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James Wrezel

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2012
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Bo Wang, Jiajun Li, Anthony Gallagher, James Wrezel, Pongpinit Towashirporn, Naiqin Zhao:
Drop impact reliability of Sn-1.0Ag-0.5Cu BGA interconnects with different mounting methods. Microelectron. Reliab. 52(7): 1475-1482 (2012)

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