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Haoze Luo

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2020 – today

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2023
[j11]
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  - journals/tie/KangLLCZX23
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Jianlong Kang, Qing Liu, Haoze Luo, Hu Cao, Zi-Hui Zhang, Zhen Xin:
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition. IEEE Trans. Ind. Electron. 70(5): 5224-5234 (2023)

2010 – 2019

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2019
[j10]
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Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao, Xiangning He, Nick Wright:
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Trans. Ind. Electron. 66(10): 8197-8204 (2019)
2018
[j9]
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Haoze Luo, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg:
On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition. Microelectron. Reliab. 88-90: 563-567 (2018)
[j8]
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Lorenzo Ceccarelli, Haoze Luo, Francesco Iannuzzo:
Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter. Microelectron. Reliab. 88-90: 627-630 (2018)
[j7]
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Haoze Luo, Wuhua Li, Francesco Iannuzzo, Xiangning He, Frede Blaabjerg:
Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules. IEEE Trans. Ind. Electron. 65(6): 4724-4738 (2018)
2017
[j6]
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Haoze Luo, Wuhua Li, Xiangning He, Francesco Iannuzzo, Frede Blaabjerg:
Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design. Microelectron. Reliab. 76-77: 123-130 (2017)
[j5]
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Haoze Luo, Nick Baker, Francesco Iannuzzo, Frede Blaabjerg:
Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules. Microelectron. Reliab. 76-77: 415-419 (2017)
[c1]
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  - conf/iecon/LuoIBLH17
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Haoze Luo, Francesco Iannuzzo, Frede Blaabjerg, Wuhua Li, Xiangning He:
Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules. IECON 2017: 1525-1530
2016
[j4]
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Haoze Luo, Francesco Iannuzzo, Paula Diaz Reigosa, Frede Blaabjerg, Wuhua Li, Xiangning He:
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview. Microelectron. Reliab. 58: 141-150 (2016)
2015
[j3]
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  - journals/tie/ZongLLHX15
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Sheng Zong, Haoze Luo, Wuhua Li, Xiangning He, Changliang Xia:
Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters. IEEE Trans. Ind. Electron. 62(7): 4170-4180 (2015)
[j2]
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Wuhua Li, Chi Xu, Haoze Luo, Yihua Hu, Xiangning He, Changliang Xia:
Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface. IEEE Trans. Ind. Electron. 62(7): 4504-4513 (2015)
[j1]
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  - journals/tie/LiGLCHX15
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Wuhua Li, Yunjie Gu, Haoze Luo, Wenfeng Cui, Xiangning He, Changliang Xia:
Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression. IEEE Trans. Ind. Electron. 62(7): 4537-4551 (2015)

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