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@article{DBLP:journals/mr/0001RI15,
author = {Paolo Lorenzi and
Rosario Rao and
Fernanda Irrera},
title = {Conductive filament evolution in HfO\({}_{\mbox{2}}\) resistive {RAM}
device during constant voltage stress},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1446--1449},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.083},
doi = {10.1016/J.MICROREL.2015.06.083},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/0001RI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbbateBIMSSTV15,
author = {Carmine Abbate and
Giovanni Busatto and
Francesco Iannuzzo and
S. Mattiazzo and
Annunziata Sanseverino and
L. Silvestrin and
D. Tedesco and
Francesco Velardi},
title = {Experimental study of Single Event Effects induced by heavy ion irradiation
in enhancement mode GaN power {HEMT}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1496--1500},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.139},
doi = {10.1016/J.MICROREL.2015.06.139},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbateBIMSSTV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AbdelwahedTSS15,
author = {N. Abdelwahed and
M. Troudi and
Nabil Sghaier and
Abdelkader Souifi},
title = {Impact of defect on {I(V)} instabilities observed on Ti/4H-SiC high
voltage Schottky diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1169--1173},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.049},
doi = {10.1016/J.MICROREL.2015.06.049},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AbdelwahedTSS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AdokanouIMPBM15,
author = {K. Adokanou and
Karim Inal and
Pierre Montmitonnet and
F. Pressecq and
Barbara Bonnet and
J. L. Muraro},
title = {Investigation on the effect of external mechanical stress on the {DC}
characteristics of GaAs microwave devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1697--1702},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.033},
doi = {10.1016/J.MICROREL.2015.06.033},
timestamp = {Mon, 14 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AdokanouIMPBM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AgeevKBSK15,
author = {O. A. Ageev and
Alexey S. Kolomiytsev and
A. V. Bykov and
V. A. Smirnov and
I. N. Kots},
title = {Fabrication of advanced probes for atomic force microscopy using focused
ion beam},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2131--2134},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.079},
doi = {10.1016/J.MICROREL.2015.06.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AgeevKBSK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhilanD15,
author = {A. Ahilan and
P. Deepa},
title = {Design for built-in {FPGA} reliability via fine-grained 2-D error
correction codes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2108--2112},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.075},
doi = {10.1016/J.MICROREL.2015.06.075},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhilanD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlamMBKH15,
author = {M. T. Alam and
K. E. Maletto and
J. Bielefeld and
Sean W. King and
M. Aman Haque},
title = {Mechanical stress field assisted charge de-trapping in carbon doped
oxides},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {846--851},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.017},
doi = {10.1016/J.MICROREL.2015.02.017},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlamMBKH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlbertiVMT15,
author = {R. Alberti and
Riccardo Enrici Vaion and
A. Mervic and
S. Testa},
title = {Metal fatigue in copper pillar Flip Chip {BGA:} {A} refined acceleration
model for the aluminium pad cracking failure mechanism},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1838--1842},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.150},
doi = {10.1016/J.MICROREL.2015.06.150},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlbertiVMT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlirezaeyanYD15,
author = {Javad Alirezaeyan and
Saleh Yousefi and
Ali Doniavi},
title = {Adaptive reliability satisfaction in wireless sensor networks through
controlling the number of active routing paths},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2412--2422},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.002},
doi = {10.1016/J.MICROREL.2015.08.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlirezaeyanYD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlkhazailiHCLW15,
author = {Atif Alkhazaili and
Mohammad M. Hamasha and
Gihoon Choi and
Susan Lu and
Charles R. Westgate},
title = {Reliability of thin films: Experimental study on mechanical and thermal
behavior of indium tin oxide and poly(3, 4-ethylenedioxythiophene)},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {538--546},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.013},
doi = {10.1016/J.MICROREL.2015.01.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlkhazailiHCLW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlmudeverR15,
author = {Carmen G. Almud{\'{e}}ver and
Antonio Rubio},
title = {Variability and reliability analysis of {CNFET} technology: Impact
of manufacturing imperfections},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {358--366},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.011},
doi = {10.1016/J.MICROREL.2014.11.011},
timestamp = {Fri, 11 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlmudeverR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AnLCN15,
author = {Ting An and
Kaikai Liu and
Hao Cai and
Lirida A. B. Naviner},
title = {Accurate reliability analysis of concurrent checking circuits employing
an efficient analytical method},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {696--703},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.018},
doi = {10.1016/J.MICROREL.2014.12.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AnLCN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArbessBTAW15,
author = {Houssam Arbess and
F. Baccar and
L. Th{\'{e}}olier and
Stephane Azzopardi and
Eric Woirgard},
title = {Mechanical stress investigation after technological process in Deep
Trench Termination DT\({}^{\mbox{2}}\) using BenzoCycloButene as dielectric
material},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2017--2021},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.019},
doi = {10.1016/J.MICROREL.2015.07.019},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ArbessBTAW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArbessBTZ15,
author = {Houssam Arbess and
Marise Bafleur and
David Tr{\'{e}}mouilles and
Moustafa Zerarka},
title = {Optimization of a {MOS-IGBT-SCR} {ESD} protection component in smart
power {SOI} technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1476--1480},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.138},
doi = {10.1016/J.MICROREL.2015.06.138},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ArbessBTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArbetSK15,
author = {Daniel Arbet and
Viera Stopjakov{\'{a}} and
Martin Kov{\'{a}}c},
title = {Investigation of the optimum oscillation frequency value towards increasing
the efficiency of {OBIST} approach},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1120--1125},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.017},
doi = {10.1016/J.MICROREL.2015.03.017},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ArbetSK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AshworthWHHLM15,
author = {Mark Ashworth and
Geoffrey D. Wilcox and
Rebecca L. Higginson and
Richard J. Heath and
Chanqing Liu and
Roger J. Mortimer},
title = {The effect of electroplating parameters and substrate material on
tin whisker formation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {180--191},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.005},
doi = {10.1016/J.MICROREL.2014.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AshworthWHHLM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AutranM15,
author = {Jean{-}Luc Autran and
Daniela Munteanu},
title = {Radiation and {COTS} at ground level},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2147--2153},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.030},
doi = {10.1016/J.MICROREL.2015.06.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AutranM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AutranMMSSGR15,
author = {Jean{-}Luc Autran and
Daniela Munteanu and
Soilihi Moindjie and
Tarek Saad Saoud and
S. Sauze and
Gilles Gasiot and
Philippe Roche},
title = {{ASTEP} {(2005-2015):} Ten years of soft error and atmospheric radiation
characterization on the Plateau de Bure},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1506--1511},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.101},
doi = {10.1016/J.MICROREL.2015.06.101},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AutranMMSSGR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AyedDLD15,
author = {Ala Ayed and
Tristan Dubois and
Jean{-}Luc Levant and
Genevi{\`{e}}ve Duchamp},
title = {Failure mechanism study and immunity modeling of an embedded analog-to-digital
converter based on immunity measurements},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2067--2071},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.109},
doi = {10.1016/J.MICROREL.2015.06.109},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AyedDLD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaccarATAW15,
author = {F. Baccar and
Houssam Arbess and
L. Th{\'{e}}olier and
Stephane Azzopardi and
Eric Woirgard},
title = {Ageing mechanisms in Deep Trench Termination (DT\({}^{\mbox{2}}\))
Diode},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1981--1987},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.132},
doi = {10.1016/J.MICROREL.2015.06.132},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BaccarATAW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BafleurPMFN15,
author = {Marise Bafleur and
Philippe Perdu and
Fran{\c{c}}ois Marc and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Nicolas Nolhier},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1269--1270},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.028},
doi = {10.1016/J.MICROREL.2015.09.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BafleurPMFN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagatinG15,
author = {Marta Bagatin and
Simone Gerardin},
title = {Soft errors in floating gate memory cells: {A} review},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {24--30},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.016},
doi = {10.1016/J.MICROREL.2014.10.016},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BagatinG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagheriRHM15,
author = {Amin Bagheri and
Mahboubeh Ranjbar and
Saeed Haji{-}Nasiri and
Sattar Mirzakuchaki},
title = {Crosstalk bandwidth and stability analysis in graphene nanoribbon
interconnects},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1262--1268},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.004},
doi = {10.1016/J.MICROREL.2015.05.004},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BagheriRHM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaillotDOB15,
author = {Raphael Baillot and
Yannick Deshayes and
Yves Ousten and
Laurent B{\'{e}}chou},
title = {Photothermal activated failure mechanism in polymer-based packaging
of low power InGaN/GaN {MQW} {LED} under active storage},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1759--1764},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.145},
doi = {10.1016/J.MICROREL.2015.06.145},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaillotDOB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Balasubramanian15,
author = {P. Balasubramanian and
Douglas L. Maskell},
title = {A distributed minority and majority voting based redundancy scheme},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1373--1378},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.015},
doi = {10.1016/J.MICROREL.2015.07.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Balasubramanian15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarnatGF15,
author = {Samed Barnat and
Alexandrine Gu{\'{e}}don{-}Gracia and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Virtual prototyping in a Design-for-Reliability approach},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1849--1854},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.071},
doi = {10.1016/J.MICROREL.2015.06.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarnatGF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Belaid15,
author = {Mohamed Ali Bela{\"{\i}}d},
title = {Impact of hot carrier injection on switching time evolution for power
{RF} {LDMOS} after accelerated tests},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2041--2044},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.002},
doi = {10.1016/J.MICROREL.2015.07.002},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Belaid15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelfortCKG15,
author = {Yannis Belfort and
J.{-}M. Caignard and
S. Keller and
J.{-}P. Guerveno},
title = {Failures on {DC-DC} modules following a change of wire bonding material
from gold to copper},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2003--2006},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.032},
doi = {10.1016/J.MICROREL.2015.07.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BelfortCKG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BensoussanSHZ15,
author = {A. Bensoussan and
Ephraim Suhir and
P. Henderson and
M. Zahir},
title = {A unified multiple stress reliability model for microelectronic devices
- Application to 1.55 {\(\mu\)}m {DFB} laser diode module for space
validation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1729--1735},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.093},
doi = {10.1016/J.MICROREL.2015.06.093},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BensoussanSHZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Beranger15,
author = {M. B{\'{e}}ranger},
title = {Use of a silicon drift detector for cathodoluminescence detection},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1569--1573},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.067},
doi = {10.1016/J.MICROREL.2015.06.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Beranger15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BergesWS15,
author = {Corinne Berg{\`{e}}s and
Y. Weber and
Pierre Soufflet},
title = {General linearized model use for High Power Reliability Assessment
test results: Conditions, procedure and case study},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1346--1350},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.143},
doi = {10.1016/J.MICROREL.2015.06.143},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BergesWS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BisiSRMRCSPLGLT15,
author = {Davide Bisi and
Antonio Stocco and
Isabella Rossetto and
Matteo Meneghini and
Fabiana Rampazzo and
Alessandro Chini and
Fabio Soci and
Alessio Pantellini and
Claudio Lanzieri and
Piero Gamarra and
Cedric Lacam and
M. Tordjman and
Marie{-}Antoinette di Forte{-}Poisson and
Davide De Salvador and
Marco Bazzan and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Effects of buffer compensation strategies on the electrical performance
and {RF} reliability of AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1662--1666},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.038},
doi = {10.1016/J.MICROREL.2015.06.038},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BisiSRMRCSPLGLT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlascoGSLM15,
author = {Juli Blasco and
Nestor Fabian Ghenzi and
Jordi Su{\~{n}}{\'{e}} and
Pablo Levy and
Enrique Miranda},
title = {Equivalent circuit modeling of the bistable conduction characteristics
in electroformed thin dielectric films},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {1--14},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.017},
doi = {10.1016/J.MICROREL.2014.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlascoGSLM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BorrelCKRLDS15,
author = {Nicolas Borrel and
Clement Champeix and
Edith Kussener and
Wenceslas Rahajandraibe and
Mathieu Lisart and
Jean{-}Max Dutertre and
Alexandre Sarafianos},
title = {Electrical model of an inverter body-biased structure in triple-well
technology under pulsed photoelectric laser stimulation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1592--1599},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.144},
doi = {10.1016/J.MICROREL.2015.06.144},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BorrelCKRLDS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoscaroJSPB15,
author = {Anthony Boscaro and
Sabir Jacquir and
Kevin Sanchez and
Philippe Perdu and
St{\'{e}}phane Binczak},
title = {Improvement of signal to noise ratio in electro optical probing technique
by wavelets filtering},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1585--1591},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.100},
doi = {10.1016/J.MICROREL.2015.06.100},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoscaroJSPB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrazziniCSULTJB15,
author = {Tommaso Brazzini and
Michael A. Casbon and
Huarui Sun and
Michael J. Uren and
Jonathan Lees and
Paul J. Tasker and
Helmut Jung and
Herv{\'{e}} Blanck and
Martin Kuball},
title = {Study of hot electrons in AlGaN/GaN HEMTs under {RF} Class {B} and
Class {J} operation using electroluminescence},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2493--2498},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.023},
doi = {10.1016/J.MICROREL.2015.09.023},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BrazziniCSULTJB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrinckerPKP15,
author = {Mads Brincker and
Kristian Bonderup Pedersen and
Peter Kj{\ae}r Kristensen and
Vladimir N. Popok},
title = {Effects of thermal cycling on aluminum metallization of power diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1988--1991},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.005},
doi = {10.1016/J.MICROREL.2015.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrinckerPKP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BroeckCD15,
author = {Christoph H. van der Broeck and
Marcus Conrad and
Rik W. De Doncker},
title = {A thermal modeling methodology for power semiconductor modules},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1938--1944},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.102},
doi = {10.1016/J.MICROREL.2015.06.102},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BroeckCD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrollGHSWL15,
author = {Marian Sebastian Broll and
Ute Geissler and
Jan H{\"{o}}fer and
Stefan Schmitz and
Olaf Wittler and
Klaus{-}Dieter Lang},
title = {Microstructural evolution of ultrasonic-bonded aluminum wires},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {961--968},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.002},
doi = {10.1016/J.MICROREL.2015.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrollGHSWL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrollGHSWSL15,
author = {Marian Sebastian Broll and
Ute Geissler and
Jan H{\"{o}}fer and
Stefan Schmitz and
Olaf Wittler and
Martin Schneider{-}Ramelow and
Klaus{-}Dieter Lang},
title = {Correlation between mechanical properties and microstructure of different
aluminum wire qualities after ultrasonic bonding},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1855--1860},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.061},
doi = {10.1016/J.MICROREL.2015.06.061},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrollGHSWSL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuffoloSMRMZ15,
author = {Matteo Buffolo and
Carlo De Santi and
Matteo Meneghini and
D. Rigon and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Long-term degradation mechanisms of mid-power LEDs for lighting applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1754--1758},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.098},
doi = {10.1016/J.MICROREL.2015.06.098},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BuffoloSMRMZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaiWLNPN15,
author = {Hao Cai and
You Wang and
Kaikai Liu and
Lirida Alves de Barros Naviner and
Herv{\'{e}} Petit and
Jean{-}Fran{\c{c}}ois Naviner},
title = {Cross-layer investigation of continuous-time sigma-delta modulator
under aging effects},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {645--653},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.015},
doi = {10.1016/J.MICROREL.2014.11.015},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CaiWLNPN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaiWNZ15,
author = {Hao Cai and
You Wang and
Lirida A. B. Naviner and
W. S. Zhao},
title = {Ultra wide voltage range consideration of reliability-aware {STT}
magnetic flip-flop in 28 nm {FDSOI} technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1323--1327},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.023},
doi = {10.1016/J.MICROREL.2015.06.023},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CaiWNZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaiYTZCLZ15,
author = {Miao Cai and
Dao{-}Guo Yang and
Kunmiao Tian and
Ping Zhang and
Xianping Chen and
Lilin Liu and
Guoqi Zhang},
title = {Step-stress accelerated testing of high-power {LED} lamps based on
subsystem isolation method},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1784--1789},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.147},
doi = {10.1016/J.MICROREL.2015.06.147},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaiYTZCLZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaignetNBWM15,
author = {Fabrice Caignet and
Nicolas Nolhier and
Marise Bafleur and
A. Wang and
Nicolas Mauran},
title = {20 GHz on-chip measurement of {ESD} waveform for system level analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2276--2283},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.021},
doi = {10.1016/J.MICROREL.2014.12.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaignetNBWM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastignollesGM15,
author = {M. Castignolles and
Julien Goxe and
R. Martin},
title = {Failure analysis on recovering low resistive via in mixed-mode device},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1574--1578},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.149},
doi = {10.1016/J.MICROREL.2015.06.149},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastignollesGM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CavaiuoloRMIBDS15,
author = {Domenico Cavaiuolo and
Michele Riccio and
Luca Maresca and
Andrea Irace and
Giovanni Breglio and
Davide Dapr{\`{a}} and
Carmelo Sanfilippo and
Luigi Merlin},
title = {A robust electro-thermal {IGBT} {SPICE} model: Application to short-circuit
protection circuit design},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1971--1975},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.086},
doi = {10.1016/J.MICROREL.2015.06.086},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CavaiuoloRMIBDS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CazzorlaFSM15,
author = {Alessandro Cazzorla and
P. Farinelli and
R. Sorrentino and
Benno Margesin},
title = {Reliability test of a {RF} {MEMS} varactor based on a double actuation
mechanism},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1906--1910},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.003},
doi = {10.1016/J.MICROREL.2015.07.003},
timestamp = {Wed, 25 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CazzorlaFSM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CesterRBLFBWGCK15,
author = {Andrea Cester and
Antonio Rizzo and
A. Bazzega and
Nicol{\`{o}} Lago and
J. Favaro and
Marco Barbato and
Nicola Wrachien and
Suren A. Gevorgyan and
Michael Corazza and
Frederik C. Krebs},
title = {Effects of constant voltage and constant current stress in {PCBM:}
{P3HT} solar cells},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1795--1799},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.082},
doi = {10.1016/J.MICROREL.2015.06.082},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CesterRBLFBWGCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChaKLM15,
author = {Soonyoung Cha and
Dae Hyun Kim and
Taizhi Liu and
Linda S. Milor},
title = {The die-to-die calibrated combined model of negative bias temperature
instability and gate oxide breakdown from device to system},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1404--1411},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.105},
doi = {10.1016/J.MICROREL.2015.06.105},
timestamp = {Thu, 06 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChaKLM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChamazcotiDMA15,
author = {Saeideh Alinezhad Chamazcoti and
Ziba Delavari and
Seyed Ghassem Miremadi and
Hossein Asadi},
title = {On endurance and performance of erasure codes in SSD-based storage
systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2453--2467},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.046},
doi = {10.1016/J.MICROREL.2015.07.046},
timestamp = {Fri, 14 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChamazcotiDMA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangLHHC15,
author = {Tao{-}Chih Chang and
Chang{-}Chun Lee and
Chia{-}Ping Hsieh and
Sheng{-}Che Hung and
Ren{-}Shin Cheng},
title = {Electrical characteristics and reliability performance of {IGBT} power
device packaging by chip embedding technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2582--2588},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.004},
doi = {10.1016/J.MICROREL.2015.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangLHHC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangSLWL15,
author = {Wei Chang and
Chun{-}Hsing Shih and
Yan{-}Xiang Luo and
Wen{-}Fa Wu and
Chen{-}Hsin Lien},
title = {Reliability impacts of high-speed 3-bit/cell Schottky barrier nanowire
charge-trapping memories},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {74--80},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.004},
doi = {10.1016/J.MICROREL.2014.09.004},
timestamp = {Thu, 29 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangSLWL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangSPYW15,
author = {Moon{-}Hwan Chang and
Peter Sandborn and
Michael G. Pecht and
Winco K. C. Yung and
Wenbin Wang},
title = {A return on investment analysis of applying health monitoring to {LED}
lighting systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {527--537},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.009},
doi = {10.1016/J.MICROREL.2015.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangSPYW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CheP15,
author = {F. X. Che and
John H. L. Pang},
title = {Study on reliability of {PQFP} assembly with lead free solder joints
under random vibration test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2769--2776},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.010},
doi = {10.1016/J.MICROREL.2015.09.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CheP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChefJSPBG15,
author = {Samuel Chef and
Sabir Jacquir and
Kevin Sanchez and
Philippe Perdu and
St{\'{e}}phane Binczak and
Chee Lip Gan},
title = {Unsupervised learning for signal mapping in dynamic photon emission},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1564--1568},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.043},
doi = {10.1016/J.MICROREL.2015.06.043},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChefJSPBG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCGSP15,
author = {Jiaoyan Chen and
Sorin Cotofana and
Satish Grandhi and
Christian Spagnol and
Emanuel M. Popovici},
title = {Inverse Gaussian distribution based timing analysis of Sub-threshold
{CMOS} circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2754--2761},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.021},
doi = {10.1016/J.MICROREL.2015.09.021},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenCGSP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenCYL15,
author = {Dao{-}Long Chen and
Tei{-}Chen Chen and
Ping{-}Feng Yang and
Yi{-}Shao Lai},
title = {Thermal resistance of side by side multi-chip package: Thermal mode
analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {822--831},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.016},
doi = {10.1016/J.MICROREL.2015.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenCYL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenGSZNLT15,
author = {Fen Chen and
Carole Graas and
Michael A. Shinosky and
Kai Zhao and
Shreesh Narasimha and
Xiao Hu Liu and
Chunyan Tian},
title = {Breakdown data generation and in-die deconvolution methodology to
address {BEOL} and {MOL} dielectric breakdown challenges},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2727--2747},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.017},
doi = {10.1016/J.MICROREL.2015.09.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenGSZNLT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLLPBM15,
author = {Cheng Chen and
Denis Labrousse and
St{\'{e}}phane Lefebvre and
Mickael Petit and
Cyril Buttay and
Herv{\'{e}} Morel},
title = {Study of short-circuit robustness of SiC MOSFETs, analysis of the
failure modes and comparison with BJTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1708--1713},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.097},
doi = {10.1016/J.MICROREL.2015.06.097},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenLLPBM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLLTLYC15,
author = {Guanggao Chen and
Xiaokang Liu and
Zongtao Li and
Yong Tang and
Longsheng Lu and
Binhai Yu and
Qiu Chen},
title = {Failure-mechanism analysis for vertical high-power LEDs under external
pressure},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2671--2677},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.008},
doi = {10.1016/J.MICROREL.2015.08.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenLLTLYC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenW15,
author = {Cheng{-}fu Chen and
Sheng{-}Tsai Wu},
title = {Equivalent mechanical properties of through silicon via interposers
- {A} unit model approach},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {221--230},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.005},
doi = {10.1016/J.MICROREL.2014.09.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenetTBKLB15,
author = {Cristiano P. Chenet and
Lucas A. Tambara and
Gabriel de M. Borges and
Fernanda Lima Kastensmidt and
Marcelo Soares Lubaszewski and
Tiago R. Balen},
title = {Exploring design diversity redundancy to improve resilience in mixed-signal
systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2833--2844},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.011},
doi = {10.1016/J.MICROREL.2015.08.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenetTBKLB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChengYYZL15,
author = {Sijie Cheng and
Zhongzhi Yuan and
Xiangping Ye and
Fuyi Zhang and
Jincheng Liu},
title = {Empirical prediction model for Li/SOCl\({}_{\mbox{2}}\) cells based
on the accelerated degradation test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {101--106},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.031},
doi = {10.1016/J.MICROREL.2014.09.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChengYYZL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChennikiBLGDWO15,
author = {Walide Chenniki and
Isabelle Bord{-}Majek and
M{\'{e}}lanie Louarn and
Vincent Gaud and
Jean{-}Luc Diot and
Komkrisd Wongtimnoi and
Yves Ousten},
title = {Liquid Crystal Polymer for {QFN} packaging: Predicted thermo-mechanical
fatigue and Design for Reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2793--2798},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.057},
doi = {10.1016/J.MICROREL.2015.06.057},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChennikiBLGDWO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CheshmikhaniZ15,
author = {Elham Cheshmikhani and
Hamid R. Zarandi},
title = {Probabilistic analysis of dynamic and temporal fault trees using accurate
stochastic logic gates},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2468--2480},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.047},
doi = {10.1016/J.MICROREL.2015.06.047},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CheshmikhaniZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiCYLL15,
author = {Wei{-}Fong Chi and
Kuei{-}Shu Chang{-}Liao and
Shih{-}Han Yi and
Chen{-}Chien Li and
Yan{-}Lin Li},
title = {Gate leakage current suppression and reliability improvement for ultra-low
{EOT} Ge {MOS} devices by suitable HfAlO/HfON thickness and sintering
temperature},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2183--2187},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.015},
doi = {10.1016/J.MICROREL.2015.08.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiCYLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChienS15,
author = {Nguyen Dang Chien and
Chun{-}Hsing Shih},
title = {Short-channel effect and device design of extremely scaled tunnel
field-effect transistors},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {31--37},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.028},
doi = {10.1016/J.MICROREL.2014.09.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChienS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChirilaKRRW15,
author = {Tudor Chirila and
Winfried Kaindl and
Tobias Reimann and
Michael R{\"{u}}b and
Uwe Wahl},
title = {Analysis of the role of the parasitic {BJT} of Super-Junction power
{MOSFET} under {TLP} stress},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1481--1485},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.108},
doi = {10.1016/J.MICROREL.2015.06.108},
timestamp = {Mon, 18 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChirilaKRRW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuLHCHC15,
author = {Hsien{-}Chin Chiu and
Wen{-}Yu Lin and
W. J. Hsueh and
Pei{-}Chin Chiu and
Yue{-}Ming Hsin and
Jen{-}Inn Chyi},
title = {The device characteristics of Ir- and Ti-based Schottky gates AlSb/InAs
high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {890--893},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.016},
doi = {10.1016/J.MICROREL.2015.03.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuLHCHC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuLHYT15,
author = {Tz{-}Cheng Chiu and
Bo{-}Sheng Lee and
Dong{-}Yi Huang and
Yu{-}Ting Yang and
Yi{-}Hsiu Tseng},
title = {Time-domain viscoelastic constitutive model based on concurrent fitting
of frequency-domain characteristics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2336--2344},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.031},
doi = {10.1016/J.MICROREL.2015.07.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuLHYT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuWCCL15,
author = {Hsien{-}Chin Chiu and
Chia{-}Hsuan Wu and
Ji{-}Fan Chi and
Jen{-}Inn Chyi and
Geng{-}Yen Lee},
title = {N\({}_{\mbox{2}}\)O treatment enhancement-mode InAlN/GaN HEMTs with
HfZrO\({}_{\mbox{2}}\) High-k insulator},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {48--51},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.026},
doi = {10.1016/J.MICROREL.2014.09.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuWCCL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoSY15,
author = {Edward Namkyu Cho and
Yong{-}Hyeon Shin and
Ilgu Yun},
title = {An analytical avalanche breakdown model for double gate {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {38--41},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.08.019},
doi = {10.1016/J.MICROREL.2014.08.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoSY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiBIJ15,
author = {Ui{-}Min Choi and
Frede Blaabjerg and
Francesco Iannuzzo and
S{\o}ren J{\o}rgensen},
title = {Junction temperature estimation method for a 600 V, 30A {IGBT} module
during converter operation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2022--2026},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.146},
doi = {10.1016/J.MICROREL.2015.06.146},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChoiBIJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiKLJAKJPYCKK15,
author = {Mi{-}Ri Choi and
Hyung{-}Giun Kim and
Taeg{-}Woo Lee and
Young{-}Jun Jeon and
Yong{-}Keun Ahn and
Kyo{-}Wang Koo and
You{-}Cheol Jang and
So{-}Yeon Park and
Jae{-}Hak Yee and
Nam{-}Kwon Cho and
Il{-}Tae Kang and
Sangshik Kim and
Seung{-}Zeon Han and
Sung{-}Hwan Lim},
title = {Microstructural evaluation and failure analysis of Ag wire bonded
to Al pads},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2306--2315},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.038},
doi = {10.1016/J.MICROREL.2015.07.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoiKLJAKJPYCKK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoiP15,
author = {Jin Hyung Choi and
Jong Tae Park},
title = {Wire width dependence of hot carrier degradation in silicon nanowire
gate-all-around MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1438--1441},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.127},
doi = {10.1016/J.MICROREL.2015.06.127},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChoiP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouHHLCH15,
author = {Chun{-}Tse Chou and
Boris Hudec and
Chung{-}Wei Hsu and
Wei{-}Li Lai and
Chih{-}Cheng Chang and
Tuo{-}Hung Hou},
title = {Crossbar array of selector-less TaO\({}_{\mbox{x}}\)/TiO\({}_{\mbox{2}}\)
bilayer {RRAM}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2220--2223},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.002},
doi = {10.1016/J.MICROREL.2015.04.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouHHLCH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouHLC15,
author = {Hsueh{-}Tao Chou and
Ho{-}Chun Hsu and
Chiu{-}Hui Lien and
Shi{-}Ting Chen},
title = {The effect of various concentrations of {PVDF-HFP} polymer gel electrolyte
for dye-sensitized solar cell},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2174--2177},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.015},
doi = {10.1016/J.MICROREL.2015.09.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouHLC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouLH15,
author = {Hsueh{-}Tao Chou and
Ke{-}Ming Lin and
Ho{-}Chun Hsu},
title = {Fabrication of TiO\({}_{\mbox{2}}\) compact layer precursor at various
reaction times for dye sensitized solar cells},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2208--2212},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.003},
doi = {10.1016/J.MICROREL.2015.05.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouLH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaB15,
author = {Mauro Ciappa and
Alessandro Blascovich},
title = {Reliability odometer for real-time and in situ lifetime measurement
of power devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1351--1356},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.095},
doi = {10.1016/J.MICROREL.2015.06.095},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ConradDD15,
author = {Marcus Conrad and
A. Diatlov and
Rik W. De Doncker},
title = {Purpose, potential and realization of chip-attached micro-pin fin
heat sinks},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1992--1996},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.007},
doi = {10.1016/J.MICROREL.2015.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ConradDD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CourjaultPILB15,
author = {Nicolas Courjault and
Philippe Perdu and
Fulvio Infante and
Thierry Lebey and
Vincent Bley},
title = {Magnetic imaging for resistive, capacitive and inductive devices;
from theory to piezo actuator failure localization},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1622--1627},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.017},
doi = {10.1016/J.MICROREL.2015.06.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CourjaultPILB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDC15,
author = {Paolo Cova and
Nicola Delmonte and
Diego Chiozzi},
title = {Numerical analysis and experimental tests for solder joints power
cycling optimization},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2036--2040},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.020},
doi = {10.1016/J.MICROREL.2015.06.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaDC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CuiCLZCY15,
author = {Zaifu Cui and
Miao Cai and
Ruifeng Li and
Ping Zhang and
Xianping Chen and
Dao{-}Guo Yang},
title = {A numerical procedure for simulating thermal oxidation diffusion of
epoxy molding compounds},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1877--1881},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.112},
doi = {10.1016/J.MICROREL.2015.06.112},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CuiCLZCY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CuiLXZ15,
author = {Tengfei Cui and
Qiang Li and
Yimin Xuan and
Ping Zhang},
title = {Preparation and thermal properties of the graphene-polyolefin adhesive
composites: Application in thermal interface materials},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2569--2574},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.036},
doi = {10.1016/J.MICROREL.2015.07.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CuiLXZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CzerwinskiPLRPP15,
author = {Andrzej Czerwinski and
Mariusz Pluska and
Adam Laszcz and
Jacek Ratajczak and
Kamil Pierscinski and
Dorota Pierscinska and
Piotr Gutowski and
Piotr Karbownik and
Maciej Bugajski},
title = {Formation of coupled-cavities in quantum cascade lasers using focused
ion beam milling},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2142--2146},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.111},
doi = {10.1016/J.MICROREL.2015.06.111},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CzerwinskiPLRPP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DakhelCJH15,
author = {A. A. Dakhel and
Seamas Cassidy and
Khalil E. Jasim and
Fryad Zeki Henari},
title = {Synthesis and characterisation of curcumin-M {(M} = B, Fe and Cu)
films grown on p-Si substrate for dielectric applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {367--373},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.008},
doi = {10.1016/J.MICROREL.2014.11.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DakhelCJH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DammannBBBMKWQM15,
author = {Maximilian Dammann and
Martina Baeumler and
Peter Br{\"{u}}ckner and
Wolfgang Bronner and
Stephan Maroldt and
Helmer Konstanzer and
Matthias Wespel and
R{\"{u}}diger Quay and
Michael Mikulla and
Andreas Graff and
M. Lorenzini and
M. Fagerlind and
P. J. van der Wel and
T. R{\"{o}}dle},
title = {Degradation of 0.25 {\(\mu\)}m GaN HEMTs under high temperature stress
test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1667--1671},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.042},
doi = {10.1016/J.MICROREL.2015.06.042},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DammannBBBMKWQM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DhiaSCN15,
author = {Arwa Ben Dhia and
Mariem Slimani and
Hao Cai and
Lirida A. B. Naviner},
title = {A dual-rail compact defect-tolerant multiplexer},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {662--670},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.011},
doi = {10.1016/J.MICROREL.2015.01.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DhiaSCN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DinaraGHBBB15,
author = {Syed Mukulika Dinara and
Saptarsi Ghosh and
Nripendra N. Halder and
Ankush Bag and
Sekhar Bhattacharya and
Dhrubes Biswas},
title = {Potentiality of trap charge effects and SiON induced interface defects
in a-Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)/SiON based {MIS} structure
for resistive {NVM} device},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {789--794},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.013},
doi = {10.1016/J.MICROREL.2015.02.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DinaraGHBBB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DingTWHYZMT15,
author = {Ying Ding and
Ruyu Tian and
Xiuli Wang and
Chunjin Hang and
Fang Yu and
Ling Zhou and
Xiangang Meng and
Yanhong Tian},
title = {Coupling effects of mechanical vibrations and thermal cycling on reliability
of {CCGA} solder joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2396--2402},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.118},
doi = {10.1016/J.MICROREL.2015.06.118},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DingTWHYZMT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DivayMLDT15,
author = {Alexis Divay and
Mohamed Masmoudi and
Olivier Latry and
Cedric Duperrier and
Farid Temcamani},
title = {An athermal measurement technique for long time constants traps characterization
in GaN {HEMT} transistors},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1703--1707},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.074},
doi = {10.1016/J.MICROREL.2015.06.074},
timestamp = {Fri, 26 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DivayMLDT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DoudrickCWCR15,
author = {Kyle Doudrick and
Jeff Chinn and
Jason Williams and
Nikhilesh Chawla and
Konrad Rykaczewski},
title = {Rapid method for testing efficacy of nano-engineered coatings for
mitigating tin whisker growth},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {832--837},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.014},
doi = {10.1016/J.MICROREL.2015.02.014},
timestamp = {Fri, 18 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DoudrickCWCR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DouziTS15,
author = {Shawki Douzi and
Mohamed Tlig and
Jaleleddine Ben Hadj Slama},
title = {Experimental investigation on the evolution of a conducted-EMI buck
converter after thermal aging tests of the {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1391--1394},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.009},
doi = {10.1016/J.MICROREL.2015.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DouziTS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Drandova15,
author = {Gergana I. Drandova},
title = {Temperature, humidity, and bias acceleration model for a GaAs pHEMT
process},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2511--2515},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.027},
doi = {10.1016/J.MICROREL.2015.09.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Drandova15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuboisHOFD15,
author = {Tristan Dubois and
Siham Hairoud and
Marcio Hermany Gomes de Oliveira and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Genevi{\`{e}}ve Duchamp},
title = {Characterization and model of temperature effect on the conducted
immunity of Op-Amp},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2055--2060},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.018},
doi = {10.1016/J.MICROREL.2015.06.018},
timestamp = {Thu, 17 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuboisHOFD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DurierBZGBF15,
author = {Andr{\'{e}} Durier and
Alain Bensoussan and
Moustafa Zerarka and
Chaimae Ghfiri and
Alexandre Boyer and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {A methodologic project to characterize and model {COTS} component
reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2097--2102},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.140},
doi = {10.1016/J.MICROREL.2015.06.140},
timestamp = {Tue, 23 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DurierBZGBF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuttaBHCB15,
author = {Koushik Dutta and
Basanta Bhowmik and
Arnab Hazra and
Partha P. Chattopadhyay and
Partha Bhattacharyya},
title = {An efficient {BTX} sensor based on p-type nanoporous titania thin
films},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {558--564},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.010},
doi = {10.1016/J.MICROREL.2014.12.010},
timestamp = {Wed, 31 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuttaBHCB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EckoldSNH15,
author = {Pierre Eckold and
M. S. Sellers and
Rainer Niewa and
Werner H{\"{u}}gel},
title = {The surface energies of {\(\beta\)}-Sn - {A} new concept for corrosion
and whisker mitigation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2799--2807},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.018},
doi = {10.1016/J.MICROREL.2015.08.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EckoldSNH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EdwardsBRBGSA15,
author = {Michael Edwards and
Klas Brinkfeldt and
Ulrich Rusche and
Tobias Bukes and
Gerd Gaiser and
Melina Da Silva and
Dag Andersson},
title = {The shear strength of nano-Ag sintered joints and the use of Ag interconnects
in the design and manufacture of SiGe-based thermo-electric modules},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {722--732},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.004},
doi = {10.1016/J.MICROREL.2015.02.004},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EdwardsBRBGSA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EghbalkhahKAAGP15,
author = {Behzad Eghbalkhah and
Mehdi Kamal and
Hassan Afzali{-}Kusha and
Ali Afzali{-}Kusha and
M. B. Ghaznavi{-}Ghoushchi and
Massoud Pedram},
title = {Workload and temperature dependent evaluation of BTI-induced lifetime
degradation in digital circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1152--1162},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.004},
doi = {10.1016/J.MICROREL.2015.06.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EghbalkhahKAAGP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EghbalkhahKAGP15,
author = {Behzad Eghbalkhah and
Mehdi Kamal and
Ali Afzali{-}Kusha and
Mohammad Bagher Ghaznavi Ghoushchi and
Massoud Pedram},
title = {{CSAM:} {A} clock skew-aware aging mitigation technique},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {282--290},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.033},
doi = {10.1016/J.MICROREL.2014.09.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EghbalkhahKAGP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EichenseerPM15,
author = {Christoph Eichenseer and
Gerhard P{\"{o}}ppel and
Thomas Mikolajick},
title = {Energy monitoring of high dose ion implantation in semiconductors
via photocurrent measurement},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1369--1372},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.001},
doi = {10.1016/J.MICROREL.2015.06.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EichenseerPM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ElssnerV15,
author = {Michael El{\ss}ner and
Holger Vogt},
title = {Failure mechanisms of microbolometer thermal imager sensors using
chip-scale packaging},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1901--1905},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.040},
doi = {10.1016/J.MICROREL.2015.07.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ElssnerV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EndoNNSN15,
author = {Koichi Endo and
Kenji Norimatsu and
Tomonori Nakamura and
Takashi Setoya and
Koji Nakamae},
title = {Thermoreflectance mapping observation of Power {MOSFET} under {UIS}
avalanche breakdown condition},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1628--1633},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.031},
doi = {10.1016/J.MICROREL.2015.06.031},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EndoNNSN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EndohN15,
author = {Hirohiko Endoh and
Takuya Naoe},
title = {Copper wire bonding package decapsulation using the anodic protection
method},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {207--212},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.003},
doi = {10.1016/J.MICROREL.2014.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EndohN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EriguchiO15,
author = {Koji Eriguchi and
Kouichi Ono},
title = {Impacts of plasma process-induced damage on {MOSFET} parameter variability
and reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1464--1470},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.004},
doi = {10.1016/J.MICROREL.2015.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EriguchiO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM15,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2483},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.029},
doi = {10.1016/J.MICROREL.2015.10.029},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ErslandM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EunCYSC15,
author = {Kyoungtae Eun and
Min{-}Woo Chon and
Tae{-}Hee Yoo and
Yong{-}Won Song and
Sung{-}Hoon Choa},
title = {Electromechanical properties of printed copper ink film using a white
flash light annealing process for flexible electronics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {838--845},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.015},
doi = {10.1016/J.MICROREL.2014.12.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EunCYSC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarahaniHS15,
author = {Bahar J. Farahani and
Seyedamin Habibi and
Saeed Safari},
title = {A cross-layer {SER} analysis in the presence of {PVTA} variations},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1013--1027},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.008},
doi = {10.1016/J.MICROREL.2015.04.008},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FarahaniHS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarahaniS15,
author = {Bahareh J. Farahani and
Saeed Safari},
title = {Cross-layer custom instruction selection to address {PVTA} variations
and soft error},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2423--2438},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.054},
doi = {10.1016/J.MICROREL.2015.06.054},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FarahaniS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FayyazC15,
author = {Asad Fayyaz and
Alberto Castellazzi},
title = {High temperature pulsed-gate robustness testing of SiC power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1724--1728},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.141},
doi = {10.1016/J.MICROREL.2015.06.141},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FayyazC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FekihKV15,
author = {Lassaad Ben Fekih and
Georges Kouroussis and
Olivier Verlinden},
title = {Verification of empirical warp-based design criteria of space electronic
boards},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2786--2792},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.031},
doi = {10.1016/J.MICROREL.2015.09.031},
timestamp = {Tue, 01 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FekihKV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FerreiraV15,
author = {Raphael Segabinazzi Ferreira and
Fabian Vargas},
title = {ShadowStack: {A} new approach for secure program execution},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2077--2081},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.021},
doi = {10.1016/J.MICROREL.2015.07.021},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FerreiraV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FichtnerFLRBG15,
author = {Susanne Fichtner and
Sophia Frankeser and
Josef Lutz and
Roland Rupp and
Thomas Basler and
Rolf Gerlach},
title = {Ruggedness of 1200 {V} SiC {MPS} diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1677--1681},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.088},
doi = {10.1016/J.MICROREL.2015.06.088},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FichtnerFLRBG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FilipovicSRCS15,
author = {Lado Filipovic and
Anderson Pires Singulani and
Frederic Roger and
Sara Carniello and
Siegfried Selberherr},
title = {Intrinsic stress analysis of tungsten-lined open TSVs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1843--1848},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.014},
doi = {10.1016/J.MICROREL.2015.06.014},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FilipovicSRCS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FischerS15,
author = {Gerhard G. Fischer and
Grazia Sasso},
title = {Ageing and thermal recovery of advanced SiGe heterojunction bipolar
transistors under long-term mixed-mode and reverse stress conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {498--507},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.014},
doi = {10.1016/J.MICROREL.2014.12.014},
timestamp = {Mon, 06 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FischerS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleuryCRHWDSKSP15,
author = {Cl{\'{e}}ment Fleury and
Mattia Capriotti and
Matteo Rigato and
Oliver Hilt and
Joachim W{\"{u}}rfl and
Joff Derluyn and
Stephan Steinhauer and
Anton K{\"{o}}ck and
Gottfried Strasser and
Dionyz Pogany},
title = {High temperature performances of normally-off p-GaN gate AlGaN/GaN
HEMTs on SiC and Si substrates for power applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1687--1691},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.010},
doi = {10.1016/J.MICROREL.2015.06.010},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FleuryCRHWDSKSP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ForestRHME15,
author = {Fran{\c{c}}ois Forest and
Amgad Rashed and
Jean{-}Jacques Huselstein and
Thierry Martir{\'{e}} and
Philippe Enrici},
title = {Fast power cycling protocols implemented in an automated test bench
dedicated to {IGBT} module ageing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {81--92},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.008},
doi = {10.1016/J.MICROREL.2014.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ForestRHME15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FudoliMSAGC15,
author = {Allesandra Fudoli and
Giuseppe Martino and
A. Scrofani and
Paolo Aliberti and
D. Gallo and
M. Cason},
title = {{RF} functional-based complete {FA} flow},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1579--1584},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.023},
doi = {10.1016/J.MICROREL.2015.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FudoliMSAGC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FujinoSKIIS15,
author = {Masahisa Fujino and
Ikuo Soga and
Daiyu Kondo and
Yoshikatsu Ishizuki and
Taisuke Iwai and
Tadatomo Suga},
title = {Fast atom bombardment onto vertically aligned multi-walled carbon
nanotube bumps to achieve low interconnect resistance with Au layer},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2560--2564},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.004},
doi = {10.1016/J.MICROREL.2015.09.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FujinoSKIIS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gallois-Garreignot15,
author = {S{\'{e}}bastien Gallois{-}Garreignot and
Naceur Benzima and
Etienne Benmussa and
Caroline Moutin and
Pierre{-}Olivier Bouchard and
Vincent Fiori and
Cl{\'{e}}ment Tavernier},
title = {Qualification of bumping processes: Experimental and numerical investigations
on mechanical stress and failure modes induced by shear test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {980--989},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.008},
doi = {10.1016/J.MICROREL.2015.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gallois-Garreignot15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalyS15,
author = {Philippe Galy and
Wim Schoenmaker},
title = {Coupled electro-magnetic field {\&} Lorentz force effects in silicon
and metal for {ESD} investigation in transient and harmonic regimes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1532--1536},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.091},
doi = {10.1016/J.MICROREL.2015.06.091},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalyS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GanH15,
author = {Chong Leong Gan and
Uda Hashim},
title = {Fundamentals of Lead-Free Solder Interconnect Technology (from Microstructures
to Reliability). Springer {(2015).} {XIII} pp. 253, {ISBN:} 978-1-4614-9265-8
(Print), 978-1-4614-9266-5 (Online)},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {852},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.010},
doi = {10.1016/J.MICROREL.2015.02.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GanH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GanH15a,
author = {Chong Leong Gan and
Uda Hashim},
title = {Wafer-Level Chip-Scale Packaging (Analog and Power Electronics Packaging),
{XVII.} Springer (2015), 322, {ISBN:} 978-1-4939-1555-2},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2481},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.007},
doi = {10.1016/J.MICROREL.2015.08.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GanH15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoCG15,
author = {Li{-}Lan Gao and
Xu Chen and
Hong Gao},
title = {Interfacial thermal stresses in {ACF} bonding assembly},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1089--1096},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.004},
doi = {10.1016/J.MICROREL.2015.04.004},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GaoCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Garcia-Gervacio15,
author = {Jose Luis Garcia{-}Gervacio and
Alejandro Nocua and
V{\'{\i}}ctor H. Champac},
title = {Screening small-delay defects using inter-path correlation to reduce
reliability risk},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {1005--1011},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.007},
doi = {10.1016/J.MICROREL.2015.03.007},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Garcia-Gervacio15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Garcia-SanchezO15,
author = {Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
Adelmo Ortiz{-}Conde and
Juan Muci and
Andrea Sucre{-}Gonz{\'{a}}lez and
Juin J. Liou},
title = {A unified look at the use of successive differentiation and integration
in {MOSFET} model parameter extraction},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {293--307},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.013},
doi = {10.1016/J.MICROREL.2014.11.013},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Garcia-SanchezO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarnierFHH15,
author = {Audrey Garnier and
Giuseppe Filoni and
Tomas Hrnc{\'{\i}}r and
Lukas Hlad{\'{\i}}k},
title = {Plasma {FIB:} Enlarge your field of view and your field of applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2135--2141},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.016},
doi = {10.1016/J.MICROREL.2015.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GarnierFHH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GeorgeOP15,
author = {Elviz George and
Michael D. Osterman and
Michael G. Pecht},
title = {An evaluation of dwell time and mean cyclic temperature parameters
in the Engelmaier model},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {582--587},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.004},
doi = {10.1016/J.MICROREL.2014.12.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GeorgeOP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GermanSVBV15,
author = {Ronan German and
Ali Sari and
Pascal Venet and
Olivier Briat and
Jean{-}Michel Vinassa},
title = {Study on specific effects of high frequency ripple currents and temperature
on supercapacitors ageing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2027--2031},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.026},
doi = {10.1016/J.MICROREL.2015.06.026},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GermanSVBV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerrerGATA15,
author = {Louis Gerrer and
Vihar P. Georgiev and
Salvatore M. Amoroso and
Ewan Towie and
A. Asenov},
title = {Comparison of Si {\textless} 100 {\textgreater} and {\textless} 110
{\textgreater} crystal orientation nanowire transistor reliability
using Poisson-Schr{\"{o}}dinger and classical simulations},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1307--1312},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.094},
doi = {10.1016/J.MICROREL.2015.06.094},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GerrerGATA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhimirePRM15,
author = {Pramod Ghimire and
Kristian Bonderup Pedersen and
Bj{\o}rn Rannestad and
Stig Munk{-}Nielsen},
title = {Ageing monitoring in {IGBT} module under sinusoidal loading},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1945--1949},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.025},
doi = {10.1016/J.MICROREL.2015.06.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhimirePRM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhoshKS15,
author = {Sayani Ghosh and
Kalyan Koley and
Chandan Kumar Sarkar},
title = {Impact of the lateral straggle on the Analog and {RF} performance
of {TFET}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {326--331},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.008},
doi = {10.1016/J.MICROREL.2014.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhoshKS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GimenezGRF15,
author = {Salvador Pinillos Gimenez and
Egon Henrique Salerno Galembeck and
Christian Renaux and
Denis Flandre},
title = {Diamond layout style impact on {SOI} {MOSFET} in high temperature
environment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {783--788},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.015},
doi = {10.1016/J.MICROREL.2015.02.015},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GimenezGRF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiuffridaBMCLM15,
author = {V. Giuffrida and
P. Barbarino and
Giuseppe Muni and
Giancarlo Calvagno and
G. Latteo and
Domenico Mello},
title = {Fault isolation in a case study of failure analysis on Metal-Insulator-Metal
capacitor structures},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1640--1643},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.015},
doi = {10.1016/J.MICROREL.2015.06.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiuffridaBMCLM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomesML15,
author = {J. Gomes and
M. Mayer and
Bill S. Lin},
title = {Development of a fast method for optimization of Au ball bond process},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {602--607},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.013},
doi = {10.1016/J.MICROREL.2014.12.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GomesML15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomesMRK15,
author = {Iuri A. C. Gomes and
Mayler G. A. Martins and
Andr{\'{e}} In{\'{a}}cio Reis and
Fernanda Lima Kastensmidt},
title = {Exploring the use of approximate {TMR} to mask transient faults in
logic with low area overhead},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2072--2076},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.125},
doi = {10.1016/J.MICROREL.2015.06.125},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GomesMRK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomesMVCLMMRSMB15,
author = {Henrique L. Gomes and
Maria C. R. Medeiros and
Fulvia Villani and
J. Canudo and
Fausta Loffredo and
R. Miscioscia and
Carme Mart{\'{\i}}nez{-}Domingo and
Eloi Ramon and
Enrico Sowade and
K. Y. Mitra and
Reinhard R. Baumann and
Iain McCulloch and
Jordi Carrabina},
title = {All-inkjet printed organic transistors: Dielectric surface passivation
techniques for improved operational stability and lifetime},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1192--1195},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.006},
doi = {10.1016/J.MICROREL.2015.05.006},
timestamp = {Fri, 08 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GomesMVCLMMRSMB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gorecki15,
author = {Krzysztof G{\'{o}}recki},
title = {Modelling mutual thermal interactions between power LEDs in {SPICE}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {389--395},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.003},
doi = {10.1016/J.MICROREL.2014.11.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gorecki15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GossnerD15,
author = {Harald Gossner and
Charvaka Duvvury},
title = {System efficient {ESD} design},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2607--2613},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.020},
doi = {10.1016/J.MICROREL.2014.12.020},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GossnerD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GousseauMBFMIBZ15,
author = {Simon Gousseau and
St{\'{e}}phane Moreau and
David Bouchu and
Alexis Farcy and
Pierre Montmitonnet and
Karim Inal and
Fran{\c{c}}ois Bay and
Marc Zelsmann and
Emmanuel Picard and
Mathieu Sala{\"{u}}n},
title = {Electromigration-induced failure in operando characterization of 3D
interconnects: microstructure influence},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1205--1213},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.019},
doi = {10.1016/J.MICROREL.2015.05.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GousseauMBFMIBZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoxeAV15,
author = {Julien Goxe and
C. Abouda and
B{\'{e}}atrice Vanhuffel},
title = {Latent gate oxide defects case studies},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1607--1610},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.096},
doi = {10.1016/J.MICROREL.2015.06.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoxeAV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrassaMSMGBZGMZ15,
author = {Marco La Grassa and
Matteo Meneghini and
Carlo De Santi and
Marco Mandurrino and
Michele Goano and
Francesco Bertazzi and
Roland Zeisel and
Bastian Galler and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Ageing of InGaN-based LEDs: Effects on internal quantum efficiency
and role of defects},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1775--1778},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.103},
doi = {10.1016/J.MICROREL.2015.06.103},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GrassaMSMGBZGMZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuLLLL15,
author = {Ke Gu and
Juin J. Liou and
Wei Li and
Yang Liu and
Ping Li},
title = {Total ionizing dose sensitivity of function blocks in {FRAM}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {873--878},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.001},
doi = {10.1016/J.MICROREL.2015.03.001},
timestamp = {Sun, 24 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GuLLLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuoY15,
author = {Xue{-}Ru Guo and
Wen{-}Bin Young},
title = {Vacuum effect on the void formation of the molded underfill process
in flip chip packaging},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {613--622},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.001},
doi = {10.1016/J.MICROREL.2014.12.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuoY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HamadHMS15,
author = {Ghaith Bany Hamad and
Syed Rafay Hasan and
Otmane A{\"{\i}}t Mohamed and
Yvon Savaria},
title = {Characterizing, modeling, and analyzing soft error propagation in
asynchronous and synchronous digital circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {238--250},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.025},
doi = {10.1016/J.MICROREL.2014.09.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HamadHMS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaoWCZS15,
author = {H. L. Hao and
L. K. Wu and
W. J. Chung and
Y. Zhang and
Z. W. Shen},
title = {Process optimization of {RTA} on the characteristics of ITO-coated
GaN-based LEDs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2263--2268},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.043},
doi = {10.1016/J.MICROREL.2015.07.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaoWCZS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HarrKKK15,
author = {Kyoung{-}Moo Harr and
Sun{-}Chul Kim and
Young{-}Min Kim and
Young{-}Ho Kim},
title = {Development of chip-on-flex bonding using Sn-based bumps and non-conductive
adhesive},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1241--1247},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.009},
doi = {10.1016/J.MICROREL.2015.05.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HarrKKK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HashimAM15,
author = {Nur Hasyimah Hashim and
P. Anithambigai and
D. Mutharasu},
title = {Thermal characterization of high power {LED} with ceramic particles
filled thermal paste for effective heat dissipation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {383--388},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.009},
doi = {10.1016/J.MICROREL.2014.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HashimAM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaussenerCTVC15,
author = {M. Haussener and
S. Caihol and
Baptiste Trajin and
Paul{-}Etienne Vidal and
F. Carrillo},
title = {Thermomechanical modeling and simulation of a silicone gel for power
electronic devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2045--2049},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.116},
doi = {10.1016/J.MICROREL.2015.06.116},
timestamp = {Thu, 06 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HaussenerCTVC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HelfmeierBFB15,
author = {Clemens Helfmeier and
Anne Beyreuther and
Alexander Fox and
Christian Boit},
title = {Ultra sensitive measurement of dielectric current under pulsed stress
conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2254--2257},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.119},
doi = {10.1016/J.MICROREL.2015.06.119},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HelfmeierBFB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoKR15,
author = {Chih{-}Hsiang Ho and
Soo Youn Kim and
Kaushik Roy},
title = {Ultra-thin dielectric breakdown in devices and circuits: {A} brief
review},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {308--317},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.019},
doi = {10.1016/J.MICROREL.2014.10.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoKR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsiaoYLCLYW15,
author = {Yu{-}Ping Hsiao and
Wen{-}Luh Yang and
Li{-}Min Lin and
Fun{-}Tat Chin and
Yu{-}Hsien Lin and
Ke{-}Luen Yang and
Chi{-}Chang Wu},
title = {Improving retention properties by thermal imidization for polyimide-based
nonvolatile resistive random access memories},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2188--2197},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.013},
doi = {10.1016/J.MICROREL.2015.08.013},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsiaoYLCLYW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuLCW15,
author = {Tianwei Hu and
Yi Li and
Yan{-}Cheong Chan and
Fengshun Wu},
title = {Effect of nano Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) particles doping
on electromigration and mechanical properties of Sn-58Bi solder joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1226--1233},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.008},
doi = {10.1016/J.MICROREL.2015.05.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuLCW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuWLLL15,
author = {Hai{-}fan Hu and
Ying Wang and
Hao Lan and
Xin Luo and
Yun{-}Tao Liu},
title = {High performance {SOI} {CMOS} pixel sensor with surrounding {N+} trench
electrode},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {42--47},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.002},
doi = {10.1016/J.MICROREL.2014.09.002},
timestamp = {Thu, 21 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuWLLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangBB15,
author = {He Huang and
Alexandre Boyer and
Sonia Bendhia},
title = {Analysis and modeling of passive device degradation for a long-term
electromagnetic emission study of a {DC-DC} converter},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2061--2066},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.058},
doi = {10.1016/J.MICROREL.2015.06.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangBB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangBD15,
author = {He Huang and
Alexandre Boyer and
Sonia Ben Dhia},
title = {Electronic counterfeit detection based on the measurement of electromagnetic
fingerprint},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2050--2054},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.008},
doi = {10.1016/J.MICROREL.2015.07.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangBD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCLF15,
author = {Yu{-}Jung Huang and
Ming{-}Kun Chen and
Yi{-}Lung Lin and
Shen{-}Li Fu},
title = {Fabrication and characterization of low-cost ultrathin flexible polyimide
interposer},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1248--1255},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.017},
doi = {10.1016/J.MICROREL.2015.05.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangCLF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangGKYLFZ15,
author = {Jianlin Huang and
Dusan S. Golubovic and
Sau Koh and
Dao{-}Guo Yang and
Xiupeng Li and
Xuejun Fan and
G. Q. Zhang},
title = {Optical degradation mechanisms of mid-power white-light LEDs in {LM-80-08}
tests},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2654--2662},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.008},
doi = {10.1016/J.MICROREL.2015.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangGKYLFZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangXWZ15,
author = {Y. Huang and
Jing{-}Ping Xu and
L. S. Wang and
S. Y. Zhu},
title = {A physical model on electron mobility in InGaAs nMOSFETs with stacked
gate dielectric},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {342--346},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.011},
doi = {10.1016/J.MICROREL.2014.10.011},
timestamp = {Fri, 19 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuangXWZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IshizakiUY15,
author = {Toshitaka Ishizaki and
Masanori Usui and
Y. Yamada},
title = {Thermal cycle reliability of Cu-nanoparticle joint},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1861--1866},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.039},
doi = {10.1016/J.MICROREL.2015.07.039},
timestamp = {Fri, 01 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IshizakiUY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IshizakiYKSUOY15,
author = {Toshitaka Ishizaki and
Masashi Yanase and
A. Kuno and
T. Satoh and
Masanori Usui and
F. Osawa and
Yasushi Yamada},
title = {Thermal simulation of joints with high thermal conductivities for
power electronic devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1060--1066},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.005},
doi = {10.1016/J.MICROREL.2015.04.005},
timestamp = {Fri, 01 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IshizakiYKSUOY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JablonskiLBVVDV15,
author = {Michal Jablonski and
Riccardo Lucchini and
Frederick Bossuyt and
Thomas Vervust and
Jan Vanfleteren and
J. W. C. DeVries and
Pasquale Vena and
Mario Gonzalez},
title = {Impact of geometry on stretchable meandered interconnect uniaxial
tensile extension fatigue reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {143--154},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.009},
doi = {10.1016/J.MICROREL.2014.09.009},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JablonskiLBVVDV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jacob15,
author = {Peter Jacob},
title = {Unusual defects, generated by wafer sawing: An update, including pick{\&}place
processing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1826--1831},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.124},
doi = {10.1016/J.MICROREL.2015.06.124},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jacob15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jacob15a,
author = {Peter Jacob},
title = {Failure analysis and reliability on system level},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2154--2158},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.022},
doi = {10.1016/J.MICROREL.2015.06.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jacob15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacquesLL15,
author = {S{\'{e}}bastien Jacques and
R. Leroy and
Marc Lethiecq},
title = {Impact of aluminum wire and ribbon bonding technologies on D\({}^{\mbox{2}}\)PAK
package reliability during thermal cycling applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1821--1825},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.012},
doi = {10.1016/J.MICROREL.2015.06.012},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JacquesLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacquetSCRAZdM15,
author = {Thomas Jacquet and
Grazia Sasso and
Anjan Chakravorty and
Niccol{\`{o}} Rinaldi and
Klaus Aufinger and
Thomas Zimmer and
Vincenzo d'Alessandro and
Cristell Maneux},
title = {Reliability of high-speed SiGe: {C} {HBT} under electrical stress
close to the {SOA} limit},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1433--1437},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.092},
doi = {10.1016/J.MICROREL.2015.06.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacquetSCRAZdM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JagtapSG15,
author = {Sharayu Jagtap and
Dinesh Sharma and
Shalabh Gupta},
title = {Design of {SET} tolerant {LC} oscillators using distributed bias circuitry},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1537--1541},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.017},
doi = {10.1016/J.MICROREL.2015.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JagtapSG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JahanshahiB15,
author = {Mohsen Jahanshahi and
Fathollah Bistouni},
title = {Improving the reliability of the Benes network for use in large-scale
systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {679--695},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.008},
doi = {10.1016/J.MICROREL.2014.12.008},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JahanshahiB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongKPKC15,
author = {Jae{-}Seong Jeong and
Yong{-}Hyun Kim and
Chang{-}kyun Park and
Heon{-}Do Kim and
Joongho Choi},
title = {The degradation mechanism of flexible a-Si: H/{\(\mu\)}c-Si: {H} photovoltaic
modules},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1804--1810},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.151},
doi = {10.1016/J.MICROREL.2015.06.151},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongKPKC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongKYSJ15,
author = {Jin{-}Cheol Jeong and
Changsoo Kwak and
In{-}Bok Yom and
In{-}Jong Seo and
In{-}Ho Jo},
title = {Life test of an X-band {MMIC} multi-function chip for active phased
array radar applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {815--821},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.002},
doi = {10.1016/J.MICROREL.2015.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongKYSJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiangYWJ15,
author = {Qi Jiang and
Huihui Yuan and
Yang Wang and
Xiangliang Jin},
title = {Design and analyze of transient-induced latch-up in {RS485} transceiver
with on-chip {TVS}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {637--644},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.012},
doi = {10.1016/J.MICROREL.2014.12.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiangYWJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiaoJMF15,
author = {Jiajia Jiao and
Da{-}Cheng Juan and
Diana Marculescu and
Yuzhuo Fu},
title = {Exploiting component dependency for accurate and efficient soft error
analysis via Probabilistic Graphical Models},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {251--263},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.011},
doi = {10.1016/J.MICROREL.2014.09.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiaoJMF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JonesHDG15,
author = {Jason P. Jones and
Eric Heller and
Donald Dorsey and
Samuel Graham},
title = {Transient stress characterization of AlGaN/GaN HEMTs due to electrical
and thermal effects},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2634--2639},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.019},
doi = {10.1016/J.MICROREL.2015.08.019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/JonesHDG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KadoguchiGYNS15,
author = {Takuya Kadoguchi and
Keisuke Gotou and
Kimihiro Yamanaka and
Shijo Nagao and
Katsuaki Suganuma},
title = {Electromigration behavior in Cu/Ni-P/Sn-Cu based joint system with
low current density},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2554--2559},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.003},
doi = {10.1016/J.MICROREL.2015.10.003},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KadoguchiGYNS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KampitsisPM15,
author = {Georgios Kampitsis and
Stavros Papathanassiou and
Stefanos N. Manias},
title = {Comparative evaluation of the short-circuit withstand capability of
1.2 kV silicon carbide (SiC) power transistors in real life applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2640--2646},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.012},
doi = {10.1016/J.MICROREL.2015.09.012},
timestamp = {Sun, 19 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KampitsisPM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KandalaftAR15,
author = {Nabeeh Kandalaft and
Ali Attaran and
Rashid Rashidzadeh},
title = {High speed test interface module using {MEMS} technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {374--382},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.010},
doi = {10.1016/J.MICROREL.2014.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KandalaftAR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kaschani15,
author = {K. T. Kaschani},
title = {What is Electrical Overstress? - Analysis and Conclusions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {853--862},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.003},
doi = {10.1016/J.MICROREL.2015.03.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kaschani15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KessarinskiyBBN15,
author = {Leonid Kessarinskiy and
A. Y. Borisov and
Dmitry Boychenko and
Alexander Nikiforov},
title = {DC-DC's total ionizing dose hardness decrease in passive reserve mode},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1527--1531},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.113},
doi = {10.1016/J.MICROREL.2015.06.113},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KessarinskiyBBN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhalidMO15,
author = {Usman Khalid and
Antonio Mastrandrea and
Mauro Olivieri},
title = {Effect of {NBTI/PBTI} aging and process variations on write failures
in {MOSFET} and FinFET flip-flops},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2614--2626},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.050},
doi = {10.1016/J.MICROREL.2015.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhalidMO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Khan15,
author = {Ayaz Arif Khan},
title = {Analysis of dielectric breakdown in CoFeB/MgO/CoFeB magnetic tunnel
junction},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {894--902},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.018},
doi = {10.1016/J.MICROREL.2015.02.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Khan15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimCM15,
author = {Dae Hyun Kim and
Soonyoung Cha and
Linda S. Milor},
title = {{AVERT:} An elaborate model for simulating variable retention time
in DRAMs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1313--1319},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.064},
doi = {10.1016/J.MICROREL.2015.06.064},
timestamp = {Thu, 06 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimCM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimCM15a,
author = {Dae Hyun Kim and
Soonyoung Cha and
Linda S. Milor},
title = {Built-in self-test for bias temperature instability, hot-carrier injection,
and gate oxide breakdown in embedded DRAMs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2113--2118},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.077},
doi = {10.1016/J.MICROREL.2015.06.077},
timestamp = {Thu, 06 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimCM15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimH15,
author = {Yeong K. Kim and
Do Soon Hwang},
title = {{PBGA} packaging reliability assessments under random vibrations for
space applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {172--179},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.022},
doi = {10.1016/J.MICROREL.2014.09.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKHKY15,
author = {Yu Tack Kim and
Kwang{-}Bum Kim and
Yoo Eo Hyun and
Ick{-}Jun Kim and
Sunhye Yang},
title = {Simulation study on the lifetime of electrochemical capacitors using
the accelerated degradation test under temperature and voltage stresses},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2712--2720},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.032},
doi = {10.1016/J.MICROREL.2015.09.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimKHKY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimP15,
author = {Dae Hyun Kim and
Jong Tae Park},
title = {Investigation on stress induced hump phenomenon in {IGZO} thin film
transistors under negative bias stress and illumination},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1811--1814},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.024},
doi = {10.1016/J.MICROREL.2015.06.024},
timestamp = {Wed, 20 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KiryukhinaPLCP15,
author = {Kateryna Kiryukhina and
Guy Perez and
Elsa Locatelli and
H{\'{e}}l{\`{e}}ne Chauvin and
Elisa Peis},
title = {Upscreening of {LED} {COTS} for space science applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1770--1774},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.035},
doi = {10.1016/J.MICROREL.2015.06.035},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KiryukhinaPLCP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KizilyalliBDBA15,
author = {Isik C. Kizilyalli and
P. Bui{-}Quang and
Don Disney and
H. Bhatia and
Ozgur Aktas},
title = {Reliability studies of vertical GaN devices based on bulk GaN substrates},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1654--1661},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.012},
doi = {10.1016/J.MICROREL.2015.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KizilyalliBDBA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KociniewskiMK15,
author = {Thierry Kociniewski and
Jeff Moussodji and
Zoubir Khatir},
title = {Temperature mapping by {\(\mu\)}-Raman spectroscopy over cross-section
area of power diode in forward biased conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {547--551},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.007},
doi = {10.1016/J.MICROREL.2014.12.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KociniewskiMK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoutsoureliMPP15,
author = {Matroni Koutsoureli and
Loukas Michalas and
E. Papandreou and
George J. Papaioannou},
title = {Induced charging phenomena on SiN\({}_{\mbox{x}}\) dielectric films
used in {RF} {MEMS} capacitive switches},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1911--1915},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.007},
doi = {10.1016/J.MICROREL.2015.06.007},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KoutsoureliMPP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KraemerW15,
author = {Frank Kraemer and
Steffen Wiese},
title = {Assessment of long term reliability of photovoltaic glass-glass modules
vs. glass-back sheet modules subjected to temperature cycles by FE-analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {716--721},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.007},
doi = {10.1016/J.MICROREL.2015.02.007},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KraemerW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrolWA15,
author = {Dawid Jan Kr{\'{o}}l and
Artur Wymyslowski and
Kamil Nouri Allaf},
title = {Adhesion work analysis through molecular modeling and wetting angle
measurement},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {758--764},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.006},
doi = {10.1016/J.MICROREL.2015.02.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrolWA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KudryavtsevRKHB15,
author = {M. Kudryavtsev and
Evgenii B. Rudnyi and
Jan G. Korvink and
Dennis Hohlfeld and
Tamara Bechtold},
title = {Computationally efficient and stable order reduction methods for a
large-scale model of {MEMS} piezoelectric energy harvester},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {747--757},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.003},
doi = {10.1016/J.MICROREL.2015.02.003},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KudryavtsevRKHB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarKP15,
author = {Vobulapuram Ramesh Kumar and
Brajesh Kumar Kaushik and
Amalendu Patnaik},
title = {Crosstalk noise modeling of multiwall carbon nanotube {(MWCNT)} interconnects
using finite-difference time-domain {(FDTD)} technique},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {155--163},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.001},
doi = {10.1016/J.MICROREL.2014.09.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KumarKP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KurzLP15,
author = {Daniel Kurz and
Horst Lewitschnig and
J{\"{u}}rgen Pilz},
title = {An advanced area scaling approach for semiconductor burn-in},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {129--137},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.007},
doi = {10.1016/J.MICROREL.2014.09.007},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KurzLP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KwonBJB15,
author = {YongHyuk Kwon and
HeeSeon Bang and
Sungmin Joo and
HanSur Bang},
title = {Numerical analysis of thermo-mechanical characteristics of solder
joint depending on change in solder junction structure of {MCP}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {442--447},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.005},
doi = {10.1016/J.MICROREL.2014.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KwonBJB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LahokallioSF15,
author = {Sanna Lahokallio and
Kirsi Saarinen{-}Pulli and
Laura Frisk},
title = {Effects of different test profiles of temperature cycling tests on
the reliability of {RFID} tags},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {93--100},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.032},
doi = {10.1016/J.MICROREL.2014.09.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LahokallioSF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiLCLC15,
author = {Wei Lai and
Xianming Liu and
Weimin Chen and
Xiaohua Lei and
Xueying Cao},
title = {Dynamic compact thermal model of high power light emitting diode},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2663--2670},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.001},
doi = {10.1016/J.MICROREL.2015.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiLCLC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiW15,
author = {Li{-}Lung Lai and
Xiaojing Wu},
title = {The device characteristics of missing {LDD} implantation via nanoprobing
techniques for localized failure analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1144--1151},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.015},
doi = {10.1016/J.MICROREL.2015.05.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LandesmanLJPLBD15,
author = {Jean{-}Pierre Landesman and
Christophe Levallois and
Juan Jim{\'{e}}nez and
Fr{\'{e}}d{\'{e}}ric Pommereau and
Yoan L{\'{e}}ger and
Alexandre Beck and
Thomas Delhaye and
Alfredo Torres and
Cesare Frigeri and
Ahmed Rhallabi},
title = {Evidence of chlorine ion penetration in InP/InAsP quantum well structures
during dry etching processes and effects of induced-defects on the
electronic and structural behaviour},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1750--1753},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.029},
doi = {10.1016/J.MICROREL.2015.07.029},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LandesmanLJPLBD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LazarTLMR15,
author = {O. Lazar and
Jean{-}Guy Tartarin and
Benoit Lambert and
C. Moreau and
J.{-}L. Roux},
title = {Correlation between transient evolutions of the gate and drain currents
in AlGaN/GaN technologies},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1714--1718},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.122},
doi = {10.1016/J.MICROREL.2015.06.122},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LazarTLMR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeczyckiAPPN15,
author = {Pawel Leczycki and
Artur Andrzejczak and
Piotr Pietrzak and
Bartosz Pekoslawski and
Andrzej Napieralski},
title = {Extended Sensor Reliability Evaluation Method in multi-sensor control
systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {671--678},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.016},
doi = {10.1016/J.MICROREL.2014.11.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeczyckiAPPN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeCL15,
author = {Hao{-}Chieh Lee and
Kuei{-}Shu Chang{-}Liao and
Yan{-}Lin Li},
title = {Improved reliability of large-sized a-Si thin-film-transistor by back
channel treatment in H\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2178--2182},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.001},
doi = {10.1016/J.MICROREL.2015.09.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeCL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeFS15,
author = {Ko{-}Chun Lee and
Ming{-}Long Fan and
Pin Su},
title = {Investigation and comparison of analog figures-of-merit for {TFET}
and FinFET considering work-function variation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {332--336},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.012},
doi = {10.1016/J.MICROREL.2014.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeFS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeH15,
author = {Chang{-}Chun Lee and
Chien{-}Chao Huang},
title = {Induced thermo-mechanical reliability of copper-filled {TSV} interposer
by transient selective annealing technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2213--2219},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.002},
doi = {10.1016/J.MICROREL.2015.05.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeHYP15,
author = {Jae Hoon Lee and
Jin{-}Woo Han and
Chong{-}Gun Yu and
Jong Tae Park},
title = {Effect of source and drain asymmetry on hot carrier degradation in
vertical nanowire MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1456--1459},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.062},
doi = {10.1016/J.MICROREL.2015.06.062},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeHYP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeKC15,
author = {Seongjun Lee and
Jonghoon Kim and
Bo{-}Hyung Cho},
title = {Maximum pulse current estimation for high accuracy power capability
prediction of a Li-Ion battery},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {572--581},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.016},
doi = {10.1016/J.MICROREL.2014.12.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeKC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeL15,
author = {Chie{-}In Lee and
Wei{-}Cheng Lin},
title = {{MOSFET} channel resistance characterization from the triode region
to impact ionization region with the inductive breakdown network},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {481--485},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.018},
doi = {10.1016/J.MICROREL.2014.11.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLL15,
author = {Chie{-}In Lee and
Wei{-}Cheng Lin and
Yan{-}Ting Lin},
title = {Investigation of geometry dependence on {MOSFET} linearity in the
impact ionization region using Volterra series},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1163--1168},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.007},
doi = {10.1016/J.MICROREL.2015.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeW15,
author = {Meng Chuan Lee and
Hin Yong Wong},
title = {Investigation on the origin of the anomalous tail bits on nitrided
charge trap flash memory},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {337--341},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.013},
doi = {10.1016/J.MICROREL.2014.10.013},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeeW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeZHM15,
author = {Chean Shen Lee and
Guang{-}Ming Zhang and
David M. Harvey and
Hong{-}Wei Ma},
title = {Development of C-Line plot technique for the characterization of edge
effects in acoustic imaging: {A} case study using flip chip package
geometry},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2762--2768},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.005},
doi = {10.1016/J.MICROREL.2015.08.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeZHM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiBXX15,
author = {Hongge Li and
Huixin Bai and
Qicheng Xu and
Tongsheng Xia},
title = {Low-power MicroV\({}_{\mbox{rms}}\) noise neural spike detector for
implantable interface microsystem device},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {807--814},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.001},
doi = {10.1016/J.MICROREL.2015.02.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiBXX15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiHLLWWZL15,
author = {Hua Li and
Xiang Huang and
Zhiwei Li and
Haoyuan Li and
Wenjuan Wang and
Bowen Wang and
Qin Zhang and
Fuchang Lin},
title = {Modeling of {ESR} in metallized film capacitors and its implication
on pulse handling capability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1046--1053},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.007},
doi = {10.1016/J.MICROREL.2015.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiHLLWWZL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLLLLWWX15,
author = {Haoyuan Li and
Hua Li and
Zhiwei Li and
Fuchang Lin and
De Liu and
Wenjuan Wang and
Bowen Wang and
Zhijian Xu},
title = {T pattern fuse construction in segment metallized film capacitors
based on self-healing characteristics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {945--951},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.006},
doi = {10.1016/J.MICROREL.2015.03.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLLLLWWX15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiLLLWWHG15,
author = {Haoyuan Li and
Hua Li and
Zhiwei Li and
Fuchang Lin and
Wenjuan Wang and
Bowen Wang and
Xiang Huang and
Xiaolong Guo},
title = {Temperature dependence of self-healing characteristics of metallized
polypropylene film},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2721--2726},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.007},
doi = {10.1016/J.MICROREL.2015.09.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiLLLWWHG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiRLW15,
author = {Z. F. Li and
Yi Ren and
Linlin Liu and
Z. L. Wang},
title = {Parallel algorithm for finding modules of large-scale coherent fault
trees},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1400--1403},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.131},
doi = {10.1016/J.MICROREL.2015.06.131},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiRLW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSOAKKNSWTNI15,
author = {Wei Li and
Akito Sasaki and
Hideyuki Oozu and
Katsuaki Aoki and
Kuniyuki Kakushima and
Yoshinori Kataoka and
Akira Nishiyama and
Nobuyuki Sugii and
Hitoshi Wakabayashi and
Kazuo Tsutsui and
Kenji Natori and
Hiroshi Iwai},
title = {Improvement of charge/discharge performance for lithium ion batteries
with tungsten trioxide electrodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {402--406},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.002},
doi = {10.1016/J.MICROREL.2014.11.002},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiSOAKKNSWTNI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSOAKKNSWTNI15a,
author = {Wei Li and
Akito Sasaki and
Hideyuki Oozu and
Katsuaki Aoki and
Kuniyuki Kakushima and
Yoshinori Kataoka and
Akira Nishiyama and
Nobuyuki Sugii and
Hitoshi Wakabayashi and
Kazuo Tsutsui and
Kenji Natori and
Hiroshi Iwai},
title = {Electron transport mechanism of tungsten trioxide powder thin film
studied by investigating effect of annealing on resistivity},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {407--410},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.012},
doi = {10.1016/J.MICROREL.2014.10.012},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiSOAKKNSWTNI15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiWPZ15,
author = {Po Li and
Yung{-}Cheng Wang and
Jing{-}Wei Peng and
David Wei Zhang},
title = {Impact of substrate resistance and layout on passivation etch-induced
wafer arcing and reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {931--936},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.024},
doi = {10.1016/J.MICROREL.2015.02.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiWPZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiX15,
author = {Fan Li and
Jiuping Xu},
title = {A new prognostics method for state of health estimation of lithium-ion
batteries based on a mixture of Gaussian process models and particle
filter},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1035--1045},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.025},
doi = {10.1016/J.MICROREL.2015.02.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiX15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoCDSLTS15,
author = {Guanglan Liao and
Pengfei Chen and
Li Du and
Lei Su and
Zhiping Liu and
Zirong Tang and
Tielin Shi},
title = {Using {SOM} neural network for X-ray inspection of missing-bump defects
in three-dimensional integration},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2826--2832},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.009},
doi = {10.1016/J.MICROREL.2015.09.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoCDSLTS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoDSZNS15,
author = {Guanglan Liao and
Li Du and
Lei Su and
Miao Zeng and
Lei Nie and
Tielin Shi},
title = {Using {RBF} networks for detection and prediction of flip chip with
missing bumps},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2817--2825},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.030},
doi = {10.1016/J.MICROREL.2015.09.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoDSZNS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LillieSH15,
author = {Edwin Lillie and
Peter Sandborn and
David Humphrey},
title = {Assessing the value of a lead-free solder control plan using cost-based
{FMEA}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {969--979},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.022},
doi = {10.1016/J.MICROREL.2015.02.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LillieSH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimKY15,
author = {Jin Hong Lim and
Jeong Jin Kim and
Jeon{-}Wook Yang},
title = {Improved surface morphology of a Ti/Al/Ni/Au ohmic contact for AlGaN/GaN
heterostructure by Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) particles},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2565--2568},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.005},
doi = {10.1016/J.MICROREL.2015.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimKY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimY15,
author = {Jun Yeong Lim and
Ilgu Yun},
title = {Reliability modeling and analysis of flicker noise for pore structure
in amorphous chalcogenide-based phase-change memory devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1320--1322},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.114},
doi = {10.1016/J.MICROREL.2015.06.114},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinC15,
author = {Chun{-}Yu Lin and
Yan{-}Lian Chiu},
title = {Investigation on SCR-based {ESD} protection device for biomedical
integrated circuits in a 0.18-{\(\mu\)}m {CMOS} process},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2229--2235},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.020},
doi = {10.1016/J.MICROREL.2015.02.020},
timestamp = {Thu, 05 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinHCWWLWHLD15,
author = {Hsiu{-}Min Lin and
Cheng{-}Ying Ho and
Wen{-}Lin Chen and
Yi{-}Hsin Wu and
De{-}Hui Wang and
Jun{-}Ren Lin and
Yu{-}Hui Wu and
Huei{-}Cheng Hong and
Zhi{-}Wei Lin and
Jenq{-}Gong Duh},
title = {Interfacial reaction and mechanical evaluation in multi-level assembly
joints with {ENEPIG} under bump metallization via drop and high speed
impact test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {231--237},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.003},
doi = {10.1016/J.MICROREL.2014.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinHCWWLWHLD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinJLWC15,
author = {K. C. Lin and
P. C. Juan and
C. H. Liu and
Mu{-}Chun Wang and
C. H. Chou},
title = {Leakage current mechanism and effect of Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
doped with Zr high-K gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2198--2202},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.045},
doi = {10.1016/J.MICROREL.2015.07.045},
timestamp = {Thu, 20 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinJLWC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinWHL15,
author = {Shih{-}Hung Lin and
You{-}Lin Wu and
Yu{-}Huei Hwang and
Jing{-}Jenn Lin},
title = {Study of radiation hardness of HfO\({}_{\mbox{2}}\)-based resistive
switching memory at nanoscale by conductive atomic force microscopy},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2224--2228},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.009},
doi = {10.1016/J.MICROREL.2015.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinWHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiouLL15,
author = {Juin J. Liou and
Chun{-}Chieh Lin and
Chu{-}Hsuan Lin},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2173},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.033},
doi = {10.1016/J.MICROREL.2015.09.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiouLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCCL15,
author = {Wei Chih Liu and
Yan Hao Chen and
Te{-}yuan Chung and
Cheng Yi Liu},
title = {Study of Al-Cu compounds as soldering bond pad for high-power device
packaging},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2549--2553},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.012},
doi = {10.1016/J.MICROREL.2015.08.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCCL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCCM15,
author = {Taizhi Liu and
Chang{-}Chih Chen and
Soonyoung Cha and
Linda Milor},
title = {System-level variation-aware aging simulator using a unified novel
gate-delay model for bias temperature instability, hot carrier injection,
and gate oxide breakdown},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1334--1340},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.008},
doi = {10.1016/J.MICROREL.2015.06.008},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCCM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCKM15,
author = {Taizhi Liu and
Chang{-}Chih Chen and
Woongrae Kim and
Linda Milor},
title = {Comprehensive reliability and aging analysis on SRAMs within microprocessor
systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1290--1296},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.078},
doi = {10.1016/J.MICROREL.2015.06.078},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCKM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLWZ15,
author = {Fang Liu and
Ye Lu and
Zhen Wang and
Zhiming Zhang},
title = {Numerical simulation and fatigue life estimation of {BGA} packages
under random vibration loading},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2777--2785},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.006},
doi = {10.1016/J.MICROREL.2015.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLWZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuSZXYZ15,
author = {Yang Liu and
Fenglian Sun and
Hao Zhang and
Tong Xin and
Cadmus A. Yuan and
Guoqi Zhang},
title = {Interfacial reaction and failure mode analysis of the solder joints
for flip-chip {LED} on {ENIG} and Cu-OSP surface finishes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1234--1240},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.005},
doi = {10.1016/J.MICROREL.2015.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuSZXYZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuWLZP15,
author = {Liansheng Liu and
Shaojun Wang and
Datong Liu and
Yujie Zhang and
Yu Peng},
title = {Entropy-based sensor selection for condition monitoring and prognostics
of aircraft engine},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2092--2096},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.076},
doi = {10.1016/J.MICROREL.2015.06.076},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuWLZP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZFSZG15,
author = {Kun Liu and
Hui Zhu and
Shiwei Feng and
Lei Shi and
Yamin Zhang and
Chunsheng Guo},
title = {The effect of external stress on the electrical characteristics of
AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {886--889},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.012},
doi = {10.1016/J.MICROREL.2015.03.012},
timestamp = {Wed, 15 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuZFSZG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LotnykPRGFBTR15,
author = {Andriy Lotnyk and
D. Poppitz and
U. Ross and
J. W. Gerlach and
F. Frost and
S. Bern{\"{u}}tz and
E. Thelander and
B. Rauschenbach},
title = {Focused high- and low-energy ion milling for {TEM} specimen preparation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2119--2125},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.005},
doi = {10.1016/J.MICROREL.2015.07.005},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LotnykPRGFBTR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LyXSM15,
author = {Nhat Ly and
Di Erick Xu and
Wan Ho Song and
Michael Mayer},
title = {More uniform Pd distribution in free-air balls of Pd-coated Cu bonding
wire using movable flame-off electrode},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {201--206},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.004},
doi = {10.1016/J.MICROREL.2014.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LyXSM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaghsoudlooZ15,
author = {Mohammad Maghsoudloo and
Hamid R. Zarandi},
title = {Design space exploration of non-uniform cache access for soft-error
vulnerability mitigation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2439--2452},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.049},
doi = {10.1016/J.MICROREL.2015.07.049},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MaghsoudlooZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahdavifardSSSB15,
author = {Mohammad Hossein Mahdavifard and
Mohd Faizul Mohd Sabri and
Dhafer Abdulameer Shnawah and
Suhana Mohd Said and
Irfan Anjum Badruddin and
S. Rozali},
title = {The effect of iron and bismuth addition on the microstructural, mechanical,
and thermal properties of Sn-1Ag-0.5Cu solder alloy},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1886--1890},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.134},
doi = {10.1016/J.MICROREL.2015.06.134},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MahdavifardSSSB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahmudiF15,
author = {R. Mahmudi and
D. Farasheh},
title = {Impression creep behavior of Zn-4Al-3Mg-xSn high-temperature lead-free
solders},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2542--2548},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.005},
doi = {10.1016/J.MICROREL.2015.09.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahmudiF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MakdessiSVACPDD15,
author = {Maawad Makdessi and
Ali Sari and
Pascal Venet and
Guillaume Aubard and
F. Chevalier and
R. Pr{\'{e}}seau and
T. Doytchinov and
Jimmy Duwattez},
title = {Lifetime estimation of high-temperature high-voltage polymer film
capacitor based on capacitance loss},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2012--2016},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.099},
doi = {10.1016/J.MICROREL.2015.06.099},
timestamp = {Mon, 01 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MakdessiSVACPDD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Manic15,
author = {Ivica Manic},
title = {Microwave Engineering: Concepts and Fundamentals, Ahmad Shahid Khan.
{CRC} Press Taylor {\&} Francis Group, Boca Raton {(2014).} 800
p., Hardcover, {ISBN:} 9781466591417},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {461},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.005},
doi = {10.1016/J.MICROREL.2014.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Manic15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MatinIKSI15,
author = {M. A. Matin and
A. Ikedo and
Takeshi Kawano and
K. Sawada and
Makoto Ishida},
title = {Microscale temperature sensing using novel reliable silicon vertical
microprobe array: Computation and experiment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2689--2697},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.003},
doi = {10.1016/J.MICROREL.2015.09.003},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MatinIKSI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeinshausenFWP15,
author = {Lutz Meinshausen and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Kirsten Weide{-}Zaage and
Bernard Plano},
title = {Electro- and thermomigration induced Cu\({}_{\mbox{3}}\)Sn and Cu\({}_{\mbox{6}}\)Sn\({}_{\mbox{5}}\)
formation in SnAg\({}_{\mbox{3.0}}\)Cu\({}_{\mbox{0.5}}\) bumps},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {192--200},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.030},
doi = {10.1016/J.MICROREL.2014.09.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeinshausenFWP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeinshausenWF15,
author = {Lutz Meinshausen and
Kirsten Weide{-}Zaage and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Dynamical IMC-growth calculation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1832--1837},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.052},
doi = {10.1016/J.MICROREL.2015.06.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeinshausenWF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelendezDSPL15,
author = {Kevin Melendez and
A. Desmoulin and
Kevin Sanchez and
Philippe Perdu and
Dean Lewis},
title = {A way to implement the electro-optical technique to inertial {MEMS}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1916--1919},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.041},
doi = {10.1016/J.MICROREL.2015.07.041},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelendezDSPL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelloRBFG15,
author = {Domenico Mello and
R. Ricciari and
A. Battaglia and
Marina Foti and
Cosimo Gerardi},
title = {Case study of failure analysis in thin film silicon solar cell},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1800--1803},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.040},
doi = {10.1016/J.MICROREL.2015.06.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelloRBFG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MerahNT15,
author = {S. M. Merah and
B{\'{e}}charia Nadji and
Hakim Tahi},
title = {Low magnetic field Impact on {NBTI} degradation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1460--1463},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.137},
doi = {10.1016/J.MICROREL.2015.06.137},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MerahNT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MertensKC15,
author = {James C. E. Mertens and
Antony Kirubanandham and
Nikhilesh Chawla},
title = {In situ fixture for multi-modal characterization during electromigration
and thermal testing of wire-like microscale specimens},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2345--2353},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.003},
doi = {10.1016/J.MICROREL.2015.08.003},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MertensKC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeyFW15,
author = {Gilbert De Mey and
Mariusz Felczak and
Boguslaw Wiecek},
title = {Modelling and {IR} measurement of the electronic substrate thermal
conductivity},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {138--142},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.002},
doi = {10.1016/J.MICROREL.2014.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeyFW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiaoZSHL15,
author = {Meng Miao and
Yuanzhong (Paul) Zhou and
Javier A. Salcedo and
Jean{-}Jacques Hajjar and
Juin J. Liou},
title = {Compact failure modeling for devices subject to electrostatic discharge
stresses - {A} review pertinent to {CMOS} reliability simulation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {15--23},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.015},
doi = {10.1016/J.MICROREL.2014.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiaoZSHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MichalasKPGP15,
author = {Loukas Michalas and
Matroni Koutsoureli and
E. Papandreou and
Flavio Giacomozzi and
George J. Papaioannou},
title = {Dielectric charging effects in floating electrode {MEMS} capacitive
switches},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1891--1895},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.024},
doi = {10.1016/J.MICROREL.2015.07.024},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MichalasKPGP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MichaudPBHGVLG15,
author = {J{\'{e}}r{\'{e}}my Michaud and
G. Pedroza and
Laurent B{\'{e}}chou and
L. S. How and
Olivier Gilard and
David Veyri{\'{e}} and
F. Laruelle and
St{\'{e}}phane Grauby},
title = {Investigations on electro-optical and thermal performances degradation
of high power density GaAs-based laser diode in vacuum environment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1746--1749},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.068},
doi = {10.1016/J.MICROREL.2015.06.068},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MichaudPBHGVLG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirgkizoudiLCR15,
author = {Maria Mirgkizoudi and
Changqing Liu and
Paul P. Conway and
Steve Riches},
title = {Mechanical and electrical characterisation of Au wire interconnects
in electronic packages under the combined vibration and thermal testing
conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {952--960},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.023},
doi = {10.1016/J.MICROREL.2015.02.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirgkizoudiLCR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoonLYNY15,
author = {Pyung Moon and
Jun Yeong Lim and
Tae{-}Un Youn and
Keum{-}Whan Noh and
Ilgu Yun},
title = {Effect of electric field polarity on inter-poly dielectric during
cell operation for the retention characteristics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {795--798},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.011},
doi = {10.1016/J.MICROREL.2015.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoonLYNY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MsolliADK15,
author = {Sabeur Msolli and
Jo{\"{e}}l Alexis and
Olivier Dalverny and
Moussa Karama},
title = {Experimental characterization of the mechanical behavior of two solder
alloys for high temperature power electronics applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {164--171},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.021},
doi = {10.1016/J.MICROREL.2014.09.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MsolliADK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MukherjeeD15,
author = {Atin Mukherjee and
Anindya Sundar Dhar},
title = {Real-time fault-tolerance with hot-standby topology for conditional
sum adder},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {704--712},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.011},
doi = {10.1016/J.MICROREL.2014.12.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MukherjeeD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MunteanuA15,
author = {Daniela Munteanu and
Jean{-}Luc Autran},
title = {{SEU} sensitivity of Junctionless Single-Gate {SOI} MOSFETs-based
6T {SRAM} cells investigated by 3D {TCAD} simulation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1501--1505},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.107},
doi = {10.1016/J.MICROREL.2015.06.107},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MunteanuA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MunteanuA15a,
author = {Daniela Munteanu and
Jean{-}Luc Autran},
title = {3D simulation of single-event-transient effects in symmetrical dual-material
double-gate MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1522--1526},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.022},
doi = {10.1016/J.MICROREL.2015.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MunteanuA15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NabiollahiMGMWC15,
author = {Nabi Nabiollahi and
Nele Moelans and
Mario Gonzalez and
Joke De Messemaeker and
Christopher J. Wilson and
Kristof Croes and
Eric Beyne and
Ingrid De Wolf},
title = {Microstructure simulation of grain growth in Cu through silicon vias
using phase-field modeling},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {765--770},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.009},
doi = {10.1016/J.MICROREL.2015.02.009},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NabiollahiMGMWC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Nahm15,
author = {Choon{-}W. Nahm},
title = {Degradation behavior by DC-accelerated and pulse-current stress in
Co/Cr/Y/Al/Ni co-doped ZnO-PrO\({}_{\mbox{1.83}}\)-based varistors},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {565--571},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.012},
doi = {10.1016/J.MICROREL.2015.01.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Nahm15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Nahm15a,
author = {Choon{-}W. Nahm},
title = {Zinc oxide-praseodymia semiconducting varistors having a powerful
surge suppression capability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2299--2305},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.001},
doi = {10.1016/J.MICROREL.2015.08.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Nahm15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Naoe15,
author = {Takuya Naoe},
title = {Case study: Root cause of fluorine detection during TiN {ARC} layer
corrosion of AlSiCu metal lines},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {411--417},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.007},
doi = {10.1016/J.MICROREL.2014.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Naoe15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NaoussM15,
author = {Mohammad Naouss and
Fran{\c{c}}ois Marc},
title = {Design and implementation of a low cost test bench to assess the reliability
of {FPGA}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1341--1345},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.087},
doi = {10.1016/J.MICROREL.2015.06.087},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NaoussM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Nazar15,
author = {Gabriel L. Nazar},
title = {Improving {FPGA} repair under real-time constraints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1109--1119},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.003},
doi = {10.1016/J.MICROREL.2015.04.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Nazar15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenCK15,
author = {Van Luong Nguyen and
Chin{-}Sung Chung and
Ho{-}Kyung Kim},
title = {The tensile impact properties of aged Sn-3Ag-0.5Cu/Cu solder joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2808--2816},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.002},
doi = {10.1016/J.MICROREL.2015.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NguyenCK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NikolicNSS15,
author = {Tatjana R. Nikolic and
Goran S. Nikolic and
Mile K. Stojcev and
Zoran Stamenkovic},
title = {Low-power fault-tolerant interconnect method based on {LCDMA} and
duplication},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {272--281},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.029},
doi = {10.1016/J.MICROREL.2014.09.029},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NikolicNSS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NowodzinskiCTJR15,
author = {Antoine Nowodzinski and
Mayeul Chipaux and
Lo{\"{\i}}c Toraille and
Vincent Jacques and
Jean{-}Fran{\c{c}}ois Roch and
Thierry Debuisschert},
title = {Nitrogen-Vacancy centers in diamond for current imaging at the redistributive
layer level of Integrated Circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1549--1553},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.069},
doi = {10.1016/J.MICROREL.2015.06.069},
timestamp = {Mon, 23 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NowodzinskiCTJR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OhKK15,
author = {Ilgeun Oh and
Myeongjin Kim and
Jooheon Kim},
title = {Deposition of Fe\({}_{\mbox{3}}\)O\({}_{\mbox{4}}\) on oxidized activated
carbon by hydrazine reducing method for high performance supercapacitor},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {114--122},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.014},
doi = {10.1016/J.MICROREL.2014.09.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OhKK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OrellanaAFRBMI15,
author = {Sebastian Orellana and
Brice Arrazat and
Pascal Fornara and
Christian Rivero and
Sylvain Blayac and
Pierre Montmitonnet and
Karim Inal},
title = {Robust design of thermo-mechanical {MEMS} switch embedded in aluminium
{BEOL} interconnect},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1896--1900},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.032},
doi = {10.1016/J.MICROREL.2015.06.032},
timestamp = {Wed, 25 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OrellanaAFRBMI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OzkolBL15,
author = {Emre {\"{O}}zkol and
Franziska Brem and
Chunlei Liu},
title = {Improving the power cycling performance of {IGBT} modules by plating
the emitter contact},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {552--557},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.001},
doi = {10.1016/J.MICROREL.2015.01.001},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OzkolBL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OzkolBLHK15,
author = {Emre {\"{O}}zkol and
Franziska Brem and
Chunlei Liu and
Samuel Hartmann and
Arnost Kopta},
title = {Enhanced power cycling performance of {IGBT} modules with a reinforced
emitter contact},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {912--918},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.013},
doi = {10.1016/J.MICROREL.2015.03.013},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OzkolBLHK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Paine15,
author = {Bruce M. Paine},
title = {Scaling {DC} lifetests on GaN {HEMT} to {RF} conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2499--2504},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.024},
doi = {10.1016/J.MICROREL.2015.09.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Paine15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanLZZ15,
author = {Dawei Pan and
Datong Liu and
Jun Zhou and
Guoyong Zhang},
title = {Anomaly detection for satellite power subsystem with associated rules
based on Kernel Principal Component Analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2082--2086},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.010},
doi = {10.1016/J.MICROREL.2015.07.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PanLZZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkeLHCH15,
author = {Justin Parke and
Randy Lewis and
Kathy Ha and
Harlan Cramer and
Harold Hearne},
title = {Design and process related {MIM} cap reliability improvement},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2516--2521},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.026},
doi = {10.1016/J.MICROREL.2015.09.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkeLHCH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PatilDP15,
author = {Nishad Patil and
Diganta Das and
Michael G. Pecht},
title = {Anomaly detection for IGBTs using Mahalanobis distance},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1054--1059},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.001},
doi = {10.1016/J.MICROREL.2015.04.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PatilDP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PedersenOGPP15,
author = {Kristian Bonderup Pedersen and
Lotte Haxen {\O}stergaard and
Pramod Ghimire and
Vladimir N. Popok and
Kjeld Pedersen},
title = {Degradation mapping in high power {IGBT} modules using four-point
probing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1196--1204},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.011},
doi = {10.1016/J.MICROREL.2015.05.011},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PedersenOGPP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PereiraG15,
author = {A. S. N. Pereira and
Renato C. Giacomini},
title = {An accurate closed-expression model for FinFETs parasitic resistance},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {470--480},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.006},
doi = {10.1016/J.MICROREL.2015.01.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PereiraG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetitdidierBGTM15,
author = {S{\'{e}}bastien Petitdidier and
Fanny Berthet and
Yannick Guhel and
Jean{-}Lionel Trolet and
Philippe Mary and
Christophe Gaqui{\`{e}}re and
Bertrand Boudart},
title = {Characterization and analysis of electrical trap related effects on
the reliability of AlInN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1719--1723},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.070},
doi = {10.1016/J.MICROREL.2015.06.070},
timestamp = {Tue, 06 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PetitdidierBGTM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PhulpinTITGA15,
author = {Tanguy Phulpin and
David Tr{\'{e}}mouilles and
Karine Isoird and
Dominique Tournier and
Philippe Godignon and
Patrick Austin},
title = {Failure analysis of ESD-stressed SiC {MESFET}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1542--1548},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.121},
doi = {10.1016/J.MICROREL.2015.06.121},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PhulpinTITGA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolingBHSBH15,
author = {B. S. Poling and
J. L. Brown and
E. R. Heller and
B. Stumpff and
J. A. Beckman and
A. M. Hilton},
title = {Performance of commercial foundry-level AlGaN/GaN HEMTs after hot
electron stressing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1187--1191},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.010},
doi = {10.1016/J.MICROREL.2015.05.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolingBHSBH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PomeroyULK15,
author = {James W. Pomeroy and
Michael J. Uren and
Benoit Lambert and
Martin Kuball},
title = {Operating channel temperature in GaN HEMTs: {DC} versus {RF} accelerated
life testing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2505--2510},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.025},
doi = {10.1016/J.MICROREL.2015.09.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PomeroyULK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PralgauskaitePM15,
author = {Sandra Pralgauskaite and
Vilius Palenskis and
Jonas Matukas and
Justinas Glemza and
Grigorij Muliuk and
Bronius Saulys and
Augustinas Trinkunas},
title = {Reliability investigation of light-emitting diodes via low frequency
noise characteristics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {52--61},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.027},
doi = {10.1016/J.MICROREL.2014.09.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PralgauskaitePM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Prasad15,
author = {Mahanth Prasad},
title = {Design, development and reliability testing of a low power bridge-type
micromachined hotplate},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {937--944},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.005},
doi = {10.1016/J.MICROREL.2015.03.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Prasad15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PumarGPRC15,
author = {Manuel Dom{\'{\i}}nguez Pumar and
Sergi Gorreta and
Joan Pons{-}Nin and
Faustino G{\'{o}}mez Rodr{\'{\i}}guez and
Diego Gonz{\'{a}}lez Casta{\~{n}}o},
title = {Charge induced by ionizing radiation understood as a disturbance in
a sliding mode control of dielectric charge},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1926--1931},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.084},
doi = {10.1016/J.MICROREL.2015.06.084},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PumarGPRC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QiXGW15,
author = {Chunhua Qi and
Liyi Xiao and
Jing Guo and
Tianqi Wang},
title = {Low cost and highly reliable radiation hardened latch design in 65
nm {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {863--872},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.014},
doi = {10.1016/J.MICROREL.2015.03.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QiXGW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QinZG15,
author = {Taichun Qin and
Shengkui Zeng and
Jianbin Guo},
title = {Robust prognostics for state of health estimation of lithium-ion batteries
based on an improved {PSO-SVR} model},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1280--1284},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.133},
doi = {10.1016/J.MICROREL.2015.06.133},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QinZG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QinZZLM15,
author = {H. B. Qin and
X. P. Zhang and
M. B. Zhou and
X. P. Li and
Yiu{-}Wing Mai},
title = {Geometry effect on mechanical performance and fracture behavior of
micro-scale ball grid array structure Cu/Sn-3.0Ag-0.5Cu/Cu solder
joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1214--1225},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.013},
doi = {10.1016/J.MICROREL.2015.05.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QinZZLM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuanXQKSJ15,
author = {Quan Chen and
Xiaobing Luo and
Qi Chen and
Kai Wang and
Sheng Liu and
Jingyan Li},
title = {Research on lumen depreciation related to {LED} packages by in-situ
measurement method},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2269--2275},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.025},
doi = {10.1016/J.MICROREL.2015.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QuanXQKSJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaghavanBP15,
author = {Nagarajan Raghavan and
Michel Bosman and
Kin Leong Pey},
title = {Probabilistic insight to possibility of new metal filament nucleation
during repeated cycling of conducting bridge memory},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1412--1416},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.051},
doi = {10.1016/J.MICROREL.2015.06.051},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaghavanBP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaghavanF15,
author = {Nagarajan Raghavan and
Daniel D. Frey},
title = {Particle filter approach to lifetime prediction for microelectronic
devices and systems with multiple failure mechanisms},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1297--1301},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.089},
doi = {10.1016/J.MICROREL.2015.06.089},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaghavanF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaghavanFBP15,
author = {Nagarajan Raghavan and
Daniel D. Frey and
Michel Bosman and
Kin Leong Pey},
title = {Statistics of retention failure in the low resistance state for hafnium
oxide {RRAM} using a Kinetic Monte Carlo approach},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1422--1426},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.090},
doi = {10.1016/J.MICROREL.2015.06.090},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaghavanFBP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rajaguru0B15,
author = {Pushparajah Rajaguru and
Hua Lu and
Chris Bailey},
title = {Sintered silver finite element modelling and reliability based design
optimisation in power electronic module},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {919--930},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.011},
doi = {10.1016/J.MICROREL.2015.03.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rajaguru0B15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rajaguru0B15a,
author = {Pushparajah Rajaguru and
Hua Lu and
Chris Bailey},
title = {A time dependent damage indicator model for Sn3.5Ag solder layer in
power electronic module},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2371--2381},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.047},
doi = {10.1016/J.MICROREL.2015.07.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rajaguru0B15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RajiPG15,
author = {Mohsen Raji and
Hossein Pedram and
Behnam Ghavami},
title = {A practical metric for soft error vulnerability analysis of combinational
circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {448--460},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.004},
doi = {10.1016/J.MICROREL.2014.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RajiPG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RandollAWBS15,
author = {Richard Randoll and
Mahmud Asef and
Wolfgang Wondrak and
Lars B{\"{o}}ttcher and
Andreas Schletz},
title = {Characteristics and aging of {PCB} embedded power electronics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1634--1639},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.072},
doi = {10.1016/J.MICROREL.2015.06.072},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RandollAWBS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReigosaWIB15,
author = {Paula Diaz Reigosa and
Rui Wu and
Francesco Iannuzzo and
Frede Blaabjerg},
title = {Robustness of MW-Level {IGBT} modules against gate oscillations under
short circuit events},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1950--1955},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.011},
doi = {10.1016/J.MICROREL.2015.07.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReigosaWIB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RicciCT15,
author = {Emanuela Ricci and
F. Cazzaniga and
S. Testai},
title = {{TEM} sample preparation of a {SEM} cross section using electron beam
induced deposition of carbon},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2126--2130},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.018},
doi = {10.1016/J.MICROREL.2015.07.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RicciCT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RicciariFPPASPC15,
author = {R. Ricciari and
E. P. Ferlito and
G. Pizzo and
M. Padalino and
G. Anastasi and
M. Sacchi and
G. Pappalardo and
C. Consalvo and
Domenico Mello},
title = {Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer
back-metal for monitoring of Ni migration on Ag surface},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1617--1621},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.020},
doi = {10.1016/J.MICROREL.2015.07.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RicciariFPPASPC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RichelliMR15,
author = {Anna Richelli and
Gilbert Matig{-}a and
Jean{-}Michel Redoute},
title = {Design of a folded cascode opamp with increased immunity to conducted
electromagnetic interference in 0.18 {\(\mu\)}m {CMOS}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {654--661},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.019},
doi = {10.1016/J.MICROREL.2014.12.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RichelliMR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RigatoFHCSP15,
author = {Matteo Rigato and
Cl{\'{e}}ment Fleury and
Michael Heer and
Mattia Capriotti and
Werner Simb{\"{u}}rger and
Dionyz Pogany},
title = {{ESD} characterization of multi-finger {RF} nMOSFET transistors by
{TLP} and transient interferometric mapping technique},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1471--1475},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.019},
doi = {10.1016/J.MICROREL.2015.06.019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RigatoFHCSP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RodriguezGCSM15,
author = {Alberto Rodriguez{-}Fernandez and
M. B. Gonz{\'{a}}lez and
Francesca Campabadal and
Jordi Su{\~{n}}{\'{e}} and
Enrique Miranda},
title = {Electrical characterization of multiple leakage current paths in HfO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)-based
nanolaminates},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1442--1445},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.018},
doi = {10.1016/J.MICROREL.2015.05.018},
timestamp = {Sat, 25 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RodriguezGCSM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch15,
author = {William J. Roesch},
title = {Setting stress conditions that qualify application expectations},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2484--2492},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.022},
doi = {10.1016/J.MICROREL.2015.09.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Roesch15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RolloffBF15,
author = {Otto Aureliano Rolloff and
Rodrigo Possamai Bastos and
Laurent Fesquet},
title = {Exploiting reliable features of asynchronous circuits for designing
low-voltage components in {FD-SOI} technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1302--1306},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.028},
doi = {10.1016/J.MICROREL.2015.07.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RolloffBF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RongenMCWSR15,
author = {Kirsten Rongen and
Amar Mavinkurve and
M. Chen and
P. J. van der Wel and
F. Swartjes and
Rene T. H. Rongen},
title = {Moisture absorption and desorption in wafer level chip scale packages},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1872--1876},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.129},
doi = {10.1016/J.MICROREL.2015.06.129},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RongenMCWSR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RosaBWKOR15,
author = {Felipe Rosa and
Raphael Martins Brum and
Gilson I. Wirth and
Fernanda Gusm{\~{a}}o de Lima Kastensmidt and
Luciano Ost and
Ricardo Reis},
title = {Impact of dynamic voltage scaling and thermal factors on {SRAM} reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1486--1490},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.013},
doi = {10.1016/J.MICROREL.2015.07.013},
timestamp = {Thu, 13 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RosaBWKOR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RossettoMBBHMWD15,
author = {Isabella Rossetto and
Matteo Meneghini and
Davide Bisi and
Alessandro Barbato and
Marleen Van Hove and
Denis Marcon and
Tian{-}Li Wu and
Stefaan Decoutere and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Impact of gate insulator on the dc and dynamic performance of AlGaN/GaN
MIS-HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1692--1696},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.130},
doi = {10.1016/J.MICROREL.2015.06.130},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RossettoMBBHMWD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RouagORMF15,
author = {N. Rouag and
Zahir Ouennoughi and
Mathias Rommel and
Katsuhisa Murakami and
Lothar Frey},
title = {Current conduction mechanism of {MIS} devices using multidimensional
minimization system program},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1028--1034},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.001},
doi = {10.1016/J.MICROREL.2015.05.001},
timestamp = {Mon, 13 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RouagORMF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyBHJKH15,
author = {Chandan K. Roy and
Sushil Bhavnani and
Michael C. Hamilton and
R. Wayne Johnson and
Roy W. Knight and
Daniel K. Harris},
title = {Accelerated aging and thermal cycling of low melting temperature alloys
as wet thermal interface materials},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2698--2704},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.020},
doi = {10.1016/J.MICROREL.2015.08.020},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoyBHJKH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RuffilliBDLWL15,
author = {R. Ruffilli and
Mounira Berkani and
Philippe Dupuy and
St{\'{e}}phane Lefebvre and
Y. Weber and
Marc Legros},
title = {In-depth investigation of metallization aging in power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1966--1970},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.036},
doi = {10.1016/J.MICROREL.2015.06.036},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RuffilliBDLWL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RusanovRGFMK15,
author = {Radoslav Rusanov and
Holger Rank and
Juergen Graf and
Tino Fuchs and
Roland Mueller{-}Fiedler and
Oliver Kraft},
title = {Reliability of platinum electrodes and heating elements on SiO\({}_{\mbox{2}}\)
insulation layers and membranes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1920--1925},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.106},
doi = {10.1016/J.MICROREL.2015.06.106},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RusanovRGFMK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RzinLMCBL15,
author = {M. Rzin and
Nathalie Labat and
Nathalie Malbert and
Arnaud Curutchet and
Laurent Brunel and
Benoit Lambert},
title = {Investigation of the dynamic on-state resistance of AlGaN/GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1672--1676},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.001},
doi = {10.1016/J.MICROREL.2015.07.001},
timestamp = {Thu, 16 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RzinLMCBL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SabriNSAAJRW15,
author = {Mohd Faizul Mohd Sabri and
Nor Ilyana Muhd Nordin and
Suhana Mohd Said and
Nur Aishah Aminah Mohd Amin and
Hamzah Arof and
Iswadi Jauhari and
Roziana Ramli and
Kirsten Weide{-}Zaage},
title = {Effect of thermal aging on the electrical resistivity of Fe-added
{SAC105} solder alloys},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1882--1885},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.123},
doi = {10.1016/J.MICROREL.2015.06.123},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SabriNSAAJRW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaitoSUNK15,
author = {Wataru Saito and
Takeshi Suwa and
Takeshi Uchihara and
Toshiyuki Naka and
Taichi Kobayashi},
title = {Breakdown behaviour of high-voltage GaN-HEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1682--1686},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.126},
doi = {10.1016/J.MICROREL.2015.06.126},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SaitoSUNK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaleemS15,
author = {Muhammad Mubasher Saleem and
Aurelio Som{\`{a}}},
title = {Design optimization of {RF-MEMS} switch considering thermally induced
residual stress and process uncertainties},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2284--2298},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.026},
doi = {10.1016/J.MICROREL.2015.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SaleemS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SalehaFA15,
author = {Nemdili Saleha and
Nemdili Fad{\`{e}}la and
Azzi Abb{\`{e}}s},
title = {Improving cooling effectiveness by use of chamfers on the top of electronic
components},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1067--1076},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.006},
doi = {10.1016/J.MICROREL.2015.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SalehaFA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanfinsRRBCB15,
author = {William Sanfins and
Damien Risaletto and
Fr{\'{e}}d{\'{e}}ric Richardeau and
G. Blondel and
M. Chemin and
Philippe Baudesson},
title = {Preliminary failure-mode characterization of emerging direct-lead-bonding
power module. Comparison with standard wire-bonding interconnection},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1956--1960},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.006},
doi = {10.1016/J.MICROREL.2015.06.006},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SanfinsRRBCB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SantiLBMMMZ15,
author = {Carlo De Santi and
Matteo Dal Lago and
Matteo Buffolo and
Desiree Monti and
Matteo Meneghini and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Failure causes and mechanisms of retrofit {LED} lamps},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1765--1769},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.080},
doi = {10.1016/J.MICROREL.2015.06.080},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SantiLBMMMZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasikumarAVWPHR15,
author = {A. Sasikumar and
A. R. Arehart and
Glen David Via and
B. Winningham and
B. S. Poling and
E. R. Heller and
S. A. Ringel},
title = {Identification of an {RF} degradation mechanism in GaN based HEMTs
triggered by midgap traps},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2258--2262},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.048},
doi = {10.1016/J.MICROREL.2015.07.048},
timestamp = {Wed, 01 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SasikumarAVWPHR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SauveplaneRVBPL15,
author = {Jean{-}Baptiste Sauveplane and
Patrice Retho and
Norbert Venet and
David Buso and
Guy Perez and
Jean{-}S{\'{e}}bastien Lefrileux},
title = {A reliable solderless connection technique for high {I/O} counts ceramic
land grid array package for space applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1815--1820},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.060},
doi = {10.1016/J.MICROREL.2015.06.060},
timestamp = {Fri, 13 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SauveplaneRVBPL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchongrundnerCM15,
author = {Ronald Sch{\"{o}}ngrundner and
Megan Jo Cordill and
G{\"{u}}nther A. Maier and
Hans{-}Peter G{\"{a}}nser},
title = {Adhesion energy of printed circuit board materials using four-point-bending
validated with finite element simulations},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2382--2390},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.055},
doi = {10.1016/J.MICROREL.2015.06.055},
timestamp = {Tue, 12 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SchongrundnerCM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SenguptaS15,
author = {Anirban Sengupta and
Reza Sedaghat},
title = {Swarm intelligence driven design space exploration of optimal k-cycle
transient fault secured datapath during high level synthesis based
on user power-delay budget},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {990--1004},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.010},
doi = {10.1016/J.MICROREL.2015.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SenguptaS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SethuNCOC15,
author = {Raj Sekar Sethu and
Hong Seng Ng and
Alvin Chan and
Cheng Nee Ong and
Sieng Fong Chan},
title = {Characterization of copper precipitates on aluminum copper bond pads
formed after plasma clean and de-ionized water exposure},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1101--1108},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.018},
doi = {10.1016/J.MICROREL.2015.03.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SethuNCOC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SetoyaOSME15,
author = {Takashi Setoya and
Tsuneo Ogura and
Wataru Saito and
Tomoko Matsudai and
Koichi Endo},
title = {Destruction failure analysis and international reliability test standard
for power devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1932--1937},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.042},
doi = {10.1016/J.MICROREL.2015.07.042},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SetoyaOSME15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SezginO15,
author = {Hatice G{\"{u}}l Sezgin and
Yasin {\"{O}}z{\c{c}}elep},
title = {Characterization and modeling of power {MOSFET} switching times variations
under constant electrical stress},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {492--497},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.002},
doi = {10.1016/J.MICROREL.2015.01.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SezginO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SharmaTWRREPCG15,
author = {Prateek Sharma and
Stanislav Tyaginov and
Yannick Wimmer and
Florian Rudolf and
Karl Rupp and
Hubert Enichlmair and
J. H. Park and
Hajdin Ceric and
Tibor Grasser},
title = {Comparison of analytic distribution function models for hot-carrier
degradation modeling in nLDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1427--1432},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.021},
doi = {10.1016/J.MICROREL.2015.06.021},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShinKCKKJP15,
author = {Jiwon Shin and
Il Kim and
Yong{-}Won Choi and
Young Soon Kim and
Un Byung Kang and
Young Kun Jee and
Kyung{-}Wook Paik},
title = {Non-conductive film with Zn-nanoparticles (Zn-NCF) for 40 {\(\mu\)}m
pitch Cu-pillar/Sn-Ag bump interconnection},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {432--441},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.007},
doi = {10.1016/J.MICROREL.2014.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShinKCKKJP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShojiNHT15,
author = {Tomoyuki Shoji and
Shuichi Nishida and
Kimimori Hamada and
Hiroshi Tadano},
title = {Analysis of neutron-induced single-event burnout in SiC power MOSFETs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1517--1521},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.081},
doi = {10.1016/J.MICROREL.2015.06.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShojiNHT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShubhakarBNLRTR15,
author = {Kalya Shubhakar and
Michel Bosman and
O. A. Neucheva and
Y. C. Loke and
Nagarajan Raghavan and
R. Thamankar and
Alok Ranjan and
Sean J. O'Shea and
Kin Leong Pey},
title = {An {SEM/STM} based nanoprobing and {TEM} study of breakdown locations
in HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{x}}\) dielectric stacks for
failure analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1450--1455},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.027},
doi = {10.1016/J.MICROREL.2015.07.027},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShubhakarBNLRTR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SimionovskiW15,
author = {Alexandre Simionovski and
Gilson I. Wirth},
title = {Adding a self-reset feature to the Bulk-BICS with dynamic storage
cell},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2748--2753},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.019},
doi = {10.1016/J.MICROREL.2015.09.019},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SimionovskiW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SlimaniDN15,
author = {Mariem Slimani and
Arwa Ben Dhia and
Lirida A. B. Naviner},
title = {A novel analytical method for defect tolerance assessment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1285--1289},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.059},
doi = {10.1016/J.MICROREL.2015.06.059},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SlimaniDN15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SoyluODS15,
author = {Murat Soylu and
I. Orak and
O. Dayan and
Z. Serbetci},
title = {A novel photodiode based on Ruthenium(II) complex containing polydentate
pyridine as photocatalyst},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2685--2688},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.004},
doi = {10.1016/J.MICROREL.2015.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SoyluODS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SridharPSMB15,
author = {Ashok Sridhar and
Sandeep M. Perinchery and
Edsger C. P. Smits and
Rajesh Mandamparambil and
Jeroen van den Brand},
title = {Reliability investigations on LIFT-printed isotropic conductive adhesive
joints for system-in-foil applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2324--2330},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.006},
doi = {10.1016/J.MICROREL.2015.07.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SridharPSMB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SterponeDA15,
author = {Luca Sterpone and
Boyang Du and
Sarah Azimi},
title = {Radiation-induced single event transients modeling and testing on
nanometric flash-based technologies},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2087--2091},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.035},
doi = {10.1016/J.MICROREL.2015.07.035},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SterponeDA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stoyanov015,
author = {Stoyan Stoyanov and
Chris Bailey},
title = {Modelling the impact of refinishing processes on {COTS} components
for use in aerospace applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1271--1279},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.030},
doi = {10.1016/J.MICROREL.2015.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stoyanov015.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuSDLL15,
author = {Lei Su and
Tielin Shi and
Li Du and
Xiangning Lu and
Guanglan Liao},
title = {Genetic algorithms for defect detection of flip chips},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {213--220},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.006},
doi = {10.1016/J.MICROREL.2014.09.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuSDLL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuganumaSL15,
author = {Katsuaki Suganuma and
Jenn{-}Ming Song and
Yi{-}Shao Lai},
title = {Power electronics packaging},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2523},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.11.014},
doi = {10.1016/J.MICROREL.2015.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuganumaSL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunPWY15,
author = {Bo Sun and
Wuyang Pan and
Zili Wang and
Kam{-}Chuen Yung},
title = {Envelope probability and EFAST-based sensitivity analysis method for
electronic prognostic uncertainty quantification},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1384--1390},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.115},
doi = {10.1016/J.MICROREL.2015.06.115},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunPWY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuzukiC15,
author = {Hiroshi Suzuki and
Mauro Ciappa},
title = {{TCAD} simulation of current filamentation in adjacent {IGBT} cells
under turn-on and turn-off short circuit condition},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1976--1980},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.110},
doi = {10.1016/J.MICROREL.2015.06.110},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuzukiC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Tala-IghilTGML15,
author = {Boubekeur Tala{-}Ighil and
Jean{-}Lionel Trolet and
Hamid Gualous and
P. Mary and
St{\'{e}}phane Lefebvre},
title = {Experimental and comparative study of gamma radiation effects on Si-IGBT
and SiC-JFET},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1512--1516},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.136},
doi = {10.1016/J.MICROREL.2015.06.136},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Tala-IghilTGML15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanYSSW15,
author = {Y. Y. Tan and
Q. L. Yang and
K. S. Sim and
Li Tao Sun and
Xing Wu},
title = {Cu-Al intermetallic compound investigation using ex-situ post annealing
and in-situ annealing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2316--2323},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.050},
doi = {10.1016/J.MICROREL.2015.06.050},
timestamp = {Tue, 05 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TanYSSW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TangXS15,
author = {Cen Tang and
Gang Xie and
Kuang Sheng},
title = {Study of the leakage current suppression for hybrid-Schottky/ohmic
drain AlGaN/GaN {HEMT}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {347--351},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.018},
doi = {10.1016/J.MICROREL.2014.10.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TangXS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TegehallW15,
author = {Per{-}Erik Tegehall and
G{\"{o}}ran Wetter},
title = {Impact of laminate cracks under solder pads on the fatigue lives of
ball grid array solder joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2354--2370},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.014},
doi = {10.1016/J.MICROREL.2015.07.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TegehallW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TinschertAPBHL15,
author = {Lukas Tinschert and
Atle Rygg {\AA}rdal and
Tilo Poller and
Marco Bohll{\"{a}}nder and
Magnar Hernes and
Josef Lutz},
title = {Possible failure modes in Press-Pack IGBTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {903--911},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.019},
doi = {10.1016/J.MICROREL.2015.02.019},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TinschertAPBHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TomonagaTONTO15,
author = {H. Tomonaga and
Masanori Tsukuda and
S. Okoda and
R. Noda and
K. Tashiro and
Ichiro Omura},
title = {16-Channel micro magnetic flux sensor array for {IGBT} current distribution
measurement},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1357--1362},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.045},
doi = {10.1016/J.MICROREL.2015.06.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TomonagaTONTO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TorrenteCRVR0G15,
author = {Giulio Torrente and
Jean Coignus and
Sophie Renard and
Alexandre Vernhet and
Gilles Reimbold and
David Roy and
G{\'{e}}rard Ghibaudo},
title = {Physically-based extraction methodology for accurate {MOSFET} degradation
assessment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1417--1421},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.063},
doi = {10.1016/J.MICROREL.2015.06.063},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TorrenteCRVR0G15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiHLWH15,
author = {Ming{-}Yi Tsai and
P. S. Huang and
C. H. Lin and
C. T. Wu and
S. C. Hu},
title = {Mechanical design and analysis of direct-plated-copper aluminum nitride
substrates for enhancing thermal reliability},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2589--2595},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.010},
doi = {10.1016/J.MICROREL.2015.08.010},
timestamp = {Sat, 20 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsaiHLWH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsengHL15,
author = {Yi{-}Wei Tseng and
Fei{-}Yi Hung and
Truan{-}Sheng Lui},
title = {Microstructure, tensile and electrical properties of gold-coated silver
bonding wire},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {608--612},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.008},
doi = {10.1016/J.MICROREL.2015.01.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsengHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsengHLCH15,
author = {Yi{-}Wei Tseng and
Fei{-}Yi Hung and
Truan{-}Sheng Lui and
Mei{-}Yu Chen and
Hao{-}Wen Hsueh},
title = {Effect of annealing on the microstructure and bonding interface properties
of Ag-2Pd alloy wire},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1256--1261},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.012},
doi = {10.1016/J.MICROREL.2015.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsengHLCH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsukudaTONTO15,
author = {Masanori Tsukuda and
H. Tomonaga and
S. Okoda and
R. Noda and
K. Tashiro and
Ichiro Omura},
title = {High-throughput and full automatic DBC-module screening tester for
high power {IGBT}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1363--1368},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.016},
doi = {10.1016/J.MICROREL.2015.06.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsukudaTONTO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VaghefP15,
author = {Vahid Hamiyati Vaghef and
Ali Peiravi},
title = {Node-to-node error sensitivity analysis using a graph based approach
for {VLSI} logic circuits},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {264--271},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.010},
doi = {10.1016/J.MICROREL.2014.09.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VaghefP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Valinataj15,
author = {Mojtaba Valinataj},
title = {Fault-tolerant carry look-ahead adder architectures robust to multiple
simultaneous errors},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2845--2857},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.017},
doi = {10.1016/J.MICROREL.2015.08.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Valinataj15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanhamelFDNOPML15,
author = {Jurgen Vanhamel and
D. Fussen and
Emmanuel Dekemper and
Eddy Neefs and
B. Van Opstal and
D. Pieroux and
Jeroen Maes and
Emmanuel Van Lil and
Paul Leroux},
title = {RF-driving of acoustic-optical tunable filters; design, realization
and qualification of analog and digital modules for {ESA}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2103--2107},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.034},
doi = {10.1016/J.MICROREL.2015.07.034},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VanhamelFDNOPML15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanziMMM15,
author = {Massimo Vanzi and
Giovanna Mura and
Giulia Marcello and
G. Martines},
title = {Clamp voltage and ideality factor in laser diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1736--1740},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.027},
doi = {10.1016/J.MICROREL.2015.06.027},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VanziMMM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VecchioCDBLLB15,
author = {Pamela Del Vecchio and
Arnaud Curutchet and
Yannick Deshayes and
M. Bettiati and
F. Laruelle and
Nathalie Labat and
Laurent B{\'{e}}chou},
title = {Correlation between forward-reverse low-frequency noise and atypical
{I-V} signatures in 980 nm high-power laser diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1741--1745},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.041},
doi = {10.1016/J.MICROREL.2015.06.041},
timestamp = {Thu, 16 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VecchioCDBLLB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VeenBHRLE15,
author = {P. J. de Veen and
C. Bos and
D. R. Hoogstede and
C. Th. A. Revenberg and
Jessica Liljeholm and
Thorbjorn Ebefors},
title = {High-resolution X-ray computed tomography of through silicon vias
for {RF} {MEMS} integrated passive device applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1644--1648},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.065},
doi = {10.1016/J.MICROREL.2015.06.065},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VeenBHRLE15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VersenESG15,
author = {Martin Versen and
W. Ernst and
G. Singh and
Prince Gulati},
title = {Test setup for reliability studies of {DDR2} {SDRAM}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1395--1399},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.028},
doi = {10.1016/J.MICROREL.2015.06.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VersenESG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VianneBFGECEHT15,
author = {Benjamin Vianne and
Pierre Bar and
Vincent Fiori and
S{\'{e}}bastien Gallois{-}Garreignot and
Komi{-}Atchou Ewuame and
Pascal Chausse and
Stephanie Escoubas and
Nicolas Hotellier and
Olivier Thomas},
title = {Thermo-mechanical characterization of passive stress sensors in Si
interposer},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {738--746},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.005},
doi = {10.1016/J.MICROREL.2015.02.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VianneBFGECEHT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VinodhkumarBNS15,
author = {N. Vinodhkumar and
Y. V. Bhuvaneshwari and
K. K. Nagarajan and
R. Srinivasan},
title = {Heavy-ion irradiation study in SOI-based and bulk-based junctionless
FinFETs using 3D-TCAD simulation},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2647--2653},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.011},
doi = {10.1016/J.MICROREL.2015.09.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VinodhkumarBNS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Vogel15,
author = {Gert Vogel},
title = {Avoiding flex cracks in ceramic capacitors: Analytical tool for a
reliable failure analysis and guideline for positioning cercaps on
PCBs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2159--2164},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.034},
doi = {10.1016/J.MICROREL.2015.06.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Vogel15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VoggHB15,
author = {G{\"{u}}nther Vogg and
T. Heidmann and
Sebastian Brand},
title = {Scanning acoustic GHz-microscopy versus conventional {SAM} for advanced
assessment of ball bond and metal interfaces in microelectronic devices},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1554--1558},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.066},
doi = {10.1016/J.MICROREL.2015.06.066},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VoggHB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VriesNV15,
author = {Hans de Vries and
Thanh Trung Nguyen and
Bert Op het Veld},
title = {Increasing the cycle life of lithium ion cells by partial state of
charge cycling},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2247--2253},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.014},
doi = {10.1016/J.MICROREL.2015.08.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VriesNV15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangCNZKZ15,
author = {Y. Wang and
Hao Cai and
Lirida A. B. Naviner and
Yue Zhang and
Jacques{-}Olivier Klein and
Weisheng Zhao},
title = {Compact thermal modeling of spin transfer torque magnetic tunnel junction},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1649--1653},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.029},
doi = {10.1016/J.MICROREL.2015.06.029},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangCNZKZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangGZQ15,
author = {Ting Wang and
Bo Gu and
Pengcheng Zhao and
Cheng Qian},
title = {Numerical investigation of liquid cooling cold plate for power control
unit in fuel cell vehicle},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1077--1088},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.015},
doi = {10.1016/J.MICROREL.2015.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangGZQ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangJYJY15,
author = {Yang Wang and
Xiangliang Jin and
Liu Yang and
Qi Jiang and
Huihui Yuan},
title = {Robust dual-direction {SCR} with low trigger voltage, tunable holding
voltage for high-voltage {ESD} protection},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {520--526},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.006},
doi = {10.1016/J.MICROREL.2014.12.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangJYJY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLYR15,
author = {Nantian Wang and
Yue Li and
Zongyue Yu and
Zhi{-}Qian Ren},
title = {Online test method of {FPGA} solder joint resistance with low power
consumption},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1867--1871},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.009},
doi = {10.1016/J.MICROREL.2015.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangLYR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangNB15,
author = {Huai Wang and
Dennis A. Nielsen and
Frede Blaabjerg},
title = {Degradation testing and failure analysis of {DC} film capacitors under
high humidity conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2007--2011},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.011},
doi = {10.1016/J.MICROREL.2015.06.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangNB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangSDWC15,
author = {Ying Wang and
Chan Shan and
Zheng Dou and
Liguo Wang and
Fei Cao},
title = {Improved performance of nanoscale junctionless transistor based on
gate engineering approach},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {318--325},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.009},
doi = {10.1016/J.MICROREL.2014.11.009},
timestamp = {Sat, 18 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangSDWC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWCLYHL15,
author = {Shea{-}Jue Wang and
Mu{-}Chun Wang and
Shuang{-}Yuan Chen and
Wen{-}How Lan and
Bor{-}Wen Yang and
L. S. Huang and
Chuan{-}Hsi Liu},
title = {Heat stress exposing performance of deep-nano {HK/MG} nMOSFETs using
{DPN} or {PDA} treatment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2203--2207},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.016},
doi = {10.1016/J.MICROREL.2015.05.016},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangWCLYHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangZSG15,
author = {Jinling Wang and
Shengkui Zeng and
Vadim V. Silberschmidt and
Jianbin Guo},
title = {Multiphysics modeling approach for micro electro-thermo-mechanical
actuator: Failure mechanisms coupled analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {771--782},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.012},
doi = {10.1016/J.MICROREL.2015.02.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangZSG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatanabeTO15,
author = {Akihiko Watanabe and
Masanori Tsukuda and
Ichiro Omura},
title = {Failure analysis of power devices based on real-time monitoring},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2032--2035},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.128},
doi = {10.1016/J.MICROREL.2015.06.128},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatanabeTO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WatzkeA15,
author = {S. Watzke and
P. Altieri{-}Weimar},
title = {Degradation of silicone in white LEDs during device operation: a finite
element approach to product reliability prediction},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {733--737},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.008},
doi = {10.1016/J.MICROREL.2015.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WatzkeA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WelterQDLAP15,
author = {Loic Welter and
J. L. Scotto di Quaquero and
Philippe Dreux and
Laurent Lopez and
Hassen Aziza and
Jean{-}Michel Portal},
title = {Improvement of {MOSFET} matching characterization with calibrated
multiplexed test structure},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1328--1333},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.104},
doi = {10.1016/J.MICROREL.2015.06.104},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WelterQDLAP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeulersseMCM15,
author = {C{\'{e}}cile Weulersse and
Florent Miller and
Thierry Carri{\`{e}}re and
R. Mangeret},
title = {Prediction of proton cross sections for {SEU} in SRAMs and SDRAMs
using the {METIS} engineer tool},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1491--1495},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.117},
doi = {10.1016/J.MICROREL.2015.06.117},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WeulersseMCM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WilemanP15,
author = {Andrew J. Wileman and
Suresh Perinpanayagam},
title = {Integrated vehicle health management: An approach to dealing with
lifetime prediction considerations on relays},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {2165--2171},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.013},
doi = {10.1016/J.MICROREL.2015.06.013},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WilemanP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WoirgardASMTA15,
author = {Eric Woirgard and
Faical Arabi and
Wissam Sabbah and
Donatien Martineau and
L. Th{\'{e}}olier and
Stephane Azzopardi},
title = {Identification and analysis of power substrates degradations subjected
to severe aging tests},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1961--1965},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.048},
doi = {10.1016/J.MICROREL.2015.06.048},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WoirgardASMTA15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wong15,
author = {Ee{-}Hua Wong},
title = {The fundamentals of thermal-mass diffusion analogy},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {588--595},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.002},
doi = {10.1016/J.MICROREL.2014.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wong15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongCDCL15,
author = {Ee{-}Hua Wong and
Jarrod Cook and
M. Dreno and
Dao{-}Long Chen and
Yi{-}Shao Lai},
title = {Characterising Arrhenius moisture diffusivity constants using non-isothermal
sorption},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2331--2335},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.053},
doi = {10.1016/J.MICROREL.2015.06.053},
timestamp = {Wed, 04 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongCDCL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WrachienLRDSTMM15,
author = {Nicola Wrachien and
Nicol{\`{o}} Lago and
Antonio Rizzo and
Riccardo D'Alpaos and
Andrea Stefani and
Guido Turatti and
Michele Muccini and
Gaudenzio Meneghesso and
Andrea Cester},
title = {Effects of thermal and electrical stress on DH4T-based organic thin-film-transistors
with {PMMA} gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1790--1794},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.073},
doi = {10.1016/J.MICROREL.2015.06.073},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WrachienLRDSTMM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuH15,
author = {Cheng{-}Han Wu and
Weng{-}Sing Hwang},
title = {The effect of the echo-time of a bipolar pulse waveform on molten
metallic droplet formation by squeeze mode piezoelectric inkjet printing},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {630--636},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.014},
doi = {10.1016/J.MICROREL.2014.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuYB15,
author = {Chunlei Wu and
Suying Yao and
Corinne Berg{\`{e}}s},
title = {Leakage current study and relevant defect localization in integrated
circuit failure analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {463--469},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.005},
doi = {10.1016/J.MICROREL.2015.01.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuYB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski15,
author = {Artur Wymyslowski},
title = {Guest Editorial: 2014 EuroSimE International Conference on Thermal,
Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics
and Micro-Systems},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {713--715},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.02.021},
doi = {10.1016/J.MICROREL.2015.02.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiSZLH15,
author = {Yunfeng Xi and
Javier A. Salcedo and
Yuanzhong (Paul) Zhou and
Juin J. Liou and
Jean{-}Jacques Hajjar},
title = {Design and characterization of {ESD} solutions with {EMC} robustness
for automotive applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2236--2246},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.018},
doi = {10.1016/J.MICROREL.2015.09.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiSZLH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiongLLTZDH15,
author = {Cen Xiong and
Shuhuan Liu and
Yonghong Li and
Du Tang and
Jinxin Zhang and
Xuecheng Du and
Chaohui He},
title = {Hot carrier effect on the bipolar transistors' response to electromagnetic
interference},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {514--519},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.019},
doi = {10.1016/J.MICROREL.2014.11.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiongLLTZDH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiongLLTZH15,
author = {Cen Xiong and
Yonghong Li and
Shuhuan Liu and
Du Tang and
Jinxin Zhang and
Chaohui He},
title = {Hot carrier effect on a single SiGe HBT's {EMI} response},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2627--2633},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.002},
doi = {10.1016/J.MICROREL.2015.09.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiongLLTZH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuH15,
author = {Yue Xu and
Yang Huang},
title = {Influence of {ISSG} tunnel oxide with decoupled plasma nitridation
on erase characteristic of NOR-type floating-gate flash memories},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1126--1129},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.04.009},
doi = {10.1016/J.MICROREL.2015.04.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XuH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuHYMWZ15,
author = {Xiangming Xu and
Jingfeng Huang and
Han Yu and
Biao Ma and
Peng{-}Fei Wang and
David Wei Zhang},
title = {Elimination of stress induced dislocation in deep Poly Sinker {LDMOS}
technology},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {486--491},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.010},
doi = {10.1016/J.MICROREL.2015.01.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XuHYMWZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YadavJPS15,
author = {Nandakishor Yadav and
Shikha Jain and
Manisha Pattanaik and
G. K. Sharma},
title = {A novel stability and process sensitivity driven model for optimal
sized FinFET based {SRAM}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1131--1143},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.05.014},
doi = {10.1016/J.MICROREL.2015.05.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YadavJPS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YanMLZL15,
author = {Haidong Yan and
Yun{-}Hui Mei and
Xin Li and
Pu Zhang and
Guo{-}Quan Lu},
title = {Degradation of high power single emitter laser modules using nanosilver
paste in continuous pulse conditions},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2532--2541},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.037},
doi = {10.1016/J.MICROREL.2015.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YanMLZL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangYL15,
author = {Guoshuai Yang and
Donghua Yang and
Liangliang Li},
title = {Microstructure and morphology of interfacial intermetallic compound
CoSn\({}_{\mbox{3}}\) in Sn-Pb/Co-P solder joints},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2403--2411},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.056},
doi = {10.1016/J.MICROREL.2015.06.056},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YangYL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangZDDZ15,
author = {Li Yang and
Yaocheng Zhang and
Chengchao Du and
Jun Dai and
Ning Zhang},
title = {Effect of aluminum concentration on the microstructure and mechanical
properties of Sn-Cu-Al solder alloy},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {596--601},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.017},
doi = {10.1016/J.MICROREL.2014.12.017},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangZDDZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YapTLDFZHTZLHWL15,
author = {Huei Hao Yap and
Pik Kee Tan and
G. R. Low and
M. K. Dawood and
H. Feng and
Y. Z. Zhao and
Ran He and
Hao Tan and
J. Zhu and
B. Liu and
Y. M. Huang and
D. D. Wang and
Jeffrey Lam and
Zhihong Mai},
title = {Top-down delayering to expose large inspection area on die side-edge
with Platinum (Pt) deposition technique},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1611--1616},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.037},
doi = {10.1016/J.MICROREL.2015.06.037},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YapTLDFZHTZLHWL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YaqubLJ15,
author = {Imran Yaqub and
Jianfeng Li and
Christopher Mark Johnson},
title = {Dependence of overcurrent failure modes of {IGBT} modules on interconnect
technologies},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2596--2605},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.020},
doi = {10.1016/J.MICROREL.2015.09.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YaqubLJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YinBBS15,
author = {Chunyan Yin and
Chris Best and
Chris Bailey and
Stoyan Stoyanov},
title = {Statistical analysis of the impact of refinishing process on leaded
components},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {424--431},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.001},
doi = {10.1016/J.MICROREL.2014.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YinBBS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoonHJLJ15,
author = {Yang Gi Yoon and
Jae Phil Hyung and
Ui Hyo Jeong and
H. W. Lim and
J. S. Jang},
title = {Life time comparison of {LED} package and the self-ballasted {LED}
lamps by simple linear regression analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1779--1783},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.044},
doi = {10.1016/J.MICROREL.2015.07.044},
timestamp = {Wed, 23 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoonHJLJ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoussefRWAVMMQR15,
author = {Toni Youssef and
W. Rmili and
Eric Woirgard and
Stephane Azzopardi and
N. Vivet and
D. M. Meekhof and
R{\'{e}}gis Meuret and
G. Le Quilliec and
C. Richard},
title = {Power modules die attach: {A} comprehensive evolution of the nanosilver
sintering physical properties versus its porosity},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1997--2002},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.085},
doi = {10.1016/J.MICROREL.2015.06.085},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoussefRWAVMMQR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuCLYF15,
author = {Xinhai Yu and
Changchun Chai and
Yang Liu and
Yintang Yang and
Qingyang Fan},
title = {Analysis of high power microwave induced degradation and damage effects
in AlGaAs/InGaAs pHEMTs},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1174--1179},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.002},
doi = {10.1016/J.MICROREL.2015.06.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuCLYF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuHHC15,
author = {Chih{-}Jen Yu and
Ching{-}Hung Hung and
Kuei{-}Chu Hsu and
Chien Chou},
title = {Phase-shift imaging ellipsometer for measuring thin-film thickness},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {352--357},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.014},
doi = {10.1016/J.MICROREL.2014.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuHHC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanB15,
author = {Jiann{-}Shiun Yuan and
Yu Bi},
title = {Process and temperature robust voltage multiplier design for {RF}
energy harvesting},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {107--113},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.024},
doi = {10.1016/J.MICROREL.2014.09.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuanB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YueFGYF15,
author = {Yuan Yue and
Shiwei Feng and
Chunsheng Guo and
Xin Yan and
Rui{-}Rui Feng},
title = {All-digital thermal distribution measurement on field programmable
gate array using ring oscillators},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {396--401},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.010},
doi = {10.1016/J.MICROREL.2014.10.010},
timestamp = {Wed, 15 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YueFGYF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zhang15,
author = {Sung{-}Uk Zhang},
title = {Quantification of silicone degradation for {LED} packages using finite
element analysis},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2678--2684},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.09.006},
doi = {10.1016/J.MICROREL.2015.09.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zhang15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangHGTXLW15,
author = {Jinxin Zhang and
Chaohui He and
Hongxia Guo and
Du Tang and
Cen Xiong and
Pei Li and
Xin Wang},
title = {3-D simulation study of single event effects of SiGe heterojunction
bipolar transistor in extreme environment},
journal = {Microelectron. Reliab.},
volume = {55},
number = {8},
pages = {1180--1186},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.003},
doi = {10.1016/J.MICROREL.2015.06.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangHGTXLW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangKOIMOSYHH15,
author = {Li Zhang and
Mitsuo Koike and
Mizuki Ono and
Shogo Itai and
Kazuya Matsuzawa and
Syotaro Ono and
Wataru Saito and
Masakazu Yamaguchi and
Yohei Hayase and
Keiryo Hara},
title = {Comprehensive 2D-carrier profiling of low-doping region by high-sensitivity
scanning spreading resistance microscopy {(SSRM)} for power device
applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1559--1563},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.142},
doi = {10.1016/J.MICROREL.2015.06.142},
timestamp = {Thu, 12 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangKOIMOSYHH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLSLP15,
author = {Wenjin Zhang and
Shunli Liu and
Bo Sun and
Yue Liu and
Michael G. Pecht},
title = {A cloud model-based method for the analysis of accelerated life test
data},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {123--128},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.006},
doi = {10.1016/J.MICROREL.2014.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLSLP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLWS15,
author = {H. W. Zhang and
Yang Liu and
J. Wang and
F. L. Sun},
title = {Effect of elevated temperature on {PCB} responses and solder interconnect
reliability under vibration loading},
journal = {Microelectron. Reliab.},
volume = {55},
number = {11},
pages = {2391--2395},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.07.033},
doi = {10.1016/J.MICROREL.2015.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLWS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangMGZG15,
author = {Wenguo Zhang and
Jian{-}hua Ma and
Li{-}Lan Gao and
Zhe Zhang and
Hong Gao},
title = {Fatigue life and resistance analysis of {COG} assemblies under hygrothermal
aging},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {623--629},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.007},
doi = {10.1016/J.MICROREL.2015.01.007},
timestamp = {Tue, 01 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangMGZG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangZCLWW15,
author = {Lei Zhang and
Yejun Zhu and
Haibin Chen and
Karina Leung and
Yeqing Wu and
Jingshen Wu},
title = {Failure analysis on reflector blackening between lead frame electrodes
in LEDs under {WHTOL} test},
journal = {Microelectron. Reliab.},
volume = {55},
number = {5},
pages = {799--806},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.004},
doi = {10.1016/J.MICROREL.2015.01.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangZCLWW15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangZWD15,
author = {Cunbo Zhang and
Jian{-}de Zhang and
Honggang Wang and
Guangxing Du},
title = {Burnout properties of microwave pulse injected on GaAs {PHEMT}},
journal = {Microelectron. Reliab.},
volume = {55},
number = {3-4},
pages = {508--513},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.01.003},
doi = {10.1016/J.MICROREL.2015.01.003},
timestamp = {Fri, 26 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangZWD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoLML15,
author = {Su{-}Yan Zhao and
Xin Li and
Yun{-}Hui Mei and
Guo{-}Quan Lu},
title = {Study on high temperature bonding reliability of sintered nano-silver
joint on bare copper plate},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2524--2531},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.10.017},
doi = {10.1016/J.MICROREL.2015.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoLML15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhengNL15,
author = {Hanguang Zheng and
Khai D. T. Ngo and
Guo{-}Quan Lu},
title = {Thermal characterization system for transient thermal impedance measurement
and power cycling of {IGBT} modules},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2575--2581},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.016},
doi = {10.1016/J.MICROREL.2015.08.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhengNL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zhou15,
author = {Ming Zhou},
title = {AlN capping layer inserted between Cu and SiCN dielectric barrier
layer for enhancing reliability of 28 nm technological node and beyond},
journal = {Microelectron. Reliab.},
volume = {55},
number = {12},
pages = {2705--2711},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.08.009},
doi = {10.1016/J.MICROREL.2015.08.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zhou15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhouWSD15,
author = {Luowei Zhou and
Junke Wu and
Pengju Sun and
Xiong Du},
title = {Corrigendum to "Junction temperature management of {IGBT} module in
power electronic converters" [Microelectron. Reliab. 54 {(2014)} 2788-2795]},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {291},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.12.003},
doi = {10.1016/J.MICROREL.2014.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhouWSD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhouZ15,
author = {Ming Zhou and
B. C. Zhang},
title = {Porous low k film with multilayer structure used for promoting adhesion
to SiCN cap barrier layer},
journal = {Microelectron. Reliab.},
volume = {55},
number = {6},
pages = {879--885},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.004},
doi = {10.1016/J.MICROREL.2015.03.004},
timestamp = {Mon, 12 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhouZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuLWG15,
author = {Yongxin Zhu and
Xiaoyan Li and
Chao Wang and
Ruiting Gao},
title = {A new creep-fatigue life model of lead-free solder joint},
journal = {Microelectron. Reliab.},
volume = {55},
number = {7},
pages = {1097--1100},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.03.019},
doi = {10.1016/J.MICROREL.2015.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuLWG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuLXFG15,
author = {Hui Zhu and
Kun Liu and
Cong Xiong and
Shiwei Feng and
Chunsheng Guo},
title = {The effect of external stress on the properties of AlGaAs/GaAs single
quantum well laser diodes},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {62--65},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.09.012},
doi = {10.1016/J.MICROREL.2014.09.012},
timestamp = {Wed, 15 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuLXFG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuLXL15,
author = {Chunsheng Zhu and
Heng Li and
Gaowei Xu and
Le Luo},
title = {A novel mechanical diced trench structure for warpage reduction in
wafer level packaging process},
journal = {Microelectron. Reliab.},
volume = {55},
number = {2},
pages = {418--423},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.11.006},
doi = {10.1016/J.MICROREL.2014.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuLXL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuP15,
author = {Wenliang Zhu and
Giuseppe Pezzotti},
title = {Raman spectroscopic assessments of structural orientation and residual
stress in wurtzitic AlN film deposited on {(0} 0 1) Si},
journal = {Microelectron. Reliab.},
volume = {55},
number = {1},
pages = {66--73},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2014.10.001},
doi = {10.1016/J.MICROREL.2014.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZimpeckMR15,
author = {Alexandra L. Zimpeck and
Cristina Meinhardt and
Ricardo Augusto da Luz Reis},
title = {Impact of {PVT} variability on 20 nm FinFET standard cells},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1379--1383},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.039},
doi = {10.1016/J.MICROREL.2015.06.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZimpeckMR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zirilli15,
author = {Thomas Zirilli},
title = {Die crack failure mechanism investigations depending on the time of
failure},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1600--1606},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.148},
doi = {10.1016/J.MICROREL.2015.06.148},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zirilli15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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