- Guangbin Yang:
Environmental-stress-screening using degradation measurements. IEEE Trans. Reliab. 51(3): 288-293 (2002) - Guangbin Yang, Kai Yang:
Accelerated degradation-tests with tightened critical values. IEEE Trans. Reliab. 51(4): 463-468 (2002) - Fu-Min Yeh, Shyue-Kung Lu, Sy-Yen Kuo:
OBDD-based evaluation of k-terminal network reliability. IEEE Trans. Reliab. 51(4): 443-451 (2002) - Ted W. Yellman:
Commentary-two reliability war stories. IEEE Trans. Reliab. 51(3): 380-381 (2002) - Hong-Fwu Yu, Chih-Hua Chiao:
An optimal designed degradation experiment for reliability improvement. IEEE Trans. Reliab. 51(4): 427-433 (2002) - Yuan Lin Zhang:
A geometric-process repair-model with good-as-new preventive repair. IEEE Trans. Reliab. 51(2): 223-228 (2002)