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Publication search results
found 208 matches
- 2004
- Erkan Acar, Sule Ozev:
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis. ITC 2004: 783-792 - Robert C. Aitken:
A Modular Wrapper Enabling High Speed BIST and Repair for Small Wide Memories. ITC 2004: 997-1005 - Greg Aldrich:
100 DPPM in Nanometer Technology - Is it achievable? ITC 2004: 1417 - M. Enamul Amyeen, Srikanth Venkataraman, Ajay Ojha, Sangbong Lee:
Evaluation of the Quality of N-Detect Scan ATPG Patterns on a Processor. ITC 2004: 669-678 - Thomas J. Anderson:
Practical Instrumentation Integration Considerations. ITC 2004: 1078-1080 - Baris Arslan, Alex Orailoglu:
Test Cost Reduction Through A Reconfigurable Scan Architecture. ITC 2004: 945-952 - Kendrick Baker, Mehrdad Nourani:
Interconnect Test Pattern Generation Algorithm For Meeting Device and Global SSO Limits With Safe Initial Vectors. ITC 2004: 163-172 - Kedarnath J. Balakrishnan, Nur A. Touba:
Improving Encoding Efficiency for Linear Decompressors Using Scan Inversion. ITC 2004: 936-944 - Tiago R. Balen, Antonio Andrade Jr., Florence Azaïs, Michel Renovell, Marcelo Lubaszewski:
Testing the Configurable Analog Blocks of Field Programmable Analog Arrays. ITC 2004: 893-902 - Thomas Bartenstein:
Panel 9 - Diagnostics vs. Failure Analysis. ITC 2004: 1439 - Brady Benware:
Achieving Sub 100 DPPM Defect Levels on VDSM and Nanometer ASICs. ITC 2004: 1418 - Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski:
Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294 - Soumendu Bhattacharya, Abhijit Chatterjee:
Use of Embedded Sensors for Built-In-Test of RF Circuits. ITC 2004: 801-809 - Sebastià A. Bota, M. Rosales, José Luis Rosselló, Jaume Segura, Ali Keshavarzi:
Within Die Thermal Gradient Impact on Clock-Skew: A New Type of Delay-Fault Mechanism. ITC 2004: 1276-1284 - Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra:
Speed Clustering of Integrated Circuits. ITC 2004: 1128-1137 - Jason G. Brown, R. D. (Shawn) Blanton:
CAEN-BIST: Testing the NanoFabric. ITC 2004: 462-471 - Dana Brown, John Ferrario, Randy Wolf, Jing Li, Jayendra Bhagat:
RF Testing on a Mixed Signal Tester. ITC 2004: 793-800 - Kenneth M. Butler:
Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC 2004: 1419 - Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington:
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364 - A. Cabbibo, J. Conder, M. Jacobs:
Feed Forward Test Methodology Utilizing Device Identification. ITC 2004: 655-660 - Sreejit Chakravarty, Eric W. Savage, Eric N. Tran:
Defect Coverage Analysis of Partitioned Testing. ITC 2004: 907-915 - Kameshwar Chandrasekar, Michael S. Hsiao:
Decision Selection and Learning for an All-Solutions ATPG Engine. ITC 2004: 607-616 - Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
A DFT Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance CMOS ALUs. ITC 2004: 1108-1117 - Kuo-Liang Cheng, Jing-Reng Huang, Chih-Wea Wang, Chih-Yen Lo, Li-Ming Denq, Chih-Tsun Huang, Shin-Wei Hung, Jye-Yuan Lee:
An SOC Test Integration Platform and Its Industrial Realization. ITC 2004: 1213-1222 - Chen-Huan Chiang, Paul J. Wheatley, Kenneth Y. Ho, Ken L. Cheung:
Testing and Remote Field Update of Distributed Base Stations in a Wireless Network. ITC 2004: 711-718 - Man Wah Chiang, Zeljko Zilic, Jean-Samuel Chenard, Katarzyna Radecka:
Architectures of Increased Availability Wireless Sensor Network Nodes. ITC 2004: 1232-1241 - Vivek Chickermane, Brian Foutz, Brion L. Keller:
Channel Masking Synthesis for Efficient On-Chip Test Compression. ITC 2004: 452-461 - C. J. Clark, Mike Ricchetti:
A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems. ITC 2004: 857-866 - Edward I. Cole Jr.:
Global Failure Localization: We Have To, But on What and How? ITC 2004: 1440 - Fulvio Corno, Matteo Sonza Reorda, Simonluca Tosato, F. Esposito:
Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems. ITC 2004: 1332-1339
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