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Shaalini Chithambaram

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2010 – 2019

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2018
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Shaalini Chithambaram, Pik Kee Tan, Yuzhe Zhao, Binghai Liu, Yinzhe Ma, Alfred Quah, Dayanand Nagalingam, Yanlin Pan, Zhihong Mai:
Failure analysis on 14 nm FinFET devices with ESD CDM failure. Microelectron. Reliab. 88-90: 321-333 (2018)

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