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Publication search results
found 82 matches
- 2009
- Eduardo Aldrete-Vidrio, Marvin Onabajo, Josep Altet, Diego Mateo, José Silva-Martínez:
Non-invasive RF built-in testing using on-chip temperature sensors. ITC 2009: 1 - M. Enamul Amyeen, Srikanth Venkataraman, Mun Wai Mak:
Microprocessor system failures debug and fault isolation methodology. ITC 2009: 1-10 - Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, Kun-Cheng Wu:
Power scan: DFT for power switches in VLSI designs. ITC 2009: 1 - Nicholas Callegari, Li-C. Wang, Pouria Bastani:
Feature based similarity search with application to speedpath analysis. ITC 2009: 1-10 - Stefano Di Carlo, Nadereh Hatami, Paolo Prinetto:
Test infrastructures evaluation at transaction level. ITC 2009: 1 - Krishna Chakravadhanula, Vivek Chickermane, Brion L. Keller, Patrick R. Gallagher Jr., Prashant Narang:
Capture power reduction using clock gating aware test generation. ITC 2009: 1-9 - Chia-Ling Chang, Charles H.-P. Wen, Jayanta Bhadra:
Speeding up bounded sequential equivalence checking with cross-timeframe state-pair constraints from data learning. ITC 2009: 1-8 - Liang-Chi Chen, Paul Dickinson, Peter Dahlgren, Scott Davidson, Olivier Caty, Kevin Wu:
Using transition test to understand timing behavior of logic circuits on UltraSPARCTM T2 family. ITC 2009: 1-10 - Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja:
Data learning techniques and methodology for Fmax prediction. ITC 2009: 1-10 - Ching-Yu Chin, Yao-Te Tsou, Chi-Min Chang, Mango Chia-Tso Chao:
A novel test flow for one-time-programming applications of NROM technology. ITC 2009: 1-9 - Chen-I Chung, Shuo-Wen Chang, Ching-Hwa Cheng:
Fine resolution double edge clipping with calibration technique for built-in at-speed delay testing. ITC 2009: 1 - Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar:
Fast extended test access via JTAG and FPGAs. ITC 2009: 1-7 - Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy:
Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10 - Swapneel Donglikar, Mainak Banga, Maheshwar Chandrasekar, Michael S. Hsiao:
Fast circuit topology based method to configure the scan chains in Illinois Scan architecture. ITC 2009: 1-10 - Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir:
Minimizing outlier delay test cost in the presence of systematic variability. ITC 2009: 1-10 - Heiko Ehrenberg:
Test Mode Entry and Exit Methods for IEEE P1581 compliant devices. ITC 2009: 1 - Tasuku Fujibe, Masakatsu Suda, Kazuhiro Yamamoto, Yoshihito Nagata, Kazuhiro Fujita, Daisuke Watanabe, Toshiyuki Okayasu:
Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. ITC 2009: 1-10 - Philip B. Geiger, Steve Butkovich:
Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry. ITC 2009: 1-10 - Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield:
Test access mechanism for multiple identical cores. ITC 2009: 1-10 - Sandeep Kumar Goel, Narendra Devta-Prasanna, Mark Ward:
Comparing the effectiveness of deterministic bridge fault and multiple-detect stuck fault patterns for physical bridge defects: A simulation and silicon study. ITC 2009: 1-10 - Rama Gudavalli, W. Robert Daasch, Phil Nigh, Douglas Heaberlin:
Application of non-parametric statistics of the parametric response for defect diagnosis. ITC 2009: 1-10 - Sankar Gurumurthy, D. Bertanzetti, P. Jakobsen, Jeff Rearick:
Cache-resident self-testing for I/O circuitry. ITC 2009: 1-8 - Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, Dan Adolfsson:
Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. ITC 2009: 1-10 - Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird:
An outlier detection based approach for PCB testing. ITC 2009: 1-10 - Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi, Yoshihiro Shimizu, Takashi Aikyo, Yuzo Takamatsu:
Diagnostic test generation for transition faults using a stuck-at ATPG tool. ITC 2009: 1-9 - Tong-Yu Hsieh, Melvin A. Breuer, Murali Annavaram, Sandeep K. Gupta, Kuen-Jong Lee:
Tolerance of performance degrading faults for effective yield improvement. ITC 2009: 1-10 - Lin Huang, Qiang Xu:
Test economics for homogeneous manycore systems. ITC 2009: 1-10 - Matthias Kamm:
Manufacturing data: Maximizing value using component-to-system analysis. ITC 2009: 1 - Sukeshwar Kannan, Bruce C. Kim:
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. ITC 2009: 1 - Bilal El Kassir, Christophe Kelma, Bernard Jarry, Michel Campovecchio:
Built-in Self Test for Error Vector Magnitude measurement of RF transceiver. ITC 2009: 1
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