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Publication search results
found 66 matches
- 2002
- Gang Chen, Ming Fu Li, Ying Jin:
Interaction of interface-traps located at various sites in MOSFETs under stress. IEEE Trans. Reliab. 51(4): 387-391 (2002) - Abdulla A. Alhadeed, Shie-Shien Yang:
Optimal simple step-stress plan for Khamis-Higgins model. IEEE Trans. Reliab. 51(2): 212-215 (2002) - Suprasad V. Amari:
Addendum to: generic rules to evaluate system-failure frequency. IEEE Trans. Reliab. 51(3): 378-379 (2002) - Vilijandas Bagdonavicius, Léo Gerville-Réache, Mikhail Nikulin:
Parametric inference for step-stress models. IEEE Trans. Reliab. 51(1): 27-31 (2002) - Lisa M. Bartlett, John D. Andrews:
Choosing a heuristic for the "fault tree to binary decision diagram" conversion, using neural networks. IEEE Trans. Reliab. 51(3): 344-349 (2002) - Alfredo Benso, Silvia Chiusano, Giorgio Di Natale, Paolo Prinetto:
An on-line BIST RAM architecture with self-repair capabilities. IEEE Trans. Reliab. 51(1): 123-128 (2002) - Rene L. Bierbaum, Thomas D. Brown, Thomas J. Kerschen:
Model-based reliability analysis. IEEE Trans. Reliab. 51(2): 133-140 (2002) - John B. Bowles:
Commentary-caution: constant failure-rate models may be hazardous to your design. IEEE Trans. Reliab. 51(3): 375-377 (2002) - Cornel Bunea, Tim Bedford:
The effect of model uncertainty on maintenance optimization. IEEE Trans. Reliab. 51(4): 486-493 (2002) - Stephen R. Cain:
Distinguishing between lognormal and Weibull distributions [time-to-failure data]. IEEE Trans. Reliab. 51(1): 32-38 (2002) - Yonghuan Cao, Hairong Sun, Kishor S. Trivedi, James J. Han:
System availability with non-exponentially distributed outages. IEEE Trans. Reliab. 51(2): 193-198 (2002) - Wei-Ting Kary Chen, Charles Hung-Jia Huang:
Practical "building-in reliability" approaches for semiconductor manufacturing. IEEE Trans. Reliab. 51(4): 469-481 (2002) - Roger M. Cooke, Tim Bedford:
Reliability databases in perspective. IEEE Trans. Reliab. 51(3): 294-310 (2002) - Geert Deconinck, Vincenzo De Florio, Oliver Botti:
Software-implemented fault-tolerance and separate recovery strategies enhance maintainability [substation automation]. IEEE Trans. Reliab. 51(2): 158-165 (2002) - Geert Deconinck, Vincenzo De Florio, Theodora A. Varvarigou, Evangelos Verentziotis:
The EFTOS approach to dependability in embedded supercomputing. IEEE Trans. Reliab. 51(1): 76-90 (2002) - Ralph A. Evans:
Editorial - fault-trees and cause-consequence charts. IEEE Trans. Reliab. 51(1): 1 (2002) - Ralph A. Evans:
Editorial - belling the cat, revisited. IEEE Trans. Reliab. 51(1): 2 (2002) - Ralph A. Evans:
Bias is not bad. IEEE Trans. Reliab. 51(3): 257 (2002) - Ralph A. Evans:
Data, data, oh where art thou data? IEEE Trans. Reliab. 51(3): 259 (2002) - Ralph A. Evans:
A contract is a piece of software. IEEE Trans. Reliab. 51(3): 260 (2002) - Maxim S. Finkelstein, Vladimir I. Zarudnij:
Laplace-transforms and fast-repair approximations for multiple availability and its generalizations. IEEE Trans. Reliab. 51(2): 168-176 (2002) - Kent Fitzgerald, Shahram Latifi, Pradip K. Srimani:
Reliability modeling and assessment of the Star-Graph networks. IEEE Trans. Reliab. 51(1): 49-57 (2002) - Beatrice Giglio, Daniel Q. Naiman, Henry P. Wynn:
Grobner bases, abstract tubes, and inclusion-exclusion reliability bounds. IEEE Trans. Reliab. 51(3): 358-366 (2002) - Antoine Grall, Laurence Dieulle, Christophe Bérenguer, Michel Roussignol:
Continuous-time predictive-maintenance scheduling for a deteriorating system. IEEE Trans. Reliab. 51(2): 141-150 (2002) - Koji Hisada, Ikuo Arizino:
Reliability tests for Weibull distribution with varying shape-parameter, based on complete data. IEEE Trans. Reliab. 51(3): 331-336 (2002) - Fabien Houéto, Samuel Pierre, Ronald Beaubrun, Yves Lemieux:
Reliability and cost evaluation of third-generation wireless access network topologies: a case study. IEEE Trans. Reliab. 51(2): 229-239 (2002) - Chin-Yu Huang, Sy-Yen Kuo:
Analysis of incorporating logistic testing-effort function into software reliability modeling. IEEE Trans. Reliab. 51(3): 261-270 (2002) - Gordon F. Hughes, Joseph F. Murray, Kenneth Kreutz-Delgado, Charles Elkan:
Improved disk-drive failure warnings. IEEE Trans. Reliab. 51(3): 350-357 (2002) - Donald S. Jackson, Himanshu Pant, Michael Tortorella:
Improved reliability-prediction and field-reliability-data analysis for field-replaceable units. IEEE Trans. Reliab. 51(1): 8-16 (2002) - Taghi M. Khoshgoftaar, Edward B. Allen, Jianyu Deng:
Using regression trees to classify fault-prone software modules. IEEE Trans. Reliab. 51(4): 455-462 (2002)
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