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@inproceedings{DBLP:conf/vts/AbadirDNPV01,
author = {Magdy S. Abadir and
Scott Davidson and
Vijay Nagasamy and
Dhiraj K. Pradhan and
Prab Varma},
title = {{ATPG} for Design Errors-Is It Possible?},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {283--285},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10019},
doi = {10.1109/VTS.2001.10019},
timestamp = {Tue, 23 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbadirDNPV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AbadirZW01,
author = {Magdy S. Abadir and
Juhong Zhu and
Li{-}C. Wang},
title = {Analysis of Testing Methodologies for Custom Designs in PowerPCTM
Microprocessor},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {252--259},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923447},
doi = {10.1109/VTS.2001.923447},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AbadirZW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Al-HarbiG01,
author = {Sultan M. Al{-}Harbi and
Sandeep K. Gupta},
title = {An Efficient Methodology for Generating Optimal and Uniform March
Tests},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {231--239},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923444},
doi = {10.1109/VTS.2001.923444},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/Al-HarbiG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AmyeenFPB01,
author = {M. Enamul Amyeen and
W. Kent Fuchs and
Irith Pomeranz and
Vamsi Boppana},
title = {Fault Equivalence Identification Using Redundancy Information and
Static and Dynamic Extraction},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {124--130},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923428},
doi = {10.1109/VTS.2001.923428},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AmyeenFPB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AttarhaN01,
author = {Amir Attarha and
Mehrdad Nourani},
title = {Built-In-Chip Testing of Voltage Overshoots in High-Speed SoCs},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {111--116},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923426},
doi = {10.1109/VTS.2001.923426},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AttarhaN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AzaisBBMR01,
author = {Florence Aza{\"{\i}}s and
Serge Bernard and
Yves Bertrand and
Xavier Michel and
Michel Renovell},
title = {A Low-Cost Adaptive Ramp Generator for Analog {BIST} Applications},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {266--271},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923449},
doi = {10.1109/VTS.2001.923449},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AzaisBBMR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BaiD01,
author = {Xiaoliang Bai and
Sujit Dey},
title = {High-level Crosstalk Defect Simulation for System-on-Chip Interconnects},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {169--177},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923435},
doi = {10.1109/VTS.2001.923435},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BaiD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BarnettSN01,
author = {Thomas S. Barnett and
Adit D. Singh and
Victor P. Nelson},
title = {Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability
Model},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {326--332},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923457},
doi = {10.1109/VTS.2001.923457},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BarnettSN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Bhavsar01,
author = {Dilip K. Bhavsar},
title = {Scan Wheel - {A} Technique for Interfacing a High Speed Scan-Path
with a Slow Speed Tester},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {94--101},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923424},
doi = {10.1109/VTS.2001.923424},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Bhavsar01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BottomsCKSS01,
author = {Bill Bottoms and
Jim Chung and
Bernd Koenemann and
Glenn Shirley and
Lisa Spainhower},
title = {Guaranteeing Quality throughout the Product Life Cycle: On-Line Test
and Repair to the Rescue},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {153--154},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10020},
doi = {10.1109/VTS.2001.10020},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BottomsCKSS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BurekDKLMR01,
author = {Dwayne Burek and
Garen Darbinyan and
Rohit Kapur and
Maurice Lousberg and
Teresa L. McLaurin and
Mike Ricchetti},
title = {{IP} and Automation to Support {IEEE} {P1500}},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {411--412},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10016},
doi = {10.1109/VTS.2001.10016},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BurekDKLMR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChandraC01,
author = {Anshuman Chandra and
Krishnendu Chakrabarty},
title = {Frequency-Directed Run-Length {(FDR)} Codes with Application to System-on-a-Chip
Test Data Compression},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {42--47},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923416},
doi = {10.1109/VTS.2001.923416},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChandraC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangDRSSA01,
author = {Henry Chang and
Steve Dollens and
Gordon W. Roberts and
Charles E. Stroud and
Mani Soma and
Jacob A. Abraham},
title = {Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them?},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {415--416},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10001},
doi = {10.1109/VTS.2001.10001},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangDRSSA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangGB01,
author = {Yi{-}Shing Chang and
Sandeep K. Gupta and
Melvin A. Breuer},
title = {Test Generation for Maximizing Ground Bounce for Internal Circuitry
with Reconvergent Fan-out},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {358--367},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923463},
doi = {10.1109/VTS.2001.923463},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/ChangGB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/CharlotMPC01,
author = {Beno{\^{\i}}t Charlot and
Salvador Mir and
Fabien Parrain and
Bernard Courtois},
title = {Electrically Induced Stimuli For {MEMS} Self-Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {210--217},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923441},
doi = {10.1109/VTS.2001.923441},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/CharlotMPC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenMRKK01,
author = {John T. Chen and
Wojciech Maly and
Janusz Rajski and
Omar Kebichi and
Jitendra Khare},
title = {Enabling Embedded Memory Diagnosis via Test Response Compression},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {292--298},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923452},
doi = {10.1109/VTS.2001.923452},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenMRKK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenS01,
author = {Yue{-}Tsang Chen and
Chauchin Su},
title = {Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {260--265},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923448},
doi = {10.1109/VTS.2001.923448},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChengTW01,
author = {Kuo{-}Liang Cheng and
Ming{-}Fu Tsai and
Cheng{-}Wen Wu},
title = {Efficient Neighborhood Pattern-Sensitive Fault Test Algorithms for
Semiconductor Memories},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {225--230},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923443},
doi = {10.1109/VTS.2001.923443},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChengTW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChouS01,
author = {Richard M. Chou and
Kewal K. Saluja},
title = {Testable Sequential Circuit Design: {A} Partition and Resynthesis
Approach},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {62--67},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923419},
doi = {10.1109/VTS.2001.923419},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChouS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChungDGNTV01,
author = {Jim Chung and
N. Derhacobian and
Jean Gasiot and
Michael Nicolaidis and
David Towne and
Raoul Velazco},
title = {Soft Errors and Tolerance for Soft Errors},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {279--280},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10002},
doi = {10.1109/VTS.2001.10002},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChungDGNTV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DushinaBG01,
author = {Julia Dushina and
Mike Benjamin and
Daniel Geist},
title = {Semi-Formal Test Generation for a Block of Industrial {DSP}},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {131--137},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923429},
doi = {10.1109/VTS.2001.923429},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DushinaBG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/El-MalehKZ01,
author = {Aiman El{-}Maleh and
Esam Khan and
Saif al Zahir},
title = {A Geometric-Primitives-Based Compression Scheme for Testing Systems-on-a-Chip},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {54--61},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923418},
doi = {10.1109/VTS.2001.923418},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/El-MalehKZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GianiSHA01,
author = {Ashish Giani and
Shuo Sheng and
Michael S. Hsiao and
Vishwani D. Agrawal},
title = {Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip
Environment},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {163--168},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923434},
doi = {10.1109/VTS.2001.923434},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GianiSHA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GirardGLPW01,
author = {Patrick Girard and
Lo{\"{\i}}s Guiller and
Christian Landrault and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A Modified Clock Scheme for a Low Power {BIST} Test Pattern Generator},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {306--311},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923454},
doi = {10.1109/VTS.2001.923454},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GirardGLPW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GizdarskiF01,
author = {Emil Gizdarski and
Hideo Fujiwara},
title = {{SPIRIT:} {A} Highly Robust Combinational Test Generation Algorithm},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {346--351},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923461},
doi = {10.1109/VTS.2001.923461},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GizdarskiF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GyvezW01,
author = {Jos{\'{e}} Pineda de Gyvez and
Eric van de Wetering},
title = {Average Leakage Current Estimation of {CMOS} Logic Circuits},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {375--379},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923465},
doi = {10.1109/VTS.2001.923465},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GyvezW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HeraguSKB01,
author = {Keerthi Heragu and
Manish Sharma and
Rahul Kundu and
R. D. (Shawn) Blanton},
title = {Testing of Dynamic Logic Circuits Based on Charge Sharing},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {396--403},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923468},
doi = {10.1109/VTS.2001.923468},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HeraguSKB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Huang01,
author = {Shi{-}Yu Huang},
title = {On Improving the Accuracy Of Multiple Defect Diagnosis},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {34--41},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923415},
doi = {10.1109/VTS.2001.923415},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Huang01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HuangC01,
author = {Jiun{-}Lang Huang and
Kwang{-}Ting Cheng},
title = {An On-Chip Short-Time Interval Measurement Technique for Testing High-Speed
Communication Links},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {380--387},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923466},
doi = {10.1109/VTS.2001.923466},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HuangC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HuangIC01,
author = {Jing{-}Reng Huang and
Madhu K. Iyer and
Kwang{-}Ting Cheng},
title = {A Self-Test Methodology for {IP} Cores in Bus-Based Programmable SoCs},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {198--203},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923439},
doi = {10.1109/VTS.2001.923439},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HuangIC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/IyengarC01,
author = {Vikram Iyengar and
Krishnendu Chakrabarty},
title = {Precedence-Based, Preemptive, and Power-Constrained Test Scheduling
for System-on-a-Chip},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {368--374},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923464},
doi = {10.1109/VTS.2001.923464},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/IyengarC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JasKT01,
author = {Abhijit Jas and
C. V. Krishna and
Nur A. Touba},
title = {Hybrid {BIST} Based on Weighted Pseudo-Random Testing: {A} New Test
Resource Partitioning Scheme},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {2--8},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923409},
doi = {10.1109/VTS.2001.923409},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JasKT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KayM01,
author = {Douglas Kay and
Samiha Mourad},
title = {Compression Technique for Interactive {BIST} Application},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923411},
doi = {10.1109/VTS.2001.923411},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KayM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KhalilW01,
author = {Mohammad Athar Khalil and
Chin{-}Long Wey},
title = {High-Voltage Stress Test Paradigms of Analog {CMOS} ICs for Gate-Oxide
Reliability Enhancement},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {333--338},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923458},
doi = {10.1109/VTS.2001.923458},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KhalilW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LaiHC01,
author = {Wei{-}Cheng Lai and
Jing{-}Reng Huang and
Kwang{-}Ting (Tim) Cheng},
title = {Embedded-Software-Based Approach to Testing Crosstalk-Induced Faults
at On-Chip Buses},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {204--209},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923440},
doi = {10.1109/VTS.2001.923440},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LaiHC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LarrabeeC01,
author = {Tracy Larrabee and
Jon Colbum},
title = {Yield Optimization and Its Relation to Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {281--282},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10008},
doi = {10.1109/VTS.2001.10008},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LarrabeeC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiM01,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Diagnosis of Tunneling Opens},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {22--27},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923413},
doi = {10.1109/VTS.2001.923413},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MakrisPO01,
author = {Yiorgos Makris and
Vishal Patel and
Alex Orailoglu},
title = {Efficient Transparency Extraction and Utilization in Hierarchical
Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {246--251},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923446},
doi = {10.1109/VTS.2001.923446},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MakrisPO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraM01,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Design Diversity for Concurrent Error Detection in Sequential Logic
Circuts},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {178--183},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923436},
doi = {10.1109/VTS.2001.923436},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MitraM01a,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Design of Redundant Systems Protected Against Common-Mode Failures},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {190--197},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923438},
doi = {10.1109/VTS.2001.923438},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MitraM01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MohammadS01,
author = {Mohammad Gh. Mohammad and
Kewal K. Saluja},
title = {Flash Memory Disturbances: Modeling and Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {218--224},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923442},
doi = {10.1109/VTS.2001.923442},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MohammadS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MonteAPSTT01,
author = {Ginette Mont{\'{e}} and
Bernard Antaki and
Serge Patenaude and
Yvon Savaria and
Claude Thibeault and
Pieter M. Trouborst},
title = {Tools for the Characterization of Bipolar {CML} Testability},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {388--395},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923467},
doi = {10.1109/VTS.2001.923467},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MonteAPSTT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/MorozovGCB01,
author = {Andrej A. Morosov and
Michael G{\"{o}}ssel and
Krishnendu Chakrabarty and
Bhargab B. Bhattacharya},
title = {Design of Parameterizable Error-Propagating Space Compactors for Response
Observation},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {48--53},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923417},
doi = {10.1109/VTS.2001.923417},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/MorozovGCB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NiggemeyerR01,
author = {Dirk Niggemeyer and
Elizabeth M. Rudnick},
title = {Automatic Generation of Diagnostic March Tests},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {299--305},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923453},
doi = {10.1109/VTS.2001.923453},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NiggemeyerR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NummerS01,
author = {Muhammad Nummer and
Manoj Sachdev},
title = {A Methodology for Testing High-Performance Circuits at Arbitrarily
Low Test Frequency},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {68--74},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923420},
doi = {10.1109/VTS.2001.923420},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NummerS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ONeillRTVWW01,
author = {Pete O'Neill and
Ron Richmond and
Mike Tripp and
Barbara Vasquez and
Art Wager and
Zeev Weinberg},
title = {Reliability Beyond GHz},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {413--414},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10011},
doi = {10.1109/VTS.2001.10011},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ONeillRTVWW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/OckunzziP01,
author = {Kelly A. Ockunzzi and
Christos A. Papachristou},
title = {Breaking Correlation to Improve Testability},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {75--81},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923421},
doi = {10.1109/VTS.2001.923421},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/OckunzziP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PatelP01,
author = {Chintan Patel and
Jim Plusquellic},
title = {A Process and Technology-Tolerant {IDDQ} Method for {IC} Diagnosis},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {145--152},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923431},
doi = {10.1109/VTS.2001.923431},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PatelP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PaulRASHS01,
author = {Ivan de Pa{\'{u}}l and
M. Rosales and
Bartomeu Alorda and
Jaume Segura and
Charles F. Hawkins and
Jerry M. Soden},
title = {Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge
Analysis: Theory and Experiments},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {286--291},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923451},
doi = {10.1109/VTS.2001.923451},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PaulRASHS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PeraliasHRH01,
author = {Eduardo J. Peral{\'{\i}}as and
Gloria Huertas and
Adoraci{\'{o}}n Rueda and
Jos{\'{e}} L. Huertas},
title = {Self-Testable Pipelined {ADC} with Low Hardware Overhead},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {272--278},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923450},
doi = {10.1109/VTS.2001.923450},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PeraliasHRH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PolianB01,
author = {Ilia Polian and
Bernd Becker},
title = {Multiple Scan Chain Design for Two-Pattern Testing},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {88--93},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923423},
doi = {10.1109/VTS.2001.923423},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PolianB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PomeranzR01,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {On the Use of Fault Dominance in n-Detection Test Generation},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {352--357},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923462},
doi = {10.1109/VTS.2001.923462},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PomeranzR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PsarakisPKGZ01,
author = {Mihalis Psarakis and
Antonis M. Paschalis and
Nektarios Kranitis and
Dimitris Gizopoulos and
Yervant Zorian},
title = {Robust and Low-Cost {BIST} Architectures for Sequential Fault Testing
in Datapath Multipliers},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {15--21},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923412},
doi = {10.1109/VTS.2001.923412},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PsarakisPKGZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Rodgers01,
author = {Mike Rodgers},
title = {{ITRS} Test Chapter 2001: We'll Tell You What We're Doing, You Tell
Us What We Should Be Doing},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {155--157},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.ieeecomputersociety.org/10.1109/VTS.2001.10000},
doi = {10.1109/VTS.2001.10000},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Rodgers01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SankaralingamTP01,
author = {Ranganathan Sankaralingam and
Nur A. Touba and
Bahram Pouya},
title = {Reducing Power Dissipation during Test Using Scan Chain Disable},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {319--325},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923456},
doi = {10.1109/VTS.2001.923456},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SankaralingamTP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SchueleS01,
author = {Tobias Sch{\"{u}}le and
Albrecht P. Stroele},
title = {Test Scheduling for Minimal Energy Consumption under Power Constraints},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {312--318},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923455},
doi = {10.1109/VTS.2001.923455},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SchueleS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SinanogluO01,
author = {Ozgur Sinanoglu and
Alex Orailoglu},
title = {RT-level Fault Simulation Based on Symbolic Propagation},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {240--245},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923445},
doi = {10.1109/VTS.2001.923445},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SinanogluO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SogomonyanMRGS01,
author = {Egor S. Sogomonyan and
Andrej A. Morosov and
Jan Rzeha and
Michael G{\"{o}}ssel and
Adit D. Singh},
title = {Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed
Debugging},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {184--189},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923437},
doi = {10.1109/VTS.2001.923437},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SogomonyanMRGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SunV01,
author = {Xiaoyun Sun and
Bapiraju Vinnakota},
title = {Current Measurement for Dynamic Idd Test},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {117--123},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923427},
doi = {10.1109/VTS.2001.923427},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SunV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TanL01,
author = {Tek Jau Tan and
Chung{-}Len Lee},
title = {Socillator Test: {A} Delay Test Scheme for Embedded ICs in the Boundary-Scan
Environment},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {158--162},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923433},
doi = {10.1109/VTS.2001.923433},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TanL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TekumallaVG01,
author = {Ramesh C. Tekumalla and
Srikanth Venkataraman and
Jayabrata Ghosh{-}Dastidar},
title = {On Diagnosing Path Delay Faults in an At-Speed Environment},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {28--33},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923414},
doi = {10.1109/VTS.2001.923414},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TekumallaVG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengCMN01,
author = {Chao{-}Wen Tseng and
Ray Chen and
Edward J. McCluskey and
Phil Nigh},
title = {{MINVDD} Testing for Weak {CMOS} ICs},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {339--345},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923459},
doi = {10.1109/VTS.2001.923459},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengCMN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TsengMMD01,
author = {Chao{-}Wen Tseng and
Subhasish Mitra and
Edward J. McCluskey and
Scott Davidson},
title = {An Evaluation of Pseudo Random Testing for Detecting Real Defects},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {404--410},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923469},
doi = {10.1109/VTS.2001.923469},
timestamp = {Sat, 16 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/TsengMMD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/XiangX01,
author = {Dong Xiang and
Yi Xu},
title = {Partial Reset for Synchronous Sequential Circuits Using Almost Independent
Reset Signals},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {82--87},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923422},
doi = {10.1109/VTS.2001.923422},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/XiangX01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YamaguchiISHRN01,
author = {Takahiro J. Yamaguchi and
Masahiro Ishida and
Mani Soma and
David Halter and
Rajesh Raina and
Jim Nissen},
title = {A Method for Measuring the Cycle-to-Cycle Period Jitter of High-Frequency
Clock Signals},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {102--110},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923425},
doi = {10.1109/VTS.2001.923425},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/YamaguchiISHRN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ZentenoC01,
author = {Antonio Zenteno and
V{\'{\i}}ctor H. Champac},
title = {Resistive Opens in a Class of {CMOS} Latches: Analysis and {DFT}},
booktitle = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
pages = {138--144},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://doi.org/10.1109/VTS.2001.923430},
doi = {10.1109/VTS.2001.923430},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ZentenoC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2001,
title = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
{USA}},
publisher = {{IEEE} Computer Society},
year = {2001},
url = {https://ieeexplore.ieee.org/xpl/conhome/7354/proceeding},
isbn = {0-7695-1122-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/2001.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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