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ORCID23rd LATS 2022: Montevideo, Uruguay
- 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022. IEEE 2022, ISBN 978-1-6654-5707-1
- Michele Boldo, Nicola Bombieri, Mirco De Marchi, Luca Geretti, Samuele Germiniani, Graziano Pravadelli:
Risk Assessment and Prediction in Human-Robot Interaction Through Assertion Mining and Pose Estimation. 1-5 - Rolf Drechsler
:
Fast and Exact is Doable: Polynomial Algorithms in Test and Verification. 1-2 - Clayton R. Farias, Rafael B. Schvittz, Tiago R. Balen, Paulo F. Butzen:
Evaluating Soft Error Reliability of Combinational Circuits Using a Monte Carlo Based Method. 1-6 - Annachiara Ruospo:
Reliability Assessment Methodologies for ANN-based Systems. 1-4 - Tingting Zhang, Zijing Niu, Jie Han:
A Brief Review of Logarithmic Multiplier Designs. 1-4 - Lucas B. Zilch, Állan G. Ferreira, Marcelo Soares Lubaszewski, Tiago R. Balen:
Evaluating Fault Coverage of Structural and Specification-based Tests Obtained With a Low-Cost Analog TPG Tool. 1-6 - Víctor H. Champac, Hector Villacorta, Roberto Gómez-Fuentes, Fabian Vargas, Jaume Segura:
Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. 1-6 - Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui:
On BTI Aging Rejuvenation in Memory Address Decoders. 1-6 - Alberto Bosio, Moreno Bragaglio, Samuele Germiniani, Samuele Mori, Graziano Pravadelli, Marcello Traiola:
Assertion-aware approximate computing design exploration on behavioral models. 1-6 - Kamal Danouchi, Guillaume Prenat, Lorena Anghel:
Spin Orbit Torque-based Crossbar Array for Error Resilient Binary Convolutional Neural Network. 1-6 - Fabrizio Finelli, Martin Omaña, Cecilia Metra:
Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection. 1-6 - Zahrein Bin Yaacob, Chooi Yee Kong:
Hybrid De-Embedding for 116 Gbps Test Channels. 1-4 - Elisa Marcelli, Tommaso Barbariol, Vincenzo Savarino, Alessandro Beghi, Gian Antonio Susto:
A Revised Isolation Forest procedure for Anomaly Detection with High Number of Data Points. 1-5 - Prasanna Ravi, Anupam Chattopadhyay, Shivam Bhasin:
Security and Quantum Computing: An Overview. 1-6 - Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre:
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. 1-6 - Dmytro Petryk, Zoya Dyka, Ievgen Kabin, Anselm Breitenreiter, Jan Schäffner, Milos Krstic:
Laser Fault Injection Attacks against Radiation Tolerant TMR Registers. 1-2 - Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls:
Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs. 1-6 - Sepide Saeedi, Alessio Carpegna, Alessandro Savino, Stefano Di Carlo:
Prediction of the Impact of Approximate Computing on Spiking Neural Networks via Interval Arithmetic. 1-6 - Zoya Dyka, Ievgen Kabin, Marcin Brzozowski, Goran Panic, Cristiano Calligaro, Milos Krstic, Peter Langendoerfer:
On the SCA Resistance of Crypto IP Cores. 1-2 - Khaled Sidahmed Sidahmed Alamin, Yukai Chen, Sebastiano Gaiardelli, Stefano Spellini, Andrea Calimera, Alessandro Beghi, Gian Antonio Susto, Franco Fummi, Enrico Macii, Sara Vinco:
SMART-IC: Smart Monitoring and Production Optimization for Zero-waste Semiconductor Manufacturing. 1-6 - Elmira Moussavi, Dominik Sisejkovic, Animesh Singh, Daniyar Kizatov, Rainer Leupers, Sven Ingebrandt, Vivek Pachauri, Farhad Merchant:
A Temperature Independent Readout Circuit for ISFET-Based Sensor Applications. 1-4 - Francesco Tosoni, Nicola Dall'Ora, Enrico Fraccaroli, Franco Fummi:
The Challenges of Coupling Digital-Twins with Multiple Classes of Faults. 1-6
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