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export results for "Simulation Comparison of Capacitance Voltage Characteristics in Nickel Oxide and Silicon dioxide-based MOS Capacitor."

 download as .bib file

@inproceedings{DBLP:conf/iccr/PandySS22,
  author       = {D. Pandy and
                  R. Sharma and
                  Suresh Sharma},
  title        = {Simulation Comparison of Capacitance Voltage Characteristics in Nickel
                  Oxide and Silicon dioxide-based {MOS} Capacitor},
  booktitle    = {2022 International Conference on Cyber Resilience (ICCR), Dubai, United
                  Arab Emirates, October 6-7, 2022},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ICCR56254.2022.9995931},
  doi          = {10.1109/ICCR56254.2022.9995931},
  timestamp    = {Fri, 31 May 2024 12:01:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iccr/PandySS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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