DFT 1996: Boston, MA, USA

Session 1: Defect Avoidance

Session 2: Yield Prediction

Session 3: Yield and Reliability Enhancement

Session 4: Layout-Driven Test

Session 5: Process Data Analysis

Session 6: Test And Diagnosis

Session 7: Self-Test and Self-Checking Designs

Session 8: Fault-Tolerant Structuies

Session 9: Reliable Circuit Synthesis

Session 10: Fault-Tolerance Approaches

a service of Schloss Dagstuhl - Leibniz Center for Informatics