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Publication search results
found 59 matches
- 2016
- Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8 - Md. Mahbub Alam, Mark M. Tehranipoor, Domenic Forte:
Recycled FPGA detection using exhaustive LUT path delay characterization. ITC 2016: 1-10 - M. Enamul Amyeen, Dongok Kim, Maheshwar Chandrasekar, Mohammad Noman, Srikanth Venkataraman, Anurag Jain, Neha Goel, Ramesh Sharma:
A novel diagnostic test generation methodology and its application in production failure isolation. ITC 2016: 1-10 - Dave Armstrong, Gary Maier:
Known-good-die test methods for large, thin, high-power digital devices. ITC 2016: 1-6 - Shalini Arora, Aman Aflaki, Sounil Biswas, Masashi Shimanouchi:
SERDES external loopback test using production parametric-test hardware. ITC 2016: 1-7 - Suvadeep Banerjee, Abhijit Chatterjee, Jacob A. Abraham:
Efficient cross-layer concurrent error detection in nonlinear control systems using mapped predictive check states. ITC 2016: 1-10 - Kenneth M. Butler, Amit Nahar, W. Robert Daasch:
What we know after twelve years developing and deploying test data analytics solutions. ITC 2016: 1-8 - Huina Chao, Huawei Li, Tiancheng Wang, Xiaowei Li, Bo Liu:
An accurate algorithm for computing mutation coverage in model checking. ITC 2016: 1-10 - Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen:
Automatic test signal generation for mixed-signal integrated circuits using circuit partitioning and interval analysis. ITC 2016: 1-10 - V. R. Devanathan, Sumant Kale:
A reconfigurable built-in memory self-repair architecture for heterogeneous cores with embedded BIST datapath. ITC 2016: 1-6 - Wim Dobbelaere, Ronny Vanhooren, Willy De Man, Koen Matthijs, Anthony Coyette, Baris Esen, Georges G. E. Gielen:
Analog fault coverage improvement using final-test dynamic part average testing. ITC 2016: 1-9 - Baris Esen, Anthony Coyette, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren:
Effective DC fault models and testing approach for open defects in analog circuits. ITC 2016: 1-9 - Y. Fan, A. Verma, Y. Su, L. Rose, J. Janney, V. Do, S. Kumar:
RF test accuracy and capacity enhancement on ATE for silicon TV tuners. ITC 2016: 1-10 - Phillip Fynan, Zeye Liu, Benjamin Niewenhuis, Soumya Mittal, Marcin Strajwas, R. D. (Shawn) Blanton:
Logic characterization vehicle design reflection via layout rewiring. ITC 2016: 1-10 - Ken Hansen:
Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research. ITC 2016: 11 - Chih-Sheng Hou, Yong-Xiao Chen, Jin-Fu Li, Chih-Yen Lo, Ding-Ming Kwai, Yung-Fa Chou:
A built-in self-repair scheme for DRAMs with spare rows, columns, and bits. ITC 2016: 1-7 - Chun-Kai Hsu, Peter Sarson, Gregor Schatzberger, Friedrich Peter Leisenberger, John M. Carulli Jr., Siddhartha Siddhartha, Kwang-Ting Cheng:
Variation and failure characterization through pattern classification of test data from multiple test stages. ITC 2016: 1-10 - Pavan Kumar Datla Jagannadha, Mahmut Yilmaz, Milind Sonawane, Sailendra Chadalavada, Shantanu Sarangi, Bonita Bhaskaran, Ayub Abdollahian:
Advanced test methodology for complex SoCs. ITC 2016: 1-10 - Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Accurate anomaly detection using correlation-based time-series analysis in a core router system. ITC 2016: 1-10 - Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge:
Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. ITC 2016: 1-8 - Gurunath Kadam, Markus Rudack, Krishnendu Chakrabarty, Juergen Alt:
Supply-voltage optimization to account for process variations in high-volume manufacturing testing. ITC 2016: 1-9 - Anastasis Keliris, Hossein Salehghaffari, Brian R. Cairl, Prashanth Krishnamurthy, Michail Maniatakos, Farshad Khorrami:
Machine learning-based defense against process-aware attacks on Industrial Control Systems. ITC 2016: 1-10 - Subhadip Kundu, Parthajit Bhattacharya, Rohit Kapur:
Handling wrong mapping: A new direction towards better diagnosis with low pin convolution compressors. ITC 2016: 1-7 - Kuen-Jong Lee, Pin-Hao Tang, Michael A. Kochte:
An on-chip self-test architecture with test patterns recorded in scan chains. ITC 2016: 1-10 - Tianjian Li, Li Jiang, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty:
Defect tolerance for CNFET-based SRAMs. ITC 2016: 1-9 - Zipeng Li, Kelvin Yi-Tse Lai, Po-Hsien Yu, Krishnendu Chakrabarty, Tsung-Yi Ho, Chen-Yi Lee:
Built-in self-test for micro-electrode-dot-array digital microfluidic biochips. ITC 2016: 1-10 - Wei-Cheng Lien, Kuen-Jong Lee:
Output bit selection methodology for test response compaction. ITC 2016: 1-10 - Carlston Lim, Yang Xue, Xin Li, Ronald D. Blanton, M. Enamul Amyeen:
Diagnostic resolution improvement through learning-guided physical failure analysis. ITC 2016: 1-10 - Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer:
Minimal area test points for deterministic patterns. ITC 2016: 1-7 - Soumya Mittal, Zeye Liu, Ben Niewenhuis, R. D. (Shawn) Blanton:
Test chip design for optimal cell-aware diagnosability. ITC 2016: 1-8
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