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24th ICSE 2002: Orlanda, FL, USA - Workshop on Software Architectures for Dependable Systems (WADS)
- Rogério de Lemos

, Cristina Gacek, Alexander B. Romanovsky:
Architecting Dependable Systems [the book is a result of the ICSE 2002 Workshop on Software Architectures for Dependable Systems]. Lecture Notes in Computer Science 2677, Springer 2003, ISBN 978-3-540-40727-0
Part 1. Architectures for Dependability
- Paulo Veríssimo, Nuno Ferreira Neves, Miguel Correia:

Intrusion-Tolerant Architectures: Concepts and Design. 3-36 - Nenad Medvidovic, Marija Mikic-Rakic, Nikunj R. Mehta:

Improving Dependability of Component-Based Systems via Multi-versioning Connectors. 37-60 - David Garlan, Shang-Wen Cheng, Bradley R. Schmerl:

Increasing System Dependability through Architecture-Based Self-Repair. 61-89 - Ferda Tartanoglu, Valérie Issarny, Alexander B. Romanovsky

, Nicole Lévy:
Dependability in the Web Services Architecture. 90-109 - Gerhard Fohler, Tomas Lennvall, Radu Dobrin:

A Component Based Real-Time Scheduling Architecture. 110-125
Part 2. Fault Tolerance in Software Architectures
- Paulo Asterio de Castro Guerra, Cecília M. F. Rubira, Rogério de Lemos

:
A Fault-Tolerant Software Architecture for Component-Based Systems. 129-149 - Marcio S. Dias, Debra J. Richardson:

The Role of Event Description in Architecting Dependable Systems. 150-174 - Rogério de Lemos, Cristina Gacek, Alexander B. Romanovsky

:
Architectural Mismatch Tolerance. 175-194
Part 3. Dependability Analysis in Software Architectures
- Apostolos V. Zarras, Christos Kloukinas

, Valérie Issarny:
Quality Analysis of Dependable Systems: A Developer Oriented Approach. 197-218 - István Majzik, András Pataricza, Andrea Bondavalli

:
Stochastic Dependability Analysis of System Architecture Based on UML Models. 219-244 - Swapna S. Gokhale, Joseph R. Horgan, Kishor S. Trivedi:

Specification-Level Integration of Simulation and Dependability Analysis. 245-266 - Charles P. Shelton, Philip Koopman:

Using Architectural Properties to Model and Measure Graceful Degradation. 267-289
Part 4. Industrial Experience
- Frank van der Linden:

Dependability Experience in Philips. 293-307

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