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@inproceedings{DBLP:conf/itc/AhmadiXNOPM16, author = {Ali Ahmadi and Constantinos Xanthopoulos and Amit Nahar and Bob Orr and Michael Pas and Yiorgos Makris}, title = {Harnessing process variations for optimizing wafer-level probe-test flow}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805835}, doi = {10.1109/TEST.2016.7805835}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/AhmadiXNOPM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AlamTF16, author = {Md. Mahbub Alam and Mark M. Tehranipoor and Domenic Forte}, title = {Recycled {FPGA} detection using exhaustive {LUT} path delay characterization}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805854}, doi = {10.1109/TEST.2016.7805854}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AlamTF16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AmyeenKCNVJGS16, author = {M. Enamul Amyeen and Dongok Kim and Maheshwar Chandrasekar and Mohammad Noman and Srikanth Venkataraman and Anurag Jain and Neha Goel and Ramesh Sharma}, title = {A novel diagnostic test generation methodology and its application in production failure isolation}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805821}, doi = {10.1109/TEST.2016.7805821}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/AmyeenKCNVJGS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ArmstrongM16, author = {Dave Armstrong and Gary Maier}, title = {Known-good-die test methods for large, thin, high-power digital devices}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--6}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805851}, doi = {10.1109/TEST.2016.7805851}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ArmstrongM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AroraABS16, author = {Shalini Arora and Aman Aflaki and Sounil Biswas and Masashi Shimanouchi}, title = {{SERDES} external loopback test using production parametric-test hardware}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805841}, doi = {10.1109/TEST.2016.7805841}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/AroraABS16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BanerjeeCA16, author = {Suvadeep Banerjee and Abhijit Chatterjee and Jacob A. Abraham}, title = {Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805861}, doi = {10.1109/TEST.2016.7805861}, timestamp = {Sat, 19 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/BanerjeeCA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ButlerND16, author = {Kenneth M. Butler and Amit Nahar and W. Robert Daasch}, title = {What we know after twelve years developing and deploying test data analytics solutions}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805844}, doi = {10.1109/TEST.2016.7805844}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ButlerND16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChaoLWLL16, author = {Huina Chao and Huawei Li and Tiancheng Wang and Xiaowei Li and Bo Liu}, title = {An accurate algorithm for computing mutation coverage in model checking}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805864}, doi = {10.1109/TEST.2016.7805864}, timestamp = {Thu, 11 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ChaoLWLL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CoyetteEDVG16, author = {Anthony Coyette and Baris Esen and Wim Dobbelaere and Ronny Vanhooren and Georges G. E. Gielen}, title = {Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805867}, doi = {10.1109/TEST.2016.7805867}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CoyetteEDVG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DevanathanK16, author = {V. R. Devanathan and Sumant Kale}, title = {A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded {BIST} datapath}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--6}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805870}, doi = {10.1109/TEST.2016.7805870}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/DevanathanK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DobbelaereVMMCE16, author = {Wim Dobbelaere and Ronny Vanhooren and Willy De Man and Koen Matthijs and Anthony Coyette and Baris Esen and Georges G. E. Gielen}, title = {Analog fault coverage improvement using final-test dynamic part average testing}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805829}, doi = {10.1109/TEST.2016.7805829}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DobbelaereVMMCE16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/EsenCGDV16, author = {Baris Esen and Anthony Coyette and Georges G. E. Gielen and Wim Dobbelaere and Ronny Vanhooren}, title = {Effective {DC} fault models and testing approach for open defects in analog circuits}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805830}, doi = {10.1109/TEST.2016.7805830}, timestamp = {Fri, 02 Nov 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/EsenCGDV16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/FanVSRJDK16, author = {Y. Fan and A. Verma and Y. Su and L. Rose and J. Janney and V. Do and S. Kumar}, title = {{RF} test accuracy and capacity enhancement on {ATE} for silicon {TV} tuners}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805842}, doi = {10.1109/TEST.2016.7805842}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/FanVSRJDK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/FynanLNMSB16, author = {Phillip Fynan and Zeye Liu and Benjamin Niewenhuis and Soumya Mittal and Marcin Strajwas and R. D. (Shawn) Blanton}, title = {Logic characterization vehicle design reflection via layout rewiring}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805849}, doi = {10.1109/TEST.2016.7805849}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/FynanLNMSB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Hansen16, author = {Ken Hansen}, title = {Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {11}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805818}, doi = {10.1109/TEST.2016.7805818}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Hansen16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HouCLLKC16, author = {Chih{-}Sheng Hou and Yong{-}Xiao Chen and Jin{-}Fu Li and Chih{-}Yen Lo and Ding{-}Ming Kwai and Yung{-}Fa Chou}, title = {A built-in self-repair scheme for DRAMs with spare rows, columns, and bits}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805832}, doi = {10.1109/TEST.2016.7805832}, timestamp = {Tue, 17 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/HouCLLKC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HsuSSLCSC16, author = {Chun{-}Kai Hsu and Peter Sarson and Gregor Schatzberger and Friedrich Peter Leisenberger and John M. Carulli Jr. and Siddhartha Siddhartha and Kwang{-}Ting Cheng}, title = {Variation and failure characterization through pattern classification of test data from multiple test stages}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805845}, doi = {10.1109/TEST.2016.7805845}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HsuSSLCSC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16, author = {Pavan Kumar Datla Jagannadha and Mahmut Yilmaz and Milind Sonawane and Sailendra Chadalavada and Shantanu Sarangi and Bonita Bhaskaran and Ayub Abdollahian}, title = {Advanced test methodology for complex SoCs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805857}, doi = {10.1109/TEST.2016.7805857}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JinZCG16, author = {Shi Jin and Zhaobo Zhang and Krishnendu Chakrabarty and Xinli Gu}, title = {Accurate anomaly detection using correlation-based time-series analysis in a core router system}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805836}, doi = {10.1109/TEST.2016.7805836}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JinZCG16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JohnsonNJCMD16, author = {Michael Johnson and Brian Noble and Mark Johnson and Jim Crafts and Cynthia Manya and John Deforge}, title = {Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm {POWER8} and zSeries processors}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805871}, doi = {10.1109/TEST.2016.7805871}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/JohnsonNJCMD16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KadamRCA16, author = {Gurunath Kadam and Markus Rudack and Krishnendu Chakrabarty and Juergen Alt}, title = {Supply-voltage optimization to account for process variations in high-volume manufacturing testing}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805846}, doi = {10.1109/TEST.2016.7805846}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KadamRCA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KelirisSCKMK16, author = {Anastasis Keliris and Hossein Salehghaffari and Brian R. Cairl and Prashanth Krishnamurthy and Michail Maniatakos and Farshad Khorrami}, title = {Machine learning-based defense against process-aware attacks on Industrial Control Systems}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805855}, doi = {10.1109/TEST.2016.7805855}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/KelirisSCKMK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KunduBK16, author = {Subhadip Kundu and Parthajit Bhattacharya and Rohit Kapur}, title = {Handling wrong mapping: {A} new direction towards better diagnosis with low pin convolution compressors}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805822}, doi = {10.1109/TEST.2016.7805822}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/KunduBK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LeeTK16, author = {Kuen{-}Jong Lee and Pin{-}Hao Tang and Michael A. Kochte}, title = {An on-chip self-test architecture with test patterns recorded in scan chains}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805865}, doi = {10.1109/TEST.2016.7805865}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/LeeTK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiJLXC16, author = {Tianjian Li and Li Jiang and Xiaoyao Liang and Qiang Xu and Krishnendu Chakrabarty}, title = {Defect tolerance for CNFET-based SRAMs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805833}, doi = {10.1109/TEST.2016.7805833}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiJLXC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiLYCHL16, author = {Zipeng Li and Kelvin Yi{-}Tse Lai and Po{-}Hsien Yu and Krishnendu Chakrabarty and Tsung{-}Yi Ho and Chen{-}Yi Lee}, title = {Built-in self-test for micro-electrode-dot-array digital microfluidic biochips}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805847}, doi = {10.1109/TEST.2016.7805847}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiLYCHL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LienL16, author = {Wei{-}Cheng Lien and Kuen{-}Jong Lee}, title = {Output bit selection methodology for test response compaction}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805873}, doi = {10.1109/TEST.2016.7805873}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/LienL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LimX0BA16, author = {Carlston Lim and Yang Xue and Xin Li and Ronald D. Blanton and M. Enamul Amyeen}, title = {Diagnostic resolution improvement through learning-guided physical failure analysis}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805824}, doi = {10.1109/TEST.2016.7805824}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/LimX0BA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiuMMRRT16, author = {Yingdi Liu and Elham K. Moghaddam and Nilanjan Mukherjee and Sudhakar M. Reddy and Janusz Rajski and Jerzy Tyszer}, title = {Minimal area test points for deterministic patterns}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805825}, doi = {10.1109/TEST.2016.7805825}, timestamp = {Fri, 02 Mar 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiuMMRRT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MittalLNB16, author = {Soumya Mittal and Zeye Liu and Ben Niewenhuis and R. D. (Shawn) Blanton}, title = {Test chip design for optimal cell-aware diagnosability}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805850}, doi = {10.1109/TEST.2016.7805850}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MittalLNB16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MoghaddamMRTZ16, author = {Elham K. Moghaddam and Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer and Justyna Zawada}, title = {Test point insertion in hybrid test compression/LBIST architectures}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805826}, doi = {10.1109/TEST.2016.7805826}, timestamp = {Fri, 02 Mar 2018 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MoghaddamMRTZ16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MuldreyDC16, author = {Barry John Muldrey and Sabyasachi Deyati and Abhijit Chatterjee}, title = {{DE-LOC:} Design validation and debugging under limited observation and control, pre- and post-silicon for mixed-signal systems}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805868}, doi = {10.1109/TEST.2016.7805868}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/MuldreyDC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MurakamiKMKMK16, author = {Masahiro Murakami and Haruo Kobayashi and Shaiful Nizam Bin Mohyar and Osamu Kobayashi and Takahiro Miki and Junya Kojima}, title = {{I-Q} signal generation techniques for communication {IC} testing and {ATE} systems}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805858}, doi = {10.1109/TEST.2016.7805858}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/MurakamiKMKMK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NakamuraA16, author = {Takayuki Nakamura and Koji Asami}, title = {Novel crosstalk evaluation method for high-density signal traces using clock waveform conversion technique}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805859}, doi = {10.1109/TEST.2016.7805859}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/NakamuraA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NakuraTIIKIA16, author = {Toru Nakura and Naoki Terao and Masahiro Ishida and Rimon Ikeno and Takashi Kusaka and Tetsuya Iizuka and Kunihiro Asada}, title = {Power supply impedance emulation to eliminate overkills and underkills due to the impedance difference between {ATE} and customer board}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805860}, doi = {10.1109/TEST.2016.7805860}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/NakuraTIIKIA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PanDSCFBC16, author = {Yan Pan and Rao Desineni and Kannan Sekar and Atul Chittora and Sherwin Fernandes and Neerja Bawaskar and John M. Carulli}, title = {Pylon: Towards an integrated customizable volume diagnosis infrastructure}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805872}, doi = {10.1109/TEST.2016.7805872}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/PanDSCFBC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Papavramidou16, author = {Panagiota Papavramidou}, title = {Memory repair for high fault rates}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805874}, doi = {10.1109/TEST.2016.7805874}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Papavramidou16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Portolan16, author = {Michele Portolan}, title = {Accessing 1687 systems using arbitrary protocols}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805839}, doi = {10.1109/TEST.2016.7805839}, timestamp = {Sat, 19 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Portolan16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Rhines16, author = {Walden C. Rhines}, title = {Plenary keynote address Tuesday: The business of test: Test and semiconductor economics}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805816}, doi = {10.1109/TEST.2016.7805816}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Rhines16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Roberts16, author = {Gordon W. Roberts}, title = {Mixed-signal {ATE} technology and its impact on today's electronic system}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805852}, doi = {10.1109/TEST.2016.7805852}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Roberts16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Rutenbar16, author = {Rob A. Rutenbar}, title = {Keynote address Wednesday: Hardware inference accelerators for machine learning}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805817}, doi = {10.1109/TEST.2016.7805817}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Rutenbar16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SadiCTCWT16, author = {Mehdi Sadi and Gustavo K. Contreras and Dat Tran and Jifeng Chen and LeRoy Winemberg and Mark M. Tehranipoor}, title = {{BIST-RM:} BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805862}, doi = {10.1109/TEST.2016.7805862}, timestamp = {Tue, 30 Nov 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SadiCTCWT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SaleemT16, author = {Kamran Saleem and Nur A. Touba}, title = {Using symbolic canceling to improve diagnosis from compacted response}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805823}, doi = {10.1109/TEST.2016.7805823}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/SaleemT16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sarson16, author = {Peter Sarson}, title = {Test time efficient group delay filter characterization technique using a discrete chirped excitation signal}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--6}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805853}, doi = {10.1109/TEST.2016.7805853}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/Sarson16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SequeiraNGC16, author = {Jyotsna Sequeira and Suriyaprakash Natarajan and Prashant Goteti and Nitin Chaudhary}, title = {Fault simulation for analog test coverage}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--7}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805831}, doi = {10.1109/TEST.2016.7805831}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/SequeiraNGC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ShawHBN16, author = {David Shaw and Dirk Hoops and Kenneth M. Butler and Amit Nahar}, title = {Statistical outlier screening as a test solution health monitor}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805837}, doi = {10.1109/TEST.2016.7805837}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ShawHBN16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SunterVM16, author = {Stephen Sunter and Alessandro Valerio and Riccardo Miglierina}, title = {Automated measurement of defect tolerance in mixed-signal ICs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805869}, doi = {10.1109/TEST.2016.7805869}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/SunterVM16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TangKIC16, author = {Jack Tang and Ramesh Karri and Mohamed Ibrahim and Krishnendu Chakrabarty}, title = {Securing digital microfluidic biochips by randomizing checkpoints}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805856}, doi = {10.1109/TEST.2016.7805856}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TangKIC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TsertovJDRLZCMK16, author = {Anton Tsertov and Artur Jutman and Sergei Devadze and Matteo Sonza Reorda and Erik Larsson and Farrokh Ghani Zadegan and Riccardo Cantoro and Mehrdad Montazeri and Rene Krenz{-}Baath}, title = {A suite of {IEEE} 1687 benchmark networks}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805840}, doi = {10.1109/TEST.2016.7805840}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TsertovJDRLZCMK16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ValleroSPCCTKGR16, author = {Alessandro Vallero and Alessandro Savino and Gianfranco Politano and Stefano Di Carlo and Athanasios Chatzidimitriou and Sotiris Tselonis and Manolis Kaliorakis and Dimitris Gizopoulos and Marc Riera and Ramon Canal and Antonio Gonz{\'{a}}lez and Maha Kooli and Alberto Bosio and Giorgio Di Natale}, title = {Cross-layer system reliability assessment framework for hardware faults}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805863}, doi = {10.1109/TEST.2016.7805863}, timestamp = {Sun, 02 Jun 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ValleroSPCCTKGR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WangC16, author = {Ran Wang and Krishnendu Chakrabarty}, title = {Testing of interposer-based 2.5D integrated circuits}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805875}, doi = {10.1109/TEST.2016.7805875}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WangC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuL16, author = {Cheng{-}Hung Wu and Kuen{-}Jong Lee}, title = {Transformation of multiple fault models to a unified model for {ATPG} efficiency enhancement}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805866}, doi = {10.1109/TEST.2016.7805866}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/WuL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/XiangCF16, author = {Dong Xiang and Krishnendu Chakrabarty and Hideo Fujiwara}, title = {A unified test and fault-tolerant multicast solution for network-on-chip designs}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805827}, doi = {10.1109/TEST.2016.7805827}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/XiangCF16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YoonCR16, author = {Insik Yoon and Ashwin Chintaluri and Arijit Raychowdhury}, title = {{EMACS:} Efficient {MBIST} architecture for test and characterization of {STT-MRAM} arrays}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805834}, doi = {10.1109/TEST.2016.7805834}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/YoonCR16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZadeganKL16, author = {Farrokh Ghani Zadegan and Rene Krenz{-}Baath and Erik Larsson}, title = {Upper-bound computation for optimal retargeting in {IEEE1687} networks}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805838}, doi = {10.1109/TEST.2016.7805838}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZadeganKL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhangHSGASWD16, author = {Fanchen Zhang and Daphne Hwong and Yi Sun and Allison Garcia and Soha Alhelaly and Geoff Shofner and LeRoy Winemberg and Jennifer Dworak}, title = {Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--10}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805828}, doi = {10.1109/TEST.2016.7805828}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ZhangHSGASWD16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhengHLWTC16, author = {Chih{-}Chieh Zheng and Shi{-}Yu Huang and Shyue{-}Kung Lu and Ting{-}Chi Wang and Kun{-}Han Tsai and Wu{-}Tung Cheng}, title = {Online slack-time binning for IO-registered die-to-die interconnects}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--8}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805848}, doi = {10.1109/TEST.2016.7805848}, timestamp = {Wed, 24 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ZhengHLWTC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhuangUJSMC16, author = {Yuming Zhuang and Akhilesh Kesavan Unnithan and Arun Joseph and Siva Sudani and Benjamin Magstadt and Degang Chen}, title = {Low cost ultra-pure sine wave generation with self calibration}, booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, pages = {1--9}, publisher = {{IEEE}}, year = {2016}, url = {https://doi.org/10.1109/TEST.2016.7805843}, doi = {10.1109/TEST.2016.7805843}, timestamp = {Tue, 26 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ZhuangUJSMC16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/itc/2016, title = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth, TX, USA, November 15-17, 2016}, publisher = {{IEEE}}, year = {2016}, url = {https://ieeexplore.ieee.org/xpl/conhome/7794484/proceeding}, isbn = {978-1-4673-8773-6}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/2016.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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