature effect on the faulty behavior
of embedded DRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {783--792},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966700},
doi = {10.1109/TEST.2001.966700},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Al-ArsGBR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Albee01,
author = {Alan Albee},
title = {A practical guide to combining {ICT} {\&} boundary scan testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {487--494},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966666},
doi = {10.1109/TEST.2001.966666},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Albee01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AttarhaN01,
author = {Amir Attarha and
Mehrdad Nourani},
title = {Testing interconnects for noise and skew in gigahertz SoCs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {305--314},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966646},
doi = {10.1109/TEST.2001.966646},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AttarhaN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BaldiniBPMT01,
author = {Andrea Baldini and
Alfredo Benso and
Paolo Prinetto and
Sergio Mo and
Andrea Taddei},
title = {Towards a unified test process: from {UML} to end-of-line functional
test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {600--608},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966679},
doi = {10.1109/TEST.2001.966679},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BaldiniBPMT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarnettSN01,
author = {Thomas S. Barnett and
Adit D. Singh and
Victor P. Nelson},
title = {Estimating burn-in fall-out for redundant memory},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {340--347},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966650},
doi = {10.1109/TEST.2001.966650},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BarnettSN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarnhartBDFKKF01,
author = {Carl Barnhart and
Vanessa Brunkhorst and
Frank Distler and
Owen Farnsworth and
Brion L. Keller and
Bernd K{\"{o}}nemann and
Andrej Ferko},
title = {{OPMISR:} the foundation for compressed {ATPG} vectors},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {748--757},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966696},
doi = {10.1109/TEST.2001.966696},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BarnhartBDFKKF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BartensteinHHS01,
author = {Thomas Bartenstein and
Douglas Heaberlin and
Leendert M. Huisman and
David Sliwinski},
title = {Diagnosing combinational logic designs using the single location at-a-time
{(SLAT)} paradigm},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {287--296},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966644},
doi = {10.1109/TEST.2001.966644},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BartensteinHHS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BennerB01,
author = {Scott Benner and
Oluseyi Boroffice},
title = {Optimal production test times through adaptive test programming},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {908--915},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966714},
doi = {10.1109/TEST.2001.966714},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BennerB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BradenLS01,
author = {John Braden and
Qing Lin and
Brian Smith},
title = {Use of {BIST} in Sun Fire\({}^{\mbox{TM}}\) servers},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1017--1022},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966727},
doi = {10.1109/TEST.2001.966727},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BradenLS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChanR01,
author = {Antonio H. Chan and
Gordon W. Roberts},
title = {A synthesizable, fast and high-resolution timing measurement device
using a component-invariant vernier delay line},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {858--867},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966708},
doi = {10.1109/TEST.2001.966708},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChanR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenKWSRM01,
author = {John T. Chen and
Jitendra Khare and
Ken Walker and
Saghir A. Shaikh and
Janusz Rajski and
Wojciech Maly},
title = {Test response compression and bitmap encoding for embedded memories
in manufacturing process monitoring},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {258--267},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966641},
doi = {10.1109/TEST.2001.966641},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenKWSRM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenMGB01,
author = {Liang{-}Chi Chen and
T. M. Mak and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Crosstalk test generation on pseudo industrial circuits: a case study},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {548--557},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966673},
doi = {10.1109/TEST.2001.966673},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenMGB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Cheng01,
author = {John Cheng},
title = {When zero picoseconds edge placement accuracy is not enough},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1134--1142},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966740},
doi = {10.1109/TEST.2001.966740},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Cheng01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CherubalC01,
author = {Sasikumar Cherubal and
Abhijit Chatterjee},
title = {A high-resolution jitter measurement technique using {ADC} sampling},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {838--847},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966706},
doi = {10.1109/TEST.2001.966706},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CherubalC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiusanoDPB01,
author = {Silvia Chiusano and
Giorgio Di Natale and
Paolo Prinetto and
Franco Bigongiari},
title = {{GRAAL:} a tool for highly dependable SRAMs generation},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {250--257},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966640},
doi = {10.1109/TEST.2001.966640},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiusanoDPB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChungB01,
author = {Sung Soo Chung and
Sanghyeon Baeg},
title = {{AC-JTAG:} empowering {JTAG} beyond testing {DC} nets},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {30--37},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966615},
doi = {10.1109/TEST.2001.966615},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChungB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Cullen01,
author = {Jamie Cullen},
title = {Scan test sequencing hardware for structural test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {713--720},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966692},
doi = {10.1109/TEST.2001.966692},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Cullen01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschCMM01,
author = {W. Robert Daasch and
Kevin Cota and
James McNames and
Robert Madge},
title = {Neighbor selection for variance reduction in I{\_}DDQ and other parametric
data},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {92--100},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966622},
doi = {10.1109/TEST.2001.966622},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DaaschCMM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DajeeGTKW01,
author = {G. Dajee and
Norman Goldblatt and
Ted R. Lundquist and
Steven Kasapi and
Keneth R. Wilsher},
title = {Practical, non-invasive optical probing for flip-chip devices},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {433--442},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966660},
doi = {10.1109/TEST.2001.966660},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DajeeGTKW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DikicFD01,
author = {Snezana Dikic and
Lars{-}Johan Fritz and
Dario Dell'Aquia},
title = {{BIST} and fault insertion re-use in telecom systems},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1011--1016},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966726},
doi = {10.1109/TEST.2001.966726},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DikicFD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DorschW01,
author = {Rainer Dorsch and
Hans{-}Joachim Wunderlich},
title = {Tailoring {ATPG} for embedded testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {530--537},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966671},
doi = {10.1109/TEST.2001.966671},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DorschW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EklowSSV01,
author = {William Eklow and
Richard M. Sedmak and
Dan Singletary and
Toai Vo},
title = {Unsafe board states during PC-based boundary-scan testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {615--623},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966681},
doi = {10.1109/TEST.2001.966681},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EklowSSV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FerrarioWD01,
author = {John Ferrario and
Randy Wolf and
Hanyi Ding},
title = {Moving from mixed signal to {RF} test hardware development},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {948--956},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966719},
doi = {10.1109/TEST.2001.966719},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FerrarioWD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FinFP01,
author = {Alessandro Fin and
Franco Fummi and
Graziano Pravadelli},
title = {{AMLETO:} a multi-language environment for functional test generation},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {821--829},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966704},
doi = {10.1109/TEST.2001.966704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FinFP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GallagherCGP01,
author = {Patrick R. Gallagher Jr. and
Vivek Chickermane and
Steven Gregor and
Thomas S. Pierre},
title = {A building block {BIST} methodology for {SOC} designs: a case study},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {111--120},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966624},
doi = {10.1109/TEST.2001.966624},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GallagherCGP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoncalvesSTT01,
author = {Fernando M. Gon{\c{c}}alves and
Marcelino B. Santos and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Implicit functionality and multiple branch coverage {(IFMB):} a testability
metric for RT-level},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {377--385},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966654},
doi = {10.1109/TEST.2001.966654},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoncalvesSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuCTTR01,
author = {Xinli Gu and
Sung Soo Chung and
Frank Tsang and
Jan Arild Tofte and
Hamid Rahmanian},
title = {An effort-minimized logic {BIST} implementation method},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1002--1010},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966725},
doi = {10.1109/TEST.2001.966725},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuCTTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuoV01,
author = {Ruifeng Guo and
Srikanth Venkataraman},
title = {A technique for fault diagnosis of defects in scan chains},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {268--277},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966642},
doi = {10.1109/TEST.2001.966642},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuoV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HafedAR01,
author = {Mohamed M. Hafed and
Nazmy Abaskharoun and
Gordon W. Roberts},
title = {A stand-alone integrated test core for time and frequency domain measurements},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1190--1199},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966743},
doi = {10.1109/TEST.2001.966743},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HafedAR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HarrisMT01,
author = {Ian G. Harris and
Premachandran R. Menon and
Russell Tessier},
title = {BIST-based delay path testing in {FPGA} architectures},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {932--938},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966717},
doi = {10.1109/TEST.2001.966717},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HarrisMT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HarrisonCNH01,
author = {Stephen Harrison and
Peter Collins and
Greg Noeninckx and
Peter Horwood},
title = {Hierarchical boundary-scan: a Scan Chip-Set solution},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {480--486},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966665},
doi = {10.1109/TEST.2001.966665},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HarrisonCNH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Helmreich01,
author = {Klaus Helmreich},
title = {Test path simulation and characterisation},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {415--423},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966658},
doi = {10.1109/TEST.2001.966658},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Helmreich01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsiaoHYC01,
author = {Ming{-}Jun Hsiao and
Jing{-}Reng Huang and
Shao{-}Shen Yang and
Tsin{-}Yuan Chang},
title = {A built-in timing parametric measurement unit},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {315--322},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966647},
doi = {10.1109/TEST.2001.966647},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsiaoHYC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsuBP01,
author = {Frank F. Hsu and
Kenneth M. Butler and
Janak H. Patel},
title = {A case study on the implementation of the Illinois Scan Architecture},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {538--547},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966672},
doi = {10.1109/TEST.2001.966672},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsuBP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangL01,
author = {Tsung{-}Chu Huang and
Kuen{-}Jong Lee},
title = {A token scan architecture for low power testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {660--669},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966686},
doi = {10.1109/TEST.2001.966686},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangTMSDCR01,
author = {Yu Huang and
Chien{-}Chung Tsai and
Nilanjan Mukherjee and
Omer Samman and
Dan Devries and
Wu{-}Tung Cheng and
Sudhakar M. Reddy},
title = {On {RTL} scan design},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {728--737},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966694},
doi = {10.1109/TEST.2001.966694},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangTMSDCR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IyengarCM01,
author = {Vikram Iyengar and
Krishnendu Chakrabarty and
Erik Jan Marinissen},
title = {Test wrapper and test access mechanism co-optimization for system-on-chip},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1023--1032},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966728},
doi = {10.1109/TEST.2001.966728},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IyengarCM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JainC01,
author = {Sunil K. Jain and
Greg P. Chema},
title = {Testing beyond {EPA:} {TDF} methodology solutions matrix},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {424--432},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966659},
doi = {10.1109/TEST.2001.966659},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JainC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JakobsenDPABNLB01,
author = {Peter Jakobsen and
Jeffrey H. Dreibelbis and
Gary Pomichter and
Darren Anand and
John Barth and
Michael R. Nelms and
Jeffrey Leach and
George M. Belansek},
title = {Embedded {DRAM} built in self test and methodology for test insertion},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {975--984},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966722},
doi = {10.1109/TEST.2001.966722},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JakobsenDPABNLB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JongBGW01,
author = {Frans G. M. de Jong and
Alex S. Biewenga and
D. C. L. (Erik) van Geest and
T. F. Waayers},
title = {Testing and programming flash memories on assemblies during high volume
production},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {470--479},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966664},
doi = {10.1109/TEST.2001.966664},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JongBGW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JosephsonPG01,
author = {Don Douglas Josephson and
Steve Poehhnan and
Vincent Govan},
title = {Debug methodology for the McKinley processor},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {451--460},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966662},
doi = {10.1109/TEST.2001.966662},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JosephsonPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JosephsonPGM01,
author = {Don Douglas Josephson and
Steve Poehlman and
Vincent Govan and
Clint Mumford},
title = {Test methodology for the McKinley processor},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {578--585},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966676},
doi = {10.1109/TEST.2001.966676},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JosephsonPGM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurLTKRK01,
author = {Rohit Kapur and
Maurice Lousberg and
Tony Taylor and
Brion L. Keller and
Paul Reuter and
Douglas Kay},
title = {{CTL} the language for describing core-based test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {131--139},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966626},
doi = {10.1109/TEST.2001.966626},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurLTKRK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapurW01,
author = {Rohit Kapur and
Thomas W. Williams},
title = {Tester retargetable patterns},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {721--727},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966693},
doi = {10.1109/TEST.2001.966693},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KapurW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerZBKP01,
author = {David C. Keezer and
Q. Zhou and
C. Bair and
J. Kuan and
B. Poole},
title = {Terabit-per-second automated digital testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1143--1151},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966741},
doi = {10.1109/TEST.2001.966741},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerZBKP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KellerTST01,
author = {Keith J. Keller and
Hiroshi Takahashi and
Kewal K. Saluja and
Yuzo Takamatsu},
title = {On reducing the target fault list of crosstalk-induced delay faults
in synchronous sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {568--577},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966675},
doi = {10.1109/TEST.2001.966675},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KellerTST01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KesslerKLSSW01,
author = {Michael Kessler and
Gundolf Kiefer and
Jens Leenstra and
Knut Sch{\"{u}}nemann and
Thomas Schwarz and
Hans{-}Joachim Wunderlich},
title = {Using a hierarchical DfT methodology in high frequency processor designs
for improved delay fault testability},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {461--469},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966663},
doi = {10.1109/TEST.2001.966663},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KesslerKLSSW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhalilW01,
author = {Mohammad Athar Khalil and
Chin{-}Long Wey},
title = {Extreme-voltage stress vector generation of analog {CMOS} ICs for
gate-oxide reliability enhancement},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {348--357},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966651},
doi = {10.1109/TEST.2001.966651},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhalilW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhocheKAWTR01,
author = {Ajay Khoche and
Rohit Kapur and
David Armstrong and
Thomas W. Williams and
Mick Tegethoff and
Jochen Rivoir},
title = {A new methodology for improved tester utilization},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {916--923},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966715},
doi = {10.1109/TEST.2001.966715},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhocheKAWTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimAS01,
author = {Yong Chang Kim and
Vishwani D. Agrawal and
Kewal K. Saluja},
title = {Combinational test generation for various classes of acyclic sequential
circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1078--1087},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966734},
doi = {10.1109/TEST.2001.966734},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimAS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimJCVFC01,
author = {Kee Sup Kim and
Rathish Jayabharathi and
Craig Carstens and
Praveen Vishakantaiah and
Derek Feltham and
Adrian Carbine},
title = {{DPDAT:} data path direct access testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {188--195},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966633},
doi = {10.1109/TEST.2001.966633},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimJCVFC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimLK01,
author = {Hong{-}Sik Kim and
Jin{-}kyue Lee and
Sungho Kang},
title = {A new multiple weight set calculation algorithm},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {878--884},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966710},
doi = {10.1109/TEST.2001.966710},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimLK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimLPR01,
author = {Young Kim and
Benny Lai and
Kenneth P. Parker and
Jeff Rearick},
title = {Frequency detection-based boundary-scan testing of {AC} coupled nets},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {46--53},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966617},
doi = {10.1109/TEST.2001.966617},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimLPR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimS01,
author = {Seongwon Kim and
Mani Soma},
title = {Test evaluation and data on defect-oriented {BIST} architecture for
high-speed {PLL}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {830--837},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966705},
doi = {10.1109/TEST.2001.966705},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimWC01,
author = {Hoki Kim and
D. M. H. Walker and
David Colby},
title = {A practical built-in current sensor for I{\_}DDQ testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {405--414},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966657},
doi = {10.1109/TEST.2001.966657},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimWC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrishnaJT01,
author = {C. V. Krishna and
Abhijit Jas and
Nur A. Touba},
title = {Test vector encoding using partial {LFSR} reseeding},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {885--893},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966711},
doi = {10.1109/TEST.2001.966711},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrishnaJT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrishnaswamyMV01,
author = {Venkatram Krishnaswamy and
A. B. Ma and
Praveen Vishakantaiah},
title = {A study of bridging defect probabilities on a Pentium {(TM)} 4 {CPU}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {688--695},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966689},
doi = {10.1109/TEST.2001.966689},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrishnaswamyMV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrsticLJC01,
author = {Angela Krstic and
Jing{-}Jia Liou and
Yi{-}Min Jiang and
Kwang{-}Ting Cheng},
title = {Delay testing considering crosstalk-induced effects},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {558--567},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966674},
doi = {10.1109/TEST.2001.966674},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrsticLJC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrusemanVK01,
author = {Bram Kruseman and
Rudger van Veen and
Kees van Kaam},
title = {The future of delta I{\_}DDQ testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {101--110},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966623},
doi = {10.1109/TEST.2001.966623},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrusemanVK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuskoRKH01,
author = {Mary P. Kusko and
Bryan J. Robbins and
Timothy J. Koprowski and
William V. Huott},
title = {99{\%} {AC} test coverage using only {LBIST} on the 1 GHz {IBM} {S/390}
zSeries 900 Microprocessor},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {586--592},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966677},
doi = {10.1109/TEST.2001.966677},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuskoRKH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaquaiC01,
author = {Bernd Laquai and
Yi Cai},
title = {Testing gigabit multilane SerDes interfaces with passive jitter injection
filters},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {297--304},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966645},
doi = {10.1109/TEST.2001.966645},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaquaiC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LavoL01,
author = {David B. Lavo and
Tracy Larrabee},
title = {Making cause-effect cost effective: low-resolution fault dictionaries},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {278--286},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966643},
doi = {10.1109/TEST.2001.966643},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LavoL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiCHW01,
author = {Jin{-}Fu Li and
Kuo{-}Liang Cheng and
Chih{-}Tsun Huang and
Cheng{-}Wen Wu},
title = {March-based {RAM} diagnosis algorithms for stuck-at and coupling faults},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {758--767},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966697},
doi = {10.1109/TEST.2001.966697},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiCHW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangHW01,
author = {Huaguo Liang and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Two-dimensional test data compression for scan-based deterministic
{BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {894--902},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966712},
doi = {10.1109/TEST.2001.966712},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangHW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinRPR01,
author = {Xijiang Lin and
Janusz Rajski and
Irith Pomeranz and
Sudhakar M. Reddy},
title = {On static test compaction and test pattern ordering for scan designs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1088--1097},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966735},
doi = {10.1109/TEST.2001.966735},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinRPR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalinoskiW01,
author = {Mark Malinoski and
Burnell G. West},
title = {Rapid-response temperature control provides new defect screening opportunities},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {903--907},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966713},
doi = {10.1109/TEST.2001.966713},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalinoskiW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Max01,
author = {Solomon Max},
title = {Ramp testing of {ADC} transition levels using finite resolution ramps},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {495--501},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966667},
doi = {10.1109/TEST.2001.966667},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Max01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McConnellRND01,
author = {Roderick McConnell and
Rochit Rajsuman and
Eric A. Nelson and
Jeffrey H. Dreibelbis},
title = {Test and repair of large embedded DRAMs. {I}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {163--172},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966630},
doi = {10.1109/TEST.2001.966630},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McConnellRND01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MetraPR01,
author = {Cecilia Metra and
Andrea Pagano and
Bruno Ricc{\`{o}}},
title = {On-line testing of transient and crosstalk faults affecting interconnections
of FPGA-implemented systems},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {939--947},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966718},
doi = {10.1109/TEST.2001.966718},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MetraPR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MillerR01,
author = {Russell B. Miller and
Walter C. Riordan},
title = {Unit level predicted yield: a method of identifying high defect density
die at wafer sort},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1118--1127},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966738},
doi = {10.1109/TEST.2001.966738},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MillerR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoranTGPV01,
author = {Andrew Moran and
Jim Teisher and
Andrew Gill and
Emir Pasalic and
John Veneruso},
title = {Automated translation of legacy code for {ATE}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {148--156},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966628},
doi = {10.1109/TEST.2001.966628},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoranTGPV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NaguraMSFFOKOTDAKT01,
author = {Yoshihiro Nagura and
Michael Mullins and
Anthony Sauvageau and
Yoshinoro Fujiwara and
Katsuya Furue and
Ryuji Ohmura and
Tatsunori Komoike and
Takenori Okitaka and
Tetsushi Tanizaki and
Katsumi Dosaka and
Kazutami Arimoto and
Yukiyoshi Koda and
Tetsuo Tada},
title = {Test cost reduction by at-speed {BISR} for embedded DRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {182--187},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966632},
doi = {10.1109/TEST.2001.966632},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NaguraMSFFOKOTDAKT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NamCL01,
author = {Hui S. Nam and
Bernard Cuddy and
Dieter Luecking},
title = {A phase noise spectrum test solution for high volume mixed signal/wireless
automatic test equipments},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {957--964},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966720},
doi = {10.1109/TEST.2001.966720},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NamCL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Natarajan01,
author = {Udaya Natarajan},
title = {Test challenges for {SONET/SDH} physical layer {OC3} devices and beyond},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {502--511},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966668},
doi = {10.1109/TEST.2001.966668},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Natarajan01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NatarajanGB01,
author = {Suriyaprakash Natarajan and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Switch-level delay test of domino logic circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {367--376},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966653},
doi = {10.1109/TEST.2001.966653},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NatarajanGB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NativMUZ01,
author = {Gilly Nativ and
Steven Mittermaier and
Shmuel Ur and
Avi Ziv},
title = {Cost evaluation of coverage directed test generation for the {IBM}
mainframe},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {793--802},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966701},
doi = {10.1109/TEST.2001.966701},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NativMUZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NelsonDM01,
author = {Eric A. Nelson and
Jeffrey H. Dreibelbis and
Roderick McConnell},
title = {Test and repair of large embedded DRAMs. 2},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {173--181},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966631},
doi = {10.1109/TEST.2001.966631},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NelsonDM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NicoliciA01,
author = {Nicola Nicolici and
Bashir M. Al{-}Hashimi},
title = {Tackling test trade-offs for {BIST} {RTL} data paths: {BIST} area
overhead, test application time and power dissipation},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {72--81},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966620},
doi = {10.1109/TEST.2001.966620},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NicoliciA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OlgaardOO01,
author = {Christian Olgaard and
Sule Ozev and
Alex Orailoglu},
title = {Testability implications in low-cost integrated radio transceivers:
a Bluetooth case study},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {965--974},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966721},
doi = {10.1109/TEST.2001.966721},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OlgaardOO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OshimaPN01,
author = {Atsushi Oshima and
John Poniatowski and
Toshihiro Nomura},
title = {Pin electronics {IC} for high speed differential devices},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1128--1133},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966739},
doi = {10.1109/TEST.2001.966739},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OshimaPN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PadmanabanMT01,
author = {Saravanan Padmanaban and
Maria K. Michael and
Spyros Tragoudas},
title = {Exact path delay grading with fundamental {BDD} operations},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {642--651},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966684},
doi = {10.1109/TEST.2001.966684},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PadmanabanMT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PatelMP01,
author = {Chintan Patel and
Fidel Muradali and
James F. Plusquellic},
title = {Power supply transient signal integration circuit},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {704--712},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966691},
doi = {10.1109/TEST.2001.966691},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PatelMP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PetersonJ01,
author = {Eric Peterson and
Wanli Jiang},
title = {Practical application of energy consumption ratio test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {386--394},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966655},
doi = {10.1109/TEST.2001.966655},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PetersonJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PiloABNR01,
author = {Harold Pilo and
R. Dean Adams and
Robert E. Busch and
Eric A. Nelson and
Geoerge E. Rudgers},
title = {Bitline contacts in high density SRAMs: design for testability and
stressability},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {776--782},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966699},
doi = {10.1109/TEST.2001.966699},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PiloABNR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PomeranzR01,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {A method to enhance the fault coverage obtained by output response
comparison of identical circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {196--203},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966634},
doi = {10.1109/TEST.2001.966634},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PomeranzR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PomeranzR01a,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {On improving the stuck-at fault coverage of functional test sequences
by using limited-scan operations},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {211--220},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966636},
doi = {10.1109/TEST.2001.966636},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PomeranzR01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RaviJ01,
author = {Srivaths Ravi and
Niraj K. Jha},
title = {Fast test generation for circuits with {RTL} and gate-level views},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1068--1077},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966733},
doi = {10.1109/TEST.2001.966733},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RaviJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rearick01,
author = {Jeff Rearick},
title = {Too much delay fault coverage is a bad thing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {624--633},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966682},
doi = {10.1109/TEST.2001.966682},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rearick01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RenovellFPFZ01,
author = {Michel Renovell and
Penelope Faure and
Jean{-}Michel Portal and
Joan Figueras and
Yervant Zorian},
title = {{IS-FPGA} : a new symmetric {FPGA} architecture with implicit scan},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {924--931},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966716},
doi = {10.1109/TEST.2001.966716},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RenovellFPFZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RenovellGABB01,
author = {Michel Renovell and
Jean Marc Galli{\`{e}}re and
Florence Aza{\"{\i}}s and
Serge Bernard and
Yves Bertrand},
title = {Boolean and current detection of {MOS} transistor with gate oxide
short},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1039--1048},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966730},
doi = {10.1109/TEST.2001.966730},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RenovellGABB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SabadeW01,
author = {Sagar S. Sabade and
D. M. H. Walker},
title = {Improved wafer-level spatial analysis for I{\_}DDQ limit setting},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {82--91},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966621},
doi = {10.1109/TEST.2001.966621},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SabadeW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoKIYH01,
author = {Yasuo Sato and
Masaki Kohno and
Toshio Ikeda and
Iwao Yamazaki and
Masato Hamamoto},
title = {An evaluation of defect-oriented test: WELL-controlled low voltage
test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1059--1067},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966732},
doi = {10.1109/TEST.2001.966732},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoKIYH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaxenaBW01,
author = {Jayashree Saxena and
Kenneth M. Butler and
Lee Whetsel},
title = {An analysis of power reduction techniques in scan testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {670--677},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966687},
doi = {10.1109/TEST.2001.966687},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaxenaBW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchoberPP01,
author = {Volker Sch{\"{o}}ber and
Steffen Paul and
Olivier Picot},
title = {Memory built-in self-repair using redundant words},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {995--1001},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966724},
doi = {10.1109/TEST.2001.966724},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchoberPP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaP01,
author = {Manish Sharma and
Janak H. Patel},
title = {Testing of critical paths for delay faults},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {634--641},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966683},
doi = {10.1109/TEST.2001.966683},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shimanouchi01,
author = {Masashi Shimanouchi},
title = {An approach to consistent jitter modeling for various jitter aspects
and measurement methods},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {848--857},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966707},
doi = {10.1109/TEST.2001.966707},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Shimanouchi01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShinYRA01,
author = {Jongshin Shin and
Xiaoming Yu and
Elizabeth M. Rudnick and
Miron Abramovici},
title = {At-speed logic {BIST} using a frozen clock testing strategy},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {64--71},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966619},
doi = {10.1109/TEST.2001.966619},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShinYRA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinanogluO01,
author = {Ozgur Sinanoglu and
Alex Orailoglu},
title = {Space and time compaction schemes for embedded cores},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {521--529},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966670},
doi = {10.1109/TEST.2001.966670},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinanogluO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinghPLPG01,
author = {Abhishek Singh and
Chintan Patel and
Shirong Liao and
James F. Plusquellic and
Anne E. Gattiker},
title = {Detecting delay faults using power supply transient signal analysis},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {395--404},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966656},
doi = {10.1109/TEST.2001.966656},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinghPLPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sivaram01,
author = {A. T. Sivaram},
title = {Split timing mode (STM)-answer to dual frequency domain testing},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {140--147},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966627},
doi = {10.1109/TEST.2001.966627},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sivaram01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SridharH01,
author = {Nandini Sridhar and
Michael S. Hsiao},
title = {On efficient error diagnosis of digital circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {678--687},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966688},
doi = {10.1109/TEST.2001.966688},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SridharH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StanojevicW01,
author = {Zoran Stanojevic and
D. M. H. Walker},
title = {FedEx - a fast bridging fault extractor},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {696--703},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966690},
doi = {10.1109/TEST.2001.966690},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StanojevicW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StevensonJV01,
author = {R. L. Stevenson and
M. E. Jarosz and
C. V. Verver},
title = {Remote access to engineering test-a case study in providing engineering/diagnostic
{IC} test services to Canadian universities},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {157--162},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966629},
doi = {10.1109/TEST.2001.966629},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StevensonJV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuT01,
author = {Chauchin Su and
Wenliang Tseng},
title = {Configuration free SoC interconnect {BIST} methodology},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1033--1038},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966729},
doi = {10.1109/TEST.2001.966729},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterFWM01,
author = {Stephen K. Sunter and
Ken Filliter and
Joe Woo and
Pat McHugh},
title = {A general purpose 1149.4 {IC} with {HF} analog test capabilities},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {38--45},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966616},
doi = {10.1109/TEST.2001.966616},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterFWM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterMD01,
author = {Stephen K. Sunter and
Charles McDonald and
Givargis Danialy},
title = {Contactless digital testing of {IC} pin leakage currents},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {204--210},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966635},
doi = {10.1109/TEST.2001.966635},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterMD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TambaSMK01,
author = {Mamoru Tamba and
Atsushi Shimizu and
Hideharu Munakata and
Takanori Komuro},
title = {A method to improve {SFDR} with random interleaved sampling method},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {512--520},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966669},
doi = {10.1109/TEST.2001.966669},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TambaSMK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TappeE01,
author = {Robert Tappe and
Dietmar Ehrhardt},
title = {Dynamic tests in complex systems [automotive electronics]},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {609--614},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966680},
doi = {10.1109/TEST.2001.966680},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TappeE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thaller01,
author = {Karl Thaller},
title = {A highly-efficient transparent online memory test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {230--239},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966638},
doi = {10.1109/TEST.2001.966638},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thaller01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThiagarajanTrichySRS01,
author = {Thiagarajan Trichy and
Peter Sandborn and
Ravi Raghavan and
Shubhada Sahasrabudhe},
title = {A new test/diagnosis/rework model for use in technical cost modeling
of electronic systems assembly},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1108--1117},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966737},
doi = {10.1109/TEST.2001.966737},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThiagarajanTrichySRS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsengLPM01,
author = {Chao{-}Wen Tseng and
Chien{-}Mo James Li and
Mike Purtell and
Edward J. McCluskey},
title = {Testing for resistive opens and stuck opens},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1049--1058},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966731},
doi = {10.1109/TEST.2001.966731},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsengLPM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsengM01,
author = {Chao{-}Wen Tseng and
Edward J. McCluskey},
title = {Multiple-output propagation transition fault test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {358--366},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966652},
doi = {10.1109/TEST.2001.966652},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsengM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TuminVPN01,
author = {Ken Tumin and
Carmen Vargas and
Ross Patterson and
Chris Nappi},
title = {Scan vs. functional testing - a comparative effectiveness study on
Motorola's MMC2107\({}^{\mbox{TM}}\)},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {443--450},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966661},
doi = {10.1109/TEST.2001.966661},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TuminVPN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Vandling01,
author = {Gilbert Vandling},
title = {Modeling and testing the Gekko microprocessor, an {IBM} PowerPC derivative
for Nintendo},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {593--599},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966678},
doi = {10.1109/TEST.2001.966678},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Vandling01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VenkataratnamN01,
author = {Aranggan Venkataratnam and
Kimberly E. Newman},
title = {Rapid prototyping of time-based {PDIT} for substrate networks {[MCM]}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {332--339},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966649},
doi = {10.1109/TEST.2001.966649},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VenkataratnamN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VermeulenOB01,
author = {Bart Vermeulen and
Steven Oostdijk and
Frank Bouwman},
title = {Test and debug strategy of the {PNX8525} Nexperia\({}^{\mbox{TM}}\)
digital video platform system chip},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {121--130},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966625},
doi = {10.1109/TEST.2001.966625},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VermeulenOB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VolkerinkKKRK01,
author = {Erik H. Volkerink and
Ajay Khoche and
Linda A. Kamas and
Jochen Rivoir and
Hans G. Kerkhoff},
title = {Tackling test trade-offs from design, manufacturing to market using
economic modeling},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {1098--1107},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966736},
doi = {10.1109/TEST.2001.966736},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VolkerinkKKRK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VollrathR01,
author = {J{\"{o}}rg E. Vollrath and
Randall Rooney},
title = {Pseudo fail bit map generation for RAMs during component test and
burn-in in a manufacturing environment},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {768--775},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966698},
doi = {10.1109/TEST.2001.966698},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VollrathR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VrankenWFL01,
author = {Harald P. E. Vranken and
Tom Waayers and
H{\'{e}}rv{\'{e}} Fleury and
David Lelouvier},
title = {Enhanced reduced pin-count test for full-scan design},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {738--747},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966695},
doi = {10.1109/TEST.2001.966695},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VrankenWFL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wang01,
author = {Seongrnoon Wang},
title = {Low hardware overhead scan based 3-weight weighted random {BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {868--877},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966709},
doi = {10.1109/TEST.2001.966709},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wang01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWW01,
author = {Peter Wohl and
John A. Waicukauski and
Thomas W. Williams},
title = {Design of compactors for signature-analyzers in built-in self-test},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {54--63},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966618},
doi = {10.1109/TEST.2001.966618},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuC01,
author = {Yuejian Wu and
Liviu Calin},
title = {Shadow write and read for at-speed {BIST} of {TDM} SRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {985--994},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966723},
doi = {10.1109/TEST.2001.966723},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuK01,
author = {Kaijie Wu and
Ramesh Karri},
title = {Algorithm level recomputing with allocation diversity: a register
transfer level time redundancy based concurrent error detection technique},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {221--229},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966637},
doi = {10.1109/TEST.2001.966637},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuSC01,
author = {Lei Xu and
Yihe Sun and
Hongyi Chen},
title = {Scan array solution for testing power and testing time},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {652--659},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966685},
doi = {10.1109/TEST.2001.966685},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuSC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiSNHRI01,
author = {Takahiro J. Yamaguchi and
Mani Soma and
Jim Nissen and
David Halter and
Rajesh Raina and
Masahiro Ishida},
title = {Testing clock distribution circuits using an analytic signal method},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {323--331},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966648},
doi = {10.1109/TEST.2001.966648},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiSNHRI01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuM01,
author = {Shu{-}Yi Yu and
Edward J. McCluskey},
title = {On-line testing and recovery in {TMR} systems for real-time applications},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {240--249},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966639},
doi = {10.1109/TEST.2001.966639},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangH01,
author = {Qiushuang Zhang and
Ian G. Harris},
title = {A validation fault model for timing-induced functional errors},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {813--820},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966703},
doi = {10.1109/TEST.2001.966703},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZilicR01,
author = {Zeljko Zilic and
Katarzyna Radecka},
title = {: Identifying redundant gate replacements in verification by error
modeling},
booktitle = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
pages = {803--812},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/TEST.2001.966702},
doi = {10.1109/TEST.2001.966702},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZilicR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2001,
title = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
MD, USA, 30 October - 1 November 2001},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://ieeexplore.ieee.org/xpl/conhome/7640/proceeding},
isbn = {0-7803-7169-0},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2001.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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