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@inproceedings{DBLP:conf/dft/AhlawatVS17,
  author       = {Satyadev Ahlawat and
                  Darshit Vaghani and
                  Virendra Singh},
  title        = {Preventing scan-based side-channel attacks through key masking},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244434},
  doi          = {10.1109/DFT.2017.8244434},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AhlawatVS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/AlrudainySMY17,
  author       = {Haider Alrudainy and
                  Rishad A. Shafik and
                  Andrey Mokhov and
                  Alex Yakovlev},
  title        = {Lifetime reliability characterization of {N/MEMS} used in power gating
                  of digital integrated circuits},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244452},
  doi          = {10.1109/DFT.2017.8244452},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AlrudainySMY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/AlvesKMF17,
  author       = {Tiago A. O. Alves and
                  Sandip Kundu and
                  Leandro A. J. Marzulo and
                  Felipe M. G. Fran{\c{c}}a},
  title        = {A resilient scheduler for dataflow execution},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244460},
  doi          = {10.1109/DFT.2017.8244460},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AlvesKMF17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/AtamanerEOR17,
  author       = {Mert Atamaner and
                  Oguz Ergin and
                  Marco Ottavi and
                  Pedro Reviriego},
  title        = {Detecting errors in instructions with bloom filters},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244458},
  doi          = {10.1109/DFT.2017.8244458},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AtamanerEOR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BaldassariBM17,
  author       = {Alessandro Baldassari and
                  Cristiana Bolchini and
                  Antonio Miele},
  title        = {A dynamic reliability management framework for heterogeneous multicore
                  systems},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244440},
  doi          = {10.1109/DFT.2017.8244440},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BaldassariBM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BoroumandPBM17,
  author       = {Sina Boroumand and
                  Hadi Parandeh{-}Afshar and
                  Philip Brisk and
                  Siamak Mohammadi},
  title        = {{CAL:} Exploring cost, accuracy, and latency in approximate and speculative
                  adder design},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244438},
  doi          = {10.1109/DFT.2017.8244438},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BoroumandPBM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BuNK17,
  author       = {Lake Bu and
                  Hien D. Nguyen and
                  Michel A. Kinsy},
  title        = {{RASSS:} {A} perfidy-aware protocol for designing trustworthy distributed
                  systems},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244432},
  doi          = {10.1109/DFT.2017.8244432},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BuNK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/CantoraSRSV17,
  author       = {R. Cantora and
                  Ernesto S{\'{a}}nchez and
                  Matteo Sonza Reorda and
                  Giovanni Squillero and
                  Emanuele Valea},
  title        = {On the optimization of {SBST} test program compaction},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244444},
  doi          = {10.1109/DFT.2017.8244444},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/CantoraSRSV17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ChapmanPLKK17,
  author       = {Glenn H. Chapman and
                  Parham Purbakht and
                  Peter Le and
                  Israel Koren and
                  Zahava Koren},
  title        = {Exploring soft errors (SEUs) with digital imager pixels ranging from
                  7 to 1.3 {\(\mu\)}m},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244457},
  doi          = {10.1109/DFT.2017.8244457},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanPLKK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/DhoriCKPKCCC17,
  author       = {Kedar Janardan Dhori and
                  Hitesh Chawla and
                  Ashish Kumar and
                  Prashant Pandey and
                  Promod Kumar and
                  Lorenzo Ciampolini and
                  Florian Cacho and
                  Damien Croain},
  title        = {High-yield design of high-density {SRAM} for low-voltage and low-leakage
                  operations},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244429},
  doi          = {10.1109/DFT.2017.8244429},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/DhoriCKPKCCC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/DhotreEDPD17,
  author       = {Harshad Dhotre and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  Mehdi Dehbashi and
                  Ulrike Pfannkuchen and
                  Rolf Drechsler},
  title        = {Machine learning based test pattern analysis for localizing critical
                  power activity areas},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244464},
  doi          = {10.1109/DFT.2017.8244464},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/DhotreEDPD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/FanSG17,
  author       = {Xin Fan and
                  Jan Stuijt and
                  Tobias Gemmeke},
  title        = {Towards {SRAM} leakage power minimization by aggressive standby voltage
                  scaling - Experiments on 40nm test chips},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244431},
  doi          = {10.1109/DFT.2017.8244431},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/FanSG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/FediOFBSAC17,
  author       = {Andrea Fedi and
                  Marco Ottavi and
                  Gianluca Furano and
                  Antimo Bruno and
                  Roberto Senesi and
                  Carla Andreani and
                  Carlo Cazzaniga},
  title        = {High-energy neutrons characterization of a safety critical computing
                  system},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244456},
  doi          = {10.1109/DFT.2017.8244456},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/FediOFBSAC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/GokulkrishnanKC17,
  author       = {Gokulkrishnan Vadakkeveedu and
                  V. Kamakoti and
                  Nitin Chandrachoodan and
                  Seetal Potluri},
  title        = {A scalable pseudo-exhaustive search for fault diagnosis in microfluidic
                  biochips},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244450},
  doi          = {10.1109/DFT.2017.8244450},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GokulkrishnanKC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/GopalakrishnanS17,
  author       = {Shoba Gopalakrishnan and
                  Virendra Singh},
  title        = {{REMORA:} {A} hybrid low-cost soft-error reliable fault tolerant architecture},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244454},
  doi          = {10.1109/DFT.2017.8244454},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GopalakrishnanS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/GutierrezTK017,
  author       = {Mauricio D. Gutierrez and
                  Vasileios Tenentes and
                  Tom J. Kazmierski and
                  Daniele Rossi},
  title        = {Low cost error monitoring for improved maintainability of IoT applications},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244445},
  doi          = {10.1109/DFT.2017.8244445},
  timestamp    = {Sun, 04 Aug 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/GutierrezTK017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/HosokawaHYA17,
  author       = {Toshinori Hosokawa and
                  Atsushi Hirai and
                  Hiroshi Yamazaki and
                  Masayuki Arai},
  title        = {A dynamic test compaction method on low power test generation based
                  on capture safe test vectors},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244463},
  doi          = {10.1109/DFT.2017.8244463},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/HosokawaHYA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/HuhnED17,
  author       = {Sebastian Huhn and
                  Stephan Eggersgl{\"{u}}{\ss} and
                  Rolf Drechsler},
  title        = {Reconfigurable {TAP} controllers with embedded compression for large
                  test data volume},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244462},
  doi          = {10.1109/DFT.2017.8244462},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/HuhnED17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/JoshiSHHB17,
  author       = {Prashant D. Joshi and
                  Arunabha Sen and
                  D. Frank Hsu and
                  Said Hamdioui and
                  Koen Bertels},
  title        = {Region based containers - {A} new paradigm for the analysis of fault
                  tolerant networks},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244442},
  doi          = {10.1109/DFT.2017.8244442},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/JoshiSHHB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/JunqiKAL17,
  author       = {H. Junqi and
                  T. Nandha Kumar and
                  Haider Abbas and
                  Fabrizio Lombardi},
  title        = {Simulation-based evaluation of frequency upscaled operation of exact/approximate
                  ripple carry adders},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244437},
  doi          = {10.1109/DFT.2017.8244437},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/JunqiKAL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/KandaHYL17,
  author       = {Michiya Kanda and
                  Masaki Hashizume and
                  Hiroyuki Yotsuyanagi and
                  Shyue{-}Kung Lu},
  title        = {A defective level monitor of open defects in 3D ICs with a comparator
                  of offset cancellation type},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244446},
  doi          = {10.1109/DFT.2017.8244446},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/KandaHYL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/LeeT17,
  author       = {Yu{-}Wei Lee and
                  Nur A. Touba},
  title        = {Improving test compression with multiple-polynomial LFSRs},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244465},
  doi          = {10.1109/DFT.2017.8244465},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/LeeT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/LiS17,
  author       = {Bing Li and
                  Ulf Schlichtmann},
  title        = {Reliability-aware synthesis and fault test of fully programmable valve
                  arrays (FPVAs)},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244449},
  doi          = {10.1109/DFT.2017.8244449},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/LiS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/LiWLH17,
  author       = {Jain{-}De Li and
                  Sying{-}Jyan Wang and
                  Katherine Shu{-}Min Li and
                  Tsung{-}Yi Ho},
  title        = {Design-for-testability for paper-based digital microfluidic biochips},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244448},
  doi          = {10.1109/DFT.2017.8244448},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/LiWLH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/MonazzahFM17,
  author       = {Amir Mahdi Hosseini Monazzah and
                  Hamed Farbeh and
                  Seyed Ghassem Miremadi},
  title        = {Investigating the effects of process variations and system workloads
                  on endurance of non-volatile caches},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244430},
  doi          = {10.1109/DFT.2017.8244430},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/MonazzahFM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/NguyenCD17,
  author       = {Nguyen T. H. Nguyen and
                  Ediz Cetin and
                  Oliver Diessel},
  title        = {Scheduling voter checks to detect configuration memory errors in FPGA-based
                  {TMR} systems},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244455},
  doi          = {10.1109/DFT.2017.8244455},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/NguyenCD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/PsarakisS17,
  author       = {Mihalis Psarakis and
                  Aitzan Sari},
  title        = {A scrubbing scheduling approach for reliable {FPGA} multicore processors
                  with real-time constraints},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244441},
  doi          = {10.1109/DFT.2017.8244441},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/PsarakisS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RestifoBLS17,
  author       = {Marco Restifo and
                  Paolo Bernardi and
                  Sergio de Luca and
                  Alessandro Sansonetti},
  title        = {On-line software-based self-test for {ECC} of embedded {RAM} memories},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244443},
  doi          = {10.1109/DFT.2017.8244443},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RestifoBLS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SandionigiAH17,
  author       = {Chiara Sandionigi and
                  Maur{\'{\i}}cio Altieri and
                  Olivier H{\'{e}}ron},
  title        = {Early estimation of aging in the design flow of integrated circuits
                  through a programmable hardware module},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244451},
  doi          = {10.1109/DFT.2017.8244451},
  timestamp    = {Thu, 27 Jul 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/SandionigiAH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SantiagoPPAMFK17,
  author       = {Leandro Santiago and
                  Vinay C. Patil and
                  Charles B. Prado and
                  Tiago A. O. Alves and
                  Leandro A. J. Marzulo and
                  Felipe M. G. Fran{\c{c}}a and
                  Sandip Kundu},
  title        = {Realizing strong {PUF} from weak {PUF} via neural computing},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244433},
  doi          = {10.1109/DFT.2017.8244433},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SantiagoPPAMFK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SchneiderPM17,
  author       = {Alexander Schneider and
                  Paul Pop and
                  Jan Madsen},
  title        = {Volume management for fault-tolerant continuous-flow microfluidics},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244447},
  doi          = {10.1109/DFT.2017.8244447},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SchneiderPM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ShafikYKM17,
  author       = {Rishad A. Shafik and
                  Qiaoyan Yu and
                  S. Saqib Khursheed and
                  Antonio Miele},
  title        = {Welcome Message},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244425},
  doi          = {10.1109/DFT.2017.8244425},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/ShafikYKM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SiddiquaSRDFLBG17,
  author       = {Taniya Siddiqua and
                  Vilas Sridharan and
                  Steven E. Raasch and
                  Nathan DeBardeleben and
                  Kurt B. Ferreira and
                  Scott Levy and
                  Elisabeth Baseman and
                  Qiang Guan},
  title        = {Lifetime memory reliability data from the field},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244428},
  doi          = {10.1109/DFT.2017.8244428},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SiddiquaSRDFLBG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Soman017,
  author       = {Jyothish Soman and
                  Timothy M. Jones},
  title        = {High performance fault tolerance through predictive instruction re-execution},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244459},
  doi          = {10.1109/DFT.2017.8244459},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Soman017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/TenentesLBMAAHD17,
  author       = {Vasileios Tenentes and
                  Charles Leech and
                  Graeme M. Bragg and
                  Geoff V. Merrett and
                  Bashir M. Al{-}Hashimi and
                  Hussam Amrouch and
                  J{\"{o}}rg Henkel and
                  Shidhartha Das},
  title        = {Hardware and software innovations in energy-efficient system-reliability
                  monitoring},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--5},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244435},
  doi          = {10.1109/DFT.2017.8244435},
  timestamp    = {Sun, 04 Aug 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/TenentesLBMAAHD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/TingH17,
  author       = {Pai{-}Shun Ting and
                  John P. Hayes},
  title        = {Eliminating a hidden error source in stochastic circuits},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244436},
  doi          = {10.1109/DFT.2017.8244436},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/TingH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/TorresLD17,
  author       = {Frank Sill Torres and
                  Pedro Fausto Rodrigues Leite and
                  Rolf Drechsler},
  title        = {Unintrusive aging analysis based on offline learning},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244453},
  doi          = {10.1109/DFT.2017.8244453},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/TorresLD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/WeigelFNR17,
  author       = {Lucas Weigel and
                  Fernando Fernandes and
                  Philippe O. A. Navaux and
                  Paolo Rech},
  title        = {Kernel vulnerability factor and efficient hardening for histogram
                  of oriented gradients},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244439},
  doi          = {10.1109/DFT.2017.8244439},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/WeigelFNR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/XieYMCX17,
  author       = {Yu Xie and
                  Chen Yang and
                  Chuang{-}An Mao and
                  He Chen and
                  Yizhuang Xie},
  title        = {A novel low-overhead fault tolerant parallel-pipelined {FFT} design},
  booktitle    = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  pages        = {1--4},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://doi.org/10.1109/DFT.2017.8244461},
  doi          = {10.1109/DFT.2017.8244461},
  timestamp    = {Sun, 12 Nov 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/XieYMCX17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/dft/2017,
  title        = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
                  and Nanotechnology Systems, {DFT} 2017, Cambridge, United Kingdom,
                  October 23-25, 2017},
  publisher    = {{IEEE} Computer Society},
  year         = {2017},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8227263/proceeding},
  isbn         = {978-1-5386-0362-8},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/2017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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