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export results for "toc:db/conf/latw/lats2021.bht:"
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@inproceedings{DBLP:conf/latw/Aponte-MorenoRP21,
author = {Alexander Aponte{-}Moreno and
Felipe Restrepo{-}Calle and
Cesar Augusto Pedraza},
title = {Reliability Evaluation of {RISC-V} and {ARM} Microprocessors Through
a New Fault Injection Tool},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651874},
doi = {10.1109/LATS53581.2021.9651874},
timestamp = {Mon, 13 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/Aponte-MorenoRP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/AzizaCR21,
author = {Hassen Aziza and
Karine Couli{\'{e}} and
Wenceslas Rahajandraibe},
title = {Design Considerations Towards Zero-Variability Resistive RAMs in {HRS}
State},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651758},
doi = {10.1109/LATS53581.2021.9651758},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/AzizaCR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BadawiABCKL21,
author = {Hassan El Badawi and
Florence Aza{\"{\i}}s and
Serge Bernard and
Mariane Comte and
Vincent Kerz{\`{e}}rho and
Fran{\c{c}}ois Lef{\`{e}}vre},
title = {Exploring on-line {RF} performance monitoring based on the indirect
test strategy},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651743},
doi = {10.1109/LATS53581.2021.9651743},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/BadawiABCKL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BalenGOSAMAGMB21,
author = {Tiago R. Balen and
Carlos J. Gonz{\'{a}}lez and
Ingrid F. V. Oliveira and
Rafael B. Schvittz and
Nemitala Added and
Eduardo L. A. Macchione and
Vitor A. P. de Aguiar and
Marcilei Aparecida Guazzelli and
Nilberto H. Medina and
Paulo F. Butzen},
title = {Reliability Evaluation of Voters for Fault Tolerant Approximate Systems},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651736},
doi = {10.1109/LATS53581.2021.9651736},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/BalenGOSAMAGMB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BernalJA21,
author = {Carlos Bernal and
Manuel Jim{\'{e}}nez and
Fabio Andrade},
title = {{TLP} Generator Setup for Reliable Switching Characterization of Commercial
GaN HEMTs},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--3},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651859},
doi = {10.1109/LATS53581.2021.9651859},
timestamp = {Tue, 29 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/BernalJA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BrumFCJHVB21,
author = {E. Brum and
Moritz Fieback and
Thiago Santos Copetti and
H. Jiayi and
Said Hamdioui and
Fabian Vargas and
Let{\'{\i}}cia Maria Veiras Bolzani},
title = {Evaluating the Impact of Process Variation on RRAMs},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651789},
doi = {10.1109/LATS53581.2021.9651789},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/BrumFCJHVB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/BrumSLTFVB21,
author = {Jo{\~{a}}o Paulo Brum and
T. Kraemer Sartori and
J. Lin and
Matheus Garay Trindade and
H. Fourati and
Raoul Velazco and
Rodrigo Possamai Bastos},
title = {Evaluation of Attitude Estimation Algorithm under Soft Error Effects},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651794},
doi = {10.1109/LATS53581.2021.9651794},
timestamp = {Mon, 16 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/BrumSLTFVB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CarbonettoGSIRF21,
author = {Sebastian Carbonetto and
Luciano Genovese and
Lucas Sambuco Salomone and
Mariano Garcia Inza and
Eduardo Gabriel Redin and
Adri{\'{a}}n Faig{\'{o}}n},
title = {Total Ionizing Dose Effects on Floating Gate Structures. Preliminary
Results},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651839},
doi = {10.1109/LATS53581.2021.9651839},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/CarbonettoGSIRF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/CoulieAR21,
author = {Karine Couli{\'{e}} and
Hassen Aziza and
Wenceslas Rahajandraibe},
title = {Investigation of Single Event Effects in a Resistive {RAM} memory
array by {SPICE} level simulation},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651871},
doi = {10.1109/LATS53581.2021.9651871},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/CoulieAR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/FaberoKFMLC21,
author = {Juan Carlos Fabero and
Golnaz Korkian and
Francisco J. Franco and
Hortensia Mecha and
Manon Letiche and
Juan Antonio Clemente},
title = {Thermal Neutron-induced SEUs on a {COTS} 28-nm SRAM-based {FPGA} under
Different Incident Angles},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651879},
doi = {10.1109/LATS53581.2021.9651879},
timestamp = {Fri, 15 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/FaberoKFMLC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/FallerSPB21,
author = {Tobias Faller and
Philipp Scholl and
Tobias Paxian and
Bernd Becker},
title = {Towards SAT-Based {SBST} Generation for {RISC-V} Cores},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651819},
doi = {10.1109/LATS53581.2021.9651819},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/FallerSPB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/KabinDKL21,
author = {Ievgen Kabin and
Zoya Dyka and
Dan Klann and
Peter Langendoerfer},
title = {{EC} Scalar Multiplication: Successful Simple Address-Bit {SCA} Attack
against Atomic Patterns},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651877},
doi = {10.1109/LATS53581.2021.9651877},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/KabinDKL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/LojdaPPCKK21,
author = {Jakub Lojda and
Richard Panek and
Jakub Podivinsky and
Ondrej Cekan and
Martin Krcma and
Zdenek Kot{\'{a}}sek},
title = {Testing Embedded Software Through Fault Injection: Case Study on Smart
Lock},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651770},
doi = {10.1109/LATS53581.2021.9651770},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/LojdaPPCKK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MelisSAS21,
author = {Tommaso Melis and
Emmanuel Simeu and
Etienne Auvray and
Luc Saury},
title = {Improved Fault Diagnosis of Analog Circuits using Light Emission Measures},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651868},
doi = {10.1109/LATS53581.2021.9651868},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/MelisSAS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/MirabellaGFRDMR21,
author = {Nunzio Mirabella and
Michelangelo Grosso and
Giovanna Franchino and
Salvatore Rinaudo and
Ioannis Deretzis and
Antonino La Magna and
Matteo Sonza Reorda},
title = {Comparing different solutions for testing resistive defects in low-power
SRAMs},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651760},
doi = {10.1109/LATS53581.2021.9651760},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/MirabellaGFRDMR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Najafi-HaghiW21,
author = {Zahra Paria Najafi{-}Haghi and
Hans{-}Joachim Wunderlich},
title = {Resistive Open Defect Classification of Embedded Cells under Variations},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651857},
doi = {10.1109/LATS53581.2021.9651857},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/Najafi-HaghiW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/OliveiraSRM21,
author = {Rafael N. M. Oliveira and
F{\'{a}}bio G. R. G. da Silva and
Ricardo Reis and
Cristina Meinhardt},
title = {{SET} Mitigation Techniques on Mirror Full Adder at 7 nm FinFET Technology},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651889},
doi = {10.1109/LATS53581.2021.9651889},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/OliveiraSRM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/Pagliarini21,
author = {Samuel Pagliarini},
title = {A Tutorial on Design Obfuscation: from Transistors to Systems},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--3},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651741},
doi = {10.1109/LATS53581.2021.9651741},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/Pagliarini21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/PancherVRBSV21,
author = {Fabrice Pancher and
Vanessa Vargas and
Pablo Ramos and
Rodrigo Possamai Bastos and
David C{\'{e}}sar Ardiles Saravia and
Raoul Velazco},
title = {Nanosatellite On-Board Computer including a Many-Core Processor},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651773},
doi = {10.1109/LATS53581.2021.9651773},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/PancherVRBSV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/RezaeiFFMPC21,
author = {Mohammadreza Rezaei and
Francisco J. Franco and
Juan Carlos Fabero and
Hortensia Mecha and
Helmut Puchner and
Juan Antonio Clemente},
title = {Impact of {DVS} on Power Consumption and {SEE} Sensitivity of {COTS}
Volatile SRAMs},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651751},
doi = {10.1109/LATS53581.2021.9651751},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/RezaeiFFMPC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/RodriguesKB21,
author = {Gennaro Severino Rodrigues and
Fernanda Lima Kastensmidt and
Alberto Bosio},
title = {Approximate Computing for Safety-Critical Applications},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--3},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651813},
doi = {10.1109/LATS53581.2021.9651813},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/RodriguesKB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/RuospoLBTDS21,
author = {Annachiara Ruospo and
Lucas Matana Luza and
Alberto Bosio and
Marcello Traiola and
Luigi Dilillo and
Ernesto S{\'{a}}nchez},
title = {Pros and Cons of Fault Injection Approaches for the Reliability Assessment
of Deep Neural Networks},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651807},
doi = {10.1109/LATS53581.2021.9651807},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/RuospoLBTDS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/SandovalBZKRM21,
author = {Bernardo Borges Sandoval and
Leonardo Heitich Brendler and
Alexandra L. Zimpeck and
Fernanda Lima Kastensmidt and
Ricardo Reis and
Cristina Meinhardt},
title = {Exploring Gate Mapping and Transistor Sizing to Improve Radiation
Robustness: {A} {C17} Benchmark Case-study},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651798},
doi = {10.1109/LATS53581.2021.9651798},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/latw/SandovalBZKRM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/latw/VerducciOM21,
author = {Orlando Verducci Jr. and
Duarte Lopes de Oliveira and
Robson L. Moreno},
title = {Fault-Tolerant Quasi Delay Insensitive Combinational Circuits in Commercial
{FPGA} Devices},
booktitle = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021.9651805},
doi = {10.1109/LATS53581.2021.9651805},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/VerducciOM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/latw/2021,
title = {22nd {IEEE} Latin American Test Symposium, {LATS} 2021, Punta del
Este, Uruguay, October 27-29, 2021},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/LATS53581.2021},
doi = {10.1109/LATS53581.2021},
isbn = {978-1-6654-2057-0},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/latw/2021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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