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Foundations and Trends in Electronic Design Automation, Volume 4

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Volume 4, Number 1, 2010

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David Z. Pan, Minsik Cho, Kun Yuan:
Manufacturability Aware Routing in Nanometer VLSI. 1-97

Volume 4, Number 2-3, 2010

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Norbert Seifert:
Radiation-induced Soft Errors: A Chip-level Modeling Perspective. 99-221

Volume 4, Number 4, 2011

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Lei He, Shauki Elassaad, Yiyu Shi, Yu Hu, Wei Yao:
System-in-Package: Electrical and Layout Perspectives. 223-306

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