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Sebastian Dietel

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2014
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Sebastian Dietel, Sebastian Höppner, Holger Eisenreich, Georg Ellguth, Stefan Hänzsche, Stephan Henker, René Schüffny, Tim Brauninger, Ulrich Fiedler:
A compact on-chip IR-drop measurement system in 28 nm CMOS technology. ISCAS 2014: 1219-1222

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