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Publication search results
found 89 matches
- 2016
- Magdy Abadir:
Creating a Successful Partnership Between Industry, Academia, and Government. IEEE Des. Test 33(5): 84-91 (2016) - Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada:
On New Test Points for Compact Cell-Aware Tests. IEEE Des. Test 33(6): 7-14 (2016) - Chuck Alpert:
Recap of the 53rd Design Automation Conference (DAC). IEEE Des. Test 33(5): 93-95 (2016) - Frank Altmann, Matthias Petzold:
Innovative Failure Analysis Techniques for 3-D Packaging Developments. IEEE Des. Test 33(3): 46-55 (2016) - Senthil Arasu, Mehrdad Nourani, John M. Carulli, Vijay Reddy:
Controlling Aging in Timing-Critical Paths. IEEE Des. Test 33(4): 82-91 (2016) - Hafiz ul Asad, Kevin D. Jones:
Verifying Inevitability of Oscillation in Ring Oscillators Using the Deductive SOS-QE Approach. IEEE Des. Test 33(5): 35-43 (2016) - Manuel J. Barragán, Haralampos-G. D. Stratigopoulos, Salvador Mir, Hervé Le Gall, Neha Bhargava, Ankur Bal:
Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques. IEEE Des. Test 33(6): 46-54 (2016) - Eric Beyne:
The 3-D Interconnect Technology Landscape. IEEE Des. Test 33(3): 8-20 (2016) - R. D. Shawn Blanton, David Yeh:
Test: Wisdom From the Giants, Visions for the Future - Part 2. IEEE Des. Test 33(1): 77-84 (2016) - Samarjit Chakraborty, Mohammad Abdullah Al Faruque, Wanli Chang, Dip Goswami, Marilyn Wolf, Qi Zhu:
Automotive Cyber-Physical Systems: A Tutorial Introduction. IEEE Des. Test 33(4): 92-108 (2016) - Kai-Hui Chang, Hong-Zu Chou, Haiqian Yu, Dylan Dobbyn, Sy-Yen Kuo:
Handling Nondeterminism in Logic Simulation so That Your Waveform Can Be Trusted Again. IEEE Des. Test 33(6): 63-71 (2016) - Hari Chauhan, Marvin Onabajo, Vladimir Kvartenko, Robin Coxe, Theophane Weber:
An Optimization Platform for Digital Predistortion of Power Amplifiers. IEEE Des. Test 33(2): 49-58 (2016) - Perceval Coudrain, Papa Momar Souare, Rafael Prieto, Vincent Fiori, Alexis Farcy, Laurent Le Pailleur, Jean-Philippe Colonna, Cristiano Santos, Pascal Vivet, M. Haykel Ben Jamaa, Denis Dutoit, François de Crecy, Sylvain Dumas, Christian Chancel, Didier Lattard, Séverine Cheramy:
Experimental Insights Into Thermal Dissipation in TSV-Based 3-D Integrated Circuits. IEEE Des. Test 33(3): 21-36 (2016) - Kristof Croes, Joke De Messemaeker, Yunlong Li, Wei Guo, Olalla Varela Pedreira, Vladimir Cherman, Michele Stucchi, Ingrid De Wolf, Eric Beyne:
Reliability Challenges Related to TSV Integration and 3-D Stacking. IEEE Des. Test 33(3): 37-45 (2016) - Ruben Cubo, Alexander Medvedev, Mattias Åström:
Model-Based Optimization of Individualized Deep Brain Stimulation Therapy. IEEE Des. Test 33(4): 74-81 (2016) - Scott Davidson:
Good Enough Computing. IEEE Des. Test 33(1): 96 (2016) - Scott Davidson:
The Five Stages of Project Grief. IEEE Des. Test 33(2): 104 (2016) - Scott Davidson:
And He Built a Crooked Chip. IEEE Des. Test 33(3): 144 (2016) - Scott Davidson:
The Intestinal Superhighway. IEEE Des. Test 33(4): 128 (2016) - Scott Davidson:
Where Are We Going? IEEE Des. Test 33(5): 104 (2016) - Vivek De:
Energy-Efficient Computing in Nanoscale CMOS. IEEE Des. Test 33(2): 68-75 (2016) - Vladimir Dubikhin, Danil Sokolov, Alex Yakovlev, Chris J. Myers:
Design of Mixed-Signal Systems With Asynchronous Control. IEEE Des. Test 33(5): 44-55 (2016) - Bill Eklow:
Recap of the ITC15 Test Conference. IEEE Des. Test 33(1): 85-86 (2016) - Rolf Ernst:
Report of the 2015 Embedded Systems Week (ESWEEK). IEEE Des. Test 33(2): 97-98 (2016) - Rolf Ernst, Marco Di Natale:
Mixed Criticality Systems - A History of Misconceptions? IEEE Des. Test 33(5): 65-74 (2016) - Luca Fanucci, Jürgen Teich:
Recap of the 2016 DATE Conference & Exhibition. IEEE Des. Test 33(4): 114-117 (2016) - Can Hankendi, Ayse Kivilcim Coskun, Henry Hoffmann:
Adapt&Cap: Coordinating System- and Application-Level Adaptation for Power-Constrained Systems. IEEE Des. Test 33(1): 68-76 (2016) - Kai He, Xin Huang, Sheldon X.-D. Tan:
EM-Based On-Chip Aging Sensor for Detection of Recycled ICs. IEEE Des. Test 33(5): 56-64 (2016) - Jörg Henkel:
Approximate Computing: Solving Computing's Inefficiency Problem? IEEE Des. Test 33(1): 4-5 (2016) - Jörg Henkel:
Three-Dimensional Integrated Circuits. IEEE Des. Test 33(2): 4-6 (2016)
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