Ali Ahmadi

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Michael Pas

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Publications

2017
[j17]
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 36(12): 2120-2133 (2017)
2016
[c22]
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  - conf/iccad/AhmadiBNOPM16
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Ali Ahmadi, Mohammad-Mahdi Bidmeshki, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
A machine learning approach to fab-of-origin attestation. ICCAD 2016: 92
[c21]
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  - conf/iscas/AhmadiSNOPM16
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing fabrication process signature for predicting yield across designs. ISCAS 2016: 898-901
[c20]
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  - conf/itc/AhmadiXNOPM16
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Ali Ahmadi, Constantinos Xanthopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Harnessing process variations for optimizing wafer-level probe-test flow. ITC 2016: 1-8
[c18]
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  - conf/vts/AhmadiNOPM16
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Ali Ahmadi, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Wafer-level process variation-driven probe-test flow selection for test cost reduction in analog/RF ICs. VTS 2016: 1-6
2015
[c16]
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  - conf/iccad/AhmadiSNOPM15
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Ali Ahmadi, Haralampos-G. D. Stratigopoulos, Amit Nahar, Bob Orr, Michael Pas, Yiorgos Makris:
Yield Forecasting in Fab-to-Fab Production Migration Based on Bayesian Model Fusion. ICCAD 2015: 9-14
[c14]
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  - conf/vts/AhmadiHNOPCM15
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Ali Ahmadi, Ke Huang, Amit Nahar, Bob Orr, Michael Pas, John M. Carulli, Yiorgos Makris:
Yield prognosis for fab-to-fab product migration. VTS 2015: 1-6

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