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@article{DBLP:journals/et/AghaeiKRB17,
author = {Babak Aghaei and
Ahmad Khademzadeh and
Midia Reshadi and
Kambiz Badie},
title = {Link Testing: a Survey of Current Trends in Network on Chip},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {209--225},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5646-0},
doi = {10.1007/S10836-017-5646-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AghaeiKRB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AghaeiKRB17a,
author = {Babak Aghaei and
Ahmad Khademzadeh and
Midia Reshadi and
Kambiz Badie},
title = {A New BIST-based Test Approach with the Fault Location Capability
for Communication Channels in Network-on-Chip},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {501--513},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5666-9},
doi = {10.1007/S10836-017-5666-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AghaeiKRB17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {1--3},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5644-2},
doi = {10.1007/S10836-017-5644-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {141},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5654-0},
doi = {10.1007/S10836-017-5654-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17b,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {275},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5664-y},
doi = {10.1007/S10836-017-5664-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {377--378},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5677-6},
doi = {10.1007/S10836-017-5677-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17d,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {539--540},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5687-4},
doi = {10.1007/S10836-017-5687-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal17e,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {689--690},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5699-0},
doi = {10.1007/S10836-017-5699-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal17e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AsliT17,
author = {Rahebeh Niaraki Asli and
Shiva Taghipour},
title = {A Near-Threshold Soft Error Resilient 7T {SRAM} Cell with Low Read
Time for 20 nm FinFET Technology},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {449--462},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5659-8},
doi = {10.1007/S10836-017-5659-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AsliT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AvramenkoRVF17,
author = {Serhiy Avramenko and
Matteo Sonza Reorda and
Massimo Violante and
G{\"{o}}rschwin Fey},
title = {A High-Level Approach to Analyze the Effects of Soft Errors on Lossless
Compression Algorithms},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {53--64},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5637-6},
doi = {10.1007/S10836-016-5637-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AvramenkoRVF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BabuMB17,
author = {Hafiz Md. Hasan Babu and
Md. Solaiman Mia and
Ashis Kumer Biswas},
title = {Efficient Techniques for Fault Detection and Correction of Reversible
Circuits},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {591--605},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5679-4},
doi = {10.1007/S10836-017-5679-4},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/BabuMB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BarraganE17,
author = {Manuel J. Barrag{\'{a}}n and
William R. Eisenstadt},
title = {Guest Editorial: Analog, Mixed-Signal and {RF} Testing},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {281--282},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5663-z},
doi = {10.1007/S10836-017-5663-Z},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BarraganE17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BartschVSK17,
author = {Christian Bartsch and
Carlos Villarraga and
Dominik Stoffel and
Wolfgang Kunz},
title = {A {HW/SW} Cross-Layer Approach for Determining Application-Redundant
Hardware Faults in Embedded Systems},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {77--92},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5643-3},
doi = {10.1007/S10836-017-5643-3},
timestamp = {Wed, 31 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/BartschVSK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BazzaziSH17,
author = {Amin Bazzazi and
Mohammad Taghi Manzuri Shalmani and
Ali Mohammad Afshin Hemmatyar},
title = {Hardware Trojan Detection Based on Logical Testing},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {381--395},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5670-0},
doi = {10.1007/S10836-017-5670-0},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BazzaziSH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BhowmikDB17,
author = {Biswajit Bhowmik and
Jatindra Kumar Deka and
Santosh Biswas},
title = {A Time-Optimized Scheme Towards Analysis of Channel-Shorts in on-Chip
Networks},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {227--254},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5655-z},
doi = {10.1007/S10836-017-5655-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BhowmikDB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DeluthaultKBSC17,
author = {Anthony Deluthault and
Vincent Kerzerho and
Serge Bernard and
Fabien Soulier and
Philippe Cauvet},
title = {New Calibration Technique of Contact-less Resonant Biosensor},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {365--375},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5660-2},
doi = {10.1007/S10836-017-5660-2},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DeluthaultKBSC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DengGL17,
author = {Ding Deng and
Yang Guo and
Zhentao Li},
title = {A Parallel Test Application Method towards Power Reduction},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {157--169},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5656-y},
doi = {10.1007/S10836-017-5656-Y},
timestamp = {Tue, 29 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DengGL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DengL17,
author = {Yong Deng and
Ning Liu},
title = {Soft Fault Diagnosis in Analog Circuits Based on Bispectral Models},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {543--557},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5686-5},
doi = {10.1007/S10836-017-5686-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DengL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DhendC17,
author = {Mangal Hemant Dhend and
Rajan Hari Chile},
title = {Fault Diagnosis of Smart Grid Distribution System by Using Smart Sensors
and Symlet Wavelet Function},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {329--338},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5658-9},
doi = {10.1007/S10836-017-5658-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DhendC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/DuanCC17,
author = {Yan Duan and
Tao Chen and
Degang Chen},
title = {A Low-cost Dithering Method for Improving {ADC} Linearity Test Applied
in uSMILE Algorithm},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {709--720},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5696-3},
doi = {10.1007/S10836-017-5696-3},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/DuanCC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/EspositoV17,
author = {Stefano Esposito and
Massimo Violante},
title = {On the Consolidation of Mixed Criticalities Applications on Multicore
Architectures},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {65--76},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5636-7},
doi = {10.1007/S10836-016-5636-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/EspositoV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GargS17,
author = {Bharat Garg and
G. K. Sharma},
title = {{ACM:} An Energy-Efficient Accuracy Configurable Multiplier for Error-Resilient
Applications},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {479--489},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5667-8},
doi = {10.1007/S10836-017-5667-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GargS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GeethaA17,
author = {S. Geetha and
P. Amritvalli},
title = {High Speed Error Tolerant Adder for Multimedia Applications},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {675--688},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5680-y},
doi = {10.1007/S10836-017-5680-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GeethaA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Gomez-PauBF17,
author = {{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Luz Balado and
Joan Figueras},
title = {Multi-Directional Space Tessellation to Improve the Decision Boundary
in Indirect Mixed-Signal Testing},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {315--328},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5648-y},
doi = {10.1007/S10836-017-5648-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Gomez-PauBF17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuFNZM17,
author = {Junjie Gu and
Haipeng Fu and
Weicong Na and
Qijun Zhang and
Jianguo Ma},
title = {Fast and Automated Electromigration Analysis for {CMOS} {RF} {PA}
Design},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {133--140},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5639-4},
doi = {10.1007/S10836-016-5639-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuFNZM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GutierrezTRK17,
author = {Mauricio D. Gutierrez and
Vasileios Tenentes and
Daniele Rossi and
Tom J. Kazmierski},
title = {Susceptible Workload Evaluation and Protection using Selective Fault
Tolerance},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {463--477},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5668-7},
doi = {10.1007/S10836-017-5668-7},
timestamp = {Sun, 04 Aug 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GutierrezTRK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HamadMS17,
author = {Ghaith Bany Hamad and
Otmane A{\"{\i}}t Mohamed and
Yvon Savaria},
title = {Formal Methods Based Synthesis of Single Event Transient Tolerant
Combinational Circuits},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {607--620},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5682-9},
doi = {10.1007/S10836-017-5682-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HamadMS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HeT17,
author = {Miao Tony He and
Mark M. Tehranipoor},
title = {An Access Mechanism for Embedded Sensors in Modern SoCs},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {397--413},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5669-6},
doi = {10.1007/S10836-017-5669-6},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/HeT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HoqueNWMB17,
author = {Tamzidul Hoque and
Seetharam Narasimhan and
Xinmu Wang and
Sanchita Mal{-}Sarkar and
Swarup Bhunia},
title = {Golden-Free Hardware Trojan Detection with High Sensitivity Under
Process Noise},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {107--124},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5632-y},
doi = {10.1007/S10836-016-5632-Y},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HoqueNWMB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Jahanirad17,
author = {Hadi Jahanirad},
title = {Reliability Model for Multiple-Error Protected Static Memories},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {189--207},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5649-x},
doi = {10.1007/S10836-017-5649-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Jahanirad17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JothinV17,
author = {R. Jothin and
C. Vasanthanayaki},
title = {High Speed Energy Efficient Static Segment Adder for Approximate Computing
Applications},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {125--132},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5634-9},
doi = {10.1007/S10836-016-5634-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JothinV17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JrFG17,
author = {L. E. Seixas Jr and
Saulo Finco and
Salvador Pinillos Gimenez},
title = {VI-Based Measurement System Focusing on Space Applications},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {267--274},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5651-3},
doi = {10.1007/S10836-017-5651-3},
timestamp = {Thu, 27 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JrFG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/JungSC17,
author = {Il{-}Woo Jung and
Bonggu Sung and
Byoungdeog Choi},
title = {Novel Method for Nondestructive Body Effect Measurement in Dynamic
Random Access Memory},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {669--674},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5676-7},
doi = {10.1007/S10836-017-5676-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/JungSC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KarelCGAR17,
author = {Amit Karel and
Mariane Comte and
Jean{-}Marc Galli{\`{e}}re and
Florence Aza{\"{\i}}s and
Michel Renovell},
title = {Resistive Bridging Defect Detection in Bulk, {FDSOI} and FinFET Technologies},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {515--527},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5674-9},
doi = {10.1007/S10836-017-5674-9},
timestamp = {Fri, 19 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KarelCGAR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiuYFCS17,
author = {Zhe Liu and
Xiaopeng Yu and
Teng{-}long Fan and
Cheng Cao and
Wen{-}quan Sui},
title = {A Bridged Contactless Measurement Technique for {LC} Tank Based Voltage-Controlled
Oscillator},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {261--266},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5657-x},
doi = {10.1007/S10836-017-5657-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LiuYFCS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LuoLWW17,
author = {Hui Luo and
Wei Lu and
Youren Wang and
Ling Wang},
title = {A New Test Point Selection Method for Analog Continuous Parameter
Fault},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {339--352},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5661-1},
doi = {10.1007/S10836-017-5661-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LuoLWW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Martinez-CruzFM17,
author = {Alfonso Mart{\'{\i}}nez{-}Cruz and
Ricardo Barr{\'{o}}n Fern{\'{a}}ndez and
Her{\'{o}}n Molina{-}Lozano and
Marco Antonio Ram{\'{\i}}rez Salinas and
Luis Alfonso Villa Vargas and
Prometeo Cort{\'{e}}s{-}Antonio and
Kwang{-}Ting (Tim) Cheng},
title = {An Automatic Functional Coverage for Digital Systems Through a Binary
Particle Swarm Optimization Algorithm with a Reinitialization Mechanism},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {431--447},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5665-x},
doi = {10.1007/S10836-017-5665-X},
timestamp = {Sat, 19 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Martinez-CruzFM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MartinsMCVP17,
author = {M. Tulio Martins and
G. Cardoso Medeiros and
Thiago Copetti and
Fabian Vargas and
Marcus Pohls},
title = {Analysing {NBTI} Impact on SRAMs with Resistive Defects},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {637--655},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5685-6},
doi = {10.1007/S10836-017-5685-6},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MartinsMCVP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MoCWY17,
author = {Jiongjiong Mo and
Hua Chen and
Liping Wang and
Fa{-}Xin Yu},
title = {Total Ionizing Dose Effect and Single Event Burnout of {VDMOS} with
Different Inter Layer Dielectric and Passivation},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {255--259},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5647-z},
doi = {10.1007/S10836-017-5647-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MoCWY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NasrA17,
author = {Abdurrahman A. Nasr and
Mohamed Z. Abdulmageed},
title = {An Efficient Reverse Engineering Hardware Trojan Detector Using Histogram
of Oriented Gradients},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {93--105},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5631-z},
doi = {10.1007/S10836-016-5631-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NasrA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PalchaudhuriD17,
author = {Ayan Palchaudhuri and
Anindya Sundar Dhar},
title = {Built-In Fault Localization Circuitry for High Performance {FPGA}
Based Implementations},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {529--537},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5671-z},
doi = {10.1007/S10836-017-5671-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PalchaudhuriD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PatelJK17,
author = {Jasbir N. Patel and
Hao Jiang and
Bozena Kaminska},
title = {A Passive Authentication System Based on Optical Variable Nano/Micro-Structures},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {353--364},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5645-1},
doi = {10.1007/S10836-017-5645-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PatelJK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PetrosyantsSKL17,
author = {Konstantin O. Petrosyants and
Lev M. Sambursky and
Igor A. Kharitonov and
Boris G. Lvov},
title = {Radiation-Induced Fault Simulation of {SOI/SOS} {CMOS} LSI's Using
Universal Rad-SPICE {MOSFET} Model},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {37--51},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5635-8},
doi = {10.1007/S10836-016-5635-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PetrosyantsSKL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RaiolaBNEB17,
author = {Pascal Raiola and
Jan Burchard and
Felix Neubauer and
Dominik Erb and
Bernd Becker},
title = {Evaluating the Effectiveness of D-chains in SAT-based {ATPG} and Diagnostic
{TPG}},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {751--767},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5693-6},
doi = {10.1007/S10836-017-5693-6},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RaiolaBNEB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RathorGS17,
author = {Vijaypal Singh Rathor and
Bharat Garg and
G. K. Sharma},
title = {New Light Weight Threshold Voltage Defined Camouflaged Gates for Trustworthy
Designs},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {657--668},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5683-8},
doi = {10.1007/S10836-017-5683-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RathorGS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Sarson17,
author = {Peter Sarson},
title = {An {ATE} Filter Characterization ToolKit Using a Discrete Chirped
Excitation Signal as Stimulus},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {283--294},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5633-x},
doi = {10.1007/S10836-016-5633-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Sarson17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SarsonK17,
author = {Peter Sarson and
Haruo Kobayashi},
title = {Using Distortion Shaping Technique to Equalize {ADC} {THD} Performance
Between ATEs},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {295--303},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5630-0},
doi = {10.1007/S10836-016-5630-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SarsonK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SenGuptaNIL17,
author = {Breeta SenGupta and
Dimitar Nikolov and
Urban Ingelsson and
Erik Larsson},
title = {Test Planning for Core-based Integrated Circuits under Power Constraints},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {7--23},
year = {2017},
url = {https://doi.org/10.1007/s10836-016-5638-5},
doi = {10.1007/S10836-016-5638-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SenGuptaNIL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShangSLM17,
author = {Yuling Shang and
Liyuan Sun and
Chunquan Li and
Jianfeng Ma},
title = {Test of Mechanical Failure for Via Holes and Solder Joints of Complex
Interconnect Structure},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {491--499},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5675-8},
doi = {10.1007/S10836-017-5675-8},
timestamp = {Fri, 05 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ShangSLM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SheshadriAA17,
author = {Vijay Sheshadri and
Vishwani D. Agrawal and
Prathima Agrawal},
title = {Power-Aware Optimization of SoC Test Schedules Using Voltage and Frequency
Scaling},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {171--187},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5652-2},
doi = {10.1007/S10836-017-5652-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SheshadriAA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ShuklaHHAC17,
author = {Vineeta Shukla and
Fawnizu Azmadi Hussin and
Nor Hisham Hamid and
Noohul Basheer Zain Ali and
Krishnendu Chakrabarty},
title = {Offline Error Detection in MEDA-Based Digital Microfluidic Biochips
Using Oscillation-Based Testing Methodology},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {621--635},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5678-5},
doi = {10.1007/S10836-017-5678-5},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ShuklaHHAC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SrivastavaSSS17,
author = {Ankush Srivastava and
Virendra Singh and
Adit D. Singh and
Kewal K. Saluja},
title = {A Reliability-Aware Methodology to Isolate Timing-Critical Paths under
Aging},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {721--739},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5692-7},
doi = {10.1007/S10836-017-5692-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SrivastavaSSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TadeusiewiczH17,
author = {Michal Tadeusiewicz and
Stanislaw Halgas},
title = {A Systematic Method for Arranging Diagnostic Tests in Linear Analog
{DC} and {AC} Circuits},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {147--156},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5650-4},
doi = {10.1007/S10836-017-5650-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TadeusiewiczH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TianLLWC17,
author = {Gengxin Tian and
Jun Li and
Xiaofang Liu and
Lixi Wan and
Liqiang Cao},
title = {Study on Magnetic Probe Calibration in Near-field Measurement System
for {EMI} Application},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {741--750},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5691-8},
doi = {10.1007/S10836-017-5691-8},
timestamp = {Thu, 13 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TianLLWC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WaliDVBGR17,
author = {Imran Wali and
Bastien Deveautour and
Arnaud Virazel and
Alberto Bosio and
Patrick Girard and
Matteo Sonza Reorda},
title = {A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively
Harden Logic Circuits},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {25--36},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5640-6},
doi = {10.1007/S10836-017-5640-6},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/WaliDVBGR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangMXR17,
author = {Nantian Wang and
Xiaoyu Ma and
Xiaobin Xu and
Ziqiao Rui},
title = {A Low Power Online Test Method for {FPGA} Single Solder Joint Resistance},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {775--780},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5698-1},
doi = {10.1007/S10836-017-5698-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangMXR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {33},
number = {1},
pages = {5--6},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5641-5},
doi = {10.1007/S10836-017-5641-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17a,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {33},
number = {2},
pages = {143--145},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5653-1},
doi = {10.1007/S10836-017-5653-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17b,
title = {Past {TTTC} Events},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {277--279},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5662-0},
doi = {10.1007/S10836-017-5662-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17c,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {379--380},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5673-x},
doi = {10.1007/S10836-017-5673-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17d,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {541--542},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5684-7},
doi = {10.1007/S10836-017-5684-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17e,
title = {2016 {JETTA-TTTC} Best Paper Award - Masahiro Ishida, Toru Nakura,
Takashi Kusaka, Satoshi Komatsu and Kunihiro Asada, "Dynamic Power
Integrity Control of {ATE} for Eliminating Overkills and Underkills
in Device Testing, " Journal of Electronic Testing: Theory and Applications,
Volume 32, Number 3, pp. 247-271. June 2016},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {691--692},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5689-2},
doi = {10.1007/S10836-017-5689-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17f,
title = {2016-2017 {JETTA} Reviewers},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {693--694},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5695-4},
doi = {10.1007/S10836-017-5695-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X17g,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {695--696},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5690-9},
doi = {10.1007/S10836-017-5690-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X17g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YanWLZL17,
author = {Liyue Yan and
Houjun Wang and
Zhen Liu and
Jingyu Zhou and
Bing Long},
title = {A Novel Noise-assisted Prognostic Method for Linear Analog Circuits},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {559--572},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5688-3},
doi = {10.1007/S10836-017-5688-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YanWLZL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YangCT17,
author = {Chenglin Yang and
Fang Chen and
Shulin Tian},
title = {Grouped Genetic Algorithm Based Optimal Tests Selection for System
with Multiple Operation Modes},
journal = {J. Electron. Test.},
volume = {33},
number = {4},
pages = {415--429},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5672-y},
doi = {10.1007/S10836-017-5672-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YangCT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YiLY17,
author = {Tengyue Yi and
Yi Liu and
Yintang Yang},
title = {A Study of {PN} Junction Diffusion Capacitance of {MOSFET} in Presence
of Single Event Transient},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {769--773},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5694-5},
doi = {10.1007/S10836-017-5694-5},
timestamp = {Sat, 20 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YiLY17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YuanHYC17,
author = {Zhijie Yuan and
Yigang He and
Lifen Yuan and
Zhen Cheng},
title = {A Diagnostics Method for Analog Circuits Based on Improved Kernel
Entropy Component Analysis},
journal = {J. Electron. Test.},
volume = {33},
number = {6},
pages = {697--707},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5697-2},
doi = {10.1007/S10836-017-5697-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YuanHYC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangA17,
author = {Bei Zhang and
Vishwani D. Agrawal},
title = {Three-Stage Optimization of Pre-Bond Diagnosis of {TSV} Defects},
journal = {J. Electron. Test.},
volume = {33},
number = {5},
pages = {573--589},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5681-x},
doi = {10.1007/S10836-017-5681-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhuangC17,
author = {Yuming Zhuang and
Degang Chen},
title = {{ADC} Spectral Testing with Signal Amplitude Drift and Simultaneous
Non-coherent Sampling},
journal = {J. Electron. Test.},
volume = {33},
number = {3},
pages = {305--313},
year = {2017},
url = {https://doi.org/10.1007/s10836-017-5642-4},
doi = {10.1007/S10836-017-5642-4},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhuangC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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