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R. Roucou

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2014
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Kirsten Weide-Zaage, J. Schlobohm, R. T. H. Rongen, F. C. Voogt, R. Roucou:
Simulation and measurement of the flip chip solder bumps with a Cu-plated plastic core. Microelectron. Reliab. 54(6-7): 1206-1211 (2014)
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R. T. H. Rongen, R. Roucou, P. J. vd Wel, F. C. Voogt, F. Swartjes, Kirsten Weide-Zaage:
Reliability of Wafer Level Chip Scale Packages. Microelectron. Reliab. 54(9-10): 1988-1994 (2014)

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