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Bum-Suk Kye

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2004
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Yong-Ha Song, Choong-Kyun Kim, Moo-Young Park, Bum-Suk Kye, Jeongil Seo, Dong-Soo Cho, Taek-Soo Kim, Gab-soo Han:
A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. Microelectron. Reliab. 44(9-11): 1829-1834 (2004)

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