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@article{DBLP:journals/et/Agrawal12,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {1},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5285-4},
doi = {10.1007/S10836-012-5285-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal12a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {151--152},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5296-1},
doi = {10.1007/S10836-012-5296-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal12b,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {263--264},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5307-2},
doi = {10.1007/S10836-012-5307-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal12c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {389--390},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5319-y},
doi = {10.1007/S10836-012-5319-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal12d,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {551--552},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5331-2},
doi = {10.1007/S10836-012-5331-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal12e,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {773--774},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5341-0},
doi = {10.1007/S10836-012-5341-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal12e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AhmedWUA12,
author = {Badar{-}ud{-}din Ahmed and
Youren Wang and
Rizwan Ullah and
Najam{-}ud{-}din Ahmed},
title = {A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault
Detection},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {535--540},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5311-6},
doi = {10.1007/S10836-012-5311-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AhmedWUA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AyadiMM12,
author = {R. M. Ayadi and
S. Mahresi and
M. Masmoudi},
title = {Self-Calibration of Output Match and Reverse Isolation in LNAs Based
Switchable Resistor},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {167--176},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5283-6},
doi = {10.1007/S10836-012-5283-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AyadiMM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BackesMSWG12,
author = {Benjamin Backes and
Colin McDonough and
Larry Smith and
Wei Wang and
Robert E. Geer},
title = {Effects of Copper Plasticity on the Induction of Stress in Silicon
from Copper Through-Silicon Vias (TSVs) for 3D Integrated Circuits},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {53--62},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5242-7},
doi = {10.1007/S10836-011-5242-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BackesMSWG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BenficaPVLLGH12,
author = {Juliano Benfica and
Let{\'{\i}}cia Maria Bolzani Poehls and
Fabian Vargas and
Jos{\'{e}} Lipovetzky and
Ariel Lutenberg and
Edmundo Gatti and
Fernando Hernandez},
title = {A Test Platform for Dependability Analysis of SoCs Exposed to {EMI}
and Radiation},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {803--816},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5334-z},
doi = {10.1007/S10836-012-5334-Z},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BenficaPVLLGH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BombieriFG12,
author = {Nicola Bombieri and
Franco Fummi and
Valerio Guarnieri},
title = {{FAST:} An {RTL} Fault Simulation Framework based on RTL-to-TLM Abstraction},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {495--510},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5318-z},
doi = {10.1007/S10836-012-5318-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BombieriFG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BoyerDLLV12,
author = {Alexandre Boyer and
Sonia Ben Dhia and
Binhong Li and
Christophe Lemoine and
Bertrand Vrignon},
title = {Prediction of Long-term Immunity of a Phase-Locked Loop},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {791--802},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5335-y},
doi = {10.1007/S10836-012-5335-Y},
timestamp = {Mon, 20 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/BoyerDLLV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ButtrickK12,
author = {Michael Buttrick and
Sandip Kundu},
title = {On Testing Prebond Dies with Incomplete Clock Networks in a 3D {IC}
Using DLLs},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {93--101},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5262-3},
doi = {10.1007/S10836-011-5262-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ButtrickK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Castellani-CoulieAMP12,
author = {Karine Castellani{-}Couli{\'{e}} and
Hassen Aziza and
Gilles Micolau and
Jean{-}Michel Portal},
title = {Optimization of {SEU} Simulations for {SRAM} Cells Reliability under
Radiation},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {331--338},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5281-8},
doi = {10.1007/S10836-012-5281-8},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/Castellani-CoulieAMP12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChakrabortyA12,
author = {Kanad Chakraborty and
Vishwani D. Agrawal},
title = {Data-Driven {DPPM} Estimation and Adaptive Fault Coverage Calibration
Using MATLAB{\textregistered}},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {869--875},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5332-1},
doi = {10.1007/S10836-012-5332-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChakrabortyA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChangK12,
author = {Hsiu{-}Ming (Sherman) Chang and
David C. Keezer},
title = {Guest Editorial: Special Issue on Analog, Mixed-Signal, RF, and {MEMS}
Testing},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {555--556},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5330-3},
doi = {10.1007/S10836-012-5330-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChangK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChenMW12,
author = {Xiaomei Chen and
Xiaofeng Meng and
Guohua Wang},
title = {A Modified Simulation-Based Multi-Signal Modeling for Electronic System},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {155--165},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5273-0},
doi = {10.1007/S10836-011-5273-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChenMW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DalirsaniHEW12,
author = {Atefe Dalirsani and
Stefan Holst and
Melanie Elm and
Hans{-}Joachim Wunderlich},
title = {Structural Test and Diagnosis for Graceful Degradation of NoC Switches},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {831--841},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5329-9},
doi = {10.1007/S10836-012-5329-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DalirsaniHEW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DasnurkarA12,
author = {Sachin Dileep Dasnurkar and
Jacob A. Abraham},
title = {Calibration Enabled Scalable Current Sensor Module for Quiescent Current
Testing},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {697--704},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5327-y},
doi = {10.1007/S10836-012-5327-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DasnurkarA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DhiaBVD12,
author = {Sonia Ben Dhia and
Alexandre Boyer and
Bertrand Vrignon and
Mika{\"{e}}l Deobarro},
title = {{IC} Immunity Modeling Process Validation Using On-Chip Measurements},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {339--348},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5294-3},
doi = {10.1007/S10836-012-5294-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DhiaBVD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DuanVZCG12,
author = {Jingbo Duan and
Bharath K. Vasan and
Chen Zhao and
Degang Chen and
Randall L. Geiger},
title = {On Chip Signal Generators for Low Overhead {ADC} {BIST}},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {615--623},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5320-5},
doi = {10.1007/S10836-012-5320-5},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DuanVZCG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FerriPBC12,
author = {Cesare Ferri and
Dimitra Papagiannopoulou and
R. Iris Bahar and
Andrea Calimera},
title = {NBTI-Aware Data Allocation Strategies for Scratchpad Based Embedded
Systems},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {349--363},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5295-2},
doi = {10.1007/S10836-012-5295-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FerriPBC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FonsecaDBGPVB12,
author = {Renan Alves Fonseca and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Nabil Badereddine},
title = {Impact of Resistive-Bridging Defects in {SRAM} at Different Technology
Nodes},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {317--329},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5291-6},
doi = {10.1007/S10836-012-5291-6},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/FonsecaDBGPVB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FreijedoSRVTT12,
author = {Judit Freijedo and
Jorge Semi{\~{a}}o and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Fabian Vargas and
Isabel C. Teixeira and
Jo{\~{a}}o Paulo Teixeira},
title = {Modeling the Effect of Process, Power-Supply Voltage and Temperature
Variations on the Timing Response of Nanometer Digital Circuits},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {421--434},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5297-0},
doi = {10.1007/S10836-012-5297-0},
timestamp = {Fri, 30 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FreijedoSRVTT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GomezAM12,
author = {Didac G{\'{o}}mez and
Josep Altet and
Diego Mateo},
title = {On the Use of Static Temperature Measurements as Process Variation
Observable},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {685--695},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5298-z},
doi = {10.1007/S10836-012-5298-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GomezAM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GrossoHSRTM12,
author = {Michelangelo Grosso and
Wilson{-}Javier P{\'{e}}rez{-}Holgu{\'{\i}}n and
Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda and
Alberto Paolo Tonda and
Jaime Velasco{-}Medina},
title = {Software-Based Testing for System Peripherals},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {189--200},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5287-2},
doi = {10.1007/S10836-012-5287-2},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/GrossoHSRTM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuarnieriGBPFHRJU12,
author = {Valerio Guarnieri and
Giuseppe Di Guglielmo and
Nicola Bombieri and
Graziano Pravadelli and
Franco Fummi and
Hanno Hantson and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar},
title = {On the Reuse of {TLM} Mutation Analysis at {RTL}},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {435--448},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5303-6},
doi = {10.1007/S10836-012-5303-6},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/GuarnieriGBPFHRJU12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HannuHVJM12,
author = {Jari Hannu and
Juha H{\"{a}}kkinen and
Juha{-}Veikko Voutilainen and
Heli Jantunen and
Markku Moilanen},
title = {Current State of the Mixed-Signal Test Bus 1149.4},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {857--863},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5339-7},
doi = {10.1007/S10836-012-5339-7},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HannuHVJM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HazraGDC12,
author = {Aritra Hazra and
Priyankar Ghosh and
Pallab Dasgupta and
Partha Pratim Chakrabarti},
title = {Cohesive Coverage Management: Simulation Meets Formal Methods},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {449--468},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5308-1},
doi = {10.1007/S10836-012-5308-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HazraGDC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuangHCCKHCK12,
author = {Xuan{-}Lun Huang and
Jiun{-}Lang Huang and
Hung{-}I Chen and
Chang{-}Yu Chen and
Tseng Kuo{-}Tsai and
Ming{-}Feng Huang and
Yung{-}Fa Chou and
Ding{-}Ming Kwai},
title = {An MCT-Based Bit-Weight Extraction Technique for Embedded {SAR} {ADC}
Testing and Calibration},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {705--722},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5325-0},
doi = {10.1007/S10836-012-5325-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HuangHCCKHCK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HungH12,
author = {Shao{-}Feng Hung and
Hao{-}Chiao Hong},
title = {Experimental Results of Testing a {BIST} {\(\Sigma\)}-{\(\Delta\)}
{ADC} on the {HOY} Wireless Test Platform},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {571--584},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5302-7},
doi = {10.1007/S10836-012-5302-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HungH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/IzosimovGLPFPF12,
author = {Viacheslav Izosimov and
Giuseppe Di Guglielmo and
Michele Lora and
Graziano Pravadelli and
Franco Fummi and
Zebo Peng and
Masahiro Fujita},
title = {Time-Constraint-Aware Optimization of Assertions in Embedded Software},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {469--486},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5316-1},
doi = {10.1007/S10836-012-5316-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/IzosimovGLPFPF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KannanKA12,
author = {Sukeshwar Kannan and
Bruce C. Kim and
Byoungchul Ahn},
title = {Fault Modeling and Multi-Tone Dither Scheme for Testing 3D {TSV} Defects},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {39--51},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5263-2},
doi = {10.1007/S10836-011-5263-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KannanKA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KavithamaniMD12,
author = {Ashok Kavithamani and
Venugopal Manikandan and
Nanjundappan Devarajan},
title = {Fault Detection of Analog Circuits Using Network Parameters},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {257--261},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5284-5},
doi = {10.1007/S10836-012-5284-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KavithamaniMD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KimA12,
author = {Hyunjin Kim and
Jacob A. Abraham},
title = {A Built-in Self-Test Scheme for Memory Interfaces Timing Test and
Measurement},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {585--597},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5324-1},
doi = {10.1007/S10836-012-5324-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KimA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KulovicM12,
author = {Kemal Kulovic and
Martin Margala},
title = {Time-Based Embedded Test Instrument with Concurrent Voltage Measurement
Capability},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {653--671},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5299-y},
doi = {10.1007/S10836-012-5299-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KulovicM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LongTW12,
author = {Bing Long and
Shulin Tian and
Houjun Wang},
title = {Diagnostics of Filtered Analog Circuits with Tolerance Based on {LS-SVM}
Using Frequency Features},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {291--300},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5275-y},
doi = {10.1007/S10836-011-5275-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LongTW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LongTW12a,
author = {Bing Long and
Shulin Tian and
Houjun Wang},
title = {Feature Vector Selection Method Using Mahalanobis Distance for Diagnostics
of Analog Circuits Based on {LS-SVM}},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {745--755},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5301-8},
doi = {10.1007/S10836-012-5301-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LongTW12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LouYZF12,
author = {Yi Lou and
Zhuo Yan and
Fan Zhang and
Paul D. Franzon},
title = {Comparing Through-Silicon-Via {(TSV)} Void/Pinhole Defect Self-Test
Methods},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {27--38},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5261-4},
doi = {10.1007/S10836-011-5261-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LouYZF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LuoWLJ12,
author = {Hui Luo and
Youren Wang and
Hua Lin and
Yuanyuan Jiang},
title = {A New Optimal Test Node Selection Method for Analog Circuit},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {279--290},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5274-z},
doi = {10.1007/S10836-011-5274-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LuoWLJ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaTG12,
author = {Junxia Ma and
Mohammad Tehranipoor and
Patrick Girard},
title = {A Layout-Aware Pattern Grading Procedure for Critical Paths Considering
Power Supply Noise and Crosstalk},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {201--214},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5268-x},
doi = {10.1007/S10836-011-5268-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaTG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaltabasKM12,
author = {Samed Maltabas and
Kemal Kulovic and
Martin Margala},
title = {Novel Practical Built-in Current Sensors},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {673--683},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5313-4},
doi = {10.1007/S10836-012-5313-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaltabasKM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MarinissenCKV12,
author = {Erik Jan Marinissen and
Chun{-}Chuan Chi and
Mario Konijnenburg and
Jouke Verbree},
title = {A DfT Architecture for 3D-SICs Based on a Standardizable Die Wrapper},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {73--92},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5269-9},
doi = {10.1007/S10836-011-5269-9},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/MarinissenCKV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MarinissenZ12,
author = {Erik Jan Marinissen and
Yervant Zorian},
title = {Guest Editorial: Special Issue on Testing of 3D Stacked Integrated
Circuits},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {13--14},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5279-2},
doi = {10.1007/S10836-012-5279-2},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/MarinissenZ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaurouxVBDGPGFV12,
author = {Pierre{-}Didier Mauroux and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Beno{\^{\i}}t Godard and
Gilles Festes and
Laurent Vachez},
title = {Analysis and Fault Modeling of Actual Resistive Defects in {ATMEL}
TSTAC\({}^{\mbox{TM}}\) eFlash Memories},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {215--228},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5277-4},
doi = {10.1007/S10836-012-5277-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaurouxVBDGPGFV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MrozekY12,
author = {Ireneusz Mrozek and
Vyacheslav N. Yarmolik},
title = {Iterative Antirandom Testing},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {301--315},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5272-1},
doi = {10.1007/S10836-011-5272-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MrozekY12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NaingWBHPBGL12,
author = {Mozar Naing and
Dallas Webster and
Nolan Blue and
Rick Hudgens and
Zahir Parkar and
Sumeer Bhatara and
Pankaj Gupta and
Donald Y. C. Lie},
title = {Maximizing Parallel Testing in an {FM} Receiver},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {723--731},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5323-2},
doi = {10.1007/S10836-012-5323-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NaingWBHPBGL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NeophytouCM12,
author = {Stelios Neophytou and
Kyriakos Christou and
Maria K. Michael},
title = {A Non-Enumerative Technique for Measuring Path Correlation in Digital
Circuits},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {843--856},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5333-0},
doi = {10.1007/S10836-012-5333-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NeophytouCM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NoiaCM12,
author = {Brandon Noia and
Krishnendu Chakrabarty and
Erik Jan Marinissen},
title = {Optimization Methods for Post-Bond Testing of 3D Stacked ICs},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {103--120},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5233-8},
doi = {10.1007/S10836-011-5233-8},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/NoiaCM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PascaAB12,
author = {Vladimir Pasca and
Lorena Anghel and
Mounir Benabdenbi},
title = {Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In
Self-Test and Diagnosis},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {817--829},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5322-3},
doi = {10.1007/S10836-012-5322-3},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PascaAB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PascaANB12,
author = {Vladimir Pasca and
Lorena Anghel and
Michael Nicolaidis and
Mounir Benabdenbi},
title = {{CSL:} Configurable Fault Tolerant Serial Links for Inter-die Communication
in 3D Systems},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {137--150},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5260-5},
doi = {10.1007/S10836-011-5260-5},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PascaANB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Portela-GarciaLEGLMPPV12,
author = {Marta Portela{-}Garc{\'{\i}}a and
Almudena Lindoso and
Luis Entrena and
Mario Garc{\'{\i}}a{-}Valderas and
Celia L{\'{o}}pez{-}Ongil and
N. Marroni and
Bernardo Pianta and
Let{\'{\i}}cia Maria Bolzani Poehls and
Fabian Vargas},
title = {Evaluating the Effectiveness of a Software-Based Technique Under SEEs
Using FPGA-Based Fault Injection Approach},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {777--789},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5321-4},
doi = {10.1007/S10836-012-5321-4},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Portela-GarciaLEGLMPPV12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenFCWWVWB12,
author = {Yi Ren and
L. Fan and
Li Chen and
Shi{-}Jie Wen and
Richard Wong and
N. W. van Vonno and
Arthur F. Witulski and
Bharat L. Bhuva},
title = {Single-Event Effects Analysis of a Pulse Width Modulator {IC} in a
{DC/DC} Converter},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {877--883},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5338-8},
doi = {10.1007/S10836-012-5338-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenFCWWVWB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RuizFGM12,
author = {Jose Mar{\'{\i}}a Ru{\'{\i}}z and
Ra{\'{u}}l Fern{\'{a}}ndez{-}Garc{\'{\i}}a and
Ignacio Gil and
Marta Morata},
title = {Current Consumption and Power Integrity of {CMOS} Digital Circuits
Under {NBTI} Wearout},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {865--868},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5337-9},
doi = {10.1007/S10836-012-5337-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RuizFGM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SarrafKSC12,
author = {Elie H. Sarraf and
Ankit Kansal and
Mrigank Sharma and
Edmond Cretu},
title = {FPGA-based Novel Adaptive Scheme Using {PN} Sequences for Self-Calibration
and Self-Testing of MEMS-based Inertial Sensors},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {599--614},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5336-x},
doi = {10.1007/S10836-012-5336-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SarrafKSC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SenBNDCC12,
author = {Shreyas Sen and
Aritra Banerjee and
Vishwanath Natarajan and
Shyam Kumar Devarakond and
Hyun Woo Choi and
Abhijit Chatterjee},
title = {BIST/Digital-Compatible Testing of {RF} Devices Using Distortion Model
Fitting},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {405--419},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5304-5},
doi = {10.1007/S10836-012-5304-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SenBNDCC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SenGuptaIL12,
author = {Breeta SenGupta and
Urban Ingelsson and
Erik Larsson},
title = {Scheduling Tests for 3D Stacked Chips under Power Constraints},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {121--135},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5244-5},
doi = {10.1007/S10836-011-5244-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SenGuptaIL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShengKZG12,
author = {Xiaoqin Sheng and
Hans G. Kerkhoff and
Amir Zjajo and
Guido Gronthoud},
title = {{ADC} Multi-Site Test Based on a Pre-test with Digital Input Stimulus},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {393--404},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5309-0},
doi = {10.1007/S10836-012-5309-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ShengKZG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShukoorA12,
author = {Mohammed Ashfaq Shukoor and
Vishwani D. Agrawal},
title = {Diagnostic Test Set Minimization and Full-Response Fault Dictionary},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {177--187},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5286-3},
doi = {10.1007/S10836-012-5286-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ShukoorA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SindiaAS12,
author = {Suraj Sindia and
Vishwani D. Agrawal and
Virendra Singh},
title = {Defect Level and Fault Coverage in Coefficient Based Analog Circuit
Testing},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {541--549},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5305-4},
doi = {10.1007/S10836-012-5305-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SindiaAS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SindiaAS12a,
author = {Suraj Sindia and
Vishwani D. Agrawal and
Virendra Singh},
title = {Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial
and V-Transform Coefficients},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {757--771},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5326-z},
doi = {10.1007/S10836-012-5326-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SindiaAS12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SukharevKCHMZH12,
author = {Valeriy Sukharev and
Armen Kteyan and
Jun{-}Ho Choy and
Henrik Hovsepyan and
Ara Markosian and
Ehrenfried Zschech and
Rene Huebner},
title = {Multi-scale Simulation Methodology for Stress Assessment in 3D {IC:}
Effect of Die Stacking on Device Performance},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {63--72},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5259-y},
doi = {10.1007/S10836-011-5259-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SukharevKCHMZH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TadeusiewiczH12,
author = {Michal Tadeusiewicz and
Stanislaw Halgas},
title = {Multiple Soft Fault Diagnosis of Nonlinear Circuits Using the Continuation
Method},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {487--493},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5306-3},
doi = {10.1007/S10836-012-5306-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TadeusiewiczH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TaouilH12,
author = {Mottaqiallah Taouil and
Said Hamdioui},
title = {Yield Improvement for 3D Wafer-to-Wafer Stacked Memories},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {523--534},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5314-3},
doi = {10.1007/S10836-012-5314-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TaouilH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TaouilHBM12,
author = {Mottaqiallah Taouil and
Said Hamdioui and
Kees Beenakker and
Erik Jan Marinissen},
title = {Test Impact on the Overall Die-to-Wafer 3D Stacked {IC} Cost},
journal = {J. Electron. Test.},
volume = {28},
number = {1},
pages = {15--25},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5270-3},
doi = {10.1007/S10836-011-5270-3},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/TaouilHBM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ThibeaultHH12,
author = {Claude Thibeault and
Yassine Hariri and
Christelle Hobeika},
title = {Tester Memory Requirements and Test Application Time Reduction for
Delay Faults with Digital Captureless Test Sensors},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {229--242},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5271-2},
doi = {10.1007/S10836-011-5271-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ThibeaultHH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Ting12,
author = {Hsin{-}Wen Ting},
title = {Digital-Compatible Testing Scheme for Operational Amplifier},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {267--277},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5290-7},
doi = {10.1007/S10836-012-5290-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Ting12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TsaiAR12,
author = {Tsung{-}Yen Tsai and
Sadok Aouini and
Gordon W. Roberts},
title = {High Speed On-Chip Signal Generation for Debug and Diagnosis},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {625--640},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5289-0},
doi = {10.1007/S10836-012-5289-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TsaiAR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ViilukasKRJUF12,
author = {Taavi Viilukas and
Anton Karputkin and
Jaan Raik and
Maksim Jenihhin and
Raimund Ubar and
Hideo Fujiwara},
title = {Identifying Untestable Faults in Sequential Circuits Using Test Path
Constraints},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {511--521},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5312-5},
doi = {10.1007/S10836-012-5312-5},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ViilukasKRJUF12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VockETO12,
author = {Stefan R. Vock and
Omar Escalona and
Colin Turner and
Frank J. Owens},
title = {Challenges for Semiconductor Test Engineering: {A} Review Paper},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {365--374},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5276-x},
doi = {10.1007/S10836-011-5276-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VockETO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WakabayashiKYKKAN12,
author = {Kazuyuki Wakabayashi and
Keisuke Kato and
Takafumi Yamada and
Osamu Kobayashi and
Haruo Kobayashi and
Fumitaka Abe and
Kiichi Niitsu},
title = {Low-Distortion Sinewave Generation Method Using Arbitrary Waveform
Generator},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {641--651},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5293-4},
doi = {10.1007/S10836-012-5293-4},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/WakabayashiKYKKAN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WuCD12,
author = {Minshun Wu and
Degang Chen and
Jingbo Duan},
title = {An Accurate and Cost-Effective Jitter Measurement Technique Using
a Single Test Frequency},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {733--743},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5310-7},
doi = {10.1007/S10836-012-5310-7},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WuCD12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X12,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {153--154},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5288-1},
doi = {10.1007/S10836-012-5288-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X12a,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {265--266},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5300-9},
doi = {10.1007/S10836-012-5300-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X12b,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {28},
number = {4},
pages = {391--392},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5317-0},
doi = {10.1007/S10836-012-5317-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X12b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X12c,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {553--554},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5328-x},
doi = {10.1007/S10836-012-5328-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X12c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X12d,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {28},
number = {6},
pages = {775--776},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5340-1},
doi = {10.1007/S10836-012-5340-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X12d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YiH12,
author = {Joonhwan Yi and
John P. Hayes},
title = {Robust Coupling Delay Test Sets},
journal = {J. Electron. Test.},
volume = {28},
number = {3},
pages = {375--388},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5292-5},
doi = {10.1007/S10836-012-5292-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YiH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangGA12,
author = {Chaoming Zhang and
Ranjit Gharpurey and
Jacob A. Abraham},
title = {Built-in Self Test of {RF} Subsystems with Integrated Detectors},
journal = {J. Electron. Test.},
volume = {28},
number = {5},
pages = {557--569},
year = {2012},
url = {https://doi.org/10.1007/s10836-012-5315-2},
doi = {10.1007/S10836-012-5315-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangGA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhaoCB12,
author = {Yang Zhao and
Krishnendu Chakrabarty and
Bhargab B. Bhattacharya},
title = {Testing of Low-cost Digital Microfluidic Biochips with Non-Regular
Array Layouts},
journal = {J. Electron. Test.},
volume = {28},
number = {2},
pages = {243--255},
year = {2012},
url = {https://doi.org/10.1007/s10836-011-5266-z},
doi = {10.1007/S10836-011-5266-Z},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ZhaoCB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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