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2020 – today
- 2021
[j6]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Fault-based Built-in Self-test and Evaluation of Phase Locked Loops. ACM Trans. Design Autom. Electr. Syst. 26(3): 20:1-20:18 (2021)
2010 – 2019
- 2019
- [c11]Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev:
Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection. ETS 2019: 1-6 - 2017
- [c10]Joonsung Park, Krishnaswamy Nagaraj, Mikel Ash, Ajay Kumar:
A 12-/14-bit, 4/2MSPS, 0.085mm2 SAR ADC in 65nm using novel residue boosting. CICC 2017: 1-4 - [c9]Abhijit Das, Joonsung Park:
High precision yet wide range on-chip oscillator with dual charge-discharge technique. ISQED 2017: 409-412 - 2016
- [c8]Lorenzo Pedala, Ugur Sonmez, Fabio Sebastiano
, Kofi A. A. Makinwa, Krishnaswamy Nagaraj, Joonsung Park:
An oxide electrothermal filter in standard CMOS. IEEE SENSORS 2016: 1-3 - 2015
- [j5]Xiao Pu, Mikel Ash, Krishnaswamy Nagaraj, Joonsung Park, Steve Vu, Paul Kimelman, Sean de la Haye:
An Embedded 65 nm CMOS Remote Temperature Sensor With Digital Beta Correction and Series Resistance Cancellation Achieving an Inaccuracy of 0.4°C (3σ) From - 40°C to 130°C. IEEE J. Solid State Circuits 50(9): 2127-2137 (2015) - 2013
- [j4]Jaeyong Chung, Joonsung Park, Jacob A. Abraham:
A Built-In Repair Analyzer With Optimal Repair Rate for Word-Oriented Memories. IEEE Trans. Very Large Scale Integr. Syst. 21(2): 281-291 (2013) - 2011
- [j3]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based on a Volterra Series Model. J. Electron. Test. 27(3): 321-334 (2011) - [j2]Kihyuk Han, Joonsung Park, Jae Wook Lee, Jaeyong Chung, Eonjo Byun, Cheol-Jong Woo, Sejang Oh, Jacob A. Abraham:
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. J. Electron. Test. 27(4): 429-439 (2011) - 2010
- [j1]Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. J. Electron. Test. 26(1): 73-86 (2010) - [c7]Joonsung Park, Jae Wook Lee, Jaeyong Chung, Kihyuk Han, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
At-speed Test of High-Speed DUT Using Built-Off Test Interface. Asian Test Symposium 2010: 269-274 - [c6]Jaeyong Chung, Joonsung Park, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo:
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate. VTS 2010: 33-38
2000 – 2009
- 2009
- [c5]Joonsung Park, Jaeyong Chung, Jacob A. Abraham:
LFSR-Based Performance Characterization of Nonlinear Analog and Mixed-Signal Circuits. Asian Test Symposium 2009: 373-378 - [c4]Kihyuk Han, Joonsung Park, Jae Wook Lee, Jacob A. Abraham, Eonjo Byun, Cheol-Jong Woo, Sejang Oh:
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip. ETS 2009: 129-134 - 2008
- [c3]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Parallel Loopback Test of Mixed-Signal Circuits. VTS 2008: 309-316 - 2007
- [c2]Joonsung Park, Hongjoong Shin, Jacob A. Abraham:
Pseudorandom Test for Nonlinear Circuits Based on a Simplified Volterra Series Model. ISQED 2007: 495-500 - 2006
- [c1]Hongjoong Shin, Joonsung Park, Jacob A. Abraham:
Built-in Fault Diagnosis for Tunable Analog Systems Using an Ensemble Method. ITC 2006: 1-10
Coauthor Index
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