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ACM Transactions on Software Engineering and Methodology (TOSEM), Volume 1
Volume 1, Number 1, January 1992
- W. Richards Adrion:

Editorial. ACM Trans. Softw. Eng. Methodol. 1(1): 1-4 (1992) - A. Jefferson Offutt:

Investigations of the Software Testing Coupling Effect. 5-20 - Kurt M. Olender, Leon J. Osterweil:

Interprocedural Static Analysis of Sequencing Constraints. 21-52 - Victor R. Basili, Gianluigi Caldiera, Giovanni Cantone:

A Reference Architecture for the Component Factory. 53-80 - Carmen J. Trammell, Leon H. Binder, Cathrine E. Snyder:

The Automated Production Control Documentation System: A Case Study in Cleanroom Software Engineering. 81-94 - Robert A. Ballance, Susan L. Graham, Michael L. Van de Vanter:

The Pan Language-Based Editing System. 95-127
Volume 1, Number 2, April 1992
- W. Richards Adrion:

Editorial. ACM Trans. Softw. Eng. Methodol. 1(2): 133 (1992) - Gregor Engels, Claus Lewerentz

, Manfred Nagl, Wilhelm Schäfer, Andy Schürr:
Building Integrated Software Development Environments Part I: Tool Specification. 135-167 - James D. Kiper:

Structural Testing of Rule-Based Expert Systems. 168-187 - G. Michael Schneider, Johnny Martin, Wei-Tek Tsai:

An Experimental Study of Fault Detection In User Requirements Documents. 188-204
Volume 1, Number 3, July 1992
- Eduardo Ostertag, James A. Hendler, Rubén Prieto Díaz, Christine Braun:

Computing Similarity in a Reuse Library System: An AI-Based Approach. 205-228 - Kevin J. Sullivan, David Notkin:

Reconciling Environment Integration and Software Evolution. 229-268 - Shmuel S. Tyszberowicz, Amiram Yehudai:

OBSERV - A Prototyping Language and Environment. 269-309 - Wuu Yang, Susan Horwitz, Thomas W. Reps:

A Program Integration Algorithm that Accommodates Semantics-Preserving Transformations. 310-354
Volume 1, Number 4, October 1992
- Don S. Batory, Sean W. O'Malley:

The Design and Implementation of Hierarchical Software Systems with Reusable Components. 355-398 - David Harel, Chaim-Arie Kahana:

On Statecharts with Overlapping. 399-421 - Steven J. Zeil, Faten H. Afifi, Lee J. White:

Detection of Linear Errors via Domain Testing. 422-451

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