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@inproceedings{DBLP:conf/irps/AguirrePPFWE18,
author = {Fernando L. Aguirre and
Sebasti{\'{a}}n Mat{\'{\i}}as Pazos and
Felix Palumbo and
Sivan Fadida and
Roy Winter and
Moshe Eizenberg},
title = {Impact of forming gas annealing on the degradation dynamics of Ge-based
{MOS} stacks},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353663},
doi = {10.1109/IRPS.2018.8353663},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/irps/AguirrePPFWE18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AhnYC18,
author = {Jae{-}Gyung Ahn and
Ping{-}Chin Yeh and
Jonathan Chang},
title = {Electromigration failure rate of redundant via},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353671},
doi = {10.1109/IRPS.2018.8353671},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/AhnYC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AkturkMGLHGW18,
author = {Akin Akturk and
James McGarrity and
Neil Goldsman and
Daniel J. Lichtenwalner and
Brett Hull and
Dave Grider and
Richard Wilkins},
title = {The effects of radiation on the terrestrial operation of SiC MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353543},
doi = {10.1109/IRPS.2018.8353543},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/AkturkMGLHGW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AlghamdiSYY18,
author = {Sami Alghamdi and
Mengwei Si and
Lingming Yang and
Peide D. Ye},
title = {Low frequency noise in {MOS2} negative capacitance field-effect transistor},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353696},
doi = {10.1109/IRPS.2018.8353696},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/AlghamdiSYY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ArabiCFNHR18,
author = {M. Arabi and
A. Cros and
X. Federspiel and
Cheikh Ndiaye and
Vincent Huard and
M. Rafik},
title = {Modeling self-heating effects in advanced {CMOS} nodes},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353673},
doi = {10.1109/IRPS.2018.8353673},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ArabiCFNHR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ArnaudMJJLFEEBB18,
author = {Lucile Arnaud and
St{\'{e}}phane Moreau and
Amadine Jouve and
Imed Jani and
Didier Lattard and
F. Fournel and
C. Euvrard and
Y. Exbrayat and
Viorel Balan and
Nicolas Bresson and
S. Lhostis and
J. Jourdon and
E. Deloffre and
S. Guillaumet and
Alexis Farcy and
Simon Gousseau and
M. Arnoux},
title = {Fine pitch 3D interconnections with hybrid bonding technology: From
process robustness to reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353591},
doi = {10.1109/IRPS.2018.8353591},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ArnaudMJJLFEEBB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BeyneDPBAWTC18,
author = {Sofie Beyne and
Shibesh Dutta and
Olalla Varela Pedreira and
Niels Bosman and
Christoph Adelmann and
Ingrid De Wolf and
Zsolt T{\"{o}}kei and
Kristof Croes},
title = {The first observation of p-type electromigration failure in full ruthenium
interconnects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353638},
doi = {10.1109/IRPS.2018.8353638},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BeyneDPBAWTC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BottiniGVVMM18,
author = {Roberta Bottini and
Andrea Ghetti and
Sara Vigano and
Maria Grazia Valentini and
Pratap Murali and
Chandra Mouli},
title = {Non-poissonian behavior of hot carrier degradation induced variability
in MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353645},
doi = {10.1109/IRPS.2018.8353645},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BottiniGVVMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuryCKCFSWL18,
author = {Erik Bury and
Adrian Vaisman Chasin and
Ben Kaczer and
Kai{-}Hsin Chuang and
Jacopo Franco and
Marko Simicic and
Pieter Weckx and
Dimitri Linten},
title = {Self-heating-aware {CMOS} reliability characterization using degradation
maps},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353541},
doi = {10.1109/IRPS.2018.8353541},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuryCKCFSWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CartierFARN18,
author = {Eduard Cartier and
Martin M. Frank and
Takashi Ando and
John Rozen and
Vijay Narayanan},
title = {{PBTI} in InGaAs {MOS} capacitors with Al2O3/HfO2/TiN gate stacks:
Interface-state generation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353604},
doi = {10.1109/IRPS.2018.8353604},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CartierFARN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CastellazziFZOP18,
author = {Alberto Castellazzi and
Asad Fayyaz and
Siwei Zhu and
Thorsten Oeder and
Martin Pfost},
title = {Single pulse short-circuit robustness and repetitive stress aging
of GaN GITs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353593},
doi = {10.1109/IRPS.2018.8353593},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CastellazziFZOP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenCMHLTLH18,
author = {I. K. Chen and
S. C. Chen and
S. Mukhopadhyay and
D. S. Huang and
J. H. Lee and
Y. S. Tsai and
Ryan Lu and
Jun He},
title = {The physical mechanism investigation of off-state drain bias {TDDB}
and its implication in advance {HK/MG} FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353575},
doi = {10.1109/IRPS.2018.8353575},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChenCMHLTLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenLOL18,
author = {Pin{-}Shiang Chen and
Shou{-}Chung Lee and
A. S. Oates and
Chee Wee Liu},
title = {{BEOL} {TDDB} reliability modeling and lifetime prediction using critical
energy to breakdown},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353626},
doi = {10.1109/IRPS.2018.8353626},
timestamp = {Mon, 08 Jul 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChenLOL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenY18,
author = {Pai{-}Yu Chen and
Shimeng Yu},
title = {Reliability perspective of resistive synaptic devices on the neuromorphic
system performance},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353615},
doi = {10.1109/IRPS.2018.8353615},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChenY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Cheung18,
author = {Kin P. Cheung},
title = {SiC power {MOSFET} gate oxide breakdown reliability - Current status},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353545},
doi = {10.1109/IRPS.2018.8353545},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Cheung18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChihaniTDWCBD18,
author = {Omar Chihani and
Loic Th{\'{e}}olier and
Jean{-}Yves Del{\'{e}}tage and
Eric Woirgard and
Alain Bensoussan and
Andr{\'{e}} Durier},
title = {Temperature and voltage effects on {HTRB} and {HTGB} stresses for
AlGaN/GaN HEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353685},
doi = {10.1109/IRPS.2018.8353685},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChihaniTDWCBD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChoiCCZFSYOZFJ18,
author = {Seungman Choi and
Cathryn Christiansen and
Linjun Cao and
James Zhang and
Ronald Filippi and
Tian Shen and
Kong Boon Yeap and
Sean P. Ogden and
Haojun Zhang and
Bianzhu Fu and
Patrick Justison},
title = {Effect of metal line width on electromigration of {BEOL} Cu interconnects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353600},
doi = {10.1109/IRPS.2018.8353600},
timestamp = {Wed, 29 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChoiCCZFSYOZFJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChuKHTWCKW18,
author = {Yu{-}Lin Chu and
Hsi{-}Yu Kuo and
Sheng{-}Fu Hsu and
Yung{-}Sheng Tsai and
Ming{-}Yi Wang and
Chuan{-}Li Chang and
Bill Kiang and
Kenneth Wu},
title = {A new mechanism of signal path charging damage across separated power
domain deep N-Well interface},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353631},
doi = {10.1109/IRPS.2018.8353631},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChuKHTWCKW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChuangBDKKGLV18,
author = {Kai{-}Hsin Chuang and
Erik Bury and
Robin Degraeve and
Ben Kaczer and
T. Kallstenius and
Guido Groeseneken and
Dimitri Linten and
Ingrid Verbauwhede},
title = {A multi-bit/cell {PUF} using analog breakdown positions in {CMOS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353655},
doi = {10.1109/IRPS.2018.8353655},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChuangBDKKGLV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChungKH18,
author = {C. Chung and
D. Kobayashi and
K. Hirose},
title = {Threshold ion parameters of line-type soft-errors in biased thin-BOX
{SOI} SRAMs: Difference between sensitivities to terrestrial and space
radiation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353585},
doi = {10.1109/IRPS.2018.8353585},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChungKH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ClausnerSKOPGWL18,
author = {Andr{\'{e}} Clausner and
Simon Schlipf and
Gottfried Kurz and
Michael Otto and
Jens Paul and
Kay{-}Uwe Giering and
Jens Warmuth and
Andr{\'{e}} Lange and
Roland Jancke and
Andreas Aal and
R{\"{u}}diger Rosenkranz and
Martin Gall and
Ehrenfried Zschech},
title = {Analysis of 28 nm {SRAM} cell stability under mechanical load applied
by nanoindentation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353607},
doi = {10.1109/IRPS.2018.8353607},
timestamp = {Thu, 06 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ClausnerSKOPGWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CroesCLZKGWTB18,
author = {Kristof Croes and
Vladimir Cherman and
Melina Lofrano and
Houman Zahedmanesh and
Luka Kljucar and
Mario Gonzalez and
Ingrid De Wolf and
Zsolt T{\"{o}}kei and
Eric Beyne},
title = {Stress mitigation of 3D-stacking/packaging induced stresses},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353590},
doi = {10.1109/IRPS.2018.8353590},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CroesCLZKGWTB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Domanski18,
author = {Krzysztof Domanski},
title = {Latch-up in FinFET technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353550},
doi = {10.1109/IRPS.2018.8353550},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Domanski18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/EndrinalKRS18,
author = {Lesly Endrinal and
Rakesh Kinger and
Lavakumar Ranganathan and
Amit Sheth},
title = {Solving critical issues in 10nm technology using innovative laser-based
fault isolation and {DFT} diagnosis techniques},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353622},
doi = {10.1109/IRPS.2018.8353622},
timestamp = {Tue, 24 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/EndrinalKRS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FanTLCCCLLCH18,
author = {Chia{-}Chi Fan and
Chun{-}Yuan Tu and
Ming{-}Huei Lin and
Chun{-}Yen Chang and
Chun{-}Hu Cheng and
Yen{-}Liang Chen and
Guan{-}Lin Liou and
Chien Liu and
Wu{-}Ching Chou and
Hsiao{-}Hsuan Hsu},
title = {Interface engineering of ferroelectric negative capacitance {FET}
for hysteresis-free switch and reliability improvement},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {8--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353703},
doi = {10.1109/IRPS.2018.8353703},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/FanTLCCCLLCH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FangO18,
author = {Yi{-}Pin Fang and
Anthony S. Oates},
title = {Soft errors in 7nm FinFET SRAMs with integrated fan-out packaging},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353584},
doi = {10.1109/IRPS.2018.8353584},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/FangO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FennerPC18,
author = {Andy Fenner and
Mark Porter and
Randy Crutchfield},
title = {Making the connection between physics of failure and system-level
reliability for medical devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353619},
doi = {10.1109/IRPS.2018.8353619},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/FennerPC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FlorentSLDCKPPG18,
author = {Karine Florent and
A. Subirats and
Simone Lavizzari and
Robin Degraeve and
Umberto Celano and
Ben Kaczer and
Luca Di Piazza and
Mihaela Ioana Popovici and
Guido Groeseneken and
Jan Van Houdt},
title = {Investigation of the endurance of FE-HfO2 devices by means of {TDDB}
studies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353634},
doi = {10.1109/IRPS.2018.8353634},
timestamp = {Sun, 09 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FlorentSLDCKPPG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrancoKCBL18,
author = {Jacopo Franco and
Ben Kaczer and
Adrian Vaisman Chasin and
Erik Bury and
Dimitri Linten},
title = {Hot electron and hot hole induced degradation of SiGe p-FinFETs studied
by degradation maps in the entire bias space},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353601},
doi = {10.1109/IRPS.2018.8353601},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrancoKCBL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FukuyamaMMTY18,
author = {Shouhei Fukuyama and
Kazuki Maeda and
Shinpei Matsuda and
Ken Takeuchi and
Ryutaro Yasuhara},
title = {Suppression of endurance-stressed data-retention failures of 40nm
TaOx-based ReRAM},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353677},
doi = {10.1109/IRPS.2018.8353677},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/FukuyamaMMTY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GambinoSRRSHTHJ18,
author = {Jeff Peter Gambino and
H. Soleimani and
I. Rahim and
B. Riebeek and
L. Sheng and
G. Hosey and
H. Truong and
Gavin D. R. Hall and
R. Jerome and
D. Price},
title = {Device reliability for {CMOS} image sensors with backside through-silicon
vias},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353611},
doi = {10.1109/IRPS.2018.8353611},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/GambinoSRRSHTHJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GaoSESPL18,
author = {David Z. Gao and
Jack Strand and
Al{-}Moatasem El{-}Sayed and
Alexander L. Shluger and
Andrea Padovani and
Luca Larcher},
title = {Role of electron and hole trapping in the degradation and breakdown
of SiO2 and HfO2 films},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353602},
doi = {10.1109/IRPS.2018.8353602},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GaoSESPL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GarrosSRGDFHR18,
author = {Xavier Garros and
Alexandre Subirats and
Gilles Reimbold and
Fred Gaillard and
Cheikh Diouf and
X. Federspiel and
Vincent Huard and
M. Rafik},
title = {A new method for quickly evaluating reversible and permanent components
of the {BTI} degradation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353688},
doi = {10.1109/IRPS.2018.8353688},
timestamp = {Thu, 04 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GarrosSRGDFHR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GraffSPA18,
author = {Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek and
David Poppitz and
Frank Altmann},
title = {Physical failure analysis methods for wide band gap semiconductor
devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353557},
doi = {10.1109/IRPS.2018.8353557},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GraffSPA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrasserSWRRSPPR18,
author = {Tibor Grasser and
Bernhard Stampfer and
Michael Waltl and
Gerhard Rzepa and
Karl Rupp and
Franz Schanovsky and
Gregor Pobegen and
Katja Puschkarsky and
Hans Reisinger and
Barry J. O'Sullivan and
Ben Kaczer},
title = {Characterization and physical modeling of the temporal evolution of
near-interfacial states resulting from {NBTI/PBTI} stress in nMOS/pMOS
transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353540},
doi = {10.1109/IRPS.2018.8353540},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GrasserSWRRSPPR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GriggioPPTSTKLH18,
author = {F. Griggio and
James Palmer and
F. Pan and
N. Toledo and
Anthony Schmitz and
Ilan Tsameret and
R. Kasim and
Gerald S. Leatherman and
Jeffery Hicks and
A. Madhavan and
J. Shin and
J. Steigerwald and
A. Yeoh and
C. Auth},
title = {Reliability of dual-damascene local interconnects featuring cobalt
on 10 nm logic technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353641},
doi = {10.1109/IRPS.2018.8353641},
timestamp = {Sat, 25 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GriggioPPTSTKLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GuoLWZZWH18,
author = {Shaofeng Guo and
Zhenghan Lin and
Runsheng Wang and
Zexuan Zhang and
Zhe Zhang and
Yangyuan Wang and
Ru Huang},
title = {Investigation on the amplitude coupling effect of random telegraph
noise {(RTN)} in nanoscale FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353701},
doi = {10.1109/IRPS.2018.8353701},
timestamp = {Mon, 03 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GuoLWZZWH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HaoGRYA18,
author = {Jifa Hao and
Amartya Ghosh and
Mark Rinehimer and
Joe Yedinak and
Muhammad Ashraful Alam},
title = {{BVDSS} (drain to source breakdown voltage) instability in shielded
gate trench power MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353643},
doi = {10.1109/IRPS.2018.8353643},
timestamp = {Fri, 03 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HaoGRYA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Hau-RiegeXYKLZF18,
author = {Christine S. Hau{-}Riege and
Huilin Xu and
You{-}Wen Yau and
Manasi S. Kakade and
Jianfeng Li and
Xiaonan Zhang and
Hosain Farr},
title = {Electromigration of multi-solder ball test structures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353608},
doi = {10.1109/IRPS.2018.8353608},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Hau-RiegeXYKLZF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuKHMSOCPPASQGB18,
author = {Chao{-}Kun Hu and
James J. Kelly and
Huai Huang and
Koichi Motoyama and
Hosadurga Shobha and
Yuri Ostrovski and
James H.{-}C. Chen and
Raghuveer Patlolla and
Brown Peethala and
Praneet Adusumilli and
Terry A. Spooner and
Roger Quon and
Lynne M. Gignac and
Chris M. Breslin and
G. Lian and
M. Ali and
Jacob Benedict and
X. S. Lin and
S. Smith and
Vimal Kamineni and
X. Zhang and
Frank Wilhelm Mont and
Shariq Siddiqui and
Frieder H. Baumann},
title = {Future on-chip interconnect metallization and electromigration},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353597},
doi = {10.1109/IRPS.2018.8353597},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuKHMSOCPPASQGB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuangLTWHLLH18,
author = {D. S. Huang and
J. H. Lee and
Y. S. Tsai and
Y. F. Wang and
Y. S. Huang and
C. K. Lin and
Ryan Lu and
Jun He},
title = {Comprehensive device and product level reliability studies on advanced
{CMOS} technologies featuring 7nm high-k metal gate FinFET transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353651},
doi = {10.1109/IRPS.2018.8353651},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/HuangLTWHLLH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuardMBLRCB18,
author = {Vincent Huard and
Souhir Mhira and
A. Barclais and
X. Lecocq and
F. Raugi and
M. Cantournet and
Alain Bravaix},
title = {Managing electrical reliability in consumer systems for improved energy
efficiency},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353561},
doi = {10.1109/IRPS.2018.8353561},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuardMBLRCB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuardNAPFMMB18,
author = {Vincent Huard and
Cheikh Ndiaye and
M. Arabi and
Narendra Parihar and
X. Federspiel and
Souhir Mhira and
S. Mahapatra and
Alain Bravaix},
title = {Key parameters driving transistor degradation in advanced strained
SiGe channels},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353699},
doi = {10.1109/IRPS.2018.8353699},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuardNAPFMMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IgarashiUTTSN18,
author = {Mitsuhiko Igarashi and
Yuuki Uchida and
Yoshio Takazawa and
Yasumasa Tsukamoto and
Koji Shibutani and
Koji Nii},
title = {Study of impact of BTI's local layout effect including recovery effect
on various standard-cells in 10nm FinFET},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353654},
doi = {10.1109/IRPS.2018.8353654},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/IgarashiUTTSN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IkoshiTYAHSYUTU18,
author = {Ayanori Ikoshi and
Masahiro Toki and
Hiroto Yamagiwa and
Daijiro Arisawa and
Masahiro Hikita and
Kazuki Suzuki and
Manabu Yanagihara and
Yasuhiro Uemoto and
Kenichiro Tanaka and
Tetsuzo Ueda},
title = {Lifetime evaluation for Hybrid-Drain-embedded Gate Injection Transistor
{(HD-GIT)} under practical switching operations},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353594},
doi = {10.1109/IRPS.2018.8353594},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/IkoshiTYAHSYUTU18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IllarionovMWKFM18,
author = {Yury Yu. Illarionov and
Aday J. Molina{-}Mendoza and
Michael Waltl and
Theresia Knobloch and
Marco M. Furchi and
Thomas Mueller and
Tibor Grasser},
title = {Reliability of next-generation field-effect transistors with transition
metal dichalcogenides},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353605},
doi = {10.1109/IRPS.2018.8353605},
timestamp = {Fri, 26 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/IllarionovMWKFM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IoannouTLBAWBJ18,
author = {Dimitris P. Ioannou and
Y. Tan and
R. Logan and
K. Bandy and
R. Achanta and
P. C. Wang and
Dave Brochu and
M. Jaffe},
title = {Hot carrier effects on the {RF} performance degradation of nanoscale
{LNA} {SOI} nFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353697},
doi = {10.1109/IRPS.2018.8353697},
timestamp = {Fri, 16 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/IoannouTLBAWBJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IucolanoPRC18,
author = {Ferdinando Iucolano and
Antonino Maurizio Parisi and
Santo Reina and
Alessandro Chini},
title = {A novel GaN {HEMT} degradation mechanism observed during {HTST} test},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353707},
doi = {10.1109/IRPS.2018.8353707},
timestamp = {Mon, 08 Apr 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/IucolanoPRC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/IyerB18,
author = {Subramanian S. Iyer and
Adeel Ahmad Bajwa},
title = {Reliability challenges in advance packaging},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353592},
doi = {10.1109/IRPS.2018.8353592},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/IyerB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JagannathanAMY18,
author = {Srikanth Jagannathan and
Kumar Abhishek and
Nihaar N. Mahatme and
Ender Yilmaz},
title = {Design of aging aware 5 Gbps {LVDS} transmitter for automotive applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353614},
doi = {10.1109/IRPS.2018.8353614},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/JagannathanAMY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JeongKKKLCBKJSP18,
author = {Seongwon Jeong and
Jinseok Kim and
Ayoung Kim and
Byungwook Kim and
Moonsoo Lee and
Jaewon Chang and
In Hak Baick and
Hanbyul Kang and
Younggeun Ji and
Sangchul Shin and
Sangwoo Pae},
title = {Optimal design of dummy ball array in wafer level package to improve
board level thermal cycle reliability {(BLR)}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353653},
doi = {10.1109/IRPS.2018.8353653},
timestamp = {Mon, 28 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/JeongKKKLCBKJSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JiKKLNJSKHCSPCD18,
author = {Younggeun Ji and
Jeonghoon Kim and
Jungin Kim and
Miji Lee and
Jaeheon Noh and
Taeyoung Jeong and
Juhyeon Shin and
Junho Kim and
Young Heo and
Ung Cho and
Hyun{-}Chul Sagong and
Junekyun Park and
Yeonsik Choo and
Gilhwan Do and
Hoyoung Kang and
Eunkyeong Choi and
Dongyoon Sun and
Changki Kang and
Sangchul Shin and
Sangwoo Pae},
title = {Reliability characterization of advanced {CMOS} image sensor {(CIS)}
with 3D stack and in-pixel {DTI}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353570},
doi = {10.1109/IRPS.2018.8353570},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/JiKKLNJSKHCSPCD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JiangZHMKMB18,
author = {Hui Jiang and
H. Zhang and
R. C. Harrington and
J. A. Maharrey and
J. S. Kauppila and
Lloyd W. Massengill and
Bharat L. Bhuva},
title = {Impact of supply voltage and particle {LET} on the soft error rate
of logic circuits},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353586},
doi = {10.1109/IRPS.2018.8353586},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/JiangZHMKMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JiangZNMB18,
author = {H. Jiang and
H. Zhang and
Balaji Narasimham and
Lloyd W. Massengill and
Bharat L. Bhuva},
title = {Designing soft-error-aware circuits with power and speed optimization},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353692},
doi = {10.1109/IRPS.2018.8353692},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/JiangZNMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JoshiCHLL18,
author = {Kaustubh Joshi and
Shu{-}Wen Chang and
D. S. Huang and
P. J. Liao and
Yung{-}Huei Lee},
title = {Study of dynamic {TDDB} in scaled FinFET technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353665},
doi = {10.1109/IRPS.2018.8353665},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/JoshiCHLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KakikawaYCTT18,
author = {Kento Kakikawa and
Yuji Yamagishi and
Yasuo Cho and
Katsuto Tanahashi and
Hidetaka Takato},
title = {Charge state evaluation of passivation layers for silicon solar cells
by scanning nonlinear dielectric microscopy},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353683},
doi = {10.1109/IRPS.2018.8353683},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KakikawaYCTT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaleMK18,
author = {Amit A. Kale and
Amit Marathe and
Ajay Kamath},
title = {Machine learning based dynamic cause maps for condition monitoring
and life estimation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353562},
doi = {10.1109/IRPS.2018.8353562},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaleMK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KangLHKLL18,
author = {Soo Cheol Kang and
Sang Kyung Lee and
S. Heo and
S. M. Kim and
Sung Kwan Lim and
Byoung Hun Lee},
title = {Reliability characteristics of {MIM} capacitor studied with {\(\Delta\)}C-F
characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353687},
doi = {10.1109/IRPS.2018.8353687},
timestamp = {Wed, 24 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KangLHKLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KempfMBMRNRPM18,
author = {Thibault Kempf and
Vincenzo Della Marca and
L. Baron and
F. Maugain and
Francesco La Rosa and
Stephan Niel and
Arnaud R{\'{e}}gnier and
Jean{-}Michel Portal and
Pascal Masson},
title = {Threshold voltage bitmap analysis methodology: Application to a 512kB
40nm Flash memory test chip},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353642},
doi = {10.1109/IRPS.2018.8353642},
timestamp = {Mon, 19 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KempfMBMRNRPM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KendrickCGMSHSW18,
author = {Chris Kendrick and
Michael Cook and
Jeff P. Gambino and
T. Myers and
J. Slezak and
T. Hirano and
T. Sano and
Y. Watanabe and
K. Ozeki},
title = {Polysilicon resistor stability under voltage stress for safe-operating
area characterization},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353686},
doi = {10.1109/IRPS.2018.8353686},
timestamp = {Thu, 20 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KendrickCGMSHSW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KhanB18,
author = {Ahmad Khan and
Frede Blaabjerg},
title = {Modified transformerless dual buck inverter with improved lifetime
for {PV} applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353628},
doi = {10.1109/IRPS.2018.8353628},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KhanB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimJSKJCPSP18,
author = {Hyunjin Kim and
Minjung Jin and
Hyun{-}Chul Sagong and
Jinju Kim and
Ukjin Jung and
Minhyuck Choi and
Junekyun Park and
Sangchul Shin and
Sangwoo Pae},
title = {A systematic study of gate dielectric {TDDB} in FinFET technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353577},
doi = {10.1109/IRPS.2018.8353577},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KimJSKJCPSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimKBCFRLBZMSXK18,
author = {Wanki Kim and
SangBum Kim and
Robert L. Bruce and
Fabio Carta and
G. Fraczak and
A. Ray and
Chung Lam and
Matthew BrightSky and
Yu Zhu and
T. Masuda and
K. Suu and
Yujun Xie and
Yerin Kim and
Judy J. Cha},
title = {Reliability benefits of a metallic liner in confined {PCM}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353636},
doi = {10.1109/IRPS.2018.8353636},
timestamp = {Sat, 17 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KimKBCFRLBZMSXK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimLL18,
author = {Andrew Kim and
Baozhen Li and
Barry P. Linder},
title = {Transient self-heating modeling and simulations of back-end-of-line
interconnects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353672},
doi = {10.1109/IRPS.2018.8353672},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KimLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimSPCP18,
author = {Heejin Kim and
Hayeon Shin and
Jiyoung Park and
Youngtae Choi and
Jongwoo Park},
title = {Statistical modeling and reliability prediction for transient luminance
degradation of flexible OLEDs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353566},
doi = {10.1109/IRPS.2018.8353566},
timestamp = {Mon, 04 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KimSPCP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KocaayRCCLW18,
author = {Deniz Kocaay and
Philippe Roussel and
Kristof Croes and
Ivan Ciofi and
Alicja Lesniewska and
Ingrid De Wolf},
title = {Method to assess the impact of {LER} and spacing variation on {BEOL}
dielectric reliability using 2D-field simulations for {\textless}20nm
spacing},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {10--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353670},
doi = {10.1109/IRPS.2018.8353670},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KocaayRCCLW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KosinskiD18,
author = {Brian Kosinski and
Ken Dodson},
title = {Key attributes to achieving {\textgreater} 99.99 satellite availability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353620},
doi = {10.1109/IRPS.2018.8353620},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KosinskiD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KraatzSCHSGZ18,
author = {Matthias Kraatz and
Christoph Sander and
Andr{\'{e}} Clausner and
Meike Hauschildt and
Yvonne Standke and
Martin Gall and
Ehrenfried Zschech},
title = {Analysis of electromigration-induced backflow stresses in Cu(Mn) interconnects
using high statistical sampling},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353598},
doi = {10.1109/IRPS.2018.8353598},
timestamp = {Wed, 29 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KraatzSCHSGZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KranthiMMVS18,
author = {Nagothu Karmel Kranthi and
Abhishek Mishra and
Adil Meersha and
Harsha B. Variar and
Mayank Shrivastava},
title = {Defect-Assisted Safe Operating Area Limits and High Current Failure
in Graphene FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353571},
doi = {10.1109/IRPS.2018.8353571},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KranthiMMVS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KurachiYNSTYF18,
author = {Yasuyo Kurachi and
Hiroshi Yamamoto and
Yukinori Nose and
Satoshi Shimizu and
Yasunori Tateno and
Takumi Yonemura and
Masato Furukawa},
title = {Failure mode analysis of GaN-HEMT under high temperature operation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353706},
doi = {10.1109/IRPS.2018.8353706},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KurachiYNSTYF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LajmiCDBRHBLB18,
author = {Rania Lajmi and
Florian Cacho and
O. David and
Jean{-}Pierre Blanc and
Emmanuel Rouat and
S{\'{e}}bastien Haendler and
Ph. Benech and
Estelle Lauga{-}Larroze and
Sylvain Bourdel},
title = {Reliability assessment of 4GSP/s interleaved {SAR} {ADC}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353658},
doi = {10.1109/IRPS.2018.8353658},
timestamp = {Fri, 09 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LajmiCDBRHBLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LallML18,
author = {Pradeep Lall and
Kazi Mirza and
David Locker},
title = {Prognostics health management of electronic systems - {A} reliability
physics approach},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353621},
doi = {10.1109/IRPS.2018.8353621},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LallML18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LallZL18,
author = {Pradeep Lall and
Hao Zhang and
Rahul Lall},
title = {{PHM} of state-of-charge for flexible power sources in wearable electronics
with {EKF}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353695},
doi = {10.1109/IRPS.2018.8353695},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LallZL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LandiBMPN18,
author = {Giovanni Landi and
Carlo Barone and
Costantino Mauro and
Sergio Pagano and
Heinz{-}Christoph Neitzert},
title = {Evaluation of silicon, organic, and perovskite solar cell reliability
with low-frequency noise spectroscopy},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353629},
doi = {10.1109/IRPS.2018.8353629},
timestamp = {Mon, 05 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LandiBMPN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LaurentGBPCGFRV18,
author = {Antoine Laurent and
Xavier Garros and
Sylvain Barraud and
J. Pelloux{-}Prayer and
Mika{\"{e}}l Cass{\'{e}} and
Fred Gaillard and
X. Federspiel and
David Roy and
E. Vincent and
G{\'{e}}rard Ghibaudo},
title = {Performance {\&} reliability of 3D architectures ({\(\pi\)}fet,
Finfet, {\(\Omega\)}fet)},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353647},
doi = {10.1109/IRPS.2018.8353647},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LaurentGBPCGFRV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Lee18,
author = {Kangwook Lee},
title = {High-density fan-out technology for advanced SiP and 3D heterogeneous
integration},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353588},
doi = {10.1109/IRPS.2018.8353588},
timestamp = {Thu, 18 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Lee18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeCHKLCTL18,
author = {Ming{-}Yi Lee and
T.{-}Y. Chang and
W.{-}F. Hsueh and
Li{-}Kuang Kuo and
Ding{-}Jhang Lin and
Yen{-}Hai Chao and
U. J. Tzeng and
Chih{-}Yuan Lu},
title = {Electrical method to localize the high-resistance of nanoscale CoSi2
word-line for {OTP} memories},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353624},
doi = {10.1109/IRPS.2018.8353624},
timestamp = {Fri, 31 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LeeCHKLCTL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeJYJ18,
author = {Sol{-}Kyu Lee and
Kyung{-}Tae Jang and
Seol{-}Min Yi and
Young{-}Chang Joo},
title = {Successive breakdown mode of time-dependent dielectric breakdown for
Cu interconnects and lifetime enhancement under dynamic bias stress},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353578},
doi = {10.1109/IRPS.2018.8353578},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LeeJYJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeKLCH18,
author = {Miky Lee and
K. Kim and
D. Lim and
D. Cho and
Ck. Han},
title = {Weibull cumulative distribution function {(CDF)} analysis with life
expectancy endurance test result of power window switch},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353694},
doi = {10.1109/IRPS.2018.8353694},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LeeKLCH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LezonWDWB18,
author = {Kurt J. Lezon and
Shi{-}Jie Wen and
Y.{-}F. Dan and
Richard Wong and
Bharat L. Bhuva},
title = {Single-event effects on optical transceiver},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353693},
doi = {10.1109/IRPS.2018.8353693},
timestamp = {Wed, 21 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LezonWDWB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiKMLC18,
author = {Baozhen Li and
Andrew Kim and
Paul McLaughlin and
Barry P. Linder and
Cathryn Christiansen},
title = {Electromigration characteristics of power grid like structures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353599},
doi = {10.1109/IRPS.2018.8353599},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LiKMLC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiSHPBBC18,
author = {Yunlong Li and
Michele Stucchi and
Stefaan Van Huylenbroeck and
Geert Van der Plas and
Gerald Beyer and
Eric Beyne and
Kristof Croes},
title = {{TSV} process-induced {MOS} reliability degradation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353610},
doi = {10.1109/IRPS.2018.8353610},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LiSHPBBC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiWDHDL18,
author = {Yun Li and
K. L. Wang and
Shaoyan Di and
Peng Huang and
Gang Du and
Xiao{-}Yan Liu},
title = {{PBTI} evaluation of In0.65Ga0.35As/In0.53Ga0.47As nanowire FETs with
Al2O3 and LaAlO3 gate dielectrics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {7--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353702},
doi = {10.1109/IRPS.2018.8353702},
timestamp = {Tue, 08 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LiWDHDL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiangYSHJLP18,
author = {Xianhu Liang and
Bin Yuan and
Yuanyuan Shi and
Fei Hui and
Xu Jing and
Mario Lanza and
Felix Palumbo},
title = {Enhanced reliability of hexagonal boron nitride dielectric stacks
due to high thermal conductivity},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353666},
doi = {10.1109/IRPS.2018.8353666},
timestamp = {Wed, 29 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LiangYSHJLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LichtenwalnerHB18,
author = {Daniel J. Lichtenwalner and
Brett Hull and
Edward Van Brunt and
Shadi Sabri and
Donald A. Gajewski and
Dave Grider and
Scott Allen and
John W. Palmour and
Akin Akturk and
James McGarrity},
title = {Reliability studies of SiC vertical power MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353544},
doi = {10.1109/IRPS.2018.8353544},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LichtenwalnerHB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LimRMNKNLTCCLP18,
author = {Jia Hao Lim and
Nagarajan Raghavan and
Sen Mei and
Vinayak Bharat Naik and
Jae Hyun Kwon and
S. M. Noh and
B. Liu and
E. H. Toh and
Nyuk Leong Chung and
Robin Chao and
K. H. Lee and
Kin Leong Pey},
title = {Area and pulsewidth dependence of bipolar {TDDB} in MgO magnetic tunnel
junction},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353637},
doi = {10.1109/IRPS.2018.8353637},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LimRMNKNLTCCLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LinKCLHTLLCWL18,
author = {T. W. Lin and
S. H. Ku and
C. H. Cheng and
C. W. Lee and
Ijen Huang and
Wen{-}Jer Tsai and
T. C. Lu and
W. P. Lu and
K. C. Chen and
Tahui Wang and
Chih{-}Yuan Lu},
title = {Chip-level characterization and RTN-induced error mitigation beyond
20nm floating gate flash memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353679},
doi = {10.1109/IRPS.2018.8353679},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LinKCLHTLLCWL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuCCYKFTLFL18,
author = {S. E. Liu and
G. Y. Chen and
M. K. Chen and
David Yen and
W. A. Kuo and
C. S. Fu and
Y. S. Tsai and
M. Z. Lin and
Y. H. Fang and
M. J. Lin},
title = {Fast chip aging prediction by product-like {VMIN} drift characterization
on test structures},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353569},
doi = {10.1109/IRPS.2018.8353569},
timestamp = {Wed, 19 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LiuCCYKFTLFL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuKGO18,
author = {Wen Liu and
Andreas Kerber and
Fernando Guarin and
Claude Ortolland},
title = {Cap layer and multi-work-function tuning impact on {TDDB/BTI} in {SOI}
FinFET devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353542},
doi = {10.1109/IRPS.2018.8353542},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LiuKGO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuLJWTLCL18,
author = {Y. H. Liu and
H. Y. Lin and
C. M. Jiang and
Tahui Wang and
W. J. Tsai and
T. C. Lu and
K. C. Chen and
Chih{-}Yuan Lu},
title = {Investigation of data pattern effects on nitride charge lateral migration
in a charge trap flash memory by using a random telegraph signal method},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353632},
doi = {10.1109/IRPS.2018.8353632},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/LiuLJWTLCL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Mariani18,
author = {Riccardo Mariani},
title = {An overview of autonomous vehicles safety},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353618},
doi = {10.1109/IRPS.2018.8353618},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Mariani18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/McNairy18,
author = {Cameron McNairy},
title = {Exascale fault tolerance challenge and approaches},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353563},
doi = {10.1109/IRPS.2018.8353563},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/McNairy18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/McPherson18,
author = {J. W. McPherson},
title = {Brief history of {JEDEC} qualification standards for silicon technology
and their applicability(?) to {WBG} semiconductors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353556},
doi = {10.1109/IRPS.2018.8353556},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/McPherson18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MengMTM18,
author = {Kuo{-}Hsuan Meng and
Mohamed Moosa and
Cynthia A. Torres and
James W. Miller},
title = {A case study of {ESD} trigger circuit: Time-out and stability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353660},
doi = {10.1109/IRPS.2018.8353660},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/MengMTM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MhiraHAFB18,
author = {Souhir Mhira and
Vincent Huard and
D. Arora and
Philippe Flatresse and
Alain Bravaix},
title = {Resilient automotive products through process, temperature and aging
compensation schemes},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353568},
doi = {10.1109/IRPS.2018.8353568},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MhiraHAFB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MitaniHN18,
author = {Yuichiro Mitani and
Yusuke Higashi and
Yasushi Nakasaki},
title = {Study on mechanism of thermal curing in ultra-thin gate dielectrics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353554},
doi = {10.1109/IRPS.2018.8353554},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MitaniHN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MonachonZBPGBK18,
author = {C. Monachon and
Marcin Stefan Zielinski and
J. Berney and
D. Poppitz and
Andreas Graff and
Steffen Breuer and
Lutz Kirste},
title = {Cathodoluminescence spectroscopy for failure analysis and process
development of GaN-based microelectronic devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353623},
doi = {10.1109/IRPS.2018.8353623},
timestamp = {Thu, 05 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MonachonZBPGBK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MukherjeeDCML18,
author = {Kalparupa Mukherjee and
Fr{\'{e}}d{\'{e}}ric Darracq and
Arnaud Curutchet and
Nathalie Malbert and
Nathalie Labat},
title = {Comprehensive study into underlying mechanisms of anomalous gate leakage
degradation in GaN high electron mobility transistors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353581},
doi = {10.1109/IRPS.2018.8353581},
timestamp = {Fri, 07 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MukherjeeDCML18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MurugesanFBHK18,
author = {Mariappan Murugesan and
Takafumi Fukushima and
Ji Chel Bea and
Hiroyuki Hashimoto and
Mitsu Koyanagi},
title = {Intra- and inter-chip electrical interconnection formed by directed
self assembly of nanocomposite containing diblock copolymer and nanometal},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353589},
doi = {10.1109/IRPS.2018.8353589},
timestamp = {Fri, 18 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/MurugesanFBHK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NadigL18,
author = {Sachin Nadig and
Amit Lal},
title = {In-situ calibration Of {MEMS} inertial sensors for long-term reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353567},
doi = {10.1109/IRPS.2018.8353567},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/NadigL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NarasimhamGRWHT18,
author = {Balaji Narasimham and
Saket Gupta and
Daniel S. Reed and
J. K. Wang and
Nick Hendrickson and
Hasan Taufique},
title = {Scaling trends and bias dependence of the soft error rate of 16 nm
and 7 nm FinFET SRAMs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353583},
doi = {10.1109/IRPS.2018.8353583},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/NarasimhamGRWHT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NarasimhamWWC18,
author = {Balaji Narasimham and
Tim Wu and
Jung K. Wang and
Bruce Conway},
title = {Evaluation of the system-level {SER} performance of gigabit ethernet
transceiver devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353587},
doi = {10.1109/IRPS.2018.8353587},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/NarasimhamWWC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NivelleBVPDCD18,
author = {Philippe Nivelle and
Tom Borgers and
Eszter Voroshazi and
Jef Poortmans and
Jan D'Haen and
Ward De Ceuninck and
Michael Daenen},
title = {Mechanical and chemical adhesion at the encapsulant interfaces in
laminated photovoltaic modules},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353630},
doi = {10.1109/IRPS.2018.8353630},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/NivelleBVPDCD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OSullivanBRRKCS18,
author = {Barry J. O'Sullivan and
Simon Van Beek and
Philippe J. Roussel and
Sidharth Rao and
Wonsub Kim and
S. Couet and
Johan Swerts and
Farrukh Yasin and
Dimitri Crotti and
Dimitri Linten and
Gouri Sankar Kar},
title = {Extended {RVS} characterisation of {STT-MRAM} devices: Enabling detection
of {AP/P} switching and breakdown},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353678},
doi = {10.1109/IRPS.2018.8353678},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/OSullivanBRRKCS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OngLO18,
author = {Yi Ching Ong and
Shou{-}Chung Lee and
A. S. Oates},
title = {Percolation defect nucleation and growth as a description of the statistics
of electrical breakdown for gate, {MOL} and {BEOL} dielectrics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {7--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353667},
doi = {10.1109/IRPS.2018.8353667},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/OngLO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PadovaniL18,
author = {Andrea Padovani and
Luca Larcher},
title = {Time-dependent dielectric breakdown statistics in SiO2 and HfO2 dielectrics:
Insights from a multi-scale modeling approach},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353552},
doi = {10.1109/IRPS.2018.8353552},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/PadovaniL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PaliwodaCKSM18,
author = {Peter C. Paliwoda and
Zakariae Chbili and
A. Kerber and
D. Singh and
Durga Misra},
title = {Ambient temperature and layout impact on self-heating characterization
in FinFET devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353640},
doi = {10.1109/IRPS.2018.8353640},
timestamp = {Wed, 29 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PaliwodaCKSM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PariharM18,
author = {Narendra Parihar and
Souvik Mahapatra},
title = {Prediction of {NBTI} stress and recovery time kinetics in Si capped
SiGe p-MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353700},
doi = {10.1109/IRPS.2018.8353700},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/PariharM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ParkKKKR18,
author = {Gyusung Park and
Minsu Kim and
Chris H. Kim and
Bongjin Kim and
Vijay Reddy},
title = {All-digital {PLL} frequency and phase noise degradation measurements
using simple on-chip monitoring circuits},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353613},
doi = {10.1109/IRPS.2018.8353613},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ParkKKKR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PatraRKC0C18,
author = {Devyani Patra and
Ahmed Kamal Reza and
Mehdi Katoozi and
Ethan H. Cannon and
Kaushik Roy and
Yu Cao},
title = {Accelerated {BTI} degradation under stochastic {TDDB} effect},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353616},
doi = {10.1109/IRPS.2018.8353616},
timestamp = {Thu, 15 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PatraRKC0C18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PaulKGS18,
author = {Milova Paul and
Boeila Sampath Kumar and
Harald Gossner and
Mayank Shrivastava},
title = {Contact and junction engineering in bulk FinFET technology for improved
ESD/latch-up performance with design trade-offs and its implications
on hot carrier reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353573},
doi = {10.1109/IRPS.2018.8353573},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PaulKGS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PedroMMRNGC18,
author = {Marta Pedro and
Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
E. Miranda and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
M. B. Gonz{\'{a}}lez and
Francesca Campabadal},
title = {Device variability tolerance of a RRAM-based self-organizing neuromorphic
system},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353657},
doi = {10.1109/IRPS.2018.8353657},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/PedroMMRNGC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PremachandranCC18,
author = {C. S. Premachandran and
Seungman Choi and
Salvatore Cimino and
Thuy Tran{-}Quinn and
Lloyd Burrell and
Patrick Justison},
title = {Reliability challenges for 2.5D/3D integration: An overview},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353609},
doi = {10.1109/IRPS.2018.8353609},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/PremachandranCC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PuschkarskyGAGR18,
author = {Katja Puschkarsky and
Tibor Grasser and
Thomas Aichinger and
Wolfgang Gustin and
Hans Reisinger},
title = {Understanding and modeling transient threshold voltage instabilities
in SiC MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353560},
doi = {10.1109/IRPS.2018.8353560},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PuschkarskyGAGR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PutchaFVKSLG18,
author = {Vamsi Putcha and
Jacopo Franco and
Abhitosh Vais and
Ben Kaczer and
S. Sioncke and
Dimitri Linten and
Guido Groeseneken},
title = {Impact of slow and fast oxide traps on In0.53Ga0.47As device operation
studied using {CET} maps},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353603},
doi = {10.1109/IRPS.2018.8353603},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PutchaFVKSLG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/QuCLLNFXCZ18,
author = {Yiming Qu and
Ran Cheng and
Wei Liu and
Junkang Li and
Bich{-}Yen Nguyen and
Olivier Faynot and
Nuo Xu and
Bing Chen and
Yi Zhao},
title = {Effect of measurement speed ({\(\mu\)}s-800 ps) on the characterization
of reliability behaviors for {FDSOI} nMOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353644},
doi = {10.1109/IRPS.2018.8353644},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/QuCLLNFXCZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/QuaxS18,
author = {Guido Quax and
Theo Smedes},
title = {An integral injector-victim current transfer model for latchup design
rule optimization},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353549},
doi = {10.1109/IRPS.2018.8353549},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/QuaxS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RafikNGAFD18,
author = {M. Rafik and
A. P. Nguyen and
Xavier Garros and
M. Arabi and
X. Federspiel and
Cheikh Diouf},
title = {{AC} {TDDB} extensive study for an enlargement of its impact and benefit
on circuit lifetime assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353576},
doi = {10.1109/IRPS.2018.8353576},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RafikNGAFD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RahmanDNLR18,
author = {Anisur Rahman and
Javier Dacu{\~{n}}a and
Pinakpani Nayak and
Gerald S. Leatherman and
Stephen Ramey},
title = {Reliability studies of a 10nm high-performance and low-power {CMOS}
technology featuring 3rd generation FinFET and 5th generation {HK/MG}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353648},
doi = {10.1109/IRPS.2018.8353648},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/RahmanDNLR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RameshRF18,
author = {Anapathur V. Ramesh and
Shilpa M. Reddy and
Dan K. Fitzsimmons},
title = {Airplane system design for reliability and quality},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353564},
doi = {10.1109/IRPS.2018.8353564},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/RameshRF18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RanjanROMBSP18,
author = {Alok Ranjan and
Nagarajan Raghavan and
Sean J. O'Shea and
Sen Mei and
Michel Bosman and
Kalya Shubhakar and
Kin Leong Pey},
title = {Mechanism of soft and hard breakdown in hexagonal boron nitride 2D
dielectrics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353574},
doi = {10.1109/IRPS.2018.8353574},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/RanjanROMBSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RenLWZYLSWZGWXH18,
author = {Pengpeng Ren and
Changze Liu and
Sanping Wan and
Jiayang Zhang and
Zhuoqing Yu and
Nie Liu and
Yongsheng Sun and
Runsheng Wang and
Canhui Zhan and
Zhenghao Gan and
Waisum Wong and
Yu Xia and
Ru Huang},
title = {New insights into the {HCI} degradation of pass-gate transistor in
advanced FinFET technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353656},
doi = {10.1109/IRPS.2018.8353656},
timestamp = {Mon, 03 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RenLWZYLSWZGWXH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RousselCDHLM18,
author = {Philippe J. Roussel and
Adrian Vaisman Chasin and
Steven Demuynck and
Naoto Horiguchi and
Dimitri Linten and
Anda Mocuta},
title = {New methodology for modelling {MOL} {TDDB} coping with variability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353555},
doi = {10.1109/IRPS.2018.8353555},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RousselCDHLM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RuzzarinMSMZSP18,
author = {Maria Ruzzarin and
Matteo Meneghini and
Carlo De Santi and
Gaudenzio Meneghesso and
Enrico Zanoni and
Min Sun and
Tom{\'{a}}s Palacios},
title = {Degradation of vertical GaN FETs under gate and drain stress},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353579},
doi = {10.1109/IRPS.2018.8353579},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RuzzarinMSMZSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SagongKCYSHJCPS18,
author = {Hyun{-}Chul Sagong and
Hyunjin Kim and
Seungjin Choo and
Sungyoung Yoon and
Hyewon Shim and
Sangsu Ha and
Tae{-}Young Jeong and
Minhyeok Choe and
Junekyun Park and
Sangchul Shin and
Sangwoo Pae},
title = {Effects of Far-BEOL anneal on the {WLR} and product reliability characterization
of FinFET process technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353649},
doi = {10.1109/IRPS.2018.8353649},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SagongKCYSHJCPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SantenDAMRCRFHN18,
author = {Victor M. van Santen and
Javier Diaz{-}Fortuny and
Hussam Amrouch and
Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Rosana Rodr{\'{\i}}guez and
Rafael Castro{-}L{\'{o}}pez and
Elisenda Roca and
Francisco V. Fern{\'{a}}ndez and
J{\"{o}}rg Henkel and
Montserrat Nafr{\'{\i}}a},
title = {Weighted time lag plot defect parameter extraction and GPU-based {BTI}
modeling for {BTI} variability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353659},
doi = {10.1109/IRPS.2018.8353659},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SantenDAMRCRFHN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SarkarPS18,
author = {Jay Sarkar and
Cory Peterson and
Amir Sanayei},
title = {Machine-learned assessment and prediction of robust solid state storage
system reliability physics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353565},
doi = {10.1109/IRPS.2018.8353565},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SarkarPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Sasse18,
author = {Guido T. Sasse},
title = {Hot carrier induced {TDDB} in {HV} {MOS:} Lifetime model and extrapolation
to use conditions},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353698},
doi = {10.1109/IRPS.2018.8353698},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Sasse18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SassineNTRLCHNV18,
author = {Gilbert Sassine and
Cecile Nail and
Luc Tillie and
Diego Alfaro Robayo and
Alexandre Levisse and
Carlo Cagli and
Khalil El Hajjam and
Jean{-}Francois Nodin and
Elisa Vianello and
Mathieu Bernard and
Gabriel Molas and
Etienne Nowak},
title = {Sub-pJ consumption and short latency time in {RRAM} arrays for high
endurance applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353675},
doi = {10.1109/IRPS.2018.8353675},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SassineNTRLCHNV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SaxenaMS18,
author = {Nirmal R. Saxena and
Sanu Mathew and
Krishna Saraswat},
title = {Keynote 1: The road to resilient computing in autonomous driving is
paved with redundancy},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1--3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353536},
doi = {10.1109/IRPS.2018.8353536},
timestamp = {Mon, 04 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SaxenaMS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SenzakiHYO18,
author = {Junji Senzaki and
Shohei Hayashi and
Yoshiyuki Yonezawa and
Hajime Okumura},
title = {Challenges to realize highly reliable SiC power devices: From the
current status and issues of SiC wafers},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353558},
doi = {10.1109/IRPS.2018.8353558},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SenzakiHYO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SeokKYLK18,
author = {Mingoo Seok and
Peter R. Kinget and
Teng Yang and
Jiangyi Li and
Doyun Kim},
title = {Recent advances in in-situ and in-field aging monitoring and compensation
for integrated circuits: Invited paper},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353612},
doi = {10.1109/IRPS.2018.8353612},
timestamp = {Wed, 29 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SeokKYLK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShahCHMAAKBSA18,
author = {Riddhi Jitendrakumar Shah and
Florian Cacho and
Vincent Huard and
Souhir Mhira and
D. Arora and
Pankaj Agarwal and
Shubham Kumar and
S. Balaraman and
Bijoy Kumar Singh and
Lorena Anghel},
title = {Investigation of speed sensors accuracy for process and aging compensation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353617},
doi = {10.1109/IRPS.2018.8353617},
timestamp = {Wed, 17 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShahCHMAAKBSA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShankarSGS18,
author = {Bhawani Shankar and
Ankit Soni and
Sayak Dutta Gupta and
Mayank Shrivastava},
title = {Safe Operating Area {(SOA)} reliability of Polarization Super Junction
{(PSJ)} GaN FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353595},
doi = {10.1109/IRPS.2018.8353595},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShankarSGS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShankarSGSKMRS18,
author = {Bhawani Shankar and
Ankit Soni and
Sayak Dutta Gupta and
R. Sengupta and
Heena Khand and
N. Mohan and
Srinivasan Raghavan and
Mayank Shrivastava},
title = {On the trap assisted stress induced safe operating area limits of
AlGaN/GaN HEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353596},
doi = {10.1109/IRPS.2018.8353596},
timestamp = {Thu, 26 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShankarSGSKMRS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShenYOCJ18,
author = {Tian Shen and
Kong Boon Yeap and
Sean P. Ogden and
Cathryn Christiansen and
Patrick Justison},
title = {New insight on {TDDB} area scaling methodology of non-Poisson systems},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353661},
doi = {10.1109/IRPS.2018.8353661},
timestamp = {Wed, 29 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShenYOCJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShinCAGWWBVKA18,
author = {SangHoon Shin and
Yen{-}Pu Chen and
Woojin Ahn and
Honglin Guo and
Byron Williams and
Jeff West and
Tom Bonifield and
Dhanoop Varghese and
Srikanth Krishnan and
Muhammad Ashraful Alam},
title = {High voltage time-dependent dielectric breakdown in stacked intermetal
dielectrics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {9--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353669},
doi = {10.1109/IRPS.2018.8353669},
timestamp = {Fri, 31 May 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShinCAGWWBVKA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SilvermanJ18,
author = {Timothy J. Silverman and
Steve Johnston},
title = {Permanent shunts from passing shadows: Reverse-bias damage in thin-film
photovoltaic modules},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353627},
doi = {10.1109/IRPS.2018.8353627},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SilvermanJ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SinghRMMZPPDSJB18,
author = {D. Singh and
Oscar D. Restrepo and
P. P. Manik and
N. Rao Mavilla and
H. Zhang and
Peter C. Paliwoda and
S. Pinkett and
Y. Deng and
Eduardo Cruz Silva and
Jeffrey B. Johnson and
M. Bajaj and
S. Furkay and
Z. Chbili and
A. Kerber and
C. Christiansen and
S. Narasimha and
E. Maciejewski and
S. Samavedam and
C.{-}H. Lin},
title = {Bottom-up methodology for predictive simulations of self-heating in
aggressively scaled process technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353650},
doi = {10.1109/IRPS.2018.8353650},
timestamp = {Thu, 11 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SinghRMMZPPDSJB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SinhaBSS18,
author = {Rajat Sinha and
Prasenjit Bhattacharya and
Sanjiv Sambandan and
Mayank Shrivastava},
title = {On the {ESD} behavior of a-Si: {H} based thin film transistors: Physical
insights, design and technological implications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353572},
doi = {10.1109/IRPS.2018.8353572},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SinhaBSS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SmitheZBPY18,
author = {Kirby K. H. Smithe and
Zhongwei Zhu and
Connor S. Bailey and
Eric Pop and
Alex Yoon},
title = {Investigation of monolayer {MX2} as sub-nanometer copper diffusion
barriers},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353681},
doi = {10.1109/IRPS.2018.8353681},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SmitheZBPY18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SrinivasanRCZKP18,
author = {P. Srinivasan and
Rakesh Ranjan and
S. Cimino and
A. Zainuddin and
B. Kannan and
L. Pantisano and
I. Mahmud and
G. Dilliway and
Tanya Nigam},
title = {Understanding gate metal work function (mWF) impact on device reliability
- {A} holistic approach},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353646},
doi = {10.1109/IRPS.2018.8353646},
timestamp = {Tue, 18 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SrinivasanRCZKP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StahbushM18,
author = {R. E. Stahbush and
Nadeemullah A. Mahadik},
title = {Defects affecting SiC power device reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353546},
doi = {10.1109/IRPS.2018.8353546},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/StahbushM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Stathis18,
author = {James H. Stathis},
title = {The physics of {NBTI:} What do we really know?},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353539},
doi = {10.1109/IRPS.2018.8353539},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/Stathis18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StellariWJRLS18,
author = {Franco Stellari and
Alan J. Weger and
Keith A. Jenkins and
Giuseppe La Rosa and
Barry P. Linder and
Peilin Song},
title = {Estimating transistor channel temperature using time-resolved and
time-integrated {NIR} emission},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353625},
doi = {10.1109/IRPS.2018.8353625},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/StellariWJRLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StockmanCTMMZMB18,
author = {Arno Stockman and
Eleonora Canato and
Alaleh Tajalli and
Matteo Meneghini and
Gaudenzio Meneghesso and
Enrico Zanoni and
Peter Moens and
Benoit Bakeroot},
title = {On the origin of the leakage current in p-gate AlGaN/GaN HEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353582},
doi = {10.1109/IRPS.2018.8353582},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/StockmanCTMMZMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SuAJKLLMPPPSSSW18,
author = {Chen{-}Yi Su and
M. Armstrong and
Lei Jiang and
S. A. Kumar and
C. D. Landon and
S. Liu and
Inanc Meric and
K. W. Park and
Leif Paulson and
K. Phoa and
Bernhard Sell and
Jihan Standfest and
Ketul B. Sutaria and
J. Wan and
D. Young and
Stephen Ramey},
title = {Transistor reliability characterization and modeling of the 22FFL
FinFET technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353652},
doi = {10.1109/IRPS.2018.8353652},
timestamp = {Thu, 31 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SuAJKLLMPPPSSSW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SuJWW18,
author = {P. C. Su and
C. M. Jiang and
C. W. Wang and
Tahui Wang},
title = {Correlation between SET-state current level and read-disturb failure
time in a resistive switching memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353674},
doi = {10.1109/IRPS.2018.8353674},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SuJWW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SugiyamaOSYKSOH18,
author = {Toru Sugiyama and
Kohei Oasa and
Yasunobu Saito and
Akira Yoshioka and
Takuo Kikuchi and
Aya Shindome and
Tatsuya Ohguro and
Takeshi Hamamoto},
title = {Evaluation methodology for current collapse phenomenon of GaN HEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353559},
doi = {10.1109/IRPS.2018.8353559},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SugiyamaOSYKSOH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SuzukiDNMT18,
author = {Shun Suzuki and
Yoshiaki Deguchi and
Toshiki Nakamura and
Kyoji Mizoguchi and
Ken Takeuchi},
title = {Error elimination {ECC} by horizontal error detection and vertical-LDPC
{ECC} to increase data-retention time by 230{\%} and acceptable bit-error
rate by 90{\%} for 3D-NAND flash SSDs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {7--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353680},
doi = {10.1109/IRPS.2018.8353680},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SuzukiDNMT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TatenoKYN18,
author = {Yasunori Tateno and
Yasuyo Kurachi and
Hiroshi Yamamoto and
Takashi Nakabayashi},
title = {Investigation of the pulsed-IV degradation mechanism of GaN-HEMT under
high temperature storage tests},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353705},
doi = {10.1109/IRPS.2018.8353705},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/TatenoKYN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TeramotoHSTHPS18,
author = {Akinobu Teramoto and
Keiichi Hashimoto and
Tomoyuki Suwa and
Jun{-}ichi Tsuchimoto and
Marie Hayashi and
Hyeonwoo Park and
Shigetoshi Sugawa},
title = {Reliability of MgO in magnetic tunnel junctions formed by MgO sputtering
and Mg oxidation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353664},
doi = {10.1109/IRPS.2018.8353664},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TeramotoHSTHPS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/UemuraLMMLLSP18,
author = {Taiki Uemura and
Soonyoung Lee and
Dahye Min and
Ihlhwa Moon and
Jungman Lim and
Seungbae Lee and
Hyun{-}Chul Sagong and
Sangwoo Pae},
title = {Investigation of alpha-induced single event transient {(SET)} in 10
nm FinFET logic circuit},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353689},
doi = {10.1109/IRPS.2018.8353689},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/UemuraLMMLLSP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandendaeleGLMT18,
author = {William Vandendaele and
Xavier Garros and
Thomas Lorin and
Erwan Morvan and
A. Torres and
Ren{\'{e}} Escoffier and
Marie{-}Anne Jaud and
Marc Plissonnier and
Fred Gaillard},
title = {A novel insight of pBTI degradation in GaN-on-Si E-mode MOSc-HEMT},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {4},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353580},
doi = {10.1109/IRPS.2018.8353580},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandendaeleGLMT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VerdyNBCCNGNBSC18,
author = {Anthonin Verdy and
Gabriele Navarro and
Mathieu Bernard and
Sophie Chevalliez and
Niccolo Castellani and
Emmanuel Nolot and
Julien Garrione and
Pierre Noe and
Guillaume Bourgeois and
Veronique Sousa and
Marie Claire Cyrille and
Etienne Nowak},
title = {Carbon electrode for Ge-Se-Sb based {OTS} selector for ultra low leakage
current and outstanding endurance},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353635},
doi = {10.1109/IRPS.2018.8353635},
timestamp = {Fri, 04 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/VerdyNBCCNGNBSC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WaltersCGNSRA18,
author = {Grant Walters and
Paul Chojecki and
Alexandra Garraud and
Toshikazu Nishida and
Scott R. Summerfelt and
J. A. Rodriguez and
A. G. Acosta},
title = {High-temperature and high-field cycling reliability of {PZT} films
embedded within 130 nm {CMOS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353676},
doi = {10.1109/IRPS.2018.8353676},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WaltersCGNSRA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WangSCS18,
author = {Miaomiao Wang and
Richard G. Southwick and
Kangguo Cheng and
James H. Stathis},
title = {Lateral profiling of {HCI} induced damage in ultra-scaled FinFET devices
with Id-Vd characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353639},
doi = {10.1109/IRPS.2018.8353639},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WangSCS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WeiMP18,
author = {Pengyu Wei and
Javad Meiguni and
David J. Pommerenke},
title = {System-level design for {ESD} protection on multiple {IO} interfaces},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353547},
doi = {10.1109/IRPS.2018.8353547},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WeiMP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuKLS18,
author = {Ernest Y. Wu and
Andrew Kim and
Baozhen Li and
James H. Stathis},
title = {Elapsed-time statistics of successive breakdown in the presence of
variability for dielectric breakdown in {BEOL/MOL/FEOL} applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353553},
doi = {10.1109/IRPS.2018.8353553},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/WuKLS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuPLLCTC18,
author = {Chen Wu and
O. Varela Pedreira and
Alicja Lesniewska and
Yunlong Li and
Ivan Ciofi and
Zsolt T{\"{o}}kei and
Kris Croes},
title = {Insights into metal drift induced failure in {MOL} and {BEOL}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353551},
doi = {10.1109/IRPS.2018.8353551},
timestamp = {Mon, 01 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuPLLCTC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiuSBMRR18,
author = {Yang Xiu and
Samuel Sagan and
Advika Battini and
Xiao Ma and
Maxim Raginsky and
Elyse Rosenbaum},
title = {Stochastic modeling of air electrostatic discharge parameters},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353548},
doi = {10.1109/IRPS.2018.8353548},
timestamp = {Fri, 10 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/XiuSBMRR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YamadaMFK18,
author = {Kodai Yamada and
Haruki Maruoka and
Jun Furuta and
Kazutoshi Kobayashi},
title = {Sensitivity to soft errors of {NMOS} and {PMOS} transistors evaluated
by latches with stacking structures in a 65 nm {FDSOI} process},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {3--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353691},
doi = {10.1109/IRPS.2018.8353691},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/YamadaMFK18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YamaguchiFKKINT18,
author = {Marina Yamaguchi and
Shosuke Fujii and
Yuuichi Kamimuta and
Shoichi Kabuyanagi and
Tsunehiro Ino and
Yasushi Nakasaki and
Riichiro Takaishi and
Reika Ichihara and
Masumi Saitoh},
title = {Impact of specific failure mechanisms on endurance improvement for
HfO2-based ferroelectric tunnel junction memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353633},
doi = {10.1109/IRPS.2018.8353633},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YamaguchiFKKINT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YangWHC18,
author = {Chih{-}Yi Yang and
Tian{-}Li Wu and
Tin{-}En Hsieh and
Edward Yi Chang},
title = {Investigation of degradation phenomena in GaN-on-Si power MIS-HEMTs
under source current and drain bias stresses},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353708},
doi = {10.1109/IRPS.2018.8353708},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YangWHC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YokogawaT18,
author = {Shinji Yokogawa and
Kazuki Tate},
title = {Reliability evaluation of defect accounted time-dependent dielectric
breakdown with competing-mixture distribution},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353662},
doi = {10.1109/IRPS.2018.8353662},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YokogawaT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YoshimuraOS18,
author = {Yoko Yoshimura and
Kensuke Ota and
Masumi Saitoh},
title = {Hot carrier degradation, TDDB, and 1/f noise in Poly-Si Tri-gate nanowire
transistor},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {5},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353606},
doi = {10.1109/IRPS.2018.8353606},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/YoshimuraOS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YunPLB18,
author = {Donghyuk Yun and
Myungsang Park and
Chul Seung Lim and
Sanghyeon Baeg},
title = {Study of {TID} effects on one row hammering using gamma in {DDR4}
SDRAMs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {2--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353690},
doi = {10.1109/IRPS.2018.8353690},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YunPLB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhangJELNMMB18,
author = {H. Zhang and
H. Jiang and
M. R. Eaker and
Kurt J. Lezon and
Balaji Narasimham and
Nihaar N. Mahatme and
Lloyd W. Massengill and
Bharat L. Bhuva},
title = {Evaluation on flip-flop physical unclonable functions in a 14/16-nm
bulk FinFET technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353682},
doi = {10.1109/IRPS.2018.8353682},
timestamp = {Tue, 19 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhangJELNMMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhouAKG18,
author = {Yu Zhou and
Diing Shenp Ang and
Pranav Sairam Kalaga and
Sankara Rao Gollu},
title = {Oxide breakdown path for optical sensing at the nanoscale level},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {8--1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353668},
doi = {10.1109/IRPS.2018.8353668},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ZhouAKG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhouJCV18,
author = {C. Zhou and
Keith A. Jenkins and
P. I. Chuang and
Christos Vezyrtzis},
title = {Effect of {HCI} degradation on the variability of {MOSFETS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353684},
doi = {10.1109/IRPS.2018.8353684},
timestamp = {Tue, 22 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ZhouJCV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhuHCZYZZMH18,
author = {Jiejie Zhu and
Bin Hou and
Lixiang Chen and
Qing Zhu and
Ling Yang and
Xiaowei Zhou and
Peng Zhang and
Xiaohua Ma and
Yue Hao},
title = {Threshold voltage shift and interface/border trapping mechanism in
Al2O3/AlGaN/GaN MOS-HEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
pages = {1},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/IRPS.2018.8353704},
doi = {10.1109/IRPS.2018.8353704},
timestamp = {Fri, 14 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhuHCZYZZMH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2018,
title = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
CA, USA, March 11-15, 2018},
publisher = {{IEEE}},
year = {2018},
url = {https://ieeexplore.ieee.org/xpl/conhome/8345372/proceeding},
isbn = {978-1-5386-5479-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/2018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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