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Publication search results
found 77 matches
- 1997
- Magdy S. Abadir, Rohit Kapur:
Cost-Driven Ranking of Memory Elements for Partial Intrusion. IEEE Des. Test Comput. 14(3): 45-50 (1997) - Robert C. Aitken:
Modeling the Unmodelable: Algorithmic Fault Diagnosis. IEEE Des. Test Comput. 14(3): 98-103 (1997) - Tony Ambler, Magdy S. Abadir:
Design and Test Economics-An Extra Dimension. IEEE Des. Test Comput. 14(3): 15-16 (1997) - Al Bailey, Tim Lada, Jim Preston:
Collateral ASIC Test. IEEE Des. Test Comput. 14(1): 55-63 (1997) - Keith Baker, Jos van Beers:
Shmoo Plotting: The Black Art of IC Testing. IEEE Des. Test Comput. 14(3): 90-97 (1997) - Reinaldo A. Bergamaschi, Salil Raje:
Observable Time Windows: Verifying High-Level Synthesis Results. IEEE Des. Test Comput. 14(2): 40-50 (1997) - Dilip K. Bhavsar, John H. Edmondson:
Alpha 21164 Testability Strategy. IEEE Des. Test Comput. 14(1): 25-33 (1997) - Ivo Bolsens, Marco Cecchini:
IP-based business conflicts. IEEE Des. Test Comput. 14(2): 4, 92 (1997) - Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena:
Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. 14(3): 83-89 (1997) - Al Crouch, Jeff Freeman:
Designing and Verifying Embedded Microprocessors. IEEE Des. Test Comput. 14(4): 87-94 (1997) - Scott Davidson:
George learns test. IEEE Des. Test Comput. 14(1): 96- (1997) - Scott Davidson:
Why projects are late. IEEE Des. Test Comput. 14(2): 96- (1997) - James Debardelaben, Vijay K. Madisetti, Anthony J. Gadient:
Incorporating Cost Modeling in Embedded-System Design. IEEE Des. Test Comput. 14(3): 24-35 (1997) - Rolf Drechsler, Bernd Becker, Stefan Ruppertz:
The K*BMD: A Verification Data Structure. IEEE Des. Test Comput. 14(2): 51-59 (1997) - Frank S. Eory:
A Core-Based System-to-Silicon Design Methodology. IEEE Des. Test Comput. 14(4): 36-41 (1997) - Des Farren, Anthony P. Ambler:
The Economics of System-Level Testing. IEEE Des. Test Comput. 14(3): 51-58 (1997) - Fabrizio Ferrandi, Franco Fummi, Donatella Sciuto, Enrico Macii, Massimo Poncino:
Testing Core-Based Systems: A Symbolic Methodology. IEEE Des. Test Comput. 14(4): 69-77 (1997) - Rajesh K. Gupta, Stan Y. Liao:
Using a Programming Language for Digital System Design. IEEE Des. Test Comput. 14(2): 72-80 (1997) - Rajesh K. Gupta, Yervant Zorian:
Introducing Core-Based System Design. IEEE Des. Test Comput. 14(4): 15-25 (1997) - Ghassan Al Hayek, Yves Le Traon, Chantal Robach:
Impact of System Partitioning on Test Cost. IEEE Des. Test Comput. 14(1): 64-74 (1997) - Margarida F. Jacome, Viktor S. Lapinskii:
NREC: Risk Assessment and Planning of Complex Designs. IEEE Des. Test Comput. 14(1): 42-49 (1997) - Keith A. Jenkins:
Detecting and Preventing Measurement Errors. IEEE Des. Test Comput. 14(4): 78-86 (1997) - Jean-Michel Karam, Bernard Courtois, Hicham Boutamine:
CAD Tools for Bridging Microsystems and Foundries. IEEE Des. Test Comput. 14(2): 34-39 (1997) - Jainendra Kumar:
Prototyping the M68060 for Concurrent Verification. IEEE Des. Test Comput. 14(1): 34-41 (1997) - Mika Kuulusa, Jari Nurmi, Janne Takala, Pasi Ojala, Henrik Herranen:
A Flexible DSP Core for Embedded Systems. IEEE Des. Test Comput. 14(4): 60-68 (1997) - Luciano Lavagno, Nanette Collins:
DAC 97 Panel: Next-Generation HDLs. IEEE Des. Test Comput. 14(3): 7-8 (1997) - Marc E. Levitt:
Guest Editor's Introduction: Microprocessors Lead the Way in Complex Design. IEEE Des. Test Comput. 14(1): 8-9 (1997) - Marc E. Levitt:
Designing UltraSparc for Testability. IEEE Des. Test Comput. 14(1): 10-17 (1997) - Clifford Liem, François Naçabal, Carlos A. Valderrama, Pierre G. Paulin, Ahmed Amine Jerraya:
System-on-a-Chip Cosimulation and Compilation. IEEE Des. Test Comput. 14(2): 16-25 (1997) - Vijay K. Madisetti, Lan Shen:
Interface Design for Core-Based Systems. IEEE Des. Test Comput. 14(4): 42-51 (1997)
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retrieved on 2024-05-26 05:45 CEST from data curated by the dblp team
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