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@article{DBLP:journals/mr/AckaertWBCC01,
author = {Jan Ackaert and
Zhichun Wang and
Eddy De Backer and
P. Colson and
Peter Coppens},
title = {Non Contact Surface Potential Measurements for Charging Reduction
During Manufacturing of Metal-Insulator-Metal Capacitors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1403--1407},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00158-5},
doi = {10.1016/S0026-2714(01)00158-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AckaertWBCC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmbatielloD01,
author = {Alexander Ambatiello and
Josef Deichler},
title = {Low and high temperature device reliability investigations of buried
p-channel MOSFETs of a 0.17 mum technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1915--1921},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00137-8},
doi = {10.1016/S0026-2714(01)00137-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AmbatielloD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndersonGKF01,
author = {Warren R. Anderson and
William M. Gonzalez and
Sheera S. Knecht and
Wendy Fowler},
title = {Reliability considerations for {ESD} protection under wire bonding
pads},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {367--373},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00239-0},
doi = {10.1016/S0026-2714(00)00239-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndersonGKF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndersonM01,
author = {Wallace T. Anderson and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1101},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00080-4},
doi = {10.1016/S0026-2714(01)00080-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndersonM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndersonRMIM01,
author = {Wallace T. Anderson and
Jason A. Roussos and
Jeffrey A. Mittereder and
Dimitrios E. Ioannou and
C. Moglestue},
title = {Pseudomorphic high electron mobility transistor monolithic microwave
integrated circuits reliability study},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1109--1113},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00082-8},
doi = {10.1016/S0026-2714(01)00082-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndersonRMIM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AsliVSYGS01,
author = {N. Asli and
M. I. Vexler and
A. F. Shulekin and
P. Douglas Yoder and
I. V. Grekhov and
Peter Seegebrecht},
title = {Threshold energies in the light emission characteristics of silicon
{MOS} tunnel diodes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1071--1076},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00079-8},
doi = {10.1016/S0026-2714(01)00079-8},
timestamp = {Thu, 07 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AsliVSYGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzzopardiKIBVWZ01,
author = {Stephane Azzopardi and
Atsuo Kawamura and
Hideo Iwamoto and
Olivier Briat and
Jean{-}Michel Vinassa and
Eric Woirgard and
Christian Zardini},
title = {Local lifetime control {IGBT} structures: turn-off performances comparison
for hard- and soft-switching between 1200V trench and new planar PT-IGBTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1731--1736},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00212-8},
doi = {10.1016/S0026-2714(01)00212-8},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzzopardiKIBVWZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BadilaGMBB01,
author = {Marian Badila and
Philippe Godignon and
Jos{\'{e}} Mill{\'{a}}n and
S. Berberich and
Gheorghe Brezeanu},
title = {The electron irradiation effects on silicon gate dioxide used for
power {MOS} devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1015--1018},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00060-9},
doi = {10.1016/S0026-2714(01)00060-9},
timestamp = {Thu, 15 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BadilaGMBB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BartonMDDCLCS01,
author = {J. Barton and
G. McCarthy and
R. Doyle and
K. Delaney and
Enric Cabruja and
Manuel Lozano and
Ana Collado and
Joaqu{\'{\i}}n Santander},
title = {Reliability evaluation of a silicon-on-silicon {MCM-D} package},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {887--899},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00014-2},
doi = {10.1016/S0026-2714(01)00014-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BartonMDDCLCS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BartonNV01,
author = {Daniel L. Barton and
Shigeru Nakajima and
Massimo Vanzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1143--1144},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00102-0},
doi = {10.1016/S0026-2714(01)00102-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BartonNV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaumannS01,
author = {Robert C. Baumann and
Eric B. Smith},
title = {Neutron-induced \({}^{\mbox{10}}\)B fission as a major source of soft
errors in high density SRAMs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {211--218},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00218-3},
doi = {10.1016/S0026-2714(00)00218-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaumannS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinCFPDL01,
author = {Felix Beaudoin and
X. Chauffleur and
Jean{-}Pierre Fradin and
Philippe Perdu and
Romain Desplats and
Dean Lewis},
title = {Modeling Thermal Laser Stimulation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1477--1482},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00202-5},
doi = {10.1016/S0026-2714(01)00202-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinCFPDL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinPDRL01,
author = {Felix Beaudoin and
Philippe Perdu and
Romain Desplats and
Sebastien Rigo and
Dean Lewis},
title = {Silicon Thinning and Polishing on Packaged Devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1557--1561},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00177-9},
doi = {10.1016/S0026-2714(01)00177-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinPDRL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeicheleBR01,
author = {Matthias Beichele and
Anton J. Bauer and
Heiner Ryssel},
title = {Reliability of ultrathin nitrided oxides grown in low pressure N\({}_{\mbox{2}}\)O
ambient},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1089--1092},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00071-3},
doi = {10.1016/S0026-2714(01)00071-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeicheleBR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BersukerJH01,
author = {Gennadi Bersuker and
Yongjoo Jeon and
Howard R. Huff},
title = {Degradation of thin oxides during electrical stress},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1923--1931},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00120-2},
doi = {10.1016/S0026-2714(01)00120-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BersukerJH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlyzniukKKPRU01,
author = {Mykola Blyzniuk and
Irena Kazymyra and
Wieslaw Kuzmicz and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Probabilistic analysis of {CMOS} physical defects in {VLSI} circuits
for test coverage improvement},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2023--2040},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00092-0},
doi = {10.1016/S0026-2714(01)00092-0},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlyzniukKKPRU01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BockKHGCN01,
author = {Karlheinz Bock and
Bart Keppens and
Vincent De Heyn and
Guido Groeseneken and
L. Y. Ching and
A. Naem},
title = {Influence of gate length on ESD-performance for deep submicron {CMOS}
technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {375--383},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00243-2},
doi = {10.1016/S0026-2714(00)00243-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BockKHGCN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorgarinoMDCF01,
author = {Mattia Borgarino and
Roberto Menozzi and
Domenico Dieci and
Laura Cattani and
Fausto Fantini},
title = {Reliability physics of compound semiconductor transistors for microwave
applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {21--30},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00206-7},
doi = {10.1016/S0026-2714(00)00206-7},
timestamp = {Wed, 17 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BorgarinoMDCF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorgarinoSMV01,
author = {Mattia Borgarino and
Giovanna Sozzi and
Andrea Mazzanti and
Giovanni Verzellesi},
title = {Gate-lag effects in AlGaAs/GaAs power HFET's},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1585--1589},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00191-3},
doi = {10.1016/S0026-2714(01)00191-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BorgarinoSMV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorsoniBGKLRVRW01,
author = {G. Borsoni and
N. B{\'{e}}chu and
M. Gros{-}Jean and
Michael L. Korwin{-}Pawlowski and
R. Laffitte and
V. Le Roux and
L. Vallier and
N{\'{e}}vine Rochat and
C. Wyon},
title = {Ultra-thin oxides on silicon fabricated using ultra-slow multicharged
ion beams},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1063--1066},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00076-2},
doi = {10.1016/S0026-2714(01)00076-2},
timestamp = {Tue, 28 Mar 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BorsoniBGKLRVRW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bosc01,
author = {J. M. Bosc},
title = {Integrated power transistor size optimisation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1671--1676},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00180-9},
doi = {10.1016/S0026-2714(01)00180-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bosc01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoselliMMK01,
author = {Gianluca Boselli and
Stan Meeuwsen and
Ton J. Mouthaan and
Fred G. Kuper},
title = {Investigations on double-diffused {MOS} transistors under {ESD} zap
conditions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {395--405},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00240-7},
doi = {10.1016/S0026-2714(00)00240-7},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoselliMMK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BratekK01,
author = {Piotr Bratek and
Andrzej Kos},
title = {A method of thermal testing of microsystems},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1877--1887},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00088-9},
doi = {10.1016/S0026-2714(01)00088-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BratekK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BravaixGRV01,
author = {Alain Bravaix and
Didier Goguenheim and
Nathalie Revil and
E. Vincent},
title = {Injection Mechanisms and Lifetime Prediction with the Substrate Voltage
in 0.15mum Channel-Length N-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1313--1318},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00206-2},
doi = {10.1016/S0026-2714(01)00206-2},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BravaixGRV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrazzelliGR01,
author = {Daniela Brazzelli and
Gabriella Ghidini and
C. Riva},
title = {Optimization of WSi\({}_{\mbox{2}}\) by SiH\({}_{\mbox{4}}\) {CVD:}
impact on oxide quality},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1003--1006},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00057-9},
doi = {10.1016/S0026-2714(01)00057-9},
timestamp = {Tue, 02 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrazzelliGR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BruyereMRVG01,
author = {S. Bruy{\`{e}}re and
Frederic Monsieur and
David Roy and
E. Vincent and
G{\'{e}}rard Ghibaudo},
title = {Failures in ultrathin oxides: Stored energy or carrier energy driven?},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1367--1372},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00142-1},
doi = {10.1016/S0026-2714(01)00142-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BruyereMRVG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BruyereRRVG01,
author = {S. Bruy{\`{e}}re and
David Roy and
E. Robilliart and
E. Vincent and
G{\'{e}}rard Ghibaudo},
title = {Body effect induced wear-out acceleration in ultra-thin oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1031--1034},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00065-8},
doi = {10.1016/S0026-2714(01)00065-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BruyereRRVG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BubennikovZ01,
author = {Alexander N. Bubennikov and
Andrey V. Zykov},
title = {Investigations of impact ionization phenomena in advanced transistors
and speed-power improvement of BiMOS {SRAM} cells based on reverse
base current effect},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {219--228},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00092-5},
doi = {10.1016/S0026-2714(00)00092-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BubennikovZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Burghartz01,
author = {Joachim N. Burghartz},
title = {Status and trends of silicon {RF} technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {13--19},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00198-0},
doi = {10.1016/S0026-2714(00)00198-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Burghartz01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoIVW01,
author = {Giovanni Busatto and
Francesco Iannuzzo and
Francesco Velardi and
Jeffery Wyss},
title = {Non-destructive tester for single event burnout of power diodes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1725--1729},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00211-6},
doi = {10.1016/S0026-2714(01)00211-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoIVW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinLPPGGS01,
author = {Sergey Bychikhin and
Martin Litzenberger and
R. Pichler and
Dionyz Pogany and
Erich Gornik and
Gerhard Groos and
Matthias Stecher},
title = {Thermal and free carrier laser interferometric mapping and failure
analysis of anti-serial smart power {ESD} protection structures},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1501--1506},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00152-4},
doi = {10.1016/S0026-2714(01)00152-4},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinLPPGGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanTH01,
author = {Y. C. Chan and
P. L. Tu and
K. C. Hung},
title = {Study of the self-alignment of no-flow underfill for micro-BGA assembly},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1867--1875},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00041-5},
doi = {10.1016/S0026-2714(01)00041-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChanTH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangJHCCWH01,
author = {Shyh{-}Ming Chang and
Jwo{-}Huei Jou and
Adam Hsieh and
Tai{-}Hong Chen and
Ching{-}Yun Chang and
Yung{-}Hao Wang and
Chun{-}Ming Huang},
title = {Characteristic study of anisotropic-conductive film for chip-on-film
packaging},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2001--2009},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00221-9},
doi = {10.1016/S0026-2714(01)00221-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangJHCCWH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Charitat01,
author = {Georges Charitat},
title = {In memory of Pierre Rossel},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {933--934},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00114-7},
doi = {10.1016/S0026-2714(01)00114-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Charitat01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Charles01,
author = {Harry K. Charles Jr.},
title = {Tradeoffs in multichip module yield and cost with known good die probability
and repair},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {715--733},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00251-1},
doi = {10.1016/S0026-2714(00)00251-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Charles01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLJ01,
author = {Gang Chen and
Ming Fu Li and
Ying Jin},
title = {Electric passivation of interface traps at drain junction space charge
region in p-MOS transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1427--1431},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00172-X},
doi = {10.1016/S0026-2714(01)00172-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenLJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenPR01,
author = {X. Y. Chen and
A. Pedersen and
A. D. van Rheenen},
title = {Effect of electrical and thermal stress on low-frequency noise characteristics
of laser diodes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {105--110},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00201-8},
doi = {10.1016/S0026-2714(00)00201-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenPR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Cheung01,
author = {Kin P. Cheung},
title = {Unifying the thermal-chemical and anode-hole-injection gate-oxide
breakdown models},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {193--199},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00203-1},
doi = {10.1016/S0026-2714(00)00203-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Cheung01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Cheung01a,
author = {Kin P. Cheung},
title = {Impact of {ESD} protection device trigger transient on the reliability
of ultra-thin gate oxide},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {745--749},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00011-7},
doi = {10.1016/S0026-2714(01)00011-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Cheung01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChinPCPGS01,
author = {J. M. Chin and
J. C. H. Phang and
D. S. H. Chan and
M. Palaniappan and
G. Gilfeather and
C. E. Soh},
title = {Single contact optical beam induced currents},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1237--1242},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00223-7},
doi = {10.1016/S0026-2714(00)00223-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChinPCPGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Chobola01,
author = {Z. Chobola},
title = {Noise as a tool for non-destructive testing of single-crystal silicon
solar cells},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1947--1952},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00219-0},
doi = {10.1016/S0026-2714(01)00219-0},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Chobola01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ClercSGLP01,
author = {Raphael Clerc and
Alessandro S. Spinelli and
G{\'{e}}rard Ghibaudo and
Charles Leroux and
G. Pananakakis},
title = {Electrical characterization and quantum modeling of {MOS} capacitors
with ultra-thin oxides {(1.4-3} nm)},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1027--1030},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00063-4},
doi = {10.1016/S0026-2714(01)00063-4},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ClercSGLP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Cole01,
author = {Edward I. Cole Jr.},
title = {Global fault localization using induced voltage alteration},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1145--1159},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00103-2},
doi = {10.1016/S0026-2714(01)00103-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Cole01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CoppensVB01,
author = {Peter Coppens and
Guido Vanhorebeek and
Eddy De Backer},
title = {Correlation between predicted cause of {SRAM} failures and in-line
defect data},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {53--57},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00105-0},
doi = {10.1016/S0026-2714(00)00105-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CoppensVB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CoqueryCOLLLVD01,
author = {Gerard Coquery and
S. Carubelli and
Jean{-}Pierre Ousten and
Richard Lallemand and
Frederic Lecoq and
Dominique Lhotellier and
V. de Viry and
Philippe Dupuy},
title = {Power module lifetime estimation from chip temperature direct measurement
in an automotive traction inverter},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1695--1700},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00197-4},
doi = {10.1016/S0026-2714(01)00197-4},
timestamp = {Fri, 05 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CoqueryCOLLLVD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CroesDMCSTW01,
author = {Kris Croes and
R. Dreesen and
Jean Manca and
Ward De Ceuninck and
Luc De Schepper and
Luc Tielemans and
P. J. van der Wel},
title = {High-resolution in-situ of gold electromigration: test time reduction},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1439--1442},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00179-2},
doi = {10.1016/S0026-2714(01)00179-2},
timestamp = {Tue, 08 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CroesDMCSTW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DabrowskiZF01,
author = {J. Dabrowski and
V. Zavodinsky and
A. Fleszar},
title = {Pseudopotential study of PrO\({}_{\mbox{2}}\) and HfO\({}_{\mbox{2}}\)
in fluorite phase},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1093--1096},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00070-1},
doi = {10.1016/S0026-2714(01)00070-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DabrowskiZF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dai01,
author = {Yisong Dai},
title = {Generation-recombination noise in bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {919--925},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00042-7},
doi = {10.1016/S0026-2714(01)00042-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dai01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DaiC01,
author = {Peter Dai and
Philip Canfield},
title = {Location of defective cells in {HBT} power amplifier arrays using
{IR} emission microscopy},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1137--1141},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00086-5},
doi = {10.1016/S0026-2714(01)00086-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DaiC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DalleauW01,
author = {David Dalleau and
Kirsten Weide{-}Zaage},
title = {Three-Dimensional Voids Simulation in chip Metallization Structures:
a Contribution to Reliability Evaluation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1625--1630},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00151-2},
doi = {10.1016/S0026-2714(01)00151-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DalleauW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DamperFS01,
author = {Robert I. Damper and
Richard L. B. French and
Tom W. Scutt},
title = {The Hi-NOON neural simulator and its applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2051--2065},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00097-X},
doi = {10.1016/S0026-2714(01)00097-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DamperFS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Deleonibus01,
author = {Simon Deleonibus},
title = {Alternative {CMOS} or alternative to CMOS?},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {3--12},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00196-7},
doi = {10.1016/S0026-2714(00)00196-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Deleonibus01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DesplatsBPPTBL01,
author = {Romain Desplats and
Felix Beaudoin and
Philippe Perdu and
Patrick Poirier and
David Tr{\'{e}}mouilles and
Marise Bafleur and
Dean Lewis},
title = {Backside Localization of Current Leakage Faults Using Thermal Laser
Stimulation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1539--1544},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00167-6},
doi = {10.1016/S0026-2714(01)00167-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DesplatsBPPTBL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DesplatsPB01,
author = {Romain Desplats and
Philippe Perdu and
Felix Beaudoin},
title = {A New Versatile Testing Interface for Failure Analysis in Integrated
Circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1495--1499},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00149-4},
doi = {10.1016/S0026-2714(01)00149-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DesplatsPB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DiestelMKSEMP01,
author = {Gunnar Diestel and
Andreas Martin and
Martin Kerber and
Alfred Schlemm and
Horst Erlenmaier and
Bernhard Murr and
Andreas Preussger},
title = {Quality assessment of thin oxides using constant and ramped stress
measurements},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1019--1022},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00061-0},
doi = {10.1016/S0026-2714(01)00061-0},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DiestelMKSEMP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DieudonneDJRB01,
author = {Fran{\c{c}}ois Dieudonn{\'{e}} and
F. Daug{\'{e}} and
Jalal Jomaah and
C. Raynaud and
Francis Balestra},
title = {An overview of hot-carrier induced degradation in 0.25 mum Partially
and Fully Depleted {SOI} N-MOSFET's},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1417--1420},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00165-2},
doi = {10.1016/S0026-2714(01)00165-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DieudonneDJRB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DilhaireGJLSC01,
author = {Stefan Dilhaire and
St{\'{e}}phane Grauby and
S{\'{e}}bastien Jorez and
Luis David Pati{\~{n}}o Lopez and
Emmanuel Schaub and
Wilfrid Claeys},
title = {Laser diode {COFD} analysis by thermoreflectance microscopy},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1597--1601},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00196-2},
doi = {10.1016/S0026-2714(01)00196-2},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DilhaireGJLSC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dion01,
author = {Michael J. Dion},
title = {Improved understanding of metal ion reservoirs within barrier-metal
systems},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {805--814},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00036-1},
doi = {10.1016/S0026-2714(01)00036-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dion01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DombrowskiDWRB01,
author = {Kai F. Dombrowski and
B. Dietrich and
Ingrid De Wolf and
R. Rooyackers and
G. Badenes},
title = {Investigation of stress in shallow trench isolation using {UV} micro-Raman
spectroscopy},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {511--515},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00260-2},
doi = {10.1016/S0026-2714(00)00260-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DombrowskiDWRB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DordevicP01,
author = {S. Dordevic and
P. Petkovic},
title = {A hierarchical approach to large circuit symbolic simulation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2041--2049},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00096-8},
doi = {10.1016/S0026-2714(01)00096-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DordevicP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DreesenCMCSPG01,
author = {R. Dreesen and
Kris Croes and
Jean Manca and
Ward De Ceuninck and
Luc De Schepper and
A. Pergoot and
Guido Groeseneken},
title = {A new degradation model and lifetime extrapolation technique for lightly
doped drain nMOSFETs under hot-carrier degradation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {437--443},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00225-0},
doi = {10.1016/S0026-2714(00)00225-0},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DreesenCMCSPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Drevon01,
author = {Claude Drevon},
title = {{RF} Packaging for Space Applications: from Micropackage to {SOP}
- "System On a Package"},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1649--1656},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00168-8},
doi = {10.1016/S0026-2714(01)00168-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Drevon01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziedzicGKTDBRW01,
author = {Andrzej Dziedzic and
Leszek J. Golonka and
Jaroslaw Kita and
Heiko Thust and
Karl{-}Heinz Drue and
Reinhard Bauer and
Lars Rebenklau and
Klaus{-}J{\"{u}}rgen Wolter},
title = {Electrical and stability properties and ultrasonic microscope characterisation
of low temperature co-fired ceramics resistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {669--676},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00004-X},
doi = {10.1016/S0026-2714(01)00004-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DziedzicGKTDBRW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DziurdziaK01,
author = {Piotr Dziurdzia and
Andrzej Kos},
title = {Monitoring of power dissipated in microelectronic structures},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1971--1978},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00123-8},
doi = {10.1016/S0026-2714(01)00123-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DziurdziaK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EbersbergerOB01,
author = {Bernd Ebersberger and
Alexander Olbrich and
Christian Boit},
title = {Scanning probe microscopy in semiconductor failure analysis},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1231--1236},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00109-3},
doi = {10.1016/S0026-2714(01)00109-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EbersbergerOB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EbersbergerOB01a,
author = {Bernd Ebersberger and
Alexander Olbrich and
Christian Boit},
title = {Application of Scanning Probe Microscopy techniques in Semiconductor
Failure Analysis},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1449--1458},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00187-1},
doi = {10.1016/S0026-2714(01)00187-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EbersbergerOB01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EriguchiHN01,
author = {Koji Eriguchi and
Yoshinao Harada and
Masaaki Niwa},
title = {Effects of base layer thickness on reliability of {CVD} Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)
stack gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {587--595},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00247-X},
doi = {10.1016/S0026-2714(00)00247-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EriguchiHN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EsmarkSWGGF01,
author = {Kai Esmark and
Wolfgang Stadler and
M. Wendel and
Harald Gossner and
X. Guggenmos and
Wolfgang Fichtner},
title = {Advanced 2D/3D {ESD} device simulation - a powerful tool already used
in a pre-Si phase},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1761--1770},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00032-4},
doi = {10.1016/S0026-2714(01)00032-4},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EsmarkSWGGF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EstradaCOG01,
author = {Magali Estrada and
Antonio Cerdeira and
Adelmo Ortiz{-}Conde and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez},
title = {Determination of trap cross-section in a-Si: {H} p-i-n diodes parameters
using simulation and parameter extraction},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {605--610},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00005-1},
doi = {10.1016/S0026-2714(01)00005-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EstradaCOG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FadlallahSGCMDJG01,
author = {M. Fadlallah and
Arkadiusz Szewczyk and
C. Giannakopoulos and
B. Cretu and
Frederic Monsieur and
T. Devoivre and
Jalal Jomaah and
G{\'{e}}rard Ghibaudo},
title = {Low frequency noise and reliability properties pf 0.12 mum {CMOS}
devices with Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) as gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1361--1366},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00141-X},
doi = {10.1016/S0026-2714(01)00141-X},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FadlallahSGCMDJG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fagerholt01,
author = {Per{-}Olof F{\"{a}}gerholt},
title = {Reliability improvements in passive components},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1279--1288},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00170-6},
doi = {10.1016/S0026-2714(01)00170-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fagerholt01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FalsterBV01,
author = {R. Falster and
F. Bonoli and
V. V. Voronkov},
title = {Dielectric breakdown distributions for void containing silicon substrates},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {967--971},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00048-8},
doi = {10.1016/S0026-2714(01)00048-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FalsterBV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FedasyukLP01,
author = {Dmytro V. Fedasyuk and
Evgenia Levus and
D. Petrov},
title = {Flip-chip structure transient thermal model},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1965--1970},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00128-7},
doi = {10.1016/S0026-2714(01)00128-7},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FedasyukLP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FerranteA01,
author = {Gaetano Ferrante and
Dominique Persano Adorno},
title = {A wavelet analysis of 1/f and white noise in microwave transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {99--104},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00199-2},
doi = {10.1016/S0026-2714(00)00199-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FerranteA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FischerALZG01,
author = {A. H. Fischer and
A. Abel and
M. Lepper and
A. E. Zitzelsberger and
A. von Glasow},
title = {Modeling bimodal electromigration failure distributions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {445--453},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00246-8},
doi = {10.1016/S0026-2714(00)00246-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FischerALZG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ForsterLJ01,
author = {St{\'{e}}phane Forster and
Thierry Lequeu and
Robert J{\'{e}}risian},
title = {Operation of power semiconductors under transient thermal conditions:
thermal fatigue reliability and mechanical aspects},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1677--1682},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00185-8},
doi = {10.1016/S0026-2714(01)00185-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ForsterLJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FurcasPPSV01,
author = {Paola Furcas and
Rosaria De Palo and
Maria Elena Patella and
Giulia Salmini and
Massimo Vanzi},
title = {Damp Heat test on LiNbO optical modulators},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1603--1607},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00199-8},
doi = {10.1016/S0026-2714(01)00199-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FurcasPPSV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GagnardRB01,
author = {Xavier Gagnard and
Yannick Rey{-}Tauriac and
Olivier Bonnaud},
title = {Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS
technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1335--1340},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00213-X},
doi = {10.1016/S0026-2714(01)00213-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GagnardRB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalbiatiGCL01,
author = {N. Galbiati and
G. Ghidini and
C. Cremonesi and
Luca Larcher},
title = {Impact of the As dose in 0.35 mum {EEPROM} technology: characterization
and modeling},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {999--1002},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00056-7},
doi = {10.1016/S0026-2714(01)00056-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalbiatiGCL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhettiAB01,
author = {A. Ghetti and
M. Alam and
J. Bude},
title = {Anode hole generation mechanisms},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1347--1354},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00139-1},
doi = {10.1016/S0026-2714(01)00139-1},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GhettiAB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GolanAR01,
author = {Gady Golan and
Alex Axelevitch and
E. Rabinovitch},
title = {Effects of electron beam generated in vacuum photo-thermal processing
on metal-silicon contacts},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {871--879},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00019-1},
doi = {10.1016/S0026-2714(01)00019-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GolanAR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GolanRIALRDSC01,
author = {Gady Golan and
E. Rabinovich and
A. Inberg and
Alex Axelevitch and
Gennady Lubarsky and
Pier Giorgio Rancoita and
M. Demarchi and
A. Seidman and
N. Croitoru},
title = {Inversion phenomenon as a result of junction damages in neutron irradiated
silicon detectors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {67--72},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00212-2},
doi = {10.1016/S0026-2714(00)00212-2},
timestamp = {Wed, 20 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GolanRIALRDSC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoldblattLL01,
author = {Norman Goldblatt and
Martin Leibowitz and
William Lo},
title = {Unique and Practical {IC} Timing Analysis Tool Utilizing Intrinsic
Photon Emission},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1507--1512},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00154-8},
doi = {10.1016/S0026-2714(01)00154-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoldblattLL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoloWKM01,
author = {N. Tosic Golo and
S. van der Wal and
Fred G. Kuper and
Ton J. Mouthaan},
title = {The time-voltage trade-off for {ESD} damage threshold in amorphous
silicon hydrogenated thin-film transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1391--1396},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00148-2},
doi = {10.1016/S0026-2714(01)00148-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoloWKM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GonfFZW01,
author = {K. Gonf and
H. G. Feng and
R. Y. Zhan and
A. Z. Wang},
title = {ESD-Induced Circuit Performance Degradation in RFICs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1379--1383},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00144-5},
doi = {10.1016/S0026-2714(01)00144-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GonfFZW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GossnerMES01,
author = {Harald Gossner and
T. M{\"{u}}ller{-}Lynch and
Kai Esmark and
Matthias Stecher},
title = {Wide range control of the sustaining voltage of electrostatic discharge
protection elements realized in a smart power technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {385--393},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00238-9},
doi = {10.1016/S0026-2714(00)00238-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GossnerMES01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuilhaumeGCFB01,
author = {A. Guilhaume and
Philippe Galy and
J. P. Chante and
B. Foucher and
F. Blanc},
title = {Simulation and experimental comparison of {GGNMOS} and {LVTSCR} protection
cells under ElectroStatic Discharges},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1433--1437},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00175-5},
doi = {10.1016/S0026-2714(01)00175-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuilhaumeGCFB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaendlerJGB01,
author = {S{\'{e}}bastien Haendler and
Jalal Jomaah and
G{\'{e}}rard Ghibaudo and
Francis Balestra},
title = {Improved analysis of low frequency noise in dynamic threshold {MOS/SOI}
transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {855--860},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00021-X},
doi = {10.1016/S0026-2714(01)00021-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaendlerJGB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaqueL01,
author = {Shatil Haque and
Guo{-}Quan Lu},
title = {Effects of device passivation materials on solderable metallization
of IGBTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {639--647},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00008-7},
doi = {10.1016/S0026-2714(01)00008-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaqueL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaqueSCWLBL01,
author = {Shatil Haque and
Kalyan Siddabattula and
Mike Craven and
Sihua Wen and
Xingsheng Liu and
Dushan Boroyevich and
Guo{-}Quan Lu},
title = {Design issues of a three-dimensional packaging scheme for power modules},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {295--305},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00208-0},
doi = {10.1016/S0026-2714(00)00208-0},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaqueSCWLBL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HarsanyiI01,
author = {G{\'{a}}bor Hars{\'{a}}nyi and
George Inzelt},
title = {Comparing migratory resistive short formation abilities of conductor
systems applied in advanced interconnection systems},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {229--237},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00093-7},
doi = {10.1016/S0026-2714(00)00093-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HarsanyiI01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HashimotoTNSN01,
author = {Chisato Hashimoto and
Takamitsu Takizawa and
Sigeru Nakajima and
Mitsuru Shinagawa and
Tadao Nagatsuma},
title = {Observation of the internal waveforms in high-speed high-density LSIs
using an {EOS} prober},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1203--1209},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00107-X},
doi = {10.1016/S0026-2714(01)00107-X},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HashimotoTNSN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HassanK01,
author = {M. M. Shahidul Hassan and
A. H. Khandoker},
title = {New expression for base transit time in a bipolar transistor for all
levels of injection},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {137--140},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00202-X},
doi = {10.1016/S0026-2714(00)00202-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HassanK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeZHW01,
author = {Jin He and
Xing Zhang and
Ru Huang and
Yangyuan Wang},
title = {Extraction of the lateral distribution of interface traps in MOSFETs
by a novel combined gated-diode technique},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1953--1957},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00235-9},
doi = {10.1016/S0026-2714(01)00235-9},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HeZHW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HenryKDB01,
author = {Leo G. Henry and
Mark A. Kelly and
Tom Diep and
Jon Barth},
title = {Issues concerning charged device model {ESD} verification modules
- the need to move to alumina},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {407--415},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00237-7},
doi = {10.1016/S0026-2714(00)00237-7},
timestamp = {Thu, 01 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HenryKDB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HenryKDB01a,
author = {Leo G. Henry and
Mark A. Kelly and
Tom Diep and
Jon Barth},
title = {The importance of standardizing {CDM} {ESD} test head parameters to
obtain data correlation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1789--1800},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00035-X},
doi = {10.1016/S0026-2714(01)00035-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HenryKDB01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HesterKKJ01,
author = {Kendall D. Hester and
Matthew P. Koehler and
Hanna Kanciak{-}Chwialkowski and
Brian H. Jones},
title = {An assessment of the value of added screening of electronic components
for commercial aerospace applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1823--1828},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00113-5},
doi = {10.1016/S0026-2714(01)00113-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HesterKKJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HillBPNA01,
author = {Daniel Hill and
X. Blasco and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Characterising the surface roughness of {AFM} grown SiO\({}_{\mbox{2}}\)
on Si},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1077--1079},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00078-6},
doi = {10.1016/S0026-2714(01)00078-6},
timestamp = {Tue, 14 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HillBPNA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoS01,
author = {W. Y. Ho and
C. Surya},
title = {Study of light-induced annealing effects in a-Si: {H} thin films},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {913--917},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00012-9},
doi = {10.1016/S0026-2714(01)00012-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HookHL01,
author = {Terence B. Hook and
David Harmon and
Chuan Lin},
title = {Plasma process-induced damage on thick {(6.8} nm) and thin {(3.5}
nm) gate oxide: parametric shifts, hot-carrier response, and dielectric
integrity degradation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {751--765},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00228-6},
doi = {10.1016/S0026-2714(00)00228-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HookHL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HotchkissAEHSSH01,
author = {Greg Hotchkiss and
Gonzalo Amador and
Darvin Edwards and
Paul Hundt and
Les Stark and
Roger Stierman and
Gail Heinen},
title = {Wafer level packaging of a tape flip-chip chip scale packages},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {705--713},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00261-4},
doi = {10.1016/S0026-2714(00)00261-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HotchkissAEHSSH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsuLY01,
author = {C. T. Hsu and
M. M. Lau and
Y. T. Yeow},
title = {Analysis of the gate capacitance measurement technique and its application
for the evaluation of hot-carrier degradation in submicrometer MOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {201--209},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00222-5},
doi = {10.1016/S0026-2714(00)00222-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsuLY01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HungZHLCW01,
author = {S. C. Hung and
P. J. Zheng and
S. H. Ho and
S. C. Lee and
H. N. Chen and
J. D. Wu},
title = {Board level reliability of {PBGA} using flex substrate},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {677--687},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00003-8},
doi = {10.1016/S0026-2714(01)00003-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HungZHLCW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ikeda01,
author = {Kazuko Ikeda},
title = {Evaluation method for the control of process induced defect in deep
sub-micron device fabrication},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1525--1533},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00161-5},
doi = {10.1016/S0026-2714(01)00161-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ikeda01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Illyefalvi-Vitez01,
author = {Zsolt Illyefalvi{-}Vit{\'{e}}z},
title = {Laser processing for microelectronics packaging applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {563--570},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00250-X},
doi = {10.1016/S0026-2714(00)00250-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Illyefalvi-Vitez01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/InnertsbergerPK01,
author = {G. Innertsberger and
T. Pompl and
Martin Kerber},
title = {The influence of p-polysilicon gate doping on the dielectric breakdown
of {PMOS} devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {973--975},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00050-6},
doi = {10.1016/S0026-2714(01)00050-6},
timestamp = {Fri, 09 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/InnertsbergerPK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Irrera01,
author = {Fernanda Irrera},
title = {Electrical degradation and recovery of dielectrics in n\({}^{\mbox{++}}\)-poly-Si/SiO\({}_{\mbox{x}}\)/SiO\({}_{\mbox{2}}\)/p-sub
structures designed for application in low-voltage non-volatile memories},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1809--1813},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00094-4},
doi = {10.1016/S0026-2714(01)00094-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Irrera01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IsmaeelMB01,
author = {Asad A. Ismaeel and
Rajan Mathew and
R. Bhatnagar},
title = {Module allocation with idle-time utilization for on-line testability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {323--332},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00078-0},
doi = {10.1016/S0026-2714(00)00078-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IsmaeelMB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JakovljevicFMLD01,
author = {Mirko Jakovljevic and
Peter A. Fotiu and
Zeljko Mrcarica and
Vanco B. Litovski and
Helmut Detter},
title = {Electro-thermal simulation of microsystems with mixed abstraction
modelling},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {823--835},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00024-5},
doi = {10.1016/S0026-2714(01)00024-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JakovljevicFMLD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JalabertTSCCVA01,
author = {Laurent Jalabert and
Pierre Temple{-}Boyer and
G{\'{e}}rard Sarrabayrouse and
F. Cristiano and
B. Colombeau and
F. Voillot and
C. Armand},
title = {Reduction of boron penetration through thin silicon oxide with a nitrogen
doped silicon layer},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {981--985},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00052-X},
doi = {10.1016/S0026-2714(01)00052-X},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JalabertTSCCVA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JankLBFR01,
author = {Michael P. M. Jank and
Martin Lemberger and
Anton J. Bauer and
Lothar Frey and
Heiner Ryssel},
title = {Electrical reliability aspects of through the gate implanted {MOS}
structures with thin oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {987--990},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00053-1},
doi = {10.1016/S0026-2714(01)00053-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JankLBFR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jevtic01,
author = {Milan Jevtic},
title = {Guidebook for Managing Silicon Chip Reliability; Michael G. Pecht,
Riko Radojcic, Gopal Rao. {CRC} Press LLC, Boca Raton, 1999, 224 pp.
{ISBN:} 0-8493-9624-7},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {141--142},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00231-6},
doi = {10.1016/S0026-2714(00)00231-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jevtic01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jevtic01a,
author = {Milan Jevtic},
title = {Optimal Reliability Design: Fundamentals and Applications; Way Kuo,
Rajendra Prasad, Frank A. Tillman, Ching-Lai Mwang. Cambridge University
Press, Cambridge, 2001, 389+XXI pp. {ISBN:} 0-521-78127-2 (hardbound)},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {623--624},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00018-X},
doi = {10.1016/S0026-2714(01)00018-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jevtic01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JevticSS01,
author = {Milan Jevtic and
Zdravko I. Stanimirovic and
Ivanka P. Stanimirovic},
title = {Evaluation of thick-film resistor structural parameters based on noise
index measurements},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {59--66},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00207-9},
doi = {10.1016/S0026-2714(00)00207-9},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JevticSS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiLWCLZ01,
author = {Yuan Ji and
Ziguo Li and
Dong Wang and
Yaohai Cheng and
Dong Luo and
Bin Zong},
title = {Scanning thermal microscopy studies of local temperature distribution
of micron-sized metallization lines},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1255--1258},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00245-6},
doi = {10.1016/S0026-2714(00)00245-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiLWCLZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jones01,
author = {Brian K. Jones},
title = {In the memory of Yisong Dai},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {779},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00095-6},
doi = {10.1016/S0026-2714(01)00095-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jones01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JonesGKH01,
author = {B. K. Jones and
C. N. Graham and
A. Konczakowska and
L. Hasse},
title = {The coherence of the gate and drain noise in stressed AlGaAs-InAlGaAs
PHEMTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {87--97},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00077-9},
doi = {10.1016/S0026-2714(00)00077-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JonesGKH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaderLM01,
author = {Mahamane Kader and
Michel Lenczner and
Zeljko Mrcarica},
title = {Distributed control based on distributed electronic circuits: application
to vibration control},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1857--1866},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00038-5},
doi = {10.1016/S0026-2714(01)00038-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaderLM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerS01,
author = {Ming{-}Dou Ker and
Yu{-}Yu Sung},
title = {Hardware/firmware co-design in an 8-bits microcontroller to solve
the system-level {ESD} issue on keyboard},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {417--429},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00242-0},
doi = {10.1016/S0026-2714(00)00242-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KerS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimJPMK01,
author = {Young Pil Kim and
Beom Jun Jin and
Young Wook Park and
Joo Tae Moon and
Sang U. Kim},
title = {Analysis of retention tail distribution induced by scaled shallow
trench isolation for high densityDRAMs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1301--1305},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00192-5},
doi = {10.1016/S0026-2714(01)00192-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimJPMK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KingLW01,
author = {Everett E. King and
Ronald C. Lacoe and
Janet Wang{-}Ratkovic},
title = {Influence of the lightly doped drain resistance on the worst-case
hot-carrier stress condition for {NMOS} devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {649--660},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00007-5},
doi = {10.1016/S0026-2714(01)00007-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KingLW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KnaussCLKCFWV01,
author = {Lee A. Knauss and
A. B. Cawthorne and
N. Lettsome and
S. Kelly and
S. Chatraphorn and
E. F. Fleet and
F. C. Wellstood and
W. E. Vanderlinde},
title = {Scanning {SQUID} microscopy for current imaging},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1211--1229},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00108-1},
doi = {10.1016/S0026-2714(01)00108-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KnaussCLKCFWV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KolarovaSC01,
author = {R. Kolarova and
Thomas Skotnicki and
J. A. Chroboczek},
title = {Low frequency noise in thin gate oxide MOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {579--585},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00248-1},
doi = {10.1016/S0026-2714(00)00248-1},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KolarovaSC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoyamaUSKM01,
author = {Tohru Koyama and
Masataka Umeno and
Kenichiro Sonoda and
Junko Komori and
Yoji Mashiko},
title = {Locally delineating of junctions and defects by local cross-section
electron-beam-induced-current technique},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1243--1253},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00110-X},
doi = {10.1016/S0026-2714(01)00110-X},
timestamp = {Tue, 25 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KoyamaUSKM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KriegTB01,
author = {K. Krieg and
Douglas J. Thomson and
Gregory E. Bridges},
title = {Electrical probing of deep sub-micron integrated circuits using scanning
probes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1185--1191},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00234-1},
doi = {10.1016/S0026-2714(00)00234-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KriegTB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumanoTIB01,
author = {Yutaka Kumano and
Yoshihiro Tomura and
Minehiro Itagaki and
Yoshihiro Bessho},
title = {Development of chip-on-flex using {SBB} flip-chip technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {525--530},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00258-4},
doi = {10.1016/S0026-2714(00)00258-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KumanoTIB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarMLR01,
author = {A. Kumar and
S. Mahapatra and
R. Lal and
V. Ramgopal Rao},
title = {Multi-frequency transconductance technique for interface characterization
of deep sub-micron SOI-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1049--1051},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00067-1},
doi = {10.1016/S0026-2714(01)00067-1},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KumarMLR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LambSBCAHH01,
author = {Andrew C. Lamb and
J. F. W. Schiz and
J. M. Bonar and
Fuccio Cristiano and
Peter Ashburn and
Stephen Hall and
Peter L. F. Hemment},
title = {Characterisation of emitter/base leakage currents in SiGe HBTs produced
using selective epitaxy},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {273--279},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00219-5},
doi = {10.1016/S0026-2714(00)00219-5},
timestamp = {Tue, 09 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LambSBCAHH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LambertMLVTHBP01,
author = {Benoit Lambert and
Nathalie Malbert and
Nathalie Labat and
Fr{\'{e}}d{\'{e}}ric Verdier and
Andr{\'{e}} Touboul and
P. Huguet and
R. Bonnet and
G. Pataut},
title = {Evolution of {LF} noise in Power PHEMT's submitted to {RF} and {DC}
Step Stresses},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1573--1578},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00186-X},
doi = {10.1016/S0026-2714(01)00186-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LambertMLVTHBP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanchavaBMBM01,
author = {Bakuri Lanchava and
Peter Baumgartner and
Andreas Martin and
Armand Beyer and
Erich Mueller},
title = {Oxide reliability: influence of interface roughness, structure layout,
and depletion layer formation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1097--1100},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00069-5},
doi = {10.1016/S0026-2714(01)00069-5},
timestamp = {Wed, 26 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LanchavaBMBM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaneSD01,
author = {Michael W. Lane and
Jeffrey M. Snodgrass and
Reinhold H. Dauskardt},
title = {Environmental Effects on Interfacial Adhesion},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1615--1624},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00150-0},
doi = {10.1016/S0026-2714(01)00150-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaneSD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLWM01,
author = {Yung{-}Huei Lee and
Tom Linton and
Ken Wu and
Neal R. Mielke},
title = {Effect of trench edge on pMOSFET reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {689--696},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00002-6},
doi = {10.1016/S0026-2714(01)00002-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLWM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeSC01,
author = {Jon C. Lee and
David Su and
J. H. Chuang},
title = {A Novel Application of the {FIB} Lift-out Technique for 3-D {TEM}
Analysis},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1551--1556},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00174-3},
doi = {10.1016/S0026-2714(01)00174-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeSC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LefrancMS01,
author = {Guy Lefranc and
Gerhard Mitic and
H.{-}J. Schultz},
title = {Thermal management and reliability of multi-chip power modules},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1663--1669},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00178-0},
doi = {10.1016/S0026-2714(01)00178-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LefrancMS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeichtFBGS01,
author = {Markus Leicht and
G. Fritzer and
B. Basnar and
S. Golka and
J{\"{u}}rgen Smoliner},
title = {A reliable course of Scanning Capacitance Microscopy analysis applied
for 2D-Dopant Profilings of Power {MOSFET} Devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1535--1537},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00164-0},
doi = {10.1016/S0026-2714(01)00164-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeichtFBGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LenkkeriJ01,
author = {Jaakko Lenkkeri and
Tuomo Jaakola},
title = {Rapid power cycling of flip-chip and {CSP} components on ceramic substrates},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {661--668},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00006-3},
doi = {10.1016/S0026-2714(01)00006-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LenkkeriJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LevinGKOP01,
author = {M. N. Levin and
V. R. Gitlin and
S. G. Kadmensky and
S. S. Ostrouhov and
V. S. Pershenkov},
title = {X-ray and {UV} controlled adjustment of {MOS} {VLSI} circuits threshold
voltages},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {185--191},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00096-2},
doi = {10.1016/S0026-2714(00)00096-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LevinGKOP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LewisPBLFTBP01,
author = {Dean Lewis and
Vincent Pouget and
Thomas Beauch{\^{e}}ne and
Herv{\'{e}} Lapuyade and
Pascal Fouillat and
Andr{\'{e}} Touboul and
Felix Beaudoin and
Philippe Perdu},
title = {Front Side and Backside {OBIT} Mappings applied to Single Event Transient
Testing},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1471--1476},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00198-6},
doi = {10.1016/S0026-2714(01)00198-6},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LewisPBLFTBP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Liebert01,
author = {Silke Liebert},
title = {Failure analysis from the back side of a die},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1193--1201},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00106-8},
doi = {10.1016/S0026-2714(01)00106-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Liebert01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimeGG01,
author = {Fran{\c{c}}ois Lime and
G{\'{e}}rard Ghibaudo and
G. Gu{\'{e}}gan},
title = {Stress induced leakage current at low field in ultra thin oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1421--1425},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00169-X},
doi = {10.1016/S0026-2714(01)00169-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimeGG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinL01,
author = {Chern{-}Sheng Lin and
Li Wen Lue},
title = {An image system for fast positioning and accuracy inspection of ball
grid array boards},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {119--128},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00213-4},
doi = {10.1016/S0026-2714(00)00213-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinYCWCL01,
author = {Kun{-}Wei Lin and
Kuo{-}Hui Yu and
Wen{-}Lung Chang and
Chih{-}Kai Wang and
Wen{-}Huei Chiou and
Wen{-}Chau Liu},
title = {On the InGaP/In\({}_{\mbox{x}}\)Ga\({}_{\mbox{1-x}}\)As pseudomorphic
high electron-mobility transistors for high-temperature operations},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1897--1902},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00093-2},
doi = {10.1016/S0026-2714(01)00093-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinYCWCL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LitzenbergerPBPGEG01,
author = {Martin Litzenberger and
R. Pichler and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Kai Esmark and
Harald Gossner},
title = {Effect of pulse risetime on trigger homogeneity in single finger grounded
gate nMOSFET electrostatic discharge protection devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1385--1390},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00146-9},
doi = {10.1016/S0026-2714(01)00146-9},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LitzenbergerPBPGEG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuXLD01,
author = {Xingsheng Liu and
Shuangyan Xu and
Guo{-}Quan Lu and
David A. Dillard},
title = {Stacked solder bumping technology for improved solder joint reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1979--1992},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00117-2},
doi = {10.1016/S0026-2714(01)00117-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuXLD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LucovskyRJ01,
author = {Gerald Lucovsky and
Gilbert B. Rayner and
Robert S. Johnson},
title = {Chemical and physical limits on the performance of metal silicate
high-k gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {937--945},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00046-4},
doi = {10.1016/S0026-2714(01)00046-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LucovskyRJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LundquistDHLT01,
author = {Ted R. Lundquist and
E. Delenia and
J. Harroun and
E. LeRoy and
Chun{-}Cheng Tsao},
title = {Ultra-Thinning of {C4} Integrated Circuits for Backside Analysis during
First Silicon Debug},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1545--1549},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00171-8},
doi = {10.1016/S0026-2714(01)00171-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LundquistDHLT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MagnusS01,
author = {Wim Magnus and
Wim Schoenmaker},
title = {On the calculation of gate tunneling currents in ultra-thin metal-insulator-semiconductor
capacitors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {31--35},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00205-5},
doi = {10.1016/S0026-2714(00)00205-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MagnusS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaloneyK01,
author = {Timothy J. Maloney and
Wilson Kan},
title = {Stacked {PMOS} clamps for high voltage power supply protection},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {359--366},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00241-9},
doi = {10.1016/S0026-2714(00)00241-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaloneyK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManicPP01,
author = {Dragan Manic and
J. Petr and
Rade S. Popovic},
title = {Die stress drift measurement in {IC} plastic packages using the piezo-Hall
effect},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {767--771},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00010-5},
doi = {10.1016/S0026-2714(01)00010-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManicPP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaoTX01,
author = {Lingfeng Mao and
Changhua Tan and
Mingzhen Xu},
title = {The effect of image potential on electron transmission and electric
current in the direct tunneling regime of ultra-thin {MOS} structures},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {927--931},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00037-3},
doi = {10.1016/S0026-2714(01)00037-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaoTX01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaoYWZXT01,
author = {Lingfeng Mao and
Yao Yang and
Jian{-}Lin Wei and
Heqiu Zhang and
Mingzhen Xu and
Changhua Tan},
title = {Effect of SiO\({}_{\mbox{2}}\)/Si interface roughness on gate current},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1903--1907},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00099-3},
doi = {10.1016/S0026-2714(01)00099-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaoYWZXT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-MartinezPPG01,
author = {M. J. Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Susana P{\'{e}}rez and
Daniel Pardo and
Tom{\'{a}}s Gonz{\'{a}}lez},
title = {High injection effects on noise characteristics of Si BJTs and SiGe
HBTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {847--854},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00022-1},
doi = {10.1016/S0026-2714(01)00022-1},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezPPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin01,
author = {Andreas Martin},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {935},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00119-6},
doi = {10.1016/S0026-2714(01)00119-6},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Masana01,
author = {F. N. Masana},
title = {A new approach to the dynamic thermal modelling of semiconductor packages},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {901--912},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00013-0},
doi = {10.1016/S0026-2714(01)00013-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Masana01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MateosGPHC01,
author = {Javier Mateos and
Tom{\'{a}}s Gonz{\'{a}}lez and
Daniel Pardo and
Virginie Hoel and
Alain Cappy},
title = {Monte Carlo simulation of electronic characteristics in short channel
{\(\delta\)}-doped AlInAs/GaInAs HEMTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {73--77},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00211-0},
doi = {10.1016/S0026-2714(00)00211-0},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MateosGPHC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MathewsonOF01,
author = {Alan Mathewson and
Carlos Montes de Oca and
Sean Foley},
title = {Thermomechanical stress analysis of Cu/low-k dielectric interconnect
schemes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1637--1641},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00160-3},
doi = {10.1016/S0026-2714(01)00160-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MathewsonOF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MazumderYMKM01,
author = {M. K. Mazumder and
S. Yamamoto and
H. Maeda and
J. Komori and
Y. Mashiko},
title = {Mechanism of pre-annealing effect on electromigration immunity of
Al-Cu line},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1259--1264},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00111-1},
doi = {10.1016/S0026-2714(01)00111-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MazumderYMKM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MechtelCF01,
author = {Deborah M. Mechtel and
Harry K. Charles Jr. and
Arthur S. Francomacaro},
title = {The development of poled polyimide dielectric layers for simultaneous
testing and light guiding applications in MCM-Ds},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1847--1855},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00132-9},
doi = {10.1016/S0026-2714(01)00132-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MechtelCF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoCZ01,
author = {Gaudenzio Meneghesso and
Gaudenzio Chini and
Enrico Zanoni},
title = {Long Term Stability of InGaAs/AlInAs/GaAs Methamorphic HEMTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1579--1584},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00189-5},
doi = {10.1016/S0026-2714(01)00189-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoCZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoPV01,
author = {Gaudenzio Meneghesso and
Simona Podda and
Massimo Vanzi},
title = {Investigation on ESD-stressed GaN/InGaN-on-sapphire blue LEDs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1609--1614},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00201-3},
doi = {10.1016/S0026-2714(01)00201-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoPV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mergens01,
author = {Markus P. J. Mergens},
title = {Foreword - On-Chip {ESD}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1737},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00029-4},
doi = {10.1016/S0026-2714(01)00029-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mergens01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mijalkovic01,
author = {Slobodan Mijalkovic},
title = {A new finite element approach to stress analysis in microfabrication
technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {837--845},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00023-3},
doi = {10.1016/S0026-2714(01)00023-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mijalkovic01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MikhelashviliE01,
author = {V. Mikhelashvili and
Gadi Eisenstein},
title = {Optical and electrical characterization of the electron beam gun evaporated
TiO\({}_{\mbox{2}}\) film},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1057--1061},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00075-0},
doi = {10.1016/S0026-2714(01)00075-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MikhelashviliE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MikolajickDHKKNMM01,
author = {Thomas Mikolajick and
Christine Dehm and
Walter Hartner and
Ivan Kasko and
Marcus J. Kastner and
Nicolas Nagel and
Manfred Moert and
Carlos Mazure},
title = {FeRAM technology for high density applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {947--950},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00049-X},
doi = {10.1016/S0026-2714(01)00049-X},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MikolajickDHKKNMM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MilitaruSMCB01,
author = {Liviu Militaru and
A. Souifi and
M. Mouis and
Alain Chantre and
G. Br{\'{e}}mond},
title = {Investigation of deep traps in silicon-germanium epitaxial base bipolar
transistors with a single polysilicon quasi self-aligned architecture},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {253--263},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00097-4},
doi = {10.1016/S0026-2714(00)00097-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MilitaruSMCB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MillerKW01,
author = {James W. Miller and
Michael G. Khazhinsky and
James C. Weldon},
title = {Layout and bias options for maximizing V\({}_{\mbox{t1}}\) in cascoded
{NMOS} output buffers},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1751--1760},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00031-2},
doi = {10.1016/S0026-2714(01)00031-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MillerKW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MitsuiYKSA01,
author = {Yasuhiro Mitsui and
Fumiko Yano and
Hiroshi Kakibayashi and
Hiroyasu Shichi and
Takashi Aoyama},
title = {Developments of new concept analytical instruments for failure analyses
of sub-100 nm devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1171--1183},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00105-6},
doi = {10.1016/S0026-2714(01)00105-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MitsuiYKSA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiuraNF01,
author = {Katsuyoshi Miura and
Koji Nakamae and
Hiromu Fujioka},
title = {Development of an {EB/FIB} Integrated Test System},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1489--1494},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00147-0},
doi = {10.1016/S0026-2714(01)00147-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiuraNF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohapatraDSDR01,
author = {Nihar R. Mohapatra and
Arijit Dutta and
G. Sridhar and
Madhav P. Desai and
V. Ramgopal Rao},
title = {Sub-100 nm {CMOS} circuit performance with high-K gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1045--1048},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00068-3},
doi = {10.1016/S0026-2714(01)00068-3},
timestamp = {Fri, 08 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MohapatraDSDR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MonsieurVPG01,
author = {Frederic Monsieur and
E. Vincent and
G. Pananakakis and
G{\'{e}}rard Ghibaudo},
title = {Wear-out, breakdown occurrence and failure detection in 18-25 {\AA}
ultrathin oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1035--1039},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00064-6},
doi = {10.1016/S0026-2714(01)00064-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MonsieurVPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MonsieurVRBPG01,
author = {Frederic Monsieur and
E. Vincent and
David Roy and
S. Bruy{\`{e}}re and
G. Pananakakis and
G{\'{e}}rard Ghibaudo},
title = {Determination of Dielectric Breakdown Weibull Distribution Parameters
Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1295--1300},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00183-4},
doi = {10.1016/S0026-2714(01)00183-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MonsieurVRBPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MooreJ01,
author = {Thomas D. Moore and
John L. Jarvis},
title = {Improved reliability in small multichip ball grid arrays},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {461--469},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00230-4},
doi = {10.1016/S0026-2714(00)00230-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MooreJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MroozKPSVBM01,
author = {O. Mrooz and
A. Kovalski and
J. Pogorzelska and
O. I. Shpotyuk and
M. Vakiv and
Bohdan S. Butkiewicz and
J. Maciak},
title = {Thermoelectrical degradation processes in {NTC} thermistors for in-rush
current protection of electronic circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {773--777},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00027-0},
doi = {10.1016/S0026-2714(01)00027-0},
timestamp = {Mon, 18 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MroozKPSVBM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuTX01,
author = {Fuchen Mu and
Changhua Tan and
Mingzhen Xu},
title = {Proportional difference estimate method of determining characteristic
parameters of normal and log-normal distributions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {129--131},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00029-9},
doi = {10.1016/S0026-2714(00)00029-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuTX01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuXTD01,
author = {Fuchen Mu and
Mingzhen Xu and
Changhua Tan and
Xiaorong Duan},
title = {A new lifetime prediction method for hot-carrier degradation in n-MOSFETs
with ultrathin gate oxides under V\({}_{\mbox{g}}\)=V\({}_{\mbox{d}}\)},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1909--1913},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00118-4},
doi = {10.1016/S0026-2714(01)00118-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuXTD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Muehlhoff01,
author = {A. Muehlhoff},
title = {An Extrapolation Model for Lifetime Prediction for Off-State - Degradation
of MOS-FETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1289--1293},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00176-7},
doi = {10.1016/S0026-2714(01)00176-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Muehlhoff01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MurayamaYN01,
author = {Hide Murayama and
Makoto Yamazaki and
Shigeru Nakajima},
title = {Electromigration and electrochemical reaction mixed failure mechanism
in gold interconnection system},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1265--1272},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00112-3},
doi = {10.1016/S0026-2714(01)00112-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MurayamaYN01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NakabayashiOSICKYM01,
author = {M. Nakabayashi and
Hidenori Ohyama and
Eddy Simoen and
M. Ikegami and
Cor Claeys and
K. Kobayashi and
M. Yoneoka and
K. Miyahara},
title = {Reliability of polycrystalline silicon thin film resistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1341--1346},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00214-1},
doi = {10.1016/S0026-2714(01)00214-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NakabayashiOSICKYM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NingSVGTR01,
author = {Zhenqiu Ning and
Yuri Sneyders and
Wim Vanderbauwhede and
Renaud Gillon and
Marnix Tack and
Paul Raes},
title = {A compact test structure for characterisation of leakage currents
in sub-micron {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1939--1945},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00100-7},
doi = {10.1016/S0026-2714(01)00100-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NingSVGTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OReillyDOOMM01,
author = {Stephen O'Reilly and
Maeve Duffy and
Thomas Ott and
Terence O'Donnell and
Paul McCloskey and
S. Cian O'Mathuna},
title = {Characterisation of embedded filters in advanced printed wiring boards},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {781--788},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00043-9},
doi = {10.1016/S0026-2714(01)00043-9},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OReillyDOOMM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OSullivanCMMG01,
author = {P. O'Sullivan and
Raphael Clerc and
Kevin G. McCarthy and
Alan Mathewson and
G{\'{e}}rard Ghibaudo},
title = {Direct tunnelling models for circuit simulation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {951--957},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00047-6},
doi = {10.1016/S0026-2714(01)00047-6},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OSullivanCMMG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OSullivanHCSW01,
author = {Barry J. O'Sullivan and
Paul K. Hurley and
F. N. Cubaynes and
P. A. Stolk and
F. P. Widdershoven},
title = {Flat band voltage shift and oxide properties after rapid thermal annealing},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1053--1056},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00073-7},
doi = {10.1016/S0026-2714(01)00073-7},
timestamp = {Mon, 14 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OSullivanHCSW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OhyamaNSCTHOK01,
author = {Hidenori Ohyama and
M. Nakabayashi and
Eddy Simoen and
Cor Claeys and
T. Tanaka and
T. Hirao and
S. Onada and
K. Kobayashi},
title = {Radiation damages of polycrystalline silicon films and npn Si transistors
by high-energy particle irradiation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1443--1448},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00182-2},
doi = {10.1016/S0026-2714(01)00182-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OhyamaNSCTHOK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OhyamaSKCTHKNS01,
author = {Hidenori Ohyama and
Eddy Simoen and
S. Kuroda and
Cor Claeys and
Y. Takami and
T. Hakata and
K. Kobayashi and
M. Nakabayashi and
Hiromi Sunaga},
title = {Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy
particle},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {79--85},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00073-1},
doi = {10.1016/S0026-2714(00)00073-1},
timestamp = {Tue, 15 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OhyamaSKCTHKNS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OohashiFKYKKKTYI01,
author = {H. Oohashi and
M. Fukuda and
Yasuhiro Kondo and
M. Yamamoto and
Y. Kadota and
Yoshihiro Kawaguchi and
K. Kishi and
Y. Tohmori and
K. Yokoyama and
Y. Itaya},
title = {Highly reliable spot-size converter integrated laser diodes over a
wide temperature range for access network systems},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {111--118},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00215-8},
doi = {10.1016/S0026-2714(00)00215-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OohashiFKYKKKTYI01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OstenLMZ01,
author = {H. J{\"{o}}rg Osten and
J. P. Liu and
H.{-}J. M{\"{u}}ssig and
P. Zaumseil},
title = {Epitaxial, high-K dielectrics on silicon: the example of praseodymium
oxide},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {991--994},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00054-3},
doi = {10.1016/S0026-2714(01)00054-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OstenLMZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaineWSWNDH01,
author = {Bruce M. Paine and
Richard C. Wong and
Adele E. Schmitz and
Robert H. Walden and
Loi D. Nguyen and
Michael J. Delaney and
Kenny C. Hum},
title = {Ka-band InP high electron mobility transistor monolithic microwave
integrated circuit reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1115--1122},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00083-X},
doi = {10.1016/S0026-2714(01)00083-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaineWSWNDH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalmMTR01,
author = {Petteri Palm and
Jarmo M{\"{a}}{\"{a}}tt{\"{a}}nen and
Aulis Tuominen and
Eero Ristolainen},
title = {Reliability of 80 mum pitch flip chip attachment on flex},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {633--638},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00009-9},
doi = {10.1016/S0026-2714(01)00009-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PalmMTR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetersenCSVBP01,
author = {R. Petersen and
Ward De Ceuninck and
Luc De Schepper and
Olivier Vendier and
Herv{\'{e}} Blanck and
Dominique Pons},
title = {Determination of the thermal resistance and current exponent of heterojunction
bipolar transistors for reliability evaluation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1591--1596},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00195-0},
doi = {10.1016/S0026-2714(01)00195-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PetersenCSVBP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PieperS01,
author = {Klaus{-}Willi Pieper and
Martin Sauter},
title = {Direct temperature measurement of integrated microelectronic devices
by thermally induced leakage currents},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {133--136},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00221-3},
doi = {10.1016/S0026-2714(00)00221-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PieperS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PomplEWK01,
author = {T. Pompl and
C. Engel and
H. Wurzer and
Martin Kerber},
title = {Soft breakdown and hard breakdown in ultra-thin oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {543--551},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00253-5},
doi = {10.1016/S0026-2714(00)00253-5},
timestamp = {Fri, 09 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PomplEWK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoonGKMW01,
author = {M. C. Poon and
Y. Gao and
Ted Chi{-}Wah Kok and
A. M. Myasnikov and
Hei Wong},
title = {{SIMS} study of silicon oxynitride prepared by oxidation of silicon-rich
silicon nitride layer},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2071--2074},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00216-5},
doi = {10.1016/S0026-2714(01)00216-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PoonGKMW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PortiBNAOE01,
author = {Marc Porti and
X. Blasco and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
Alexander Olbrich and
Bernd Ebersberger},
title = {Local current fluctuations before and after breakdown of thin SiO\({}_{\mbox{2}}\)
films observed with conductive atomic force microscope},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1041--1044},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00066-X},
doi = {10.1016/S0026-2714(01)00066-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PortiBNAOE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PougetLFLB01,
author = {Vincent Pouget and
Herv{\'{e}} Lapuyade and
Pascal Fouillat and
Dean Lewis and
S. Buchner},
title = {Theoretical Investigation of an Equivalent Laser {LET}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1513--1518},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00156-1},
doi = {10.1016/S0026-2714(01)00156-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PougetLFLB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PuchnerLKDC01,
author = {Helmut Puchner and
Y.{-}C. Liu and
W. Kong and
F. Duan and
R. Castagnetti},
title = {Substrate Engineering to Improve Soft-Error-Rate Immunity for {SRAM}
Technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1319--1324},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00207-4},
doi = {10.1016/S0026-2714(01)00207-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PuchnerLKDC01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Qi01,
author = {Quan Qi},
title = {Reliability studies of two flip-chip {BGA} packages using power cycling
test},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {553--562},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00252-3},
doi = {10.1016/S0026-2714(00)00252-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Qi01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RamakrishnanSP01,
author = {Bharatwaj Ramakrishnan and
Peter Sandborn and
Michael G. Pecht},
title = {Process capability indices and product reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2067--2070},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00227-X},
doi = {10.1016/S0026-2714(01)00227-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RamakrishnanSP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RautioahoNLLJ01,
author = {Risto Rautioaho and
Olli Nousiainen and
Seppo Lepp{\"{a}}vuori and
Jaakko Lenkkeri and
Tuomo Jaakola},
title = {Thermal fatigue in solder joints of Ag-Pd and Ag-Pt metallized {LTCC}
modules},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1643--1648},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00163-9},
doi = {10.1016/S0026-2714(01)00163-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RautioahoNLLJ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReicherSSA01,
author = {Roland Reicher and
Walter Smetana and
Julius C. Schuster and
Alexander Adla{\ss}nig},
title = {A fritless copper conductor system for power electronic applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {491--498},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00264-X},
doi = {10.1016/S0026-2714(00)00264-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReicherSSA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReimboldP01,
author = {Gilles Reimbold and
T. Poiroux},
title = {Plasma charging damage mechanisms and impact on new technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {959--965},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00045-2},
doi = {10.1016/S0026-2714(01)00045-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReimboldP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReinerK01,
author = {Joachim C. Reiner and
Thomas Keller},
title = {Relevance of contact reliability in {HBM-ESD} test equipment},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1397--1401},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00155-X},
doi = {10.1016/S0026-2714(01)00155-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReinerK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RembeAWHDMW01,
author = {Christian Rembe and
Harald Aschemann and
Stefan aus der Wiesche and
Eberhard P. Hofer and
H{\'{e}}l{\`{e}}ne Deb{\'{e}}da and
J{\"{u}}rgen Mohr and
Ulrike Wallrabe},
title = {Testing and improvement of micro-optical-switch dynamics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {471--480},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00216-X},
doi = {10.1016/S0026-2714(00)00216-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RembeAWHDMW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RenH01,
author = {Hongxia Ren and
Yue Hao},
title = {Study on the degradation induced by donor interface state in deep-sub-micron
grooved-gate P-channel MOSFET's},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {597--604},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00233-X},
doi = {10.1016/S0026-2714(00)00233-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RenH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RevilG01,
author = {Nathalie Revil and
Xavier Garros},
title = {Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation
Model Limitations and Applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1307--1312},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00203-7},
doi = {10.1016/S0026-2714(01)00203-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RevilG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rey-TauriacTB01,
author = {Yannick Rey{-}Tauriac and
M. Taurin and
Olivier Bonnaud},
title = {Wafer Level Accelerated test for ionic contamination control on {VDMOS}
transistors in Bipolar/CMOS/DMOS},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1331--1334},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00209-8},
doi = {10.1016/S0026-2714(01)00209-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rey-TauriacTB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rey-TauriacTB01a,
author = {Yannick Rey{-}Tauriac and
M. Taurin and
Olivier Bonnaud},
title = {High reliability power {VDMOS} Transistors in Bipolar/CMOS/DMOS technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1707--1712},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00204-9},
doi = {10.1016/S0026-2714(01)00204-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rey-TauriacTB01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RocakBHSKPS01,
author = {Dubravka Rocak and
Darko Belavic and
Marko Hrovat and
Josef Sikula and
Pavel Koktavy and
Jan Pavelka and
Vlasta Sedlakova},
title = {Low-frequency noise of thick-film resistors as quality and reliability
indicator},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {531--542},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00255-9},
doi = {10.1016/S0026-2714(00)00255-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RocakBHSKPS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RodriguezPNA01,
author = {Rosana Rodr{\'{\i}}guez and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Influence of a low field with opposite polarity to the stress on the
degradation of 4.5 nm thick SiO\({}_{\mbox{2}}\) films},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1011--1013},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00059-2},
doi = {10.1016/S0026-2714(01)00059-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RodriguezPNA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RodriguezS01,
author = {M. P. Rodriguez and
Noel Y. A. Shammas},
title = {Finite element simulation of thermal fatigue in multilayer structures:
thermal and mechanical approach},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {517--523},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00256-0},
doi = {10.1016/S0026-2714(00)00256-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RodriguezS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch01,
author = {William J. Roesch},
title = {Volume impacts on GaAs reliability improvement},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1123--1127},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00084-1},
doi = {10.1016/S0026-2714(01)00084-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Roesch01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoldSMSBD01,
author = {M. Da Rold and
Eddy Simoen and
Sofie Mertens and
Marc Schaekers and
G. Badenes and
Stefaan Decoutere},
title = {Impact of gate oxide nitridation process on 1/f noise in 0.18 mum
{CMOS}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1933--1938},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00098-1},
doi = {10.1016/S0026-2714(01)00098-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoldSMSBD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RosenbaumW01,
author = {Elyse Rosenbaum and
Jie Wu},
title = {Trap generation and breakdown processes in very thin gate oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {625--632},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00026-9},
doi = {10.1016/S0026-2714(01)00026-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RosenbaumW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SandenMGO01,
author = {Martin Sand{\'{e}}n and
B. Gunnar Malm and
Jan V. Grahn and
Mikael {\"{O}}stling},
title = {Lateral base design rules for optimized low-frequency noise of differentially
grown SiGe heterojunction bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {881--886},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00016-6},
doi = {10.1016/S0026-2714(01)00016-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SandenMGO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SarhanA01,
author = {Ammar M. Sarhan and
Abdul{-}Rahman M. Abouammoh},
title = {Reliability of k-out-of-n nonrepairable systems with nonindependent
components subjected to common shocks},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {617--621},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00254-7},
doi = {10.1016/S0026-2714(00)00254-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SarhanA01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Scavennec01,
author = {A. Scavennec},
title = {Introduction of InP high speed electronics into optical fiber transmission
systems and current technological limits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1563--1566},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00181-0},
doi = {10.1016/S0026-2714(01)00181-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Scavennec01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchauerSM01,
author = {P. Schauer and
Josef Sikula and
Pavel Moravec},
title = {Transport and noise properties of CdTe(Cl) crystals},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {431--436},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00200-6},
doi = {10.1016/S0026-2714(00)00200-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchauerSM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchefflerCT01,
author = {Michael Scheffler and
Didier Cottet and
Gerhard Tr{\"{o}}ster},
title = {A simplified yield modeling method for design rule trade-off in interconnection
substrates},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {861--869},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00020-8},
doi = {10.1016/S0026-2714(01)00020-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchefflerCT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchenkelPWAF01,
author = {Michael Schenkel and
Paul Pf{\"{a}}ffli and
Wolfgang Wilkening and
D. Aemmer and
Wolfgang Fichtner},
title = {Substrate potential shift due to parasitic minority carrier injection
in smart-power ICs: measurements and full-chip 3D device simulation},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {815--822},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00028-2},
doi = {10.1016/S0026-2714(01)00028-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchenkelPWAF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScheuermannH01,
author = {Uwe Scheuermann and
E. Herr},
title = {A Novel Power Module Design and Technology for Improved Power Cycling
Capability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1713--1718},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00205-0},
doi = {10.1016/S0026-2714(01)00205-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ScheuermannH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlegelHR01,
author = {Reinhard Schlegel and
E. Herr and
F. Richter},
title = {Reliability of non-hermetic pressure contact {IGBT} modules},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1689--1694},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00193-7},
doi = {10.1016/S0026-2714(01)00193-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlegelHR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchusterVS01,
author = {Constance E. Schuster and
Mark G. Vangel and
Harry A. Schafft},
title = {Improved estimation of the resistivity of pure copper and electrical
determination of thin copper film dimensions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {239--252},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00227-4},
doi = {10.1016/S0026-2714(00)00227-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchusterVS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Schwalke01,
author = {Udo Schwalke},
title = {Progress in device isolation technology},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {483--490},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00259-6},
doi = {10.1016/S0026-2714(00)00259-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Schwalke01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchwalkePSK01,
author = {Udo Schwalke and
Martin P{\"{o}}lzl and
Thomas Sekinger and
Martin Kerber},
title = {Ultra-thick gate oxides: charge generation and its impact on reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1007--1010},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00058-0},
doi = {10.1016/S0026-2714(01)00058-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchwalkePSK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchwierzL01,
author = {F. Schwierz and
Juin J. Liou},
title = {Semiconductor devices for {RF} applications: evolution and current
status},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {145--168},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00076-7},
doi = {10.1016/S0026-2714(00)00076-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchwierzL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShengTRV01,
author = {L. Y. Sheng and
C. De Tandt and
Willy Ranson and
Roger Vounckx},
title = {Reliability aspects of thermal micro-structures implemented on industrial
0.8 mum {CMOS} chips},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {307--315},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00226-2},
doi = {10.1016/S0026-2714(00)00226-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShengTRV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SimonG01,
author = {G. Simon and
G. Guffroy},
title = {A pragmatic methodology for the monitoring of the electronic components
ageing: The case of power thyristors at {EDF}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1701--1705},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00200-1},
doi = {10.1016/S0026-2714(01)00200-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SimonG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Smith01,
author = {Jeremy C. Smith},
title = {An anti-snapback circuit technique for inhibiting parasitic bipolar
conduction during {EOS/ESD} events},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {349--357},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00244-4},
doi = {10.1016/S0026-2714(00)00244-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Smith01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SorgeH01,
author = {Roland Sorge and
Bernd Heinemann},
title = {Recombination current measurements in the space charge region of {MOS}
field-induced pn junctions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {789--795},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00040-3},
doi = {10.1016/S0026-2714(01)00040-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SorgeH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SouzaWMNO01,
author = {Merlyne M. De Souza and
J. Wang and
S. K. Manhas and
E. M. Sankara Narayanan and
A. S. Oates},
title = {A comparison of early stage hot carrier degradation behaviour in 5
and 3 {V} sub-micron low doped drain metal oxide semiconductor field
effect transistors},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {169--177},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00210-9},
doi = {10.1016/S0026-2714(00)00210-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SouzaWMNO01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SpontonCCCCMZ01,
author = {Luca Sponton and
Lorenzo Cerati and
Giuseppe Croce and
Francesco Chrappan and
Claudio Contiero and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {{ESD} protection structures for {BCD5} smart power technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1683--1687},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00188-3},
doi = {10.1016/S0026-2714(01)00188-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SpontonCCCCMZ01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StadlerGBDPHBE01,
author = {A. Stadler and
I. Genchev and
A. Bergmaier and
G. Dollinger and
Vesselinka Petrova{-}Koch and
Walter Hansch and
H. Baumg{\"{a}}rtner and
I. Eisele},
title = {Nitrogen implantations for rapid thermal oxinitride layers},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {977--980},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00051-8},
doi = {10.1016/S0026-2714(01)00051-8},
timestamp = {Mon, 18 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StadlerGBDPHBE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StamD01,
author = {F. A. Stam and
E. Davitt},
title = {Effects of thermomechanical cycling on lead and lead-free (SnPb and
SnAgCu) surface mount solder joints},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1815--1822},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00087-7},
doi = {10.1016/S0026-2714(01)00087-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StamD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StellariZCV01,
author = {Franco Stellari and
Franco Zappa and
Sergio Cova and
L. Vendrame},
title = {Tools for contactless testing and simulation of {CMOS} circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1801--1808},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00091-9},
doi = {10.1016/S0026-2714(01)00091-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StellariZCV01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stepniak01,
author = {Frank Stepniak},
title = {Conversion of the under bump metallurgy into intermetallics: the impact
on flip chip reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {735--744},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00015-4},
doi = {10.1016/S0026-2714(01)00015-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stepniak01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojadinovic01,
author = {Ninoslav Stojadinovic},
title = {Understanding Semiconductor Devices; Sima Dimitrijev. Oxford University
Press, New York. 2000. {ISBN:} 0-19-513186-X},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {142--143},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00102-5},
doi = {10.1016/S0026-2714(00)00102-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojadinovic01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicMDDGD01,
author = {Ninoslav Stojadinovic and
Ivica Manic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Snezana Golubovic and
Sima Dimitrijev},
title = {Mechanisms of positive gate bias stress induced instabilities in power
VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1373--1378},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00143-3},
doi = {10.1016/S0026-2714(01)00143-3},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicMDDGD01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicP01,
author = {Ninoslav Stojadinovic and
Michael G. Pecht},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {1},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00232-8},
doi = {10.1016/S0026-2714(00)00232-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicP01a,
author = {Ninoslav Stojadinovic and
Michael G. Pecht},
title = {In memory of D. Stewart Peck},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {481},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00017-8},
doi = {10.1016/S0026-2714(01)00017-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicP01a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StrobelBBR01,
author = {S. Strobel and
Anton J. Bauer and
Matthias Beichele and
Heiner Ryssel},
title = {Suppression of boron penetration through thin gate oxides by nitrogen
implantation into the gate electrode in {PMOS} devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1085--1088},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00072-5},
doi = {10.1016/S0026-2714(01)00072-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StrobelBBR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SukharevSCPS01,
author = {Valeriy Sukharev and
Ben P. Shieh and
Ratan K. Choudhury and
Chong W. Park and
Krishna C. Saraswat},
title = {Reliability Studies on Multilevel Interconnection with Intermetal
Dielectric Air Gaps},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1631--1635},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00153-6},
doi = {10.1016/S0026-2714(01)00153-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SukharevSCPS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SwansonE01,
author = {Dale W. Swanson and
Leonard R. Enlow},
title = {Stress effects of epoxy adhesives on ceramic substrates and magnetics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {499--510},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00263-8},
doi = {10.1016/S0026-2714(00)00263-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SwansonE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SydloMGHKDCCFB01,
author = {Cezary Sydlo and
Bastian Mottet and
Husin Ganis and
Hans L. Hartnagel and
Viktor Krozer and
Sylvain L. Delage and
Simone Cassette and
Eric Chartier and
D. Floriot and
Steven Bland},
title = {Defect detection and modelling using pulsed electrical stress for
reliability investigations of InGaP {HBT}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1567--1571},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00184-6},
doi = {10.1016/S0026-2714(01)00184-6},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SydloMGHKDCCFB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangBCLRB01,
author = {Xiaohui Tang and
Xavier Baie and
Jean{-}Pierre Colinge and
Pierre Loumaye and
Christian Renaux and
Vincent Bayot},
title = {Influence of device geometry on {SOI} single-hole transistor characteristics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1841--1846},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00044-0},
doi = {10.1016/S0026-2714(01)00044-0},
timestamp = {Mon, 18 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TangBCLRB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TeramotoUAKSKOS01,
author = {Akinobu Teramoto and
H. Umeda and
K. Azamawari and
Kiyoteru Kobayashi and
K. Shiga and
J. Komori and
Y. Ohno and
A. Shigetomi},
title = {Time-dependent dielectric breakdown of SiO\({}_{\mbox{2}}\) films
in a wide electric field range},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {47--52},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00095-0},
doi = {10.1016/S0026-2714(00)00095-0},
timestamp = {Fri, 27 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TeramotoUAKSKOS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThobenXSW01,
author = {M. Thoben and
X. Xie and
D. Silber and
J{\"{u}}rgen Wilde},
title = {Reliability of Chip/DCB Solder Joints in AlSiC Base Plate Power Modules:
Influence of Chip Size},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1719--1723},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00210-4},
doi = {10.1016/S0026-2714(01)00210-4},
timestamp = {Tue, 03 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ThobenXSW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThomasFM01,
author = {Stephen Thomas III and
Charles H. Fields and
Meena Madhav},
title = {{RF} modeling approach to determining end-of-life reliability for
InP-based HBTs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1129--1135},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00085-3},
doi = {10.1016/S0026-2714(01)00085-3},
timestamp = {Mon, 08 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ThomasFM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ToutahLTMHGB01,
author = {Hamid Toutah and
Jean{-}Fran{\c{c}}ois Llibre and
Boubekeur Tala{-}Ighil and
Taieb Mohammed{-}Brahim and
Youri Helen and
G. Gautier and
Olivier Bonnaud},
title = {Improved Stability of Large Area Excimer Laser Crstallised Polysilicon
Thin Film Transistors under {DC} and {AC} Operating},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1325--1329},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00208-6},
doi = {10.1016/S0026-2714(01)00208-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ToutahLTMHGB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsangF01,
author = {James C. Tsang and
Massimo V. Fischetti},
title = {Why hot carrier emission based timing probes will work for 50 nm,
1V {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1465--1470},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00194-9},
doi = {10.1016/S0026-2714(01)00194-9},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsangF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaoWBS01,
author = {C.{-}C. Tsao and
Q. S. Wang and
P. Bouchet and
P. Sudraud},
title = {Coaxial Ion-Photon System},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1483--1488},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00145-7},
doi = {10.1016/S0026-2714(01)00145-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaoWBS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsuiYK01,
author = {Bing{-}Yue Tsui and
Tsung{-}Ju Yang and
Tzu{-}Kun Ku},
title = {Impact of interface nature on deep sub-micron Al-plug resistance},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1889--1896},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00090-7},
doi = {10.1016/S0026-2714(01)00090-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsuiYK01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TuCH01,
author = {P. L. Tu and
Y. C. Chan and
K. C. Hung},
title = {Reliability of microBGA assembly using no-flow underfill},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1993--2000},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00115-9},
doi = {10.1016/S0026-2714(01)00115-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TuCH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TuCHL01,
author = {P. L. Tu and
Y. C. Chan and
K. C. Hung and
J. K. L. Lai},
title = {Study of micro-BGA solder joint reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {287--293},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00217-1},
doi = {10.1016/S0026-2714(00)00217-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TuCHL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ValdaperezRBCBL01,
author = {Nicolas Valdaperez and
Jean{-}Marc Routoure and
Daniel Bloyet and
R{\'{e}}gis Carin and
Serge Bardy and
Jacques Lebailly},
title = {Low-frequency noise in single-poly bipolar transistors at low base
current density},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {265--271},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00197-9},
doi = {10.1016/S0026-2714(00)00197-9},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ValdaperezRBCBL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Verhaege01,
author = {Koen G. Verhaege},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {333},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00235-3},
doi = {10.1016/S0026-2714(00)00235-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Verhaege01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VerhaegeR01,
author = {Koen G. Verhaege and
Christian C. Russ},
title = {Novel fully silicided ballasting and {MFT} design techniques for {ESD}
protection in advanced deep sub-micron {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1739--1749},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00030-0},
doi = {10.1016/S0026-2714(01)00030-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VerhaegeR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VidekovTAI01,
author = {Valentin Videkov and
Slavka Tzanova and
Radosvet Arnaudov and
Nikolai Iordanov},
title = {New assembling technique for {BGA} packages without thermal processes},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {611--615},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00257-2},
doi = {10.1016/S0026-2714(00)00257-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VidekovTAI01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VoldmanAACDMW01,
author = {Steven H. Voldman and
W. Anderson and
R. Ashton and
M. Chaine and
Charvaka Duvvury and
T. Maloney and
E. Worley},
title = {A strategy for characterization and evaluation of {ESD} robustness
of {CMOS} semiconductor technologies},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {335--348},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00236-5},
doi = {10.1016/S0026-2714(00)00236-5},
timestamp = {Mon, 14 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VoldmanAACDMW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WagnerFSBMMP01,
author = {Ulrich Wagner and
J. Franz and
M. Schweiker and
Winfried Bernhard and
Roland M{\"{u}}ller{-}Fiedler and
Bernd Michel and
Oliver Paul},
title = {Mechanical Reliability of MEMS-structures under shock load},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1657--1662},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00173-1},
doi = {10.1016/S0026-2714(01)00173-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WagnerFSBMMP01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WalkerFLS01,
author = {D. Greg Walker and
T. S. Fisher and
J. Liu and
Ronald D. Schrimpf},
title = {Thermal modeling of single event burnout failure in semiconductor
power devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {4},
pages = {571--578},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00249-3},
doi = {10.1016/S0026-2714(00)00249-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WalkerFLS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangJJR01,
author = {Yu Wang and
Patrick Juliano and
Sopan Joshi and
Elyse Rosenbaum},
title = {Electrothermal model for simulation of bulk-Si and {SOI} diodes in
{ESD} protection circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1781--1787},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00034-8},
doi = {10.1016/S0026-2714(01)00034-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangJJR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeberHHKSHBJNNF01,
author = {Detlef Weber and
F. H{\"{o}}hnsdorf and
A. Hausmann and
A. Klipp and
Z. Stavreva and
J. Herrmann and
L. Bauch and
M. Junack and
H. Neef and
M. Nichterwitz and
S. Finsterbusch},
title = {Impact of substituting SiO\({}_{\mbox{2}}\) {ILD} by low k materials
into AlCu {RIE} metallization},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1081--1083},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00077-4},
doi = {10.1016/S0026-2714(01)00077-4},
timestamp = {Thu, 10 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WeberHHKSHBJNNF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WiseSPG01,
author = {Loren J. Wise and
Ronald D. Schrimpf and
Harold G. Parks and
Kenneth F. Galloway},
title = {A generalized model for the lifetime of microelectronic components,
applied to storage conditions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {317--322},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00220-1},
doi = {10.1016/S0026-2714(00)00220-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WiseSPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WojciechowskiCM01,
author = {Dominique Wojciechowski and
Moses Chan and
Fabrizio Martone},
title = {Lead-free plastic area array BGAs and polymer stud grid arrays\({}^{\mbox{TM}}\)
package reliability},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1829--1839},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00089-0},
doi = {10.1016/S0026-2714(01)00089-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WojciechowskiCM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfR01,
author = {Ingrid De Wolf and
Mahmoud Rasras},
title = {Spectroscopic photon emission microscopy: a unique tool for failure
analysis of microelectronics devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1161--1169},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00104-4},
doi = {10.1016/S0026-2714(01)00104-4},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongHPG01,
author = {Hei Wong and
P. G. Han and
M. C. Poon and
Y. Gao},
title = {Investigation of the surface silica layer on porous poly-Si thin films},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {179--184},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00098-6},
doi = {10.1016/S0026-2714(00)00098-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongHPG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuJR01,
author = {Jie Wu and
Patrick Juliano and
Elyse Rosenbaum},
title = {Breakdown and latent damage of ultra-thin gate oxides under {ESD}
stress conditions},
journal = {Microelectron. Reliab.},
volume = {41},
number = {11},
pages = {1771--1779},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00033-6},
doi = {10.1016/S0026-2714(01)00033-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuJR01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuL01,
author = {Lifeng Wu and
Zhihong Liu},
title = {Full-Chip Reliability Simulation for {VDSM} Integrated Circuits},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1273--1278},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00166-4},
doi = {10.1016/S0026-2714(01)00166-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuL01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WurflKBMRW01,
author = {Joachim W{\"{u}}rfl and
Paul Kurpas and
Frank Brunner and
Michael Mai and
Matthias Rudolph and
Markus Weyers},
title = {Degradation properties of MOVPE-grown GaInP/GaAs HBTs under combined
temperature and current stressing},
journal = {Microelectron. Reliab.},
volume = {41},
number = {8},
pages = {1103--1108},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00081-6},
doi = {10.1016/S0026-2714(01)00081-6},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WurflKBMRW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiePDH01,
author = {Jingsong Xie and
Michael G. Pecht and
David DeDonato and
Ali Hassanzadeh},
title = {An investigation of the mechanical behavior of conductive elastomer
interconnects},
journal = {Microelectron. Reliab.},
volume = {41},
number = {2},
pages = {281--286},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00214-6},
doi = {10.1016/S0026-2714(00)00214-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiePDH01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YabuharaCF01,
author = {H. Yabuhara and
Mauro Ciappa and
Wolfgang Fichtner},
title = {Diamond-Coated Cantilevers for Scanning Capacitance Microscopy Applications},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1459--1463},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00190-1},
doi = {10.1016/S0026-2714(01)00190-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YabuharaCF01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamadaMHFE01,
author = {Takayuki Yamada and
Masaru Moriwaki and
Yoshinao Harada and
Shinji Fujii and
Koji Eriguchi},
title = {Effects of the sputtering deposition process of metal gate electrode
on the gate dielectric characteristics},
journal = {Microelectron. Reliab.},
volume = {41},
number = {5},
pages = {697--704},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00262-6},
doi = {10.1016/S0026-2714(00)00262-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YamadaMHFE01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YamadaNT01,
author = {Keizo Yamada and
Toyokazu Nakamura and
Tohru Tsujide},
title = {An in-line process monitoring method using electron beam induced substrate
current},
journal = {Microelectron. Reliab.},
volume = {41},
number = {3},
pages = {455--459},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00204-3},
doi = {10.1016/S0026-2714(00)00204-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YamadaNT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YanYHLY01,
author = {B. P. Yan and
Y. F. Yang and
C. C. Hsu and
H. B. Lo and
E. S. Yang},
title = {A reliability comparison of InGaP/GaAs HBTs with and without passivation
ledge},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {1959--1963},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00222-0},
doi = {10.1016/S0026-2714(01)00222-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YanYHLY01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangW01,
author = {Nian Yang and
Jimmie J. Wortman},
title = {A study of the effects of tunneling currents and reliability of sub-2
nm gate oxides on scaled n-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {41},
number = {1},
pages = {37--46},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(00)00099-8},
doi = {10.1016/S0026-2714(00)00099-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangW01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YokogawaOKT01,
author = {Shinji Yokogawa and
Norio Okada and
Yumi Kakuhara and
Hideyuki Takizawa},
title = {Electromigration Performance of Multi-level Damascene Copper Interconnects},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1409--1416},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00162-7},
doi = {10.1016/S0026-2714(01)00162-7},
timestamp = {Wed, 10 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YokogawaOKT01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zahlmann-NowitzkiNS01,
author = {Jan{-}Werner Zahlmann{-}Nowitzki and
Lars Nebrich and
Peter Seegebrecht},
title = {On the influence of the variation of measurement conditions on the
{FNT} characteristics of stressed thin silicon oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1067--1069},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00074-9},
doi = {10.1016/S0026-2714(01)00074-9},
timestamp = {Thu, 09 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zahlmann-NowitzkiNS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZanderPSM01,
author = {Damien Zander and
Christian Petit and
F. Saign{\'{e}} and
A. Meinertzhagen},
title = {High field stress at and above room temperature in 2.3 nm thick oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {1023--1026},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00062-2},
doi = {10.1016/S0026-2714(01)00062-2},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZanderPSM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZanderSM01,
author = {D. Zander and
F. Saign{\'{e}} and
A. Meinertzhagen},
title = {Creation and thermal annealing of interface states induced by uniform
or localized injection in 2.3nm thick oxides},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1355--1360},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00140-8},
doi = {10.1016/S0026-2714(01)00140-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZanderSM01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoRBYHHNGHB01,
author = {Chao Zhao and
Gert Roebben and
Hugo Bender and
Edward Young and
S. Haukka and
Michel Houssa and
Mohamed Naili and
Stefan De Gendt and
Marc M. Heyns and
Omer Van der Biest},
title = {In situ crystallisation in ZrO\({}_{\mbox{2}}\) thin films during
high temperature X-ray diffraction},
journal = {Microelectron. Reliab.},
volume = {41},
number = {7},
pages = {995--998},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00055-5},
doi = {10.1016/S0026-2714(01)00055-5},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhaoRBYHHNGHB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuangCCS01,
author = {W. D. Zhuang and
P. C. Chang and
F. Y. Chou and
R. K. Shiue},
title = {Effect of solder creep on the reliability of large area die attachment},
journal = {Microelectron. Reliab.},
volume = {41},
number = {12},
pages = {2011--2021},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00101-9},
doi = {10.1016/S0026-2714(01)00101-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuangCCS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZmeckPBOWBNSFB01,
author = {M. Zmeck and
J. C. H. Phang and
Andrew Bettiol and
T. Osipowicz and
F. Watt and
L. J. Balk and
Franz{-}Josef Niedernostheide and
Hans{-}Joachim Schulze and
E. Falck and
R. Barthelmess},
title = {Analysis of high-power devices using proton beam induced charge microscopy},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1519--1524},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00159-7},
doi = {10.1016/S0026-2714(01)00159-7},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZmeckPBOWBNSFB01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zwolinski01,
author = {Mark Zwolinski},
title = {A technique for transparent fault injection and simulation in {VHDL}},
journal = {Microelectron. Reliab.},
volume = {41},
number = {6},
pages = {797--804},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00039-7},
doi = {10.1016/S0026-2714(01)00039-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zwolinski01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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