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@misc{DBLP:data/10/FreireSABBCCCEKLMRRSSSV16,
  author       = {Juliana Freire and
                  Cl{\'{a}}udio T. Silva and
                  Erik W. Anderson and
                  Louis Bavoil and
                  Clifton Brooks and
                  Jason H. Callahan and
                  Steven P. Callahan and
                  Lorena Carlo and
                  Tommy Ellqvist and
                  David Koop and
                  Lauro Didier Lins and
                  Phillip Mates and
                  R{\'{e}}mi Rampin and
                  Daniel Rees and
                  Emmanuele Santos and
                  Carlos Eduardo Scheidegger and
                  Nathan Smith and
                  Huy T. Vo},
  title        = {VisTrails 2.2.4 (Version 2.2.4)},
  publisher    = {Zenodo},
  year         = {2016},
  month        = may,
  howpublished = {\url{https://doi.org/10.5281/zenodo.2573118}},
  note         = {Accessed on YYYY-MM-DD.},
  url          = {https://doi.org/10.5281/zenodo.2573118},
  doi          = {10.5281/ZENODO.2573118},
  timestamp    = {Fri, 06 Sep 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/data/10/FreireSABBCCCEKLMRRSSSV16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mj/MahamdiSMTSJ09,
  author       = {Ramdane Mahamdi and
                  Laurent Saci and
                  Farida Mansour and
                  Pierre Temple{-}Boyer and
                  Emmanuel Scheid and
                  Laurent Jalabert},
  title        = {Boron diffusion and activation in polysilicon multilayer films for
                  P\({}^{\mbox{+}}\) {MOS} structure: Characterization and modeling},
  journal      = {Microelectron. J.},
  volume       = {40},
  number       = {1},
  pages        = {1--4},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.mejo.2008.08.003},
  doi          = {10.1016/J.MEJO.2008.08.003},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mj/MahamdiSMTSJ09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SauveplaneSD09,
  author       = {Jean{-}Baptiste Sauveplane and
                  Emmanuel Scheid and
                  A. Deram},
  title        = {On the accurate determination of the thermomechanical properties of
                  micro-scale material: Application to AlSi\({}_{\mbox{1{\%}}}\) chip
                  metallization of a power semiconductor device},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {5},
  pages        = {499--505},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.02.012},
  doi          = {10.1016/J.MICROREL.2009.02.012},
  timestamp    = {Fri, 06 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SauveplaneSD09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SauveplaneTSD08,
  author       = {Jean{-}Baptiste Sauveplane and
                  Patrick Tounsi and
                  Emmanuel Scheid and
                  A. Deram},
  title        = {3D electro-thermal investigations for reliability of ultra low {ON}
                  state resistance power {MOSFET}},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1464--1467},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.06.022},
  doi          = {10.1016/J.MICROREL.2008.06.022},
  timestamp    = {Fri, 06 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SauveplaneTSD08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/KhongLTDCLVS07,
  author       = {B. Khong and
                  Marc Legros and
                  Patrick Tounsi and
                  Philippe Dupuy and
                  X. Chauffleur and
                  Colette Levade and
                  G. Vanderschaeve and
                  Emmanuel Scheid},
  title        = {Characterization and modelling of ageing failures on power {MOSFET}
                  devices},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1735--1740},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.055},
  doi          = {10.1016/J.MICROREL.2007.07.055},
  timestamp    = {Fri, 06 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KhongLTDCLVS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PeratDSBCPZT02,
  author       = {Oliver Perat and
                  Jean{-}Marie Dorkel and
                  Emmanuel Scheid and
                  Pierre Temple{-}Boyer and
                  Y. S. Chung and
                  A. Peyre{-}Lavigne and
                  M. Zecri and
                  Patrick Tounsi},
  title        = {Characterization method of thermomechanical parameters for microelectronic
                  materials},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {7},
  pages        = {1053--1058},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00060-4},
  doi          = {10.1016/S0026-2714(02)00060-4},
  timestamp    = {Fri, 06 May 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PeratDSBCPZT02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}